KR101461602B1 - 양자우물 구조 태양전지 및 그 제조 방법 - Google Patents
양자우물 구조 태양전지 및 그 제조 방법 Download PDFInfo
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- KR101461602B1 KR101461602B1 KR1020120068180A KR20120068180A KR101461602B1 KR 101461602 B1 KR101461602 B1 KR 101461602B1 KR 1020120068180 A KR1020120068180 A KR 1020120068180A KR 20120068180 A KR20120068180 A KR 20120068180A KR 101461602 B1 KR101461602 B1 KR 101461602B1
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- 239000004065 semiconductor Substances 0.000 claims abstract description 42
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- 239000010703 silicon Substances 0.000 claims abstract description 28
- 239000010409 thin film Substances 0.000 claims abstract description 24
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- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
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- 229910052681 coesite Inorganic materials 0.000 description 3
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- 238000010586 diagram Methods 0.000 description 3
- 239000000377 silicon dioxide Substances 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- 229910052682 stishovite Inorganic materials 0.000 description 3
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- -1 Si 3 N 4 Inorganic materials 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
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- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 description 1
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Abstract
Description
도 1b는 본 발명에 따른 양자우물 구조 태양전지의 에너지밴드 다이어그램,
도 2는 본 발명의 제1실시 예에 따른 양자우물 구조를 갖는 이종 pn 접합 태양전지의 단면도,
도 3은 본 발명의 제2실시 예에 따른 양자우물 구조를 갖는 이종 pn 접합 태양전지의 단면도,
도 4는 본 발명의 제3실시 예에 따른 양자우물 구조를 갖는 이종 pn 접합 태양전지의 단면도,
도 5는 본 발명의 제4실시 예에 따른 양자우물 구조를 갖는 이종 pn 접합 태양전지의 단면도.
Claims (12)
- p형 및 n형 중 어느 한 타입의 실리콘 기판 상에 1~10 nm의 박막 절연층과 1~10 nm의 박막 반도체층을 교대로 연속 형성시켜 양자우물층을 수~수십 사이클 수만큼 형성하는 과정;
상기 양자우물층 위에 상기 기판과 다른 타입의 실리콘으로 에미터층을 형성하는 과정;
상기 에미터층 위에 금속성 핑거 전극을 형성하는 과정;
상기 금속성 핑거 상에 반사방지막으로 SiNx층을 전면에 형성하는 과정; 및
상기 기판 저면에 패시베이션(Passivation)막을 형성하는 과정;으로 이루어지는 것을 특징으로 하는 양자우물 구조 태양전지 제조 방법.
- 제 1항에 있어서,
상기 양자우물층을 형성하기 전에, 상기 실리콘 기판을 텍스처링(Texturing)하는 것을 특징으로 하는 양자우물 구조 태양전지 제조 방법.
- p형 및 n형 중 어느 하나의 실리콘 기판 상에 1~10 nm의 박막 절연층과 1~10 nm의 박막 반도체층을 교대로 연속 형성시켜 양자우물층을 수~수십 사이클 수만큼 형성하는 과정;
상기 양자우물층 위에 상기 기판과 다른 타입의 실리콘으로 에미터층을 형성하는 과정;
SiNx로 반사방지막을 전면에 형성하는 과정;
상기 반사방지막 위에 금속성 핑거 전극을 형성하고 열처리하여 상기 금속성 핑거 전극을 상기 에미터층에 접촉시키는 과정; 및
상기 기판 저면에 패시베이션(Passivation)막을 형성하는 과정;으로 이루어지는 것을 특징으로 하는 양자우물 구조 태양전지 제조 방법.
- 제 3항에 있어서,
상기 양자우물층을 형성하기 전에, 상기 실리콘 기판을 텍스처링(Texturing)하는 것을 특징으로 하는 양자우물 구조 태양전지 제조 방법.
- p형 및 n형 중 어느 한 타입의 실리콘 기판 상에 1~10 nm의 박막 절연층과 1~10 nm의 박막 반도체층을 교대로 연속 형성시켜 수~수십 사이클 수만큼 형성된 양자우물층;
상기 양자우물층 위에 상기 기판과 다른 타입의 실리콘으로 형성된 에미터층;
상기 에미터층 위에 형성된 금속성 핑거 전극;
상기 금속성 핑거 상 전면에 SiNx층으로 형성된 반사방지막; 및
상기 기판 저면에 형성된 패시베이션(Passivation)막;을 포함하는 것을 특징으로 하는 양자우물 구조 태양전지.
