KR101034923B1 - 오토 프로브 검사장비 및 이를 이용한 검사방법 - Google Patents
오토 프로브 검사장비 및 이를 이용한 검사방법 Download PDFInfo
- Publication number
- KR101034923B1 KR101034923B1 KR1020040039352A KR20040039352A KR101034923B1 KR 101034923 B1 KR101034923 B1 KR 101034923B1 KR 1020040039352 A KR1020040039352 A KR 1020040039352A KR 20040039352 A KR20040039352 A KR 20040039352A KR 101034923 B1 KR101034923 B1 KR 101034923B1
- Authority
- KR
- South Korea
- Prior art keywords
- inspection
- liquid crystal
- crystal display
- display panel
- auto probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
Abstract
Description
Claims (9)
- 삭제
- 삭제
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- 삭제
- 컨베이어를 이용한 수평방향으로의 이송방식으로 검사용 액정표시패널을 지지부재의 오토 프로브 유닛에 로딩하는 단계;상기 오토 프로브 유닛의 게이트 니들과 데이터 니들을 상기 검사용 액정표시패널의 게이트라인과 데이터라인에 각각 접촉시켜 전기적으로 연결하는 단계;상기 오토 프로브 유닛을 통해 패턴 신호를 상기 검사용 액정표시패널에 입력하는 단계;상기 입력된 신호에 따라 상기 검사용 액정표시패널에 표시되는 검사용 패턴을 카메라와 같은 비젼장치를 이용하여 수집하는 단계;상기 비젼장치를 이용하여 상기 검사용 액정표시패널 위를 수평방향으로 스캔하여 상기 검사용 패턴을 수집하는 단계;시야각에 따른 결함검출이 달라지는 것을 보완하기 위해 상기 비젼장치를 0~70도, 80~100도, 110~160도 등의 각도를 준 상태에서 상기 검사용 액정표시패널 위를 수평방향으로 스캔하여 상기 검사용 패턴을 수집하는 단계; 및컴퓨터 시스템을 이용하여 상기 정해진 패턴 신호에 대해 수집된 검사용 패턴을 비교, 분석하여 상기 검사용 액정표시패널의 점결함, 선결함 또는 얼룩 등의 결함이 있는지를 판단하는 단계를 포함하며, 상기 지지부재에 설치된 구동장치를 통해 상기 지지부재를 전후좌우로 구동시키는 한편, 상기 검사용 액정표시패널을 상기 오토 프로브 유닛에 로딩, 언로딩하며, 여러 항목에 대한 정해진 패턴 신호를 상기 검사용 액정표시패널에 반복, 입력하고 상기 컴퓨터 시스템을 이용하여 반복적으로 분석, 판단하는 것을 특징으로 하는 오토 프로브 검사방법.
- 삭제
- 삭제
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Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040039352A KR101034923B1 (ko) | 2004-05-31 | 2004-05-31 | 오토 프로브 검사장비 및 이를 이용한 검사방법 |
US11/141,220 US7548083B2 (en) | 2004-05-31 | 2005-05-31 | Test apparatus having auto probe that contacts a display device and test method using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020040039352A KR101034923B1 (ko) | 2004-05-31 | 2004-05-31 | 오토 프로브 검사장비 및 이를 이용한 검사방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20050114132A KR20050114132A (ko) | 2005-12-05 |
KR101034923B1 true KR101034923B1 (ko) | 2011-05-17 |
Family
ID=35424525
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020040039352A Expired - Fee Related KR101034923B1 (ko) | 2004-05-31 | 2004-05-31 | 오토 프로브 검사장비 및 이를 이용한 검사방법 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7548083B2 (ko) |
KR (1) | KR101034923B1 (ko) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101232158B1 (ko) * | 2006-06-09 | 2013-02-12 | 엘지디스플레이 주식회사 | 액정표시장치의 검사공정 |
CN104240625B (zh) * | 2014-08-19 | 2017-11-07 | 合肥鑫晟光电科技有限公司 | 一种显示装置及其检测方法 |
CN104317079B (zh) * | 2014-10-29 | 2017-12-01 | 京东方科技集团股份有限公司 | 一种显示面板识别系统、检测系统、识别方法及检测方法 |
CN104317081A (zh) * | 2014-11-17 | 2015-01-28 | 合肥京东方光电科技有限公司 | 一种点灯设备 |
CN105093574B (zh) * | 2015-06-05 | 2018-06-08 | 京东方科技集团股份有限公司 | 显示面板检测台 |
CN105867337B (zh) * | 2016-05-23 | 2019-08-16 | 河源华盈科技有限公司 | 一种背光模块自动化产线的管理系统及其方法 |
CN110211522A (zh) * | 2019-06-29 | 2019-09-06 | 苏州精濑光电有限公司 | 一种显示面板的检测机构 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0735645A (ja) * | 1993-07-23 | 1995-02-07 | Sony Corp | 液晶パネルの検査装置 |
