KR100951915B1 - 플라즈마 에칭을 이용한 마이크로-나노 패턴의 제작 방법 - Google Patents
플라즈마 에칭을 이용한 마이크로-나노 패턴의 제작 방법 Download PDFInfo
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- KR100951915B1 KR100951915B1 KR1020080067082A KR20080067082A KR100951915B1 KR 100951915 B1 KR100951915 B1 KR 100951915B1 KR 1020080067082 A KR1020080067082 A KR 1020080067082A KR 20080067082 A KR20080067082 A KR 20080067082A KR 100951915 B1 KR100951915 B1 KR 100951915B1
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 24
- 238000001020 plasma etching Methods 0.000 title claims abstract description 24
- 238000000034 method Methods 0.000 title claims description 27
- 239000000758 substrate Substances 0.000 claims abstract description 56
- 229920000642 polymer Polymers 0.000 claims abstract description 28
- 238000005530 etching Methods 0.000 claims abstract description 7
- 229910052760 oxygen Inorganic materials 0.000 claims description 5
- 238000003825 pressing Methods 0.000 claims description 2
- 239000002114 nanocomposite Substances 0.000 abstract description 5
- 239000000463 material Substances 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 5
- 239000007789 gas Substances 0.000 description 5
- 230000010076 replication Effects 0.000 description 5
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 4
- 239000010408 film Substances 0.000 description 4
- 239000001301 oxygen Substances 0.000 description 4
- TXEYQDLBPFQVAA-UHFFFAOYSA-N tetrafluoromethane Chemical compound FC(F)(F)F TXEYQDLBPFQVAA-UHFFFAOYSA-N 0.000 description 4
- 239000004793 Polystyrene Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000059 patterning Methods 0.000 description 3
- 238000002310 reflectometry Methods 0.000 description 3
- 229920001187 thermosetting polymer Polymers 0.000 description 3
- 239000010409 thin film Substances 0.000 description 3
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 2
- 239000004372 Polyvinyl alcohol Substances 0.000 description 2
- 230000003667 anti-reflective effect Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000009501 film coating Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000001746 injection moulding Methods 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 239000004038 photonic crystal Substances 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 229920002223 polystyrene Polymers 0.000 description 2
- 229920002451 polyvinyl alcohol Polymers 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- 240000002853 Nelumbo nucifera Species 0.000 description 1
- 235000006508 Nelumbo nucifera Nutrition 0.000 description 1
- 235000006510 Nelumbo pentapetala Nutrition 0.000 description 1
- 229920001400 block copolymer Polymers 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000609 electron-beam lithography Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000004313 glare Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000000025 interference lithography Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 238000007734 materials engineering Methods 0.000 description 1
- 230000003278 mimic effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000054 nanosphere lithography Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 229920002635 polyurethane Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000000820 replica moulding Methods 0.000 description 1
- 238000001338 self-assembly Methods 0.000 description 1
- 238000002174 soft lithography Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0015—Production of aperture devices, microporous systems or stamps
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
- Surface Treatment Of Optical Elements (AREA)
- Micromachines (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
Abstract
Description
Claims (8)
- 기판을 준비하는 단계;상기 기판 상에 레지스트층을 도포하는 단계;상기 기판상에 마이크로 패턴을 형성하는 단계;상기 기판 상에 폴리머층을 형성하는 단계; 및상기 폴리머층을 플라즈마 에칭하여 나노 패턴을 형성하는 단계;를 포함하는 마이크로-나노 패턴의 제작 방법.
- 제1항에 있어서,상기 마이크로 패턴을 형성하는 단계는, 상기 레지스트층을 노광하고, 에칭하는 단계를 포함하는 마이크로-나노 패턴의 제작 방법.
- 제1항에 있어서,상기 기판은 투명 기판인 마이크로 나노 패턴의 제작 방법.
- 제1항에 있어서,상기 기판은 빛을 굴절시키는 비평면 렌즈인 마이크로 나노 패턴의 제작 방법.
- 제1항에 있어서,상기 나노 패턴은 300nm 이하의 피치를 갖는 마이크로-나노 패턴의 제작 방법.
- 제1항에 있어서,상기 나노 패턴을 형성하는 단계에 있어서, 상기 플라즈마를 형성하기 위한 플라즈마 형성 가스는 O2, CF4, CHF3, SF6, H2, Ar로 이루어진 군에서 선택되는 어느 하나 이상을 포함하는 마이크로-나노 패턴의 제작 방법.
- 제1항에 있어서,상기 마이크로 패턴과 상기 나노 패턴 상에 폴리머를 덮어서 몰드를 제작하는 단계를 더 포함하는 마이크로-나노 패턴 제작 방법.
