KR102114039B1 - 증착 공정 가스와 클리닝 가스를 분리 처리하는 하이브리드 스크러버 및 상기 하이브리드 스크러버의 운용 시스템 - Google Patents
증착 공정 가스와 클리닝 가스를 분리 처리하는 하이브리드 스크러버 및 상기 하이브리드 스크러버의 운용 시스템 Download PDFInfo
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- KR102114039B1 KR102114039B1 KR1020180119216A KR20180119216A KR102114039B1 KR 102114039 B1 KR102114039 B1 KR 102114039B1 KR 1020180119216 A KR1020180119216 A KR 1020180119216A KR 20180119216 A KR20180119216 A KR 20180119216A KR 102114039 B1 KR102114039 B1 KR 102114039B1
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- 238000004140 cleaning Methods 0.000 title claims abstract description 36
- 238000005137 deposition process Methods 0.000 title claims description 14
- 238000000034 method Methods 0.000 claims abstract description 74
- 239000004065 semiconductor Substances 0.000 claims abstract description 25
- 239000006227 byproduct Substances 0.000 claims abstract description 18
- 238000006243 chemical reaction Methods 0.000 claims abstract description 15
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000003814 drug Substances 0.000 claims abstract description 7
- 229910021536 Zeolite Inorganic materials 0.000 claims abstract description 4
- HNPSIPDUKPIQMN-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Al]O[Al]=O HNPSIPDUKPIQMN-UHFFFAOYSA-N 0.000 claims abstract description 4
- 150000002430 hydrocarbons Chemical class 0.000 claims abstract description 4
- 239000010457 zeolite Substances 0.000 claims abstract description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 4
- 229910052710 silicon Inorganic materials 0.000 claims description 4
- 239000010703 silicon Substances 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 3
- 239000007787 solid Substances 0.000 abstract description 4
- 239000007789 gas Substances 0.000 description 80
- 210000002381 plasma Anatomy 0.000 description 13
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 9
- 238000004519 manufacturing process Methods 0.000 description 9
- 238000005530 etching Methods 0.000 description 8
- 238000010517 secondary reaction Methods 0.000 description 6
- 231100000331 toxic Toxicity 0.000 description 6
- 230000002588 toxic effect Effects 0.000 description 6
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 5
- 229910004014 SiF4 Inorganic materials 0.000 description 5
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- ABTOQLMXBSRXSM-UHFFFAOYSA-N silicon tetrafluoride Chemical compound F[Si](F)(F)F ABTOQLMXBSRXSM-UHFFFAOYSA-N 0.000 description 5
- 229910052681 coesite Inorganic materials 0.000 description 4
- 229910052906 cristobalite Inorganic materials 0.000 description 4
- 238000000151 deposition Methods 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 235000012239 silicon dioxide Nutrition 0.000 description 4
- 238000001179 sorption measurement Methods 0.000 description 4
- 229910052682 stishovite Inorganic materials 0.000 description 4
- 229910052905 tridymite Inorganic materials 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 230000007797 corrosion Effects 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 229940079593 drug Drugs 0.000 description 3
- 239000002341 toxic gas Substances 0.000 description 3
- 239000002351 wastewater Substances 0.000 description 3
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 description 2
- HEDRZPFGACZZDS-UHFFFAOYSA-N Chloroform Chemical compound ClC(Cl)Cl HEDRZPFGACZZDS-UHFFFAOYSA-N 0.000 description 2
- 229910020323 ClF3 Inorganic materials 0.000 description 2
- 101100441092 Danio rerio crlf3 gene Proteins 0.000 description 2
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- GDTBXPJZTBHREO-UHFFFAOYSA-N bromine Substances BrBr GDTBXPJZTBHREO-UHFFFAOYSA-N 0.000 description 2
- 239000011575 calcium Substances 0.000 description 2
- AXCZMVOFGPJBDE-UHFFFAOYSA-L calcium dihydroxide Chemical compound [OH-].[OH-].[Ca+2] AXCZMVOFGPJBDE-UHFFFAOYSA-L 0.000 description 2
- 239000000356 contaminant Substances 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 238000005265 energy consumption Methods 0.000 description 2
- 238000004880 explosion Methods 0.000 description 2
