KR101671087B1 - 시퀀서 아날로그 출력 유닛 - Google Patents
시퀀서 아날로그 출력 유닛 Download PDFInfo
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- KR101671087B1 KR101671087B1 KR1020147028001A KR20147028001A KR101671087B1 KR 101671087 B1 KR101671087 B1 KR 101671087B1 KR 1020147028001 A KR1020147028001 A KR 1020147028001A KR 20147028001 A KR20147028001 A KR 20147028001A KR 101671087 B1 KR101671087 B1 KR 101671087B1
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- circuit
- current
- output
- load
- disconnection
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/048—Monitoring; Safety
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/05—Programmable logic controllers, e.g. simulating logic interconnections of signals according to ladder diagrams or function charts
- G05B19/058—Safety, monitoring
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- General Engineering & Computer Science (AREA)
- Programmable Controllers (AREA)
- Testing And Monitoring For Control Systems (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Emergency Protection Circuit Devices (AREA)
Abstract
Description
도 2는 비교예로서 나타내는 일반적인 전류 출력 회로에서의 이상 검출 방법을 설명하는 회로도이다.
도 3은 도 2에 도시된 전류 출력 회로를 복수 채널분 마련했을 경우의 문제점을 설명하는 도면이다.
도 4는 복수 채널 구성의 시퀀서 아날로그 출력 유닛에서 이용하는 전류 출력 회로의 회로도이다.
2, 17, 23 트랜지스터
3: 전류 검출 저항기
4: 증폭기
5: 전원
6: 부하(제어 대상)를 나타내는 부하 저항기
7: 입력 단자
11: 차동 회로(감시 회로)
12: 단선 판별 회로
13: 과전류 판별 회로
14: 기준 전압 제어부
16, 22: 비교 회로
18, 24: 기준 전압원
19, 25: 저항기
20, 26: 출력 단자
Claims (4)
- 부하를 아날로그 전류 신호에 의해서 제어하는 시퀀서 아날로그 출력 유닛에 있어서,
상기 부하보다도 상위 전위측에 마련되어, 상기 부하로 출력하는 아날로그 전류를 직접 검출하는 것을 가능하게 하고, 상기 부하와의 사이에서 전류 출력 회로를 형성하는 전류 검출 저항기와,
상기 전류 검출 저항기의 양단 전압의 차동 전압을 출력할 수 있는 차동 회로와,
상기 차동 회로가 출력하는 차동 전압을 공통적으로 사용하여, 상기 차동 전압이 판정치 이하인지 여부의 판정 결과에 기초하여 상기 시퀀서 아날로그 출력 유닛의 출력 배선의 단선을 판별할 수 있는 단선 판별 회로와, 상기 차동 전압이 판정치를 넘는지 여부의 판정 결과에 기초하여 상기 출력 배선에 있어서 과전류의 발생 유무를 판변할 수 있는 과전류 판별 회로의 양쪽을 구비하는 이상 검출 회로와,
상기 이상 검출 회로에 있어서, 상기 차동 전압과 비교하는 상기 판정치를, 임의로 변경 설정할 수 있는 제어부를 구비한 것을 특징으로 하는 시퀀서 아날로그 출력 유닛. - 청구항 1에 있어서,
상기 단선 판별 회로는, 상기 차동 전압이 판정치 이하인지 여부에 의해 단선 발생 유무를 판별하는 비교 회로로 구성된 것을 특징으로 하는 시퀀서 아날로그 출력 유닛. - 청구항 1에 있어서,
상기 과전류 판별 회로는, 상기 차동 전압이 판정치를 넘는지 여부에 의해 과전류 출력 발생 유무를 판별하는 비교 회로로 구성된 것을 특징으로 하는 시퀀서 아날로그 출력 유닛. - 삭제
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2012/059696 WO2013153599A1 (ja) | 2012-04-09 | 2012-04-09 | シーケンサアナログ出力ユニット |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20140132001A KR20140132001A (ko) | 2014-11-14 |
KR101671087B1 true KR101671087B1 (ko) | 2016-11-09 |
Family
ID=49327209
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020147028001A Expired - Fee Related KR101671087B1 (ko) | 2012-04-09 | 2012-04-09 | 시퀀서 아날로그 출력 유닛 |
Country Status (7)
Country | Link |
---|---|
US (1) | US9470723B2 (ko) |
JP (1) | JP5952388B2 (ko) |
KR (1) | KR101671087B1 (ko) |
CN (1) | CN104204974B (ko) |
DE (1) | DE112012006209B4 (ko) |
TW (1) | TWI498686B (ko) |
WO (1) | WO2013153599A1 (ko) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103955161B (zh) * | 2014-05-14 | 2016-12-07 | 华为技术有限公司 | 一种监控电路及电子设备 |
CN104535887B (zh) * | 2015-01-23 | 2018-01-12 | 浙江中控技术股份有限公司 | 一种开关量输出回路断线诊断系统和开关量输出模块 |
KR101649704B1 (ko) * | 2015-07-28 | 2016-08-19 | 엘에스산전 주식회사 | 디지털 보호 계전기의 전원 감시장치 |
JP6705732B2 (ja) * | 2016-10-24 | 2020-06-03 | 株式会社日立製作所 | アナログ出力装置 |
JPWO2018185973A1 (ja) * | 2017-04-04 | 2020-02-13 | 株式会社アマダミヤチ | レーザ加工監視方法及びレーザ加工監視装置 |