- 제 5항에 있어서, 상기 에미터층은,
0.1~1 mm두께로 아몰퍼스 및 다결정 형태 중 어느 하나의 형태를 가지는 것을 특징으로 하는 양자우물 구조 태양전지.
- 제 5항에 있어서, 상기 패시베이션막은,
Al2O3막, Si3N4막, SiO2막 중 어느 하나인 것을 특징으로 하는 양자우물 구조 태양전지.
- 제 5항에 있어서,
상기 패시베이션막에, 상기 기판과 동일한 타입의 고도핑층을 국부적으로 도핑시켜 후면전계;를 더 형성하는 것을 특징으로 하는 양자우물 구조 태양전지.
- p형 및 n형 중 어느 하나의 실리콘 기판 상에 1~10 nm의 박막 절연층과 1~10 nm의 박막 반도체층을 교대로 연속 형성시켜 수~수십 사이클 수만큼 형성된 양자우물층;
상기 양자우물층 위에 상기 기판과 다른 타입의 실리콘으로 형성된 에미터층;
상기 에미터층 전면에 SiNx로 형성된 반사방지막;
상기 반사방지막 위에 형성되어 열처리에 의하여 상기 에미터층에 접촉되는 금속성 핑거 전극; 및
상기 기판 저면에 형성된 패시베이션(Passivation)막;을 포함하는 것을 특징으로 하는 양자우물 구조 태양전지.
- 제 9항에 있어서, 상기 에미터층은,
0.1~1 mm두께로 아몰퍼스 및 다결정 형태 중 어느 하나의 형태를 가지는 것을 특징으로 하는 양자우물 구조 태양전지.
- 제 9항에 있어서, 상기 패시베이션막은,
Al2O3막, Si3N4막, SiO2막 중 어느 하나인 것을 특징으로 하는 양자우물 구조 태양전지.
- 제 9항에 있어서,
상기 패시베이션막에, 상기 기판과 동일한 타입의 고도핑층을 국부적으로 도핑시켜 후면전계;를 더 형성하는 것을 특징으로 하는 양자우물 구조 태양전지.
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JP2015520003A JP2015526894A (ja) | 2012-06-25 | 2013-06-05 | 量子井戸構造の太陽電池及びその製造方法 |
PCT/KR2013/004959 WO2014003326A1 (ko) | 2012-06-25 | 2013-06-05 | 양자우물 구조 태양전지 및 그 제조 방법 |
US14/410,108 US20160204291A1 (en) | 2012-06-25 | 2013-06-05 | Solar cell having quantum well structure and method for manufacturing same |
TW102120541A TWI557930B (zh) | 2012-06-25 | 2013-06-10 | 量子井結構太陽能電池及其製造方法 |
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CN109362238A (zh) * | 2016-06-01 | 2019-02-19 | 三菱电机株式会社 | 光生伏特元件及其制造方法 |
CN106129172B (zh) * | 2016-07-01 | 2017-07-04 | 江苏微导纳米装备科技有限公司 | 一种可调节电荷密度的晶硅太阳能电池表面钝化方法 |
US10418781B1 (en) | 2018-07-06 | 2019-09-17 | Ii-Vi Delaware, Inc. | Quantum well passivation structure for laser facets |
KR102523706B1 (ko) * | 2021-04-13 | 2023-04-19 | 성균관대학교산학협력단 | 실리콘 양자우물 구조를 갖는 터널 산화막 실리콘 태양전지 및 이의 제조 방법 |
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US20080257405A1 (en) * | 2007-04-18 | 2008-10-23 | Emcore Corp. | Multijunction solar cell with strained-balanced quantum well middle cell |
US7951640B2 (en) * | 2008-11-07 | 2011-05-31 | Sunpreme, Ltd. | Low-cost multi-junction solar cells and methods for their production |
US8288645B2 (en) * | 2009-03-17 | 2012-10-16 | Sharp Laboratories Of America, Inc. | Single heterojunction back contact solar cell |
US8294027B2 (en) * | 2010-01-19 | 2012-10-23 | International Business Machines Corporation | Efficiency in antireflective coating layers for solar cells |
WO2012039800A2 (en) * | 2010-06-15 | 2012-03-29 | California Institute Of Technology | Surface passivation by quantum exclusion using multiple layers |
US8217258B2 (en) * | 2010-07-09 | 2012-07-10 | Ostendo Technologies, Inc. | Alternating bias hot carrier solar cells |
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