KR100937721B1 - Wss를 이용한 반도체 패키지 제조 방법 - Google Patents
Wss를 이용한 반도체 패키지 제조 방법 Download PDFInfo
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- KR100937721B1 KR100937721B1 KR1020080028754A KR20080028754A KR100937721B1 KR 100937721 B1 KR100937721 B1 KR 100937721B1 KR 1020080028754 A KR1020080028754 A KR 1020080028754A KR 20080028754 A KR20080028754 A KR 20080028754A KR 100937721 B1 KR100937721 B1 KR 100937721B1
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- wafer
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 64
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 26
- 235000012431 wafers Nutrition 0.000 claims abstract description 149
- 238000000034 method Methods 0.000 claims abstract description 37
- 238000000059 patterning Methods 0.000 claims abstract description 25
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 19
- 239000010703 silicon Substances 0.000 claims abstract description 19
- 239000011521 glass Substances 0.000 claims abstract description 10
- 238000005538 encapsulation Methods 0.000 claims abstract description 5
- 230000000149 penetrating effect Effects 0.000 claims abstract description 5
- 238000007789 sealing Methods 0.000 claims abstract description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 18
- 238000010030 laminating Methods 0.000 claims description 8
- 229910000679 solder Inorganic materials 0.000 claims description 4
- 238000003486 chemical etching Methods 0.000 claims description 3
- 230000006870 function Effects 0.000 abstract description 12
- 239000011805 ball Substances 0.000 description 4
- 238000000018 DNA microarray Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 150000001875 compounds Chemical class 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000465 moulding Methods 0.000 description 2
- 238000007747 plating Methods 0.000 description 2
- 241000724291 Tobacco streak virus Species 0.000 description 1
- 210000004556 brain Anatomy 0.000 description 1
- 239000011231 conductive filler Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000008393 encapsulating agent Substances 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000011806 microball Substances 0.000 description 1
- 210000005036 nerve Anatomy 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000015541 sensory perception of touch Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73265—Layer and wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/153—Connection portion
- H01L2924/1531—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
- H01L2924/15311—Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Dicing (AREA)
- Micromachines (AREA)
Abstract
Description
Claims (7)
- 웨이퍼 형상을 갖는 소정 두께의 웨이퍼 지지수단을 구비하는 단계와;상기 웨이퍼 지지수단의 일면에 웨이퍼의 각 칩 단위 크기보다 작은 다수의 패터닝 홈 또는 홀을 형성하는 단계와;상기 웨이퍼 지지수단의 타면에 복수개의 웨이퍼를 적층 부착시키는 단계와;상기 웨이퍼 지지수단의 각 홈 또는 홀에서부터 상기 복수개의 웨이퍼까지 전도성 비아홀을 관통 형성하는 단계와;상기 각 홈 또는 홀에 원하는 기능의 반도체 칩을 부착하되, 상기 전도성 비아홀과 반도체 칩을 전기적 신호 교환 가능하게 연결시키면서 반도체 칩을 부착하는 단계와;상기 반도체 칩이 부착된 각 홈을 봉지체로 밀봉하는 단계;를 포함하여 이루어지는 것을 특징으로 하는 WSS를 이용한 반도체 패키지 제조 방법.
- 청구항 1에 있어서, 상기 웨이퍼 지지수단은 실리콘 또는 글래스인 것을 특징으로 하는 WSS를 이용한 반도체 패키지 제조 방법.
- 청구항 1 또는 청구항 2에 있어서, 상기 웨이퍼 지지수단의 패터닝 홈 또는 홀은 레이저 가공 또는 화학적 에칭 공정으로 형성된 것을 특징으로 하는 WSS를 이용한 반도체 패키지 제조 방법.
- 청구항 1에 있어서, 상기 웨이퍼 지지수단에 복수개의 웨이퍼를 적층하는 공정은, 웨이퍼 지지수단의 타면상에 상기 웨이퍼를 접착시키는 과정과 이를 백그라인딩 또는 스마트 컷(smartcut)을 이용하여 웨이퍼를 얇게 가공하는 과정으로 진행되는 것을 특징으로 하는 WSS를 이용한 반도체 패키지 제조 방법.
- 청구항 1에 있어서, 상기 웨이퍼 지지수단에 복수개의 웨이퍼를 적층하는 공정은, 벌크 상태의 실리콘체 저면에 백그라인딩된 웨이퍼를 접착시키는 과정과, 웨이퍼 지지수단의 타면상에 상기 웨이퍼가 접착된 벌크 상태의 실리콘체를 로딩하는 과정과, 벌크 상태의 실리콘체 저면에 접착된 웨이퍼를 웨이퍼 지지수단상에 적층 부착시키는 과정으로 진행되는 것을 특징으로 하는 WSS를 이용한 반도체 패키지 제조 방법.
- 청구항 1에 있어서, 상기 복수개의 웨이퍼중 가장 바깥쪽에 적층된 웨이퍼의 전도성 비아홀에 솔더볼이 융착되는 단계가 더 진행되는 것을 특징으로 하는 WSS를 이용한 반도체 패키지 제조 방법.
- 청구항 1에 있어서, 상기 웨이퍼 지지수단 및 복수개의 웨이퍼의 소잉라인을 따라 소잉 공정이 진행되어, 개개의 반도체 패키지로 분리되는 단계가 더 진행되는 것을 특징으로 하는 WSS를 이용한 반도체 패키지 제조 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080028754A KR100937721B1 (ko) | 2008-03-28 | 2008-03-28 | Wss를 이용한 반도체 패키지 제조 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080028754A KR100937721B1 (ko) | 2008-03-28 | 2008-03-28 | Wss를 이용한 반도체 패키지 제조 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090103261A KR20090103261A (ko) | 2009-10-01 |
KR100937721B1 true KR100937721B1 (ko) | 2010-01-20 |
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KR1020080028754A Active KR100937721B1 (ko) | 2008-03-28 | 2008-03-28 | Wss를 이용한 반도체 패키지 제조 방법 |
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KR (1) | KR100937721B1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR102259959B1 (ko) | 2013-12-05 | 2021-06-04 | 삼성전자주식회사 | 캐리어 및 이를 이용하는 반도체 장치의 제조 방법 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001144037A (ja) | 1999-11-17 | 2001-05-25 | Fujitsu Ltd | 半導体装置の製造方法及び製造装置 |
JP2002231909A (ja) | 2001-01-31 | 2002-08-16 | Canon Inc | 薄膜半導体装置の製造方法 |
JP2005191039A (ja) | 2003-12-24 | 2005-07-14 | Matsushita Electric Ind Co Ltd | 半導体ウェハの処理方法 |
-
2008
- 2008-03-28 KR KR1020080028754A patent/KR100937721B1/ko active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001144037A (ja) | 1999-11-17 | 2001-05-25 | Fujitsu Ltd | 半導体装置の製造方法及び製造装置 |
JP2002231909A (ja) | 2001-01-31 | 2002-08-16 | Canon Inc | 薄膜半導体装置の製造方法 |
JP2005191039A (ja) | 2003-12-24 | 2005-07-14 | Matsushita Electric Ind Co Ltd | 半導体ウェハの処理方法 |
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