- 229910052731 fluorine Inorganic materials 0.000 description 2
- 239000011737 fluorine Substances 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910000000 metal hydroxide Inorganic materials 0.000 description 2
- 150000004692 metal hydroxides Chemical class 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- VZGDMQKNWNREIO-UHFFFAOYSA-N tetrachloromethane Chemical compound ClC(Cl)(Cl)Cl VZGDMQKNWNREIO-UHFFFAOYSA-N 0.000 description 2
- JOHWNGGYGAVMGU-UHFFFAOYSA-N trifluorochlorine Chemical compound FCl(F)F JOHWNGGYGAVMGU-UHFFFAOYSA-N 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 238000010792 warming Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 229910015844 BCl3 Inorganic materials 0.000 description 1
- WKBOTKDWSSQWDR-UHFFFAOYSA-N Bromine atom Chemical compound [Br] WKBOTKDWSSQWDR-UHFFFAOYSA-N 0.000 description 1
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 1
- XPDWGBQVDMORPB-UHFFFAOYSA-N Fluoroform Chemical compound FC(F)F XPDWGBQVDMORPB-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- -1 SiCL4 Chemical compound 0.000 description 1
- 229910052794 bromium Inorganic materials 0.000 description 1
- 239000013626 chemical specie Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000000460 chlorine Substances 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- WMIYKQLTONQJES-UHFFFAOYSA-N hexafluoroethane Chemical compound FC(F)(F)C(F)(F)F WMIYKQLTONQJES-UHFFFAOYSA-N 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- SFZCNBIFKDRMGX-UHFFFAOYSA-N sulfur hexafluoride Chemical compound FS(F)(F)(F)(F)F SFZCNBIFKDRMGX-UHFFFAOYSA-N 0.000 description 1
- 238000003786 synthesis reaction Methods 0.000 description 1
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 1
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/67034—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Treating Waste Gases (AREA)
Abstract
Description
Claims (1)
- 반도체 공정 챔버에서 증착 공정 시에 발생하는 다량의 반응 부산물이 유입되도록 안내하는 공정 가스 유입 배관 상에 연결되는 콜드 트랩;
상기 콜드 트랩의 후단에 직접 연결되는 제1 건식 스크러버 챔버;
상기 제1 건식 스크러버 챔버와의 격리된 상태에서 클리닝 가스 유입 배관 상에 연결되는 제2 건식 스크러버 챔버; 및
상기 제2 건식 스크러버 챔버에 직접 연결되는 제3 건식 스크러버 챔버;를 포함하고,
상기 콜드 트랩은 상기 제1 건식 스크러버 챔버 상에 수용되는 약제의 보호를 위해 상기 공정 가스 유입 배관을 통해 상기 반도체 공정 챔버로부터 유입된 고형 부산물(by-product)를 제거하며,
상기 제1 건식 스크러버 챔버는 상기 반도체 공정 챔버 상에서 발생한 실리콘 함유 재료인 테트라에틸오쏘실리케이트(TEOS)의 반응 부산물인 탄화수소 화합물을 제올라이트로 흡착 제거하고,
상기 제2 건식 스크러버 챔버는 상기 반도체 공정 챔버의 클리닝 공정 시에 발생하여 상기 클리닝 가스 유입 배관으로 유입된 다량의 F2 가스를 Ca(OH)2를 통해 제거하고, 상기 제3 건식 스크러버 챔버는 상기 제2 건식 스크러버 챔버에서 미제거된 NF3를 분해 흡착하여 제거하며,
상기 반도체 공정 챔버에서 이루어지는 증착 공정과 클리닝 공정 시에 각각 발생하는 가스들을 상기 공정 가스 유입 배관과 클리닝 가스 유입 배관을 통해 분리 처리하는 것을 특징으로 하는,
하이브리드 스크러버.
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KR20180031145 | 2018-03-16 | ||
KR1020180031145 | 2018-03-16 |
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KR20190109211A KR20190109211A (ko) | 2019-09-25 |
KR102114039B1 true KR102114039B1 (ko) | 2020-05-22 |
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Cited By (1)
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KR20240087075A (ko) | 2022-12-12 | 2024-06-19 | 서종원 | 가스정화시스템 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100774810B1 (ko) | 2006-07-19 | 2007-11-07 | 동부일렉트로닉스 주식회사 | Hf 가스 및 수분 제거 장치 |
KR100858045B1 (ko) | 2007-11-16 | 2008-09-10 | 주식회사 엠아이 | 반도체 반응부산물 트랩장치 |
KR101480237B1 (ko) | 2013-07-11 | 2015-01-09 | 주식회사 엠와이에스 | 입자 포집장치 |
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JP2001185539A (ja) * | 1999-12-24 | 2001-07-06 | Toshiba Corp | ガス回収システムおよびガス回収方法 |
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Publication number | Priority date | Publication date | Assignee | Title |
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KR100774810B1 (ko) | 2006-07-19 | 2007-11-07 | 동부일렉트로닉스 주식회사 | Hf 가스 및 수분 제거 장치 |
KR100858045B1 (ko) | 2007-11-16 | 2008-09-10 | 주식회사 엠아이 | 반도체 반응부산물 트랩장치 |
KR101480237B1 (ko) | 2013-07-11 | 2015-01-09 | 주식회사 엠와이에스 | 입자 포집장치 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20240087075A (ko) | 2022-12-12 | 2024-06-19 | 서종원 | 가스정화시스템 |
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