KR100993775B1 - 다층 전도성 박막의 식각용 조성물 및 이를 이용한 식각 방법 - Google Patents
다층 전도성 박막의 식각용 조성물 및 이를 이용한 식각 방법 Download PDFInfo
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- KR100993775B1 KR100993775B1 KR1020080081810A KR20080081810A KR100993775B1 KR 100993775 B1 KR100993775 B1 KR 100993775B1 KR 1020080081810 A KR1020080081810 A KR 1020080081810A KR 20080081810 A KR20080081810 A KR 20080081810A KR 100993775 B1 KR100993775 B1 KR 100993775B1
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- Prior art keywords
- acid
- etching
- layer
- oxide layer
- thin film
- Prior art date
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- 238000005530 etching Methods 0.000 title claims abstract description 60
- 238000000034 method Methods 0.000 title claims abstract description 24
- 239000000203 mixture Substances 0.000 title claims abstract description 22
- 239000010409 thin film Substances 0.000 title abstract description 31
- 229910052751 metal Inorganic materials 0.000 claims abstract description 45
- 239000002184 metal Substances 0.000 claims abstract description 45
- 239000002253 acid Substances 0.000 claims abstract description 38
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims abstract description 24
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 claims abstract description 22
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 13
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims abstract description 12
- 150000001875 compounds Chemical class 0.000 claims abstract description 11
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 claims description 20
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 claims description 12
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 claims description 12
- 238000005507 spraying Methods 0.000 claims description 9
- 229910052709 silver Inorganic materials 0.000 claims description 8
- 235000019253 formic acid Nutrition 0.000 claims description 7
- 235000006408 oxalic acid Nutrition 0.000 claims description 6
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 claims description 5
- 229910001316 Ag alloy Inorganic materials 0.000 claims description 4
- 150000007513 acids Chemical class 0.000 claims description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims 2
- 239000004332 silver Substances 0.000 claims 2
- 239000010408 film Substances 0.000 abstract description 25
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 abstract description 12
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 abstract description 12
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 abstract description 9
- 229910017604 nitric acid Inorganic materials 0.000 abstract description 9
- 239000010410 layer Substances 0.000 description 78
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 28
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 21
- 238000002834 transmittance Methods 0.000 description 14
- 239000011787 zinc oxide Substances 0.000 description 12
- 238000001039 wet etching Methods 0.000 description 9
- 239000007921 spray Substances 0.000 description 6
- 238000004544 sputter deposition Methods 0.000 description 6
- 239000000758 substrate Substances 0.000 description 6
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 5
- 238000011160 research Methods 0.000 description 5
- 238000011161 development Methods 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 4
- 229910045601 alloy Inorganic materials 0.000 description 3
- 239000000956 alloy Substances 0.000 description 3
- 238000000151 deposition Methods 0.000 description 3
- 230000008021 deposition Effects 0.000 description 3
- 239000011259 mixed solution Substances 0.000 description 3
- 229920001621 AMOLED Polymers 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- -1 ITO Substances 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 235000011054 acetic acid Nutrition 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 229910052738 indium Inorganic materials 0.000 description 1
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
- H01L21/32134—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by liquid etching only
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/10—Etching compositions
- C23F1/14—Aqueous compositions
- C23F1/16—Acidic compositions
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Metallurgy (AREA)
- Mechanical Engineering (AREA)
- Inorganic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Weting (AREA)
- Manufacturing Of Electric Cables (AREA)
- ing And Chemical Polishing (AREA)
Abstract
Description
Claims (10)
- 투명산화물층과 은 또는 은 합금층이 교차적으로 다층 적층되어 있는 투명 전도막의 식각용 조성물에 있어서,염산 및 인산으로 된 식각용 산;산화물층 및 금속층과 동시에 착화합물을 형성할 수 있는 포름산, 말론산 및 옥살산으로 이루어진 군에서 일종 이상 선택된 산; 및물을 포함하는 투명 전도막의 식각용 조성물.
- 삭제
- 삭제
- 제 1항에 있어서, 상기 식각용 산은 20 내지 60 중량%, 상기 착화합물을 형성하는 산은 10 내지 40 중량% 및 나머지는 물인 조성물.
- 제 1항에 있어서, 상기 산화물층은 ITO, ZnO, IZO, ZTO, AZTO, AZO 또는 ZnO가 도핑된 ITO인 조성물.
