KR100965926B1 - 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓 - Google Patents
수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓 Download PDFInfo
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- KR100965926B1 KR100965926B1 KR1020080056968A KR20080056968A KR100965926B1 KR 100965926 B1 KR100965926 B1 KR 100965926B1 KR 1020080056968 A KR1020080056968 A KR 1020080056968A KR 20080056968 A KR20080056968 A KR 20080056968A KR 100965926 B1 KR100965926 B1 KR 100965926B1
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- cooler
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- cooled
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- 238000012360 testing method Methods 0.000 title claims abstract description 79
- 230000008878 coupling Effects 0.000 claims abstract description 20
- 238000010168 coupling process Methods 0.000 claims abstract description 20
- 238000005859 coupling reaction Methods 0.000 claims abstract description 20
- 238000003780 insertion Methods 0.000 claims description 15
- 230000037431 insertion Effects 0.000 claims description 15
- 238000000034 method Methods 0.000 claims description 7
- 230000007547 defect Effects 0.000 abstract description 9
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 3
- 238000011161 development Methods 0.000 description 9
- 238000005516 engineering process Methods 0.000 description 7
- 238000012545 processing Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 5
- 230000002950 deficient Effects 0.000 description 4
- 238000009434 installation Methods 0.000 description 4
- 238000001816 cooling Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 230000006870 function Effects 0.000 description 3
- 239000003507 refrigerant Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000013473 artificial intelligence Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 230000007123 defense Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000000746 purification Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0458—Details related to environmental aspects, e.g. temperature
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/16—Constructional details or arrangements
- G06F1/20—Cooling means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
- G01R31/2817—Environmental-, stress-, or burn-in tests
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Human Computer Interaction (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Cooling Or The Like Of Electrical Apparatus (AREA)
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
Abstract
Description
Claims (7)
- 메인보드 상에 실장된 CPU에 비해 큰 크기로 형성되어지되 수냉식 쿨러가 삽입 안착되는 일정 크기의 쿨러 안착홈이 구비되어 상기 메인보드 상의 CPU 상부로 설치되는 소켓몸체;상기 소켓몸체의 일측 상단에 일정범위 회전 가능하게 힌지 결합되어 상기 쿨러 안착홈 상부를 가로지르는 구조로 형성되는 쿨러 고정부재, 상기 쿨러 고정부재의 타단에 일정범위 회전 가능하게 설치되어지되 그 하단에는 걸림후크가 형성된 후크부재, 상기 후크부재의 걸림후크에 대응하여 상기 소켓몸체의 타측 외측면 상에 형성되는 걸림턱 및 상기 쿨러 고정부재의 타단에 설치되어 상기 후크부재가 상기 걸림턱에 상시 걸릴 수 있는 방향으로 그 힘이 작용하는 탄성스프링으로 이루어져 상기 쿨러 안착홈 상에 삽입 안착된 수냉식 쿨러를 고정시키는 쿨러 고정수단;상기 쿨러 고정부재의 하부면 상에 일정 깊이로 형성되어지되 그 양측의 동일 선상에는 힌지공이 관통 형성된 안착홈, 상기 안착홈에 대응하는 크기로 이루어져 상기 안착홈 상에 돌출 설치되어지되 상하로 일정범위 이동 가능하도록 장공 형태의 힌지 관통공이 상기 힌지공에 대응하여 형성된 쿨러 가압편, 상기 힌지공과 힌지 관통공을 통해 결합되어 상기 쿨러 가압편을 상기 안착홈 상에 설치되도록 하는 힌지 및 상기 안착홈 상에 설치되어 상기 쿨러 가압편을 외측 방향으로 상시 가압하는 가압스프링으로 이루어져 상기 소켓몸체의 쿨러 안착홈 상에 안착된 수냉식 쿨러의 상부면을 탄력적으로 가압하여 그 하부면 상기 메인보드 상의 CPU 상부면에 밀착되도록 하는 쿨러 가압수단; 및상기 소켓몸체의 하부면에 다수 형성되는 나사 결합공 및 상기 메인보드의 하부면을 관통하여 상기 나사 결합공과의 체결을 통해 상기 메인보드 상에 상기 소켓몸체를 고정시키는 고정볼트로 이루어져 상기 소켓몸체를 상기 메인보드 상에 고정시키는 소켓 고정수단을 포함한 구성으로 이루어진 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓.
- 삭제
- 제 1 항에 있어서, 상기 힌지는 상기 소켓몸체의 일측 하부면 상에 일정 깊이의 길이 방향으로 형성된 힌지 삽입홈을 통해 삽입되어 상기 쿨러 고정부재의 일단을 힌지 결합하되 상기 힌지 삽입홈을 통해 상향으로 나사 결합되는 힌지 고정나사의 나사머리에 의해 상기 힌지 삽입홈 상에 고정되는 것을 특징으로 하는 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓.
- 삭제
- 제 3 항에 있어서, 상기 수냉식 쿨러의 상부면 중심부에는 상기 쿨러 가압수단의 쿨러 가압편에 대응하는 위치 고정홈이 형성되어 상기 쿨러 고정수단을 통해 상기 쿨러 안착홈 상에 상기 수냉식 쿨러를 고정시키는 경우 상기 쿨러 가압편에 의해 상기 수냉식 쿨러의 위치가 고정되도록 한 것을 특징으로 하는 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓.
