KR100942474B1 - 스펙트럼 분석에 기초한 연속 데이터 지터 측정 장치 및 방법 - Google Patents
스펙트럼 분석에 기초한 연속 데이터 지터 측정 장치 및 방법 Download PDFInfo
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- KR100942474B1 KR100942474B1 KR1020020032572A KR20020032572A KR100942474B1 KR 100942474 B1 KR100942474 B1 KR 100942474B1 KR 1020020032572 A KR1020020032572 A KR 1020020032572A KR 20020032572 A KR20020032572 A KR 20020032572A KR 100942474 B1 KR100942474 B1 KR 100942474B1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31708—Analysis of signal quality
- G01R31/3171—BER [Bit Error Rate] test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
- G01R23/20—Measurement of non-linear distortion
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
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Abstract
Description
Claims (13)
- 삭제
- 주기적인 반복 패턴과 기지의 길이를 갖는 연속 데이터 신호(serial data signal)에서 확정 지터(DJ)와 랜덤 지터(RJ)를 측정하는 방법으로서,a) 상기 연속 데이터 신호의 시간 간격 오차(Time Interval Error)(TIE)를 측정하는 단계,b) 보간을 이용하여 상기 연속 데이터 신호 내에서 과도기(transition)가 발생하지 않는 위치의 데이터 포인트(data point)를 추정하는 단계,c) 고속 푸리에 변환(Fast Fourier Transform)(FFT)을 행하여 전체 지터의 스펙트럼을 얻도록 상기 시간 간격 오차에서 제1 창 함수(first window function)를 이용하는 단계,d) 슬라이딩 창(sliding window)을 적용하는 단계,e) 상기 전체 지터의 스펙트럼에서 임펄스를 찾는 단계,f) 상기 슬라이딩 창 내의 상기 전체 지터 스펙트럼의 일부에 대하여 주파수 영역 히스토그램을 생성하는 단계,g) 상기 전체 지터 스펙트럼의 상기 주파수 영역 히스토그램의 상기 RJ 성분의 양을 추정하는 단계, 그리고h) 상기 주파수 영역 히스토그램의 임펄스로부터 상기 DJ의 양을 계산하는 단계를 포함하는 방법.
- 제2항에서,i) 상기 슬라이딩 창을 상기 전체 지터 내의 다른 위치로 이동시키는 단계, 그리고j) 완료시까지 상기 d) 내지 h) 단계를 반복하는 단계를 더 포함하는 방법.
- 제3항에서,k) 상기 주파수 영역 히스토그램에서 유도한 상기 RJ 성분의 RMS 값을 계산함으로써 표준 편차 파라미터를 계산하는 단계를 더 포함하는 방법.
- 제4항에서,l) 상기 전체 지터 스펙트럼에서 ISI 및 DCD에 기인한 임펄스의 위치에 기초하여 DJ 성분으로부터 ISI 및 DCD 지터를 분리시키는 단계를 더 포함하는 방법.
- 제5항에서,ISI 및 DCD 성분에 기인한 상기 임펄스는 0.5/N의 배수로 나타나며, 상기 N은 상기 연속 데이터 신호의 상기 반복 패턴에서의 심볼(symbol) 수인 방법.
- 제6항에서,m) RJ, ISI 및 DCD에 기여 가능한 상기 지터 스펙트럼 부분을 제거하는 단계, 그리고n) 역 FFT를 행하여, 시간열(time train)의 피크간 값인 PJ(Periodic Jitter) 성분을 시간 영역에서 복원하는 단계를 더 포함하는 방법.
- 제7항에서,o) 역 FFT를 행하여 시간 영역 기록에서 상기 ISI 및 상기 DCD를 복원하도록 단계,p) 상기 시간 영역 기록을 하나는 상승 에지에 관한 정보만을 포함하고 나머지 하나는 하강 에지에 관한 정보만을 포함하도록 2개의 기록으로 분리하는 단계,q) 상기 2개의 기록 각각에 히스토그램을 수행하는 단계,r) 상기 2개의 히스토그램의 평균값 차이를 계산하여 상기 DCD 성분을 얻는 단계, 그리고s) 상기 2개의 히스토그램의 피크간 값의 평균을 계산하여 상기 ISI 성분을 얻는 단계를 포함하는 방법.
- 제7항에서,상기 DJ 성분의 양을 계산하는 단계는,t) 상기 ISI, 상기 DCD, 및 상기 PJ 성분을 포함하는 상기 주파수 영역 스펙트럼에서 역 FFT를 행하는 단계, 그리고u) 상기 역 FET를 행한 것으로부터 상기 DJ 성분의 시간 영역 히스토그램을 계산하는 단계를 포함하는 방법.