US10754357B2 (en) * | 2018-06-19 | 2020-08-25 | International Business Machines Corporation | Optimizing a water recovery system |
JP7279460B2 (ja) * | 2019-03-27 | 2023-05-23 | 株式会社Gsユアサ | 電池管理装置、蓄電装置、電池管理方法、及びコンピュータプログラム |
Citations (4)
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JP2001202109A (ja) * | 2000-01-20 | 2001-07-27 | Hitachi Ltd | プログラマブルコントローラ |
JP2006048481A (ja) * | 2004-08-06 | 2006-02-16 | Omron Corp | 信号入力装置 |
JP2007072908A (ja) * | 2005-09-08 | 2007-03-22 | Jtekt Corp | Plcのミューティング装置 |
JP2007304986A (ja) * | 2006-05-12 | 2007-11-22 | Fuji Electric Fa Components & Systems Co Ltd | 過電流制御回路 |
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JPS63155505U (ko) | 1987-03-27 | 1988-10-12 | ||
JPH01199213A (ja) | 1988-02-03 | 1989-08-10 | Daifuku Co Ltd | シーケンサーの出力系故障診断方法 |
JPH02202797A (ja) | 1989-01-31 | 1990-08-10 | Noritz Corp | 2芯遠隔制御装置 |
JP3021911B2 (ja) | 1992-02-05 | 2000-03-15 | 株式会社デンソー | リニアソレノイドの駆動装置 |
JP2857529B2 (ja) * | 1992-03-04 | 1999-02-17 | 三菱電機株式会社 | 回路遮断器 |
JPH10149216A (ja) | 1996-11-19 | 1998-06-02 | Toshiba Corp | アナログ出力装置 |
JP2001004690A (ja) | 1999-06-24 | 2001-01-12 | Yazaki Corp | 負荷断線検出装置 |
JP2001033507A (ja) | 1999-07-23 | 2001-02-09 | Hitachi Ltd | 断線検出回路 |
JP3798378B2 (ja) * | 2003-03-10 | 2006-07-19 | 三菱電機株式会社 | 誘導性負荷の電流制御装置 |
TWI238891B (en) * | 2004-01-08 | 2005-09-01 | Delta Electronics Inc | Battery ground fault detecting circuit |
US20050243491A1 (en) * | 2004-04-28 | 2005-11-03 | James Tanis | Multi-function power monitor and circuit protector |
JP5036638B2 (ja) | 2008-06-16 | 2012-09-26 | 株式会社日立産機システム | プログラマブルコントローラ及びプログラマブルコントローラを用いた異常検出方法 |
KR101307000B1 (ko) * | 2008-12-26 | 2013-09-11 | 미쓰비시덴키 가부시키가이샤 | 아날로그 전류 출력 회로 |
JP2012032359A (ja) | 2010-08-03 | 2012-02-16 | Honda Motor Co Ltd | 配線状態検出回路及び制御装置 |
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2012
- 2012-04-09 WO PCT/JP2012/059696 patent/WO2013153599A1/ja active Application Filing
- 2012-04-09 KR KR1020147028001A patent/KR101671087B1/ko not_active Expired - Fee Related
- 2012-04-09 CN CN201280072233.1A patent/CN104204974B/zh active Active
- 2012-04-09 JP JP2014509919A patent/JP5952388B2/ja active Active
- 2012-04-09 DE DE112012006209.4T patent/DE112012006209B4/de active Active
- 2012-04-09 US US14/391,199 patent/US9470723B2/en active Active
- 2012-10-09 TW TW101137233A patent/TWI498686B/zh active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001202109A (ja) * | 2000-01-20 | 2001-07-27 | Hitachi Ltd | プログラマブルコントローラ |
JP2006048481A (ja) * | 2004-08-06 | 2006-02-16 | Omron Corp | 信号入力装置 |
JP2007072908A (ja) * | 2005-09-08 | 2007-03-22 | Jtekt Corp | Plcのミューティング装置 |
JP2007304986A (ja) * | 2006-05-12 | 2007-11-22 | Fuji Electric Fa Components & Systems Co Ltd | 過電流制御回路 |
Also Published As
Publication number | Publication date |
---|---|
TWI498686B (zh) | 2015-09-01 |
US9470723B2 (en) | 2016-10-18 |
KR20140132001A (ko) | 2014-11-14 |
US20150077132A1 (en) | 2015-03-19 |
DE112012006209T5 (de) | 2015-01-08 |
WO2013153599A1 (ja) | 2013-10-17 |
JP5952388B2 (ja) | 2016-07-13 |
JPWO2013153599A1 (ja) | 2015-12-17 |
TW201341993A (zh) | 2013-10-16 |
CN104204974A (zh) | 2014-12-10 |
DE112012006209B4 (de) | 2017-09-07 |
CN104204974B (zh) | 2018-06-08 |
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