KR101613864B1 - 유기금속화학기상증착장치 - Google Patents
유기금속화학기상증착장치 Download PDFInfo
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- KR101613864B1 KR101613864B1 KR1020140137956A KR20140137956A KR101613864B1 KR 101613864 B1 KR101613864 B1 KR 101613864B1 KR 1020140137956 A KR1020140137956 A KR 1020140137956A KR 20140137956 A KR20140137956 A KR 20140137956A KR 101613864 B1 KR101613864 B1 KR 101613864B1
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- 238000006243 chemical reaction Methods 0.000 title claims abstract description 54
- 238000002488 metal-organic chemical vapour deposition Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 claims abstract description 67
- 239000007789 gas Substances 0.000 claims description 116
- 239000012495 reaction gas Substances 0.000 claims description 27
- 238000000034 method Methods 0.000 claims description 16
- 238000010438 heat treatment Methods 0.000 claims description 12
- 235000014676 Phragmites communis Nutrition 0.000 claims description 6
- 230000007423 decrease Effects 0.000 claims description 3
- 238000005229 chemical vapour deposition Methods 0.000 abstract description 19
- 238000004140 cleaning Methods 0.000 abstract description 6
- 239000002184 metal Substances 0.000 abstract description 5
- 239000010409 thin film Substances 0.000 description 16
- 125000002524 organometallic group Chemical group 0.000 description 14
- 238000011109 contamination Methods 0.000 description 10
- 238000000151 deposition Methods 0.000 description 9
- 230000006698 induction Effects 0.000 description 8
- 230000008021 deposition Effects 0.000 description 6
- 238000005137 deposition process Methods 0.000 description 6
- 238000007789 sealing Methods 0.000 description 6
- 229910052582 BN Inorganic materials 0.000 description 4
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 4
- 230000004888 barrier function Effects 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- 238000009826 distribution Methods 0.000 description 3
- 238000002347 injection Methods 0.000 description 3
- 239000007924 injection Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 239000002826 coolant Substances 0.000 description 2
- 239000000112 cooling gas Substances 0.000 description 2
- 239000000498 cooling water Substances 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 239000012530 fluid Substances 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 125000000217 alkyl group Chemical group 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 239000012159 carrier gas Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000011553 magnetic fluid Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910003465 moissanite Inorganic materials 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 150000002902 organometallic compounds Chemical class 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000010926 purge Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
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- Manufacturing & Machinery (AREA)
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- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
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- Chemical Vapour Deposition (AREA)
Abstract
Description
도 2는 본 발명의 일 실시예에 따른 유기금속화학기상증착장치의 단면도를 개략적으로 도시한 것이다.
도 3은 도 2의 A부분의 확대도를 개략적으로 도시한 것이다.
도 4는 본 발명의 일 실시예에서의 공정가스와 누름가스의 흐름도를 개략적으로 도시한 것이다.
도 5는 본 발명의 일 실시예에서, 열차폐리드와 리드분리판의 구조의 일예를 도시한 것이다.
도 6은 본 발명의 일 실시예에서, 열차폐리드와 리드분리판의 구조의 다른예를 도시한 것이다.
도 7은 본 발명의 일 실시예에서, 열차폐리드와 리드분리판의 구조의 또 다른예를 도시한 것이다.
20: 서셉터부 21 : 히터블럭
24: 유도가열부 30 : 가스공급부
40 : 반응공간형성유닛
70 : 열차폐리드
80 : 리드분리판
Claims (7)
- 기판수용챔버와,
상기 기판수용챔버 내부에 배치되고, 기판이 안착되며 안착된 상기 기판을 가열하는 서셉터부와,
반응가스공급원에 연결되어 상기 기판수용챔버내부로 반응가스를 공급하는 가스공급부와,
상기 서셉터의 상부에서 상기 가스공급부와 배기홀에 연통되도록 설치되며 상부판과 측부판과 하부판을 구비하여 상기 기판수용챔버 내부에 반응공간을 형성하는 반응공간형성유닛과,
상기 서셉터부의 상부에 배치되며 상기 반응공간형성유닛의 상부판에 연결되어 설치되는 열차폐리드 및
상기 서셉터부와 마주보는 위치에서 상기 열차폐리드에 분리가능하게 설치된 리드분리판을 포함하는 것을 특징으로 하는 유기금속화학기상증착장치.
