KR101239636B1 - Mems 공진기, 이를 구비하는 센서 및 mems 공진기의 제조방법 - Google Patents
Mems 공진기, 이를 구비하는 센서 및 mems 공진기의 제조방법 Download PDFInfo
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- H—ELECTRICITY
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- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/24—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/0072—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks of microelectro-mechanical resonators or networks
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/02—Microstructural systems; Auxiliary parts of microstructural devices or systems containing distinct electrical or optical devices of particular relevance for their function, e.g. microelectro-mechanical systems [MEMS]
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B81C1/00642—Manufacture or treatment of devices or systems in or on a substrate for improving the physical properties of a device
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- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
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- H03H9/24—Constructional features of resonators of material which is not piezoelectric, electrostrictive, or magnetostrictive
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- H03H9/2447—Beam resonators
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Abstract
Description
도 2a 내지 도 2h는 와이어가 생성되기 전의 MEMS 공진기를 제조하는 개념도들
도 3은 도 1의 제조방법에서 와이어가 생성되기 전의 MEMS 공진기의 평면도
도 4는 도 3의 MEMS 공진기에 와이어 생성용 용액을 공급하는 개념도
도 5는 도 3의 MEMS 공진기에서 와이어를 생성시키는 개념도
도 6은 도 5와 같이 MEMS 공진기에 생성된 와이어를 전기적으로 절단하는 방법을 나타낸 개념도
도 7은 본 발명의 제조방법에 의해 제작된 MEMS 공진기의 현미경 사진에 대응하는 개념도
도 8은 도 7의 A부분의 확대도
도 9는 도 7의 MEMS 공진기가 적용된 센서의 개념도
도 10은 본 발명의 MEMS 공진기의 고유주파수를 측정하기 위한 실험 방법을 도시한 개념도
도 11은 본 발명의 제조방법에 의해 MEMS 공진기의 고유주파수가 조정된 결과를 도시한 그래프
Claims (15)
- 일면에서 리세스되는 리세스부를 구비하는 미세전자기계시스템(MEMS) 공진기의 베이스 기판;
상기 리세스부의 빈공간을 이용하여 진동하도록, 상기 베이스 기판에 장착되고 적어도 일부가 상기 리세스부와 중첩되도록 배치되는 진동자; 및
상기 진동자의 적어도 일부를 지지하여 상기 MEMS 공진기의 고유주파수를 조정하도록, 상기 진동자와 베이스 기판에 각각 연결되는 와이어를 포함하며,
상기 베이스 기판에는 상기 일면을 덮도록 이루어지는 박막이 증착되고, 상기 진동자는 상기 박막으로부터 연장되도록 이루어지며,
상기 박막과 상기 진동자의 일면에는 각각 제1 및 제2 금속막이 형성되고,
상기 와이어는 상기 제1 및 제2 금속막을 연결하도록 이루어지는 것을 특징으로 하는 MEMS 공진기. - 삭제
- 삭제
- 제1항에 있어서,
상기 와이어는 상기 제1 및 제2 금속막을 전극으로 하는 유전영동에 의하여 형성되는 것을 특징으로 하는 MEMS 공진기. - 제4항에 있어서,
상기 와이어는 상기 유전영동에 의하여 상기 제1 및 제2 금속막에 부착되는 나노입자를 포함하는 것을 특징으로 하는 MEMS 공진기. - 제1항에 있어서,
상기 제1 및 제2 금속막은 상기 박막과 상기 진동자로부터 상기 빈 공간으로 돌출되는 구조물들에 배치되는 것을 특징으로 하는 MEMS 공진기. - 제1항에 있어서,
상기 제1 및 제2 금속막은 서로 마주보도록 배치되는 것을 특징으로 하는 MEMS 공진기. - 제1항에 있어서,
상기 와이어는 전압의 인가에 의하여 절단되도록 이루어지는 것을 특징으로 하는 MEMS 공진기. - 제1항에 있어서,
상기 진동자는 상기 기판에 연결되는 고정단과 상기 리세스부로 연장되는 자유단을 구비하는 외팔보를 이루거나, 상기 리세스부를 가로질러 양단이 각각 상기 기판에 연결되는 고정보를 형성하는 것을 특징으로 하는 MEMS 공진기. - 센서 본체;
상기 본체에 장착되며, 진동자를 구비하고, 제1항, 제4항 내지 제9항 중 어느 한 항에 따르는 MEMS 공진기; 및
가속도 또는 각속도를 측정하도록 상기 진동자의 변위를 검출하는 제어부를 포함하는 센서. - 베이스 기판으로부터 연장되는 진동자를 구비하는 MEMS 공진기의 고유주파수 조정방법에 있어서,
상기 베이스 기판과 진동자에 각각 제1 및 제2 전극막이 생성된 MEMS 공진기를 제조하는 단계;
상기 제1 및 제2 전극막의 사이에 나노입자가 혼합된 용액을 충전하는 단계; 및
상기 진동자의 적어도 일부를 지지하여 상기 MEMS 공진기의 고유주파수를 조정하도록, 상기 제1 및 제2 전극막에 전원을 공급하여 상기 베이스 기판과 진동자를 연결하는 와이어를 생성하는 단계를 포함하며,
상기 제조하는 단계는,
베이스 기판에 박막을 증착하는 단계;
상기 박막이 기설정된 패턴을 형성하도록 식각하는 단계;
상기 패턴이 형성된 박막에 상기 제1 및 제2 금속막을 증착하는 단계; 및