- 염산 및 인산으로 된 식각용 산; 산화물층 및 금속층과 동시에 착화합물을 형성할 수 있는 포름산, 말론산 및 옥살산으로 이루어진 군에서 일종 이상 선택된 산; 및 물이 혼합된 에천트를 준비하는 단계; 및투명산화물층과 은 또는 은 합금층이 교차적으로 다층 적층되어 있는 투명 전도막에 상기 에천트를 분사하는 단계를 포함하는 투명 전도막의 식각 방법.
- 삭제
- 삭제
- 제 6항에 있어서, 상기 에천트는 식각용 산 20 내지 60중량%, 상기 착화합물을 형성하는 산 10 내지 40 중량% 및 나머지 물인 식각 방법.
- 제 6항에 있어서, 상기 산화물층은 ITO, ZnO, IZO, ZTO, AZTO, AZO 또는 ZnO가 도핑된 ITO인 식각 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020080081810A KR100993775B1 (ko) | 2008-04-01 | 2008-08-21 | 다층 전도성 박막의 식각용 조성물 및 이를 이용한 식각 방법 |
Applications Claiming Priority (2)
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KR1020080030160 | 2008-04-01 | ||
KR1020080081810A KR100993775B1 (ko) | 2008-04-01 | 2008-08-21 | 다층 전도성 박막의 식각용 조성물 및 이를 이용한 식각 방법 |
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KR20090105781A KR20090105781A (ko) | 2009-10-07 |
KR100993775B1 true KR100993775B1 (ko) | 2010-11-12 |
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KR1020080081810A KR100993775B1 (ko) | 2008-04-01 | 2008-08-21 | 다층 전도성 박막의 식각용 조성물 및 이를 이용한 식각 방법 |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101316536B1 (ko) * | 2012-06-21 | 2013-10-15 | 충북대학교 산학협력단 | 저방사용 다층막 |
US10611962B2 (en) | 2018-04-23 | 2020-04-07 | Samsung Display Co., Ltd. | Etchant composition and manufacturing method of metal pattern using the same |
US10636666B1 (en) | 2018-10-11 | 2020-04-28 | Samsung Display Co., Ltd. | Etchant and method for manufacturing display device using the same |
US11091694B2 (en) | 2018-11-14 | 2021-08-17 | Samsung Display Co., Ltd. | Etching composition, method for forming pattern and method for manufacturing a display device using the same |
US11639470B2 (en) | 2020-12-28 | 2023-05-02 | Samsung Display Co., Ltd. | Etching composition for thin film containing silver, method for forming pattern and method for manufacturing a display device using the same |
US11683975B2 (en) | 2020-04-29 | 2023-06-20 | Samsung Display Co., Ltd. | Etchant composition and method of manufacturing display apparatus by using the same |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101718460B1 (ko) * | 2016-11-14 | 2017-03-22 | 길기환 | 금 박막 식각액 조성물 |
KR20190058758A (ko) | 2017-11-21 | 2019-05-30 | 삼성디스플레이 주식회사 | 식각액 조성물 및 이를 이용한 디스플레이 장치의 제조방법 |
KR102503788B1 (ko) * | 2017-11-21 | 2023-02-27 | 삼성디스플레이 주식회사 | 식각액 조성물 및 이를 이용한 디스플레이 장치의 제조방법 |
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2008
- 2008-08-21 KR KR1020080081810A patent/KR100993775B1/ko not_active IP Right Cessation
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101316536B1 (ko) * | 2012-06-21 | 2013-10-15 | 충북대학교 산학협력단 | 저방사용 다층막 |
US10611962B2 (en) | 2018-04-23 | 2020-04-07 | Samsung Display Co., Ltd. | Etchant composition and manufacturing method of metal pattern using the same |
US10636666B1 (en) | 2018-10-11 | 2020-04-28 | Samsung Display Co., Ltd. | Etchant and method for manufacturing display device using the same |
US11091694B2 (en) | 2018-11-14 | 2021-08-17 | Samsung Display Co., Ltd. | Etching composition, method for forming pattern and method for manufacturing a display device using the same |
US11683975B2 (en) | 2020-04-29 | 2023-06-20 | Samsung Display Co., Ltd. | Etchant composition and method of manufacturing display apparatus by using the same |
US11639470B2 (en) | 2020-12-28 | 2023-05-02 | Samsung Display Co., Ltd. | Etching composition for thin film containing silver, method for forming pattern and method for manufacturing a display device using the same |
US12031076B2 (en) | 2020-12-28 | 2024-07-09 | Samsung Display Co., Ltd. | Etching composition for thin film containing silver, method for forming pattern and method for manufacturing a display device using the same |
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KR20090105781A (ko) | 2009-10-07 |
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