KR102051569B1 - 진공척부재의 제조방법 및 그에 의해 제조된 진공척부재 - Google Patents
진공척부재의 제조방법 및 그에 의해 제조된 진공척부재 Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29D—PRODUCING PARTICULAR ARTICLES FROM PLASTICS OR FROM SUBSTANCES IN A PLASTIC STATE
- B29D7/00—Producing flat articles, e.g. films or sheets
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C71/00—After-treatment of articles without altering their shape; Apparatus therefor
- B29C71/02—Thermal after-treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C2793/00—Shaping techniques involving a cutting or machining operation
- B29C2793/0027—Cutting off
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29K—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
- B29K2021/00—Use of unspecified rubbers as moulding material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29K—INDEXING SCHEME ASSOCIATED WITH SUBCLASSES B29B, B29C OR B29D, RELATING TO MOULDING MATERIALS OR TO MATERIALS FOR MOULDS, REINFORCEMENTS, FILLERS OR PREFORMED PARTS, e.g. INSERTS
- B29K2023/00—Use of polyalkenes or derivatives thereof as moulding material
- B29K2023/04—Polymers of ethylene
- B29K2023/06—PE, i.e. polyethylene
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Abstract
Description
도 2는 본 발명의 일 실시예에 의한 진공척부재의 제조방법을 설명하기 위한 순서도이다.
도 3 내지 도 7은 본 발명의 일 실시예에 의한 진공척부재의 제조방법을 순차적으로 도시한 제조도면들이다.
도 8은 본 발명의 일 실시예에 의한 진공척부재의 사용례를 도시한 사용상태도이다.
도 9는 도 3의 공정에 해당하는 절삭하기 전 재료부재의 표면사진이다.
도 10은 도 5의 공정에 해당하는 절삭 후 재료부재의 표면사진이다.
도 11은 도 6의 공정에 해당하는 열처리 후 재료부재의 표면사진이다.
부압(mmHg) | 정압(mmHg) | |
참고예 1 | 73.8 | 94.5 |
참고예 2 | 81.4 | 94.9 |
실시예 1 | 73.8 | 94.7 |
2: 케이싱 10: 돌출면
11: 기공 12: 절삭찌꺼기
12': 변형물 21: 수용공간
22: 기체흡입로 23: 고정부
24: 지지부 A: 절삭장치
B: 가열장치 C: 커터
D1, D2: 피처리물 D3: 접합층
Claims (12)
- (a) 수지재로 이루어진, 다공성 재료부재를 준비하는 단계;
(b) 상기 재료부재의 적어도 일 면을 절삭하는 단계;
(c) 상기 재료부재의 절삭된 면에 열처리하여, 절삭찌꺼기를 열로 변형시킨 변형물을 상기 재료부재 표면에 형성시키는 단계; 및
(d) 상기 재료부재 표면에서 상기 변형물을 이탈시켜 제거하는 단계를 포함하는 진공척부재의 제조방법. - 제1항에 있어서,
상기 (c) 단계는,
상기 열로 상기 재료부재의 일부를 함께 변형시켜, 상기 절삭된 면의 적어도 일부를 돌출면으로 형성하는 진공척부재의 제조방법. - 제2항에 있어서,
상기 돌출면은 상기 재료부재의 외측으로 볼록하게 돌출된 곡면으로 형성되는 진공척부재의 제조방법. - 제2항에 있어서,
상기 (c) 단계의 열처리는, 상기 재료부재의 상기 절삭된 면이 아닌 나머지 표면 중 적어도 일부를 고정시킨 상태로 실시하는 진공척부재의 제조방법. - 제2항에 있어서,
상기 (c) 단계의 열처리는, 처리시간, 및 처리온도 중 적어도 어느 하나를 제어하여 상기 돌출면의 돌출정도를 조절하는 진공척부재의 제조방법. - 제1항에 있어서,
상기 (c) 단계의 열처리는, 140~400℃의 처리온도로, 0.2~2초의 처리시간 동안 실시하는 것인 진공척부재의 제조방법. - 제1항에 있어서,
상기 (c) 단계의 열처리는, 화염 및 열풍 중 적어도 어느 하나를 상기 절삭된 면에 가하는 것인 진공척부재의 제조방법. - 제1항에 있어서,
상기 (b) 단계의 절삭은, 상기 재료부재가 절삭되는 면이 외부로 노출된 상태로 케이싱의 수용공간에 삽입되어 고정된 상태에서 실시하는 진공척부재의 제조방법. - 제8항에 있어서,
상기 케이싱은, 내측에 상기 수용공간과 연통되는 기체흡입로가 형성된 것인 진공척부재의 제조방법. - 제1항에 있어서,
상기 수지재는 폴리에틸렌 수지 또는 고무 중에서 선택된 하나 이상을 포함하는 진공척부재의 제조방법. - 제1항에 있어서,
상기 (b)단계의 절삭은 상기 재료부재의 적어도 일 면을 평면도공차 2~3㎛인 평면으로 형성하는 것인 진공척부재의 제조방법. - 제1항 내지 제11항 중 어느 한 항의 제조방법에 의해 제조된 진공척부재.
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Cited By (1)
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JP2021151720A (ja) * | 2020-03-24 | 2021-09-30 | キヤノン株式会社 | 平坦化装置、平坦化方法及び物品の製造方法 |
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JPH11226833A (ja) * | 1998-02-13 | 1999-08-24 | Ckd Corp | 真空チャックの吸着板及びその製造方法 |
KR20060088015A (ko) * | 2004-03-25 | 2006-08-03 | 이비덴 가부시키가이샤 | 진공 척, 흡착판, 연마 장치 및 반도체 웨이퍼의 제조 방법 |
KR20120069390A (ko) * | 2010-12-20 | 2012-06-28 | 쿠어스텍아시아 유한회사 | 반도체 웨이퍼 진공 고정용 포러스 척 |
CN205045486U (zh) * | 2015-09-16 | 2016-02-24 | 长春工业大学 | 一种安瓿针剂真空吸盘装置 |
KR101736824B1 (ko) | 2016-12-29 | 2017-05-29 | 최병준 | 디스플레이 패널 반송 패드용 진공 척 |
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Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11226833A (ja) * | 1998-02-13 | 1999-08-24 | Ckd Corp | 真空チャックの吸着板及びその製造方法 |
KR20060088015A (ko) * | 2004-03-25 | 2006-08-03 | 이비덴 가부시키가이샤 | 진공 척, 흡착판, 연마 장치 및 반도체 웨이퍼의 제조 방법 |
KR20120069390A (ko) * | 2010-12-20 | 2012-06-28 | 쿠어스텍아시아 유한회사 | 반도체 웨이퍼 진공 고정용 포러스 척 |
CN205045486U (zh) * | 2015-09-16 | 2016-02-24 | 长春工业大学 | 一种安瓿针剂真空吸盘装置 |
KR101736824B1 (ko) | 2016-12-29 | 2017-05-29 | 최병준 | 디스플레이 패널 반송 패드용 진공 척 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2021151720A (ja) * | 2020-03-24 | 2021-09-30 | キヤノン株式会社 | 平坦化装置、平坦化方法及び物品の製造方法 |
JP7418127B2 (ja) | 2020-03-24 | 2024-01-19 | キヤノン株式会社 | 平坦化装置、平坦化方法及び物品の製造方法 |
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