KR102025694B1 - 재구성 가능한 프로세서의 검증 방법 - Google Patents
재구성 가능한 프로세서의 검증 방법 Download PDFInfo
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- KR102025694B1 KR102025694B1 KR1020120099526A KR20120099526A KR102025694B1 KR 102025694 B1 KR102025694 B1 KR 102025694B1 KR 1020120099526 A KR1020120099526 A KR 1020120099526A KR 20120099526 A KR20120099526 A KR 20120099526A KR 102025694 B1 KR102025694 B1 KR 102025694B1
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2115/00—Details relating to the type of the circuit
- G06F2115/10—Processors
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Abstract
Description
도 2는 재구성 가능한 프로세서의 검증방법의 절차도,
도 3은 재구성 가능 프로세서의 검증을 위한 테스트 프로그램의 생성을 설명하기 위한 예시도,
도 4는 value tracking을 이용한 재구성 가능 프로세서의 검증을 설명하기 위한 예시도이다.
Claims (6)
- 테스트 기술정보 및 아키텍처 기술정보를 생성하는 단계;
아키텍처 기술정보 및 테스트 기술 정보를 기초하여 테스트 프로그램을 생성하는 단계로서, 상기 테스트 기술 정보는 테스트를 위한 명령의 종류 및 가중치, 테스트 수행 싸이클의 길이, 테스트 스케줄 정보를 포함하고, 상기 테스트 기술정보에 기초하여 무작위로 생성되는 단계;
프로세서와 시뮬레이터에서 테스트 프로그램을 실행하는 단계; 및
프로세서와 시뮬레이터의 테스트 프로그램 실행 결과의 입출력 값 형태의 일치 여부를 판단하여 프로세서를 검증하는 단계로서, 레지스터 값, 펑션유닛의 출력값의 형태를 추적하는 단계, 추적된 레지스터 값 및 펑션유닛의 출력값의 형태를 비교하여 프로세서를 검증하는 단계를 포함하는 단계;를 포함하는 재구성 가능한 프로세서의 검증방법. - 제 1 항에 있어서, 아키텍처 기술 정보는
재구성 가능한 프로세서의 펑션유닛 및 레지스터 파일 간의 상호연결에 관한 정보, 특정 형태의 값이 저장되는 레지스터의 위치에 관한 정보 및 프로세서의 명령어 집합(Instruction set)에 관한 정보를 포함하는 재구성 가능한 프로세서의 검증방법. - 삭제
- 삭제
- 삭제
- 제 1 항에 있어서, 추적된 레지스터 값 및 펑션유닛의 출력값의 형태를 비교하여 프로세서를 검증하는 단계는
일정한 싸이클마다 추적된 레지스터 값 및 펑션유닛의 출력값의 형태를 비교하여 프로세서의 동작을 검증하는 재구성 가능한 프로세서의 검증 방법.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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KR1020120099526A KR102025694B1 (ko) | 2012-09-07 | 2012-09-07 | 재구성 가능한 프로세서의 검증 방법 |
US14/020,061 US9141498B2 (en) | 2012-09-07 | 2013-09-06 | Method for verification of reconfigurable processor |
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KR1020120099526A KR102025694B1 (ko) | 2012-09-07 | 2012-09-07 | 재구성 가능한 프로세서의 검증 방법 |
Publications (2)
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KR20140032796A KR20140032796A (ko) | 2014-03-17 |
KR102025694B1 true KR102025694B1 (ko) | 2019-09-27 |
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US (1) | US9141498B2 (ko) |
KR (1) | KR102025694B1 (ko) |
Families Citing this family (1)
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EP3457284A1 (en) * | 2017-09-14 | 2019-03-20 | Vestel Elektronik Sanayi ve Ticaret A.S. | Technique for testing an electronic device |
Citations (2)
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JP2010244300A (ja) | 2009-04-06 | 2010-10-28 | Mitsubishi Electric Corp | テストパターン作成手法、シミュレーション方法、情報処理装置およびシミュレーション装置 |
US20110047428A1 (en) * | 2009-08-20 | 2011-02-24 | Honeywell International Inc. | On-device constrained random verification for device development |
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TW421761B (en) * | 1994-04-12 | 2001-02-11 | Yokogawa Electric Corp | Verification support system |
US5572666A (en) | 1995-03-28 | 1996-11-05 | Sun Microsystems, Inc. | System and method for generating pseudo-random instructions for design verification |
US5923567A (en) * | 1996-04-10 | 1999-07-13 | Altera Corporation | Method and device for test vector analysis |
US6167364A (en) * | 1998-04-17 | 2000-12-26 | Altera Corporation | Methods and apparatus for automatically generating interconnect patterns in programmable logic devices |
KR100874738B1 (ko) * | 1999-02-05 | 2008-12-22 | 텐실리카 인코포레이티드 | 구성가능한 프로세서를 설계하기 위한 프로세서 자동 생성시스템 및 방법 |
US6871298B1 (en) | 1999-11-12 | 2005-03-22 | Obsidian Software, Inc. | Method and apparatus that simulates the execution of paralled instructions in processor functional verification testing |
DE10041137A1 (de) | 2000-08-21 | 2002-03-21 | Philips Corp Intellectual Pty | Anordnung zum Testen von integrierten Schaltkreisen |
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US6948096B2 (en) * | 2001-07-31 | 2005-09-20 | Intel Corporation | Functional random instruction testing (FRIT) method for complex devices such as microprocessors |
US7139955B2 (en) * | 2002-12-17 | 2006-11-21 | Avago Technologies General Ip (Singapore) Pte. Ltd. | Hierarchically-controlled automatic test pattern generation |
WO2006059775A2 (en) * | 2004-11-30 | 2006-06-08 | Tokyo Electron Limited | Dynamically reconfigurable processor |
US7523367B2 (en) * | 2005-06-30 | 2009-04-21 | International Business Machines Corporation | Method and apparatus to verify non-deterministic results in an efficient random manner |
KR100731976B1 (ko) * | 2005-06-30 | 2007-06-25 | 전자부품연구원 | 재구성 가능 프로세서의 효율적인 재구성 방법 |
US7454726B2 (en) | 2006-02-13 | 2008-11-18 | Sun Microsystems, Inc. | Technique for generating input stimulus to cover properties not covered in random simulation |
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JP2010244300A (ja) | 2009-04-06 | 2010-10-28 | Mitsubishi Electric Corp | テストパターン作成手法、シミュレーション方法、情報処理装置およびシミュレーション装置 |
US20110047428A1 (en) * | 2009-08-20 | 2011-02-24 | Honeywell International Inc. | On-device constrained random verification for device development |
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KR20140032796A (ko) | 2014-03-17 |
US9141498B2 (en) | 2015-09-22 |
US20140075253A1 (en) | 2014-03-13 |
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