- 제 1 항에 있어서,
상기 가스공급부는 상기 기판수용챔버의 측벽에 설치되고, 상기 반응공간형성유닛은 복수의 가스안내판을 구비하여 반응가스의 수평 플로우를 형성하는 것을 특징으로 하는 유기금속화학기상증착장치.
- 제 1 항 또는 제 2 항에 있어서,
상기 열차폐리드는 상기 리드분리판과 상기 서셉터부의 히터블럭과의 사이에 수직플로우를 형성하는 누름가스가 공급되는 가스유로를 구비하는 것을 특징으로 하는 유기금속화학기상증착장치.
- 제 3 항에 있어서,
상기 리드분리판은 상기 히터블럭의 가장자리 부분으로부터 상기 히터블럭의 중앙부분으로 갈수록 상기 히터블럭과의 거리가 좁아지는 것을 특징으로 하는 유기금속화학기상증착장치.
- 제 3 항에 있어서,
상기 리드분리판은 다공성 구조를 가지는 것을 특징으로 하는 유기금속화학기상증착장치.
- 제 3 항에 있어서,
상기 리드분리판에는 상기 가스유로와 연통되는 복수의 가스관통홀을 구비하는 것을 특징으로 하는 유기금속화학기상증착장치.
- 제 2 항에 있어서,
상기 복수의 가스안내판 각각은 상기 가스공급부로부터 상기 서셉터부를 향하여 경사져 형성되며,
상기 복수의 가스안내판은 최상단의 가스안내판의 경사각도가 가장 크고, 하부로 갈수록 점차 경사각도가 감소하도록 설치되는 것을 특징으로 하는 유기금속화학기상증착장치.
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KR1020140137956A KR101613864B1 (ko) | 2014-10-13 | 2014-10-13 | 유기금속화학기상증착장치 |
TW104109654A TWI554637B (zh) | 2014-10-13 | 2015-03-26 | 金屬有機化學汽相沈積裝置 |
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Cited By (1)
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WO2022211395A1 (ko) * | 2021-03-30 | 2022-10-06 | 주식회사 테스 | 유기금속화학기상증착장치 |
Citations (3)
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KR101004222B1 (ko) | 2001-02-09 | 2010-12-24 | 도쿄엘렉트론가부시키가이샤 | 성막 장치 |
KR101007534B1 (ko) | 2008-11-05 | 2011-01-14 | 주식회사 테스 | 반도체 제조장치 및 이를 이용한 실리콘 산화막 건식 식각 방법 |
KR101238162B1 (ko) | 2011-11-16 | 2013-03-11 | 주식회사 테스 | 유기금속화학증착 반응기 |
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JP2011501409A (ja) * | 2007-10-10 | 2011-01-06 | イザ,マイケル | 化学蒸着反応チャンバ |
CN202164350U (zh) * | 2011-05-04 | 2012-03-14 | 广东量晶光电科技有限公司 | 一种金属有机化学气相沉积反应器 |
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KR101004222B1 (ko) | 2001-02-09 | 2010-12-24 | 도쿄엘렉트론가부시키가이샤 | 성막 장치 |
KR101007534B1 (ko) | 2008-11-05 | 2011-01-14 | 주식회사 테스 | 반도체 제조장치 및 이를 이용한 실리콘 산화막 건식 식각 방법 |
KR101238162B1 (ko) | 2011-11-16 | 2013-03-11 | 주식회사 테스 | 유기금속화학증착 반응기 |
Cited By (1)
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WO2022211395A1 (ko) * | 2021-03-30 | 2022-10-06 | 주식회사 테스 | 유기금속화학기상증착장치 |
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TW201614095A (en) | 2016-04-16 |
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