- 삭제
- 제 1 항, 제 3 항 및 제 5 항 중 어느 한 항에 있어서, 상기 쿨러 안착홈의 선단부를 이루는 상기 소켓몸체의 선단면 일부분은 상기 수냉식 쿨러의 선단면에 구성된 커플링이 삽입 안착되도록 개방된 것을 특징으로 하는 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080056968A KR100965926B1 (ko) | 2008-06-17 | 2008-06-17 | 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓 |
JP2011514483A JP5148750B2 (ja) | 2008-06-17 | 2009-06-03 | 水冷式クーラー固定構造を備えたメインボードテスト用ソケット |
CN2009801230224A CN102067063B (zh) | 2008-06-17 | 2009-06-03 | 具备水冷式散热器固定结构的主板测试座 |
PCT/KR2009/002959 WO2009154370A2 (ko) | 2008-06-17 | 2009-06-03 | 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓 |
US12/481,053 US7864537B2 (en) | 2008-06-17 | 2009-06-09 | Socket for testing main board having water-cooled cooler fixing structure |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080056968A KR100965926B1 (ko) | 2008-06-17 | 2008-06-17 | 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090131140A KR20090131140A (ko) | 2009-12-28 |
KR100965926B1 true KR100965926B1 (ko) | 2010-06-24 |
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Family Applications (1)
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KR1020080056968A Active KR100965926B1 (ko) | 2008-06-17 | 2008-06-17 | 수냉식 쿨러 고정구조가 구비된 메인보드 테스트용 소켓 |
Country Status (5)
Country | Link |
---|---|
US (1) | US7864537B2 (ko) |
JP (1) | JP5148750B2 (ko) |
KR (1) | KR100965926B1 (ko) |
CN (1) | CN102067063B (ko) |
WO (1) | WO2009154370A2 (ko) |
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US8937810B2 (en) | 2012-09-14 | 2015-01-20 | International Business Machines Corporation | Electronic assembly with detachable coolant manifold and coolant-cooled electronic module |
US9066460B2 (en) | 2013-01-17 | 2015-06-23 | International Business Machines Corporation | Disassemblable electronic assembly with leak-inhibiting coolant capillaries |
ITTO20140013U1 (it) * | 2014-01-23 | 2015-07-23 | Johnson Electric Asti S R L | Connettore elettrico e relativo dispositivo di ritegno per un gruppo elettroventilatore di raffreddamento di uno scambiatore di calore per autoveicoli |
KR101697325B1 (ko) * | 2016-07-18 | 2017-01-17 | 민형식 | 컴퓨터 처리장치용 냉각장치 |
CN109062350A (zh) * | 2018-08-17 | 2018-12-21 | 广西紫极科技有限公司 | 一种计算机硬件保护装置 |
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KR102188133B1 (ko) * | 2018-11-15 | 2020-12-07 | 주식회사 에이텍 | 컴퓨터의 발열을 이용한 cpu 냉각장치 |
CN210008008U (zh) * | 2018-11-30 | 2020-01-31 | 富顶精密组件(深圳)有限公司 | 一种固定芯片模组的锁固结构及其背板结构 |
CN113823932B (zh) * | 2020-06-18 | 2025-07-18 | 莫列斯有限公司 | 连接器组件 |
TWI756868B (zh) * | 2020-10-16 | 2022-03-01 | 奇鋐科技股份有限公司 | 組合式水冷模組扣具結構 |
TWI751742B (zh) * | 2020-10-16 | 2022-01-01 | 奇鋐科技股份有限公司 | 組合式水冷單元扣具結構 |
US11737236B2 (en) | 2020-11-16 | 2023-08-22 | Asia Vital Components Co., Ltd. | Knockdown water-cooling module latch device structure |
US11683908B2 (en) | 2020-11-16 | 2023-06-20 | Asia Vital Components Co., Ltd. | Knockdown water-cooling unit latch device structure |
GB2601357B (en) | 2020-11-27 | 2023-02-01 | Nexalus Ltd | Modular thermal heat sink device |
US11800666B2 (en) | 2021-06-28 | 2023-10-24 | International Business Machines Corporation | Temporary removable module lid |
US12028997B2 (en) * | 2021-06-28 | 2024-07-02 | International Business Machines Corporation | Rotating lid for module cooler |
CN113918399B (zh) * | 2021-12-06 | 2022-03-08 | 深圳市微特精密科技股份有限公司 | 一种电脑主板固件功能测试装置 |
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2008
- 2008-06-17 KR KR1020080056968A patent/KR100965926B1/ko active Active
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2009
- 2009-06-03 WO PCT/KR2009/002959 patent/WO2009154370A2/ko active Application Filing
- 2009-06-03 JP JP2011514483A patent/JP5148750B2/ja active Active
- 2009-06-03 CN CN2009801230224A patent/CN102067063B/zh active Active
- 2009-06-09 US US12/481,053 patent/US7864537B2/en active Active
Patent Citations (4)
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JPH0372013U (ko) * | 1989-11-17 | 1991-07-22 | ||
KR20030002386A (ko) * | 2001-06-29 | 2003-01-09 | 엘지전선 주식회사 | 히트싱크 결합용 클립 |
JP2006287149A (ja) * | 2005-04-05 | 2006-10-19 | Matsushita Electric Ind Co Ltd | 放熱装置 |
KR100783615B1 (ko) | 2006-06-05 | 2007-12-07 | 잘만테크 주식회사 | 워터블록용 클립 |
Also Published As
Publication number | Publication date |
---|---|
US7864537B2 (en) | 2011-01-04 |
CN102067063B (zh) | 2013-03-06 |
US20090311894A1 (en) | 2009-12-17 |
WO2009154370A3 (ko) | 2010-03-11 |
KR20090131140A (ko) | 2009-12-28 |
JP2011526708A (ja) | 2011-10-13 |
WO2009154370A2 (ko) | 2009-12-23 |
CN102067063A (zh) | 2011-05-18 |
JP5148750B2 (ja) | 2013-02-20 |
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