- 제9항에서,v) 상기 표준 편차 파라미터을 이용하는 가우스 모델에 기초하여 상기 RJ 성분의 시간 영역 히스토그램을 계산하는 단계, 그리고w) 상기 DJ 및 상기 RJ 성분의 상기 히스토그램을 컨벌루션하여 전체 지터의 히스토그램을 얻는 단계를 더 포함하는 방법.
- 제9항에서,x) 전체 지터의 상기 히스토그램을 적분하여, 상보적인 누적 분포 함수가 되는 욕조 곡선(bathtub curve)을 생성하는 단계, 그리고y) 상기 욕조 곡선에 기초하여 소정의 비트 오차율에 대한 아이 오프닝(eye opening)을 추정하는 단계를 더 포함하는 방법.
- 주기적인 반복 패턴과 알고 있는 길이를 갖는 연속 데이터 신호에서 확정 지터(DJ)와 랜덤 지터(RJ)를 측정하는 방법으로서,a) 상기 연속 데이터 신호의 시간 간격 오차(time interval error)(TIE)를 측정하는 단계,b) 보간을 이용하여 과도기가 없는 상기 신호에서의 위치에서 데이터 포인트를 추정하는 단계,c) 상기 TIE에서 빠른 푸리에 변환(Fast Fourier Transform)(FFT)을 행하여 전체 지터의 스펙트럼을 얻는 단계, 그리고d) 스펙트럼 피크를 분리시키는 단계를 포함하는 방법.
- 제12항에서,상기 d) 단계는,e) 상기 전체 지터 스펙트럼에서 주파수 영역 히스토그램을 생성하는 단계,f) 상기 전체 지터 스펙트럼의 상기 주파수 영역 히스토그램으로부터 상기 RJ 성분의 양을 추정하는 단계, 그리고g) 상기 주파수 영역 히스토그램의 임펄스로부터 상기 DJ 성분의 양을 계산하는 단계를 포함하는 방법.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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US29858201P | 2001-06-15 | 2001-06-15 | |
US60/298,582 | 2001-06-15 | ||
US10/150,558 | 2002-05-16 | ||
US10/150,558 US6832172B2 (en) | 2001-06-15 | 2002-05-16 | Apparatus and method for spectrum analysis-based serial data jitter measurement |
Publications (2)
Publication Number | Publication Date |
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KR20020096895A KR20020096895A (ko) | 2002-12-31 |
KR100942474B1 true KR100942474B1 (ko) | 2010-02-12 |
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KR1020020032572A Expired - Lifetime KR100942474B1 (ko) | 2001-06-15 | 2002-06-11 | 스펙트럼 분석에 기초한 연속 데이터 지터 측정 장치 및 방법 |
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US (1) | US6832172B2 (ko) |
EP (1) | EP1267172B1 (ko) |
JP (1) | JP4204806B2 (ko) |
KR (1) | KR100942474B1 (ko) |
CN (1) | CN1314215C (ko) |
DE (1) | DE60215722T2 (ko) |
SG (1) | SG100794A1 (ko) |
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CN111781564B (zh) * | 2020-06-12 | 2022-11-18 | 中国船舶重工集团公司第七二四研究所 | 一种抖动信号脉冲序列快速预判方法 |
CN114055515B (zh) * | 2020-07-31 | 2023-07-07 | 配天机器人技术有限公司 | 一种抖动分析方法与系统 |
EP4030319A1 (en) | 2021-01-13 | 2022-07-20 | Rohde & Schwarz GmbH & Co. KG | Signal interpolation method and measurement instrument |
WO2024233410A1 (en) * | 2023-05-05 | 2024-11-14 | Tektronix, Inc. | Method for separating and modeling n-ui jitter based on spectrum |
CN119780817A (zh) * | 2024-12-30 | 2025-04-08 | 电子科技大学 | 数字示波器中时域、频域、统计域结合的抖动测量方法 |
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- 2002-06-11 KR KR1020020032572A patent/KR100942474B1/ko not_active Expired - Lifetime
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KR19990002758A (ko) * | 1997-06-23 | 1999-01-15 | 윤종용 | 펄스성 신호의 지터 측정장치 및 방법 |
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KR20020096895A (ko) | 2002-12-31 |
EP1267172B1 (en) | 2006-11-02 |
SG100794A1 (en) | 2003-12-26 |
JP2003057280A (ja) | 2003-02-26 |
US6832172B2 (en) | 2004-12-14 |
DE60215722T2 (de) | 2007-09-06 |
CN1392697A (zh) | 2003-01-22 |
EP1267172A3 (en) | 2003-09-10 |
US20030004664A1 (en) | 2003-01-02 |
DE60215722D1 (de) | 2006-12-14 |
EP1267172A2 (en) | 2002-12-18 |
JP4204806B2 (ja) | 2009-01-07 |
CN1314215C (zh) | 2007-05-02 |
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