KR101011437B1 - 비전을 이용한 정밀나사 자동검사 및 선별시스템 - Google Patents
비전을 이용한 정밀나사 자동검사 및 선별시스템 Download PDFInfo
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- KR101011437B1 KR101011437B1 KR1020090018010A KR20090018010A KR101011437B1 KR 101011437 B1 KR101011437 B1 KR 101011437B1 KR 1020090018010 A KR1020090018010 A KR 1020090018010A KR 20090018010 A KR20090018010 A KR 20090018010A KR 101011437 B1 KR101011437 B1 KR 101011437B1
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- screw
- inspection
- rotating plate
- head
- microcomputer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G47/00—Article or material-handling devices associated with conveyors; Methods employing such devices
- B65G47/34—Devices for discharging articles or materials from conveyor
- B65G47/46—Devices for discharging articles or materials from conveyor and distributing, e.g. automatically, to desired points
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8858—Flaw counting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Pathology (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Textile Engineering (AREA)
- Mechanical Engineering (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Sorting Of Articles (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (2)
- 호퍼(10)로부터 가공된 정밀나사를 공급받아 볼피더(20)로서 정렬 및 이송하고, 볼피더(20)와 연계 설치된 리니어피더(30)를 통해 회전되는 회전플레이트(1)상에 나사를 일렬로 공급시켜 각 위치에서 촬영된 나사의 각부 영상을 마이콤(100)에서 분석된 신호처리로서 모니터링 및 설정된 수치 및 형상과 비교 판단하여 양품과 불량품으로 배출선별하도록 한 검사 시스템에 있어서,상기 회전플레이트(1)의 일측에 설치되어 리니어피더(30)를 통해 나사의 헤드부가 회전플레이트상에 세워지는 형태로 공급되는 나사를 원주상으로 안내하는 정렬가이드부(40)와;상기 정렬가이드부(40)의 일측에 이격 설치되어 회전플레이트(1)상의 공급되는 각 나사들의 설정간격을 감지하여 검사대상만을 체크하고, 미검사대상의 나사는 미분류대상으로의 배출인지를 판단하는 신호를 마이콤(100)에 전달하는 제품투입간격 감지부(50)와;상기 회전플레이트(1)에 근접 설치되어 설정간격에 맞게 배치된 검사대상 나사의 헤드부 측면을 다방향으로 촬영하고, 촬영된 영상신호를 마이콤(100)에 모니터하기 위한 헤드부 측면 영상검사부(60)와;상기 회전플레이트(1)에 근접 설치되어 헤드부 측면 영상검사부에서 촬영을 마치고 이송되는 나사의 리드를 촬영하고, 촬영된 영상신호를 마이콤(100)에 모니터하기 위한 리드검사부(70)와;상기 회전플레이트(1)의 저면측에 이격 설치되어 리드검사부(70)에서 촬영되어 이송되는 나사의 헤드부 저면을 촬영하고, 촬영된 영상신호를 마이콤에 모니터하기 위한 헤드 저면검사부(80)와;상기 회전플레이트의 가장자리측에 설치되어 양품으로 인정된 나사를 수거하기 위한 제1양품 배출부(90) 및 제2양품 배출부(91)와;상기 회전플레이트의 가장자리측에 설치되어 불량품으로 인정된 나사를 수거하기 위한 불량품 배출부(92)와;상기 회전플레이트의 가장자리측에 설치되어 미검사된 나사만을 수거하기 위한 미분류 배출부(93);를 포함하여 구성된 것을 특징으로 하는 비전을 이용한 정밀나사 자동검사 및 선별시스템.
- 제1항에 있어서, 상기 회전플레이트(1)상의 저면에 설치되어 헤드부 측면영상검사부(60), 리드검사부(70), 헤드 저면검사부(80)로부터 촬영되는 각각의 나사에 빛을 조사하는 제1~제3조명부(L1~L3)가 더 설치된 것을 특징으로 하는 비전을 이용한 정밀나사 자동검사 및 선별시스템.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090018010A KR101011437B1 (ko) | 2009-03-03 | 2009-03-03 | 비전을 이용한 정밀나사 자동검사 및 선별시스템 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090018010A KR101011437B1 (ko) | 2009-03-03 | 2009-03-03 | 비전을 이용한 정밀나사 자동검사 및 선별시스템 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100099487A KR20100099487A (ko) | 2010-09-13 |
KR101011437B1 true KR101011437B1 (ko) | 2011-01-28 |
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KR1020090018010A Expired - Fee Related KR101011437B1 (ko) | 2009-03-03 | 2009-03-03 | 비전을 이용한 정밀나사 자동검사 및 선별시스템 |
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KR (1) | KR101011437B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101366189B1 (ko) | 2012-02-03 | 2014-02-25 | 주식회사 서울금속 | 비전 검사 장치 |
CN106123953A (zh) * | 2016-06-18 | 2016-11-16 | 上海大学 | 特种螺栓自动检测入库装置 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101366188B1 (ko) * | 2012-02-03 | 2014-02-25 | 주식회사 서울금속 | 측면 및 표면 검사기능을 갖는 비전 검사 장치 |
CN116026391B (zh) * | 2021-10-27 | 2025-05-30 | 泰科电子(上海)有限公司 | 产品检查系统 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040024801A (ko) * | 2002-09-16 | 2004-03-22 | 김명희 | 자전거 안장과 핸들의 승강장치 |
JP2005221270A (ja) * | 2004-02-03 | 2005-08-18 | Tsunehiro Yoshida | ネジの検査装置 |
KR200424801Y1 (ko) | 2006-05-08 | 2006-08-28 | 박소영 | 정밀나사 검사 및 선별장치 |
-
2009
- 2009-03-03 KR KR1020090018010A patent/KR101011437B1/ko not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20040024801A (ko) * | 2002-09-16 | 2004-03-22 | 김명희 | 자전거 안장과 핸들의 승강장치 |
JP2005221270A (ja) * | 2004-02-03 | 2005-08-18 | Tsunehiro Yoshida | ネジの検査装置 |
KR200424801Y1 (ko) | 2006-05-08 | 2006-08-28 | 박소영 | 정밀나사 검사 및 선별장치 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101366189B1 (ko) | 2012-02-03 | 2014-02-25 | 주식회사 서울금속 | 비전 검사 장치 |
CN106123953A (zh) * | 2016-06-18 | 2016-11-16 | 上海大学 | 特种螺栓自动检测入库装置 |
Also Published As
Publication number | Publication date |
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KR20100099487A (ko) | 2010-09-13 |
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