KR101060654B1 - 기판흡착장치 및 기판흡착방법 - Google Patents
기판흡착장치 및 기판흡착방법 Download PDFInfo
- Publication number
- KR101060654B1 KR101060654B1 KR1020080138418A KR20080138418A KR101060654B1 KR 101060654 B1 KR101060654 B1 KR 101060654B1 KR 1020080138418 A KR1020080138418 A KR 1020080138418A KR 20080138418 A KR20080138418 A KR 20080138418A KR 101060654 B1 KR101060654 B1 KR 101060654B1
- Authority
- KR
- South Korea
- Prior art keywords
- vacuum
- substrate
- line
- leakage
- pumping force
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 70
- 238000001179 sorption measurement Methods 0.000 title claims abstract description 29
- 238000000034 method Methods 0.000 title claims abstract description 28
- 238000005086 pumping Methods 0.000 claims abstract description 24
- 230000000903 blocking effect Effects 0.000 claims description 3
- 238000007689 inspection Methods 0.000 abstract description 10
- 230000000694 effects Effects 0.000 abstract description 2
- 230000007547 defect Effects 0.000 description 5
- 238000012360 testing method Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 2
- 238000012883 sequential measurement Methods 0.000 description 2
- 238000011179 visual inspection Methods 0.000 description 2
- 238000005286 illumination Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (6)
- 다수개의 진공포트를 가지는 진공라인이 복수개 배치된 기판홀더에 기판을 안착시키는 단계;상기 다수개의 진공라인에 진공펌핑력을 제공하는 단계;상기 진공펌핑력 제공시에 진공누설이 발생하면 상기 진공라인에 개별적으로 진공펌핑력을 제공하여 진공 누설이 발생하는 진공라인을 식별하는 단계;상기 진공라인 중 진공 누설이 발생하는 진공라인을 차단하고, 나머지 진공라인에 진공 펌핑력을 제공하여 기판을 흡착하는 단계를 포함하는 것을 특징으로 하는 기판흡착방법.
- 제 1 항에 있어서, 상기 진공 누설이 발생하는 진공라인을 식별할 때 복수개의 진공라인 단위로 진공 누설을 검사하는 것을 특징으로 하는 기판흡착방법.
- 제 1 항에 있어서, 상기 진공라인을 식별하는 단계 전에 압력을 각 라인별로 측정하여 진공 누설을 검사하는 것을 특징으로 하는 기판흡착방법.
- 삭제
- 삭제
- 삭제
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080138418A KR101060654B1 (ko) | 2008-12-31 | 2008-12-31 | 기판흡착장치 및 기판흡착방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080138418A KR101060654B1 (ko) | 2008-12-31 | 2008-12-31 | 기판흡착장치 및 기판흡착방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100079841A KR20100079841A (ko) | 2010-07-08 |
KR101060654B1 true KR101060654B1 (ko) | 2011-08-31 |
Family
ID=42640884
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020080138418A Expired - Fee Related KR101060654B1 (ko) | 2008-12-31 | 2008-12-31 | 기판흡착장치 및 기판흡착방법 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR101060654B1 (ko) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101688989B1 (ko) * | 2015-10-30 | 2016-12-22 | 스테코 주식회사 | 칩 분리 장치 |
KR101636070B1 (ko) * | 2015-12-30 | 2016-07-14 | 주식회사 라파스 | 마이크로니들 제조장치 |
KR20200020365A (ko) | 2018-08-17 | 2020-02-26 | 부산대학교 산학협력단 | 일체형 나노원통 금형 제작을 위한 원통에서 감광제를 균일하게 코팅하는 장치 및 방법 |
-
2008
- 2008-12-31 KR KR1020080138418A patent/KR101060654B1/ko not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20100079841A (ko) | 2010-07-08 |
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