KR960024435A (ko) * | 1994-12-30 | 1996-07-20 | 구자홍 | 티에프티 엘씨디 모듈(tft-lcd module)의 탭(tab) 자동 검사 장치 |
KR19980018312U (ko) * | 1996-09-25 | 1998-07-06 | 김광호 | Tft lcd 패널 테스트 카메라 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04208834A (ja) * | 1990-12-04 | 1992-07-30 | Ezel Inc | 液晶パネルの検査方法 |
US5235272A (en) * | 1991-06-17 | 1993-08-10 | Photon Dynamics, Inc. | Method and apparatus for automatically inspecting and repairing an active matrix LCD panel |
JPH055709A (ja) * | 1991-06-27 | 1993-01-14 | Matsushita Electric Ind Co Ltd | 画面検査装置 |
US5391985A (en) * | 1992-03-06 | 1995-02-21 | Photon Dynamics, Inc. | Method and apparatus for measuring high speed logic states using voltage imaging with burst clocking |
US5546013A (en) * | 1993-03-05 | 1996-08-13 | International Business Machines Corporation | Array tester for determining contact quality and line integrity in a TFT/LCD |
WO1995034044A1 (en) * | 1994-06-09 | 1995-12-14 | Kollmorgen Instrument Corporation | Stereoscopic electro-optical system for automated inspection and/or alignment of imaging devices on a production assembly line |
TW410524B (en) * | 1994-07-14 | 2000-11-01 | Advantest Corp | LCD panel image quality examining device and LCD image sampling method |
KR100189178B1 (ko) * | 1995-05-19 | 1999-06-01 | 오우라 히로시 | 패널 화질 검사 장치 및 화질 보정 방법 |
US5999012A (en) * | 1996-08-15 | 1999-12-07 | Listwan; Andrew | Method and apparatus for testing an electrically conductive substrate |
US6111424A (en) * | 1997-09-04 | 2000-08-29 | Lucent Technologies Inc. | Testing method and apparatus for flat panel displays using infrared imaging |
JPH11259225A (ja) * | 1998-03-09 | 1999-09-24 | Shimadzu Corp | 視線入力装置 |
JP2001330639A (ja) * | 2000-05-24 | 2001-11-30 | Toshiba Corp | アレイ基板の検査方法 |
GB2368635B (en) * | 2000-11-01 | 2004-12-22 | Nokia Mobile Phones Ltd | Testing an image display device |
WO2003058158A2 (en) * | 2001-12-28 | 2003-07-17 | Applied Precision, Llc | Stereoscopic three-dimensional metrology system and method |
TWI221540B (en) * | 2002-04-10 | 2004-10-01 | Toshiba Corp | Method of testing liquid crystal display cells and apparatus for the same |
KR100955486B1 (ko) * | 2004-01-30 | 2010-04-30 | 삼성전자주식회사 | 디스플레이 패널의 검사장치 및 검사방법 |
-
2004
- 2004-05-31 KR KR1020040039352A patent/KR101034923B1/ko not_active Expired - Fee Related
-
2005
- 2005-05-31 US US11/141,220 patent/US7548083B2/en not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0735645A (ja) * | 1993-07-23 | 1995-02-07 | Sony Corp | 液晶パネルの検査装置 |
KR960024435A (ko) * | 1994-12-30 | 1996-07-20 | 구자홍 | 티에프티 엘씨디 모듈(tft-lcd module)의 탭(tab) 자동 검사 장치 |
KR19980018312U (ko) * | 1996-09-25 | 1998-07-06 | 김광호 | Tft lcd 패널 테스트 카메라 |
Also Published As
Publication number | Publication date |
---|---|
KR20050114132A (ko) | 2005-12-05 |
US20050264309A1 (en) | 2005-12-01 |
US7548083B2 (en) | 2009-06-16 |
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