상기 베이스 기판을 식각하여 상기 진동자를 형성하는 단계를 포함하는 MEMS 공진기의 제조방법. - 삭제
- 제11항에 있어서,
상기 용액에는 폴리머의 단량체가 혼합되는 것을 특징으로 하는 MEMS 공진기의 제조방법. - 제11항에 있어서,
상기 나노입자는 탄소나노튜브, 풀러렌, 금나노입자 및 은나노입자 중 적어도 하나를 포함하는 MEMS 공진기의 제조방법. - 제11항에 있어서,
상기 MEMS 공진기의 고유주파수를 복원시키도록 상기 와이어에 전압을 인가하여 상기 와이어를 절단하는 단계를 더 포함하는 MEMS 공진기의 제조방법.
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KR1020110032913A KR101239636B1 (ko) | 2011-04-08 | 2011-04-08 | Mems 공진기, 이를 구비하는 센서 및 mems 공진기의 제조방법 |
US13/519,451 US9032795B2 (en) | 2011-04-08 | 2011-05-04 | MEMS resonator, sensor having the same and manufacturing method for MEMS resonator |
PCT/KR2011/003333 WO2012138006A1 (en) | 2011-04-08 | 2011-05-04 | Mems resonator, sensor having the same and manufacturing method for mems resonator |
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US9738512B2 (en) | 2012-06-27 | 2017-08-22 | Invensense, Inc. | CMOS-MEMS integrated device including multiple cavities at different controlled pressures and methods of manufacture |
WO2015030898A2 (en) | 2013-06-07 | 2015-03-05 | The Regents Of The University Of California | Micromechanical resonant switches and charge pumps |
US10252920B2 (en) * | 2015-09-07 | 2019-04-09 | International Business Machines Corporation | Flowfield sensors for monitoring liquid flow |
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US10771040B2 (en) * | 2017-07-12 | 2020-09-08 | Nutech Ventures | Systems and methods for reducing the actuation voltage for electrostatic MEMS devices |
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JP2007058105A (ja) * | 2005-08-26 | 2007-03-08 | Matsushita Electric Works Ltd | マイクロミラー素子及び可動構造 |
JP5622347B2 (ja) * | 2006-08-09 | 2014-11-12 | セイコーエプソン株式会社 | 慣性センサ装置 |
US8362618B2 (en) * | 2006-11-08 | 2013-01-29 | Northeastern University | Three dimensional nanoscale circuit interconnect and method of assembly by dielectrophoresis |
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KR100949375B1 (ko) * | 2007-10-31 | 2010-03-25 | 포항공과대학교 산학협력단 | 미세 와이어 제조 방법, 그리고 미세 와이어를 포함하는 센서 제조 방법 |
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US20120085649A1 (en) * | 2010-03-09 | 2012-04-12 | Virginia Tech Intellectual Properties, Inc. | Dielectrophoresis devices and methods therefor |
US20120061241A1 (en) * | 2010-09-15 | 2012-03-15 | Nokia Corporation | Apparatus and associated methods |
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2011
- 2011-04-08 KR KR1020110032913A patent/KR101239636B1/ko active Active
- 2011-05-04 WO PCT/KR2011/003333 patent/WO2012138006A1/en active Application Filing
- 2011-05-04 US US13/519,451 patent/US9032795B2/en not_active Expired - Fee Related
Patent Citations (1)
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JP2006041911A (ja) * | 2004-07-27 | 2006-02-09 | Matsushita Electric Ind Co Ltd | Memsフィルタ装置およびその製造方法 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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US10177733B2 (en) | 2015-12-11 | 2019-01-08 | Hyundai Motor Company | MEMS resonator |
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US9032795B2 (en) | 2015-05-19 |
WO2012138006A1 (en) | 2012-10-11 |
US20120279302A1 (en) | 2012-11-08 |
KR20120115013A (ko) | 2012-10-17 |
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