- 제7항에 있어서,복제 기판에 복제 레지스트층을 형성하는 단계;상기 몰드로 상기 복제 레지스트층에 눌러서 패턴을 형성하는 단계; 및상기 복제 레지스트층을 경화시키는 단계;를 더 포함하는 마이크로-나노 패턴 제작 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080067082A KR100951915B1 (ko) | 2008-07-10 | 2008-07-10 | 플라즈마 에칭을 이용한 마이크로-나노 패턴의 제작 방법 |
Applications Claiming Priority (1)
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KR1020080067082A KR100951915B1 (ko) | 2008-07-10 | 2008-07-10 | 플라즈마 에칭을 이용한 마이크로-나노 패턴의 제작 방법 |
Publications (2)
Publication Number | Publication Date |
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KR20100006748A KR20100006748A (ko) | 2010-01-21 |
KR100951915B1 true KR100951915B1 (ko) | 2010-04-09 |
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KR1020080067082A Active KR100951915B1 (ko) | 2008-07-10 | 2008-07-10 | 플라즈마 에칭을 이용한 마이크로-나노 패턴의 제작 방법 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101250450B1 (ko) | 2010-07-30 | 2013-04-08 | 광주과학기술원 | 마이크로 나노 조합구조의 제조방법 및 마이크로 나노 조합구조가 집적된 광소자의 제조방법 |
KR101385976B1 (ko) | 2012-08-30 | 2014-04-16 | 한국전기연구원 | 나노-마이크로 복합 패턴 형성을 위한 몰드의 제조 방법 |
US10451772B2 (en) | 2015-02-05 | 2019-10-22 | Samsung Electronics, Co., Ltd. | Manufacturing device of anti-reflecting structure and manufacturing method for the anti-reflecting structure using thereof |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5823958B2 (ja) | 2009-06-02 | 2015-11-25 | スリーエム イノベイティブ プロパティズ カンパニー | 光再偏向フィルム及び該フィルムを使用したディスプレイ |
WO2011028373A1 (en) | 2009-08-25 | 2011-03-10 | 3M Innovative Properties Company | Light redirecting film and display system incorporating same |
EP2567269A1 (en) | 2010-05-07 | 2013-03-13 | 3M Innovative Properties Company | Antireflective films comprising microstructured surface |
SG190280A1 (en) * | 2010-12-01 | 2013-06-28 | 3M Innovative Properties Co | Microstructured articles comprising nanostructures and method |
CN106784221B (zh) * | 2016-12-23 | 2019-06-18 | 华南理工大学 | 一种基于表面等离子体效应的宽带高效GaN基LED芯片及其制备方法 |
KR102297890B1 (ko) * | 2018-11-01 | 2021-09-06 | 한국핵융합에너지연구원 | 플라즈마 기반 나노구조물 형성방법 |
KR102815066B1 (ko) * | 2019-07-31 | 2025-05-30 | 한국전기연구원 | 나노-마이크로 복합 패턴을 갖는 데코 필름 및 제작 방법 |
Citations (4)
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KR100663263B1 (ko) | 2005-08-17 | 2007-01-02 | 삼성전기주식회사 | 임프린트 몰드의 이형처리방법 및 이에 의해 형성된 배선기판 |
JP2007266384A (ja) | 2006-03-29 | 2007-10-11 | Toppan Printing Co Ltd | インプリント用モールド及びその製造方法 |
KR100881233B1 (ko) | 2007-05-23 | 2009-02-05 | 한국기계연구원 | 임프린트 리소그래피용 스탬프 및 이를 이용한 임프린트리소그래피방법 |
KR20090058729A (ko) * | 2007-12-05 | 2009-06-10 | 한국전자통신연구원 | 하이브리드 마이크로 렌즈 어레이 및 그 제조 방법 |
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- 2008-07-10 KR KR1020080067082A patent/KR100951915B1/ko active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100663263B1 (ko) | 2005-08-17 | 2007-01-02 | 삼성전기주식회사 | 임프린트 몰드의 이형처리방법 및 이에 의해 형성된 배선기판 |
JP2007266384A (ja) | 2006-03-29 | 2007-10-11 | Toppan Printing Co Ltd | インプリント用モールド及びその製造方法 |
KR100881233B1 (ko) | 2007-05-23 | 2009-02-05 | 한국기계연구원 | 임프린트 리소그래피용 스탬프 및 이를 이용한 임프린트리소그래피방법 |
KR20090058729A (ko) * | 2007-12-05 | 2009-06-10 | 한국전자통신연구원 | 하이브리드 마이크로 렌즈 어레이 및 그 제조 방법 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101250450B1 (ko) | 2010-07-30 | 2013-04-08 | 광주과학기술원 | 마이크로 나노 조합구조의 제조방법 및 마이크로 나노 조합구조가 집적된 광소자의 제조방법 |
KR101385976B1 (ko) | 2012-08-30 | 2014-04-16 | 한국전기연구원 | 나노-마이크로 복합 패턴 형성을 위한 몰드의 제조 방법 |
US10451772B2 (en) | 2015-02-05 | 2019-10-22 | Samsung Electronics, Co., Ltd. | Manufacturing device of anti-reflecting structure and manufacturing method for the anti-reflecting structure using thereof |
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KR20100006748A (ko) | 2010-01-21 |
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