KR101552229B1 - 회전 부재를 포함하는 증착막 형성 장치 - Google Patents
회전 부재를 포함하는 증착막 형성 장치 Download PDFInfo
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- KR101552229B1 KR101552229B1 KR1020140151371A KR20140151371A KR101552229B1 KR 101552229 B1 KR101552229 B1 KR 101552229B1 KR 1020140151371 A KR1020140151371 A KR 1020140151371A KR 20140151371 A KR20140151371 A KR 20140151371A KR 101552229 B1 KR101552229 B1 KR 101552229B1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4584—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally the substrate being rotated
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
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- Condensed Matter Physics & Semiconductors (AREA)
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- Chemical Vapour Deposition (AREA)
Abstract
Description
도 2는 본 발명의 일 실시예에 따른 기판 지지부의 구성을 나타내는 도면이다.
도 3은 본 발명의 일 실시예에 따른 기판 지지부의 일부 구성을 나타내는 도면이다.
도 4는 본 발명의 일 실시예에 따른 증착막 형성 장치의 일부 구성을 나타내는 도면이다.
도 5는 도 4의 "B" 부분을 확대하여 나타내는 도면이다.
도 6은 본 발명의 일 실시예에 따른 제1 지지부의 구성을 나타내는 도면이다.
Claims (5)
- 복수의 기판 지지부를 포함하고,
각각의 상기 기판 지지부 상에는 복수의 기판이 배치되며,
각각의 상기 기판 지지부 상에는 상기 복수의 기판에 대응하는 복수의 회전 부재가 형성되고,
상기 기판 지지부에는 상기 복수의 회전 부재 각각이 안착되기 위한 복수의 회전 부재 수용부가 형성되며, 상기 복수의 회전 부재 수용부 각각의 상부면에는 상기 회전 부재가 회전하도록 하기 위한 그루브가 형성되고,
상기 복수의 회전 부재 각각이 상기 기판 지지부 내에서 회전함에 따라 각각의 상기 기판은 가스 포일(gas-foil) 방식에 의해 상기 기판 지지부 상에서 회전하며,
상기 그루브에 소정의 가스를 공급하기 위한 유로가 각각의 상기 기판 지지부 내에 형성되는 것을 특징으로 하는 증착막 형성 장치. - 제1항에 있어서,
상기 복수의 기판 지지부 각각은 회전 가능한 것을 특징으로 하는 증착막 형성 장치. - 제1항에 있어서,
상기 그루브는 나선 형상인 것을 특징으로 하는 증착막 형성 장치. - 삭제
- 제1항에 있어서,
상기 복수의 회전 부재 수용부 각각의 상부면에는 돌출부가 형성되고,
상기 복수의 회전 부재 각각은 상기 돌출부를 중심으로 회전할 수 있는 것을 특징으로 하는 증착막 형성 장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020140151371A KR101552229B1 (ko) | 2014-11-03 | 2014-11-03 | 회전 부재를 포함하는 증착막 형성 장치 |
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KR1020140151371A KR101552229B1 (ko) | 2014-11-03 | 2014-11-03 | 회전 부재를 포함하는 증착막 형성 장치 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020130088754A Division KR101505183B1 (ko) | 2013-07-26 | 2013-07-26 | 회전 부재를 포함하는 증착막 형성 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20150013096A KR20150013096A (ko) | 2015-02-04 |
KR101552229B1 true KR101552229B1 (ko) | 2015-09-10 |
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KR1020140151371A Expired - Fee Related KR101552229B1 (ko) | 2014-11-03 | 2014-11-03 | 회전 부재를 포함하는 증착막 형성 장치 |
Country Status (1)
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KR (1) | KR101552229B1 (ko) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002175992A (ja) | 2000-12-07 | 2002-06-21 | Ee Technologies:Kk | 基板回転機構を備えた成膜装置 |
KR100741182B1 (ko) | 1999-08-24 | 2007-07-19 | 아익스트론 아게 | 반도체층의 증착 방법 및 장치 |
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2014
- 2014-11-03 KR KR1020140151371A patent/KR101552229B1/ko not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100741182B1 (ko) | 1999-08-24 | 2007-07-19 | 아익스트론 아게 | 반도체층의 증착 방법 및 장치 |
JP2002175992A (ja) | 2000-12-07 | 2002-06-21 | Ee Technologies:Kk | 基板回転機構を備えた成膜装置 |
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