KR100874428B1 - 하이브리드 간섭계를 이용한 광섬유 센서 시스템 - Google Patents
하이브리드 간섭계를 이용한 광섬유 센서 시스템 Download PDFInfo
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- KR100874428B1 KR100874428B1 KR1020070045512A KR20070045512A KR100874428B1 KR 100874428 B1 KR100874428 B1 KR 100874428B1 KR 1020070045512 A KR1020070045512 A KR 1020070045512A KR 20070045512 A KR20070045512 A KR 20070045512A KR 100874428 B1 KR100874428 B1 KR 100874428B1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0271—Testing optical properties by measuring geometrical properties or aberrations by using interferometric methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Geometry (AREA)
- Optics & Photonics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
Description
Claims (4)
- 제1광결합부와 제2광결합부가, 사이에 간극이 존재하도록 제1섬유결합부에 의해 결합되어 형성된 제1암부와, 제3광도파로와 제4광도파로가, 사이에 간극이 존재하도록 제2섬유결합부에 의해 결합되어 형성되고, 상기 제3광도파로에는 소정의 위상변조를 위한 동기신호를 이용하여 위상변조를 수행하는 제1위상변조부가 구비되고, 상기 제4광도파로에는 물리량 측정을 위한 센서에 연결되어 센서에 가해진 물리량에 따라 따라 위상변조를 수행하는 제2위상변조부를 구비한 제2암부를 구비한 하이브리드 간섭계부;상기 제1광결합부에 소정의 광신호를 출력하는 광원부;상기 제1광결합부를 통해 입사되어 상기 제1암부의 상기 제1섬유결합부에서 반사된 신호 및 상기 제2암부의 제2섬유결합부에서 반사된 신호가 상기 제1광결합부에서 결합되어 출력되는 신호를 검출하는 제1광검출부;상기 제1광결합부를 통해 입사되어 상기 제1암부 및 상기 제2암부를 거쳐 상기 제2광결합부에서 결합되어 출력되는 신호를 검출하는 제2광검출부; 및상기 제1광검출부에서 검출된 신호에서 제로크로싱이 일어나는 지점을 이용하여 상기 제2광검출부에서 검출된 신호에서 샘플링을 수행하여 상기 제2위상변조부에서 발생되는 신호의 위상 변화를 이용하여 물리량을 연산하는 연산부;를 포함하는 것을 특징으로 하는 하이브리드 간섭계를 이용한 광섬유 센서 시스템.
- 제1항에 있어서, 상기 제1암부는 특정 편광만을 통과시키는 편광조절부를 포함하는 것을 특징으로 하는 하이브리드 간섭계를 이용한 광섬유 센서 시스템.
- 제1항에 있어서, 상기 제2위상변조부는 막대형 압전소자에 의해 형성되는 것을 특징으로 하는 하이브리드 간섭계를 이용한 광섬유 센서 시스템.
- 제1항에 있어서, 상기 제1광도파로, 상기 제2광도파로, 상기 제3광도파로 및 상기 제4광도파로는 광섬유, 폴리머, 리튬나오베이트 또는 리튬탄탈레이트로 구성되는 것을 특징으로 하는 하이브리드 간섭계를 이용한 광섬유 센서 시스템.
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KR1020070045512A KR100874428B1 (ko) | 2007-05-10 | 2007-05-10 | 하이브리드 간섭계를 이용한 광섬유 센서 시스템 |
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KR1020070045512A KR100874428B1 (ko) | 2007-05-10 | 2007-05-10 | 하이브리드 간섭계를 이용한 광섬유 센서 시스템 |
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KR20080099668A KR20080099668A (ko) | 2008-11-13 |
KR100874428B1 true KR100874428B1 (ko) | 2008-12-16 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100982487B1 (ko) | 2008-05-13 | 2010-09-16 | 전북대학교산학협력단 | 더블 패스 마하젠더 간섭계를 이용한 광섬유 센서 시스템 |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101436925B1 (ko) * | 2013-06-27 | 2014-09-03 | 한국과학기술연구원 | 광 파이버를 이용한 센서 장치 |
CN109343173B (zh) * | 2018-12-06 | 2023-08-25 | 安徽问天量子科技股份有限公司 | 一种混合波导集成的干涉仪 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060109476A1 (en) | 2004-11-23 | 2006-05-25 | Lockheed Martin Corporation | Bessel beam interferometer and measurement method |
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- 2007-05-10 KR KR1020070045512A patent/KR100874428B1/ko not_active Expired - Fee Related
Patent Citations (1)
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US20060109476A1 (en) | 2004-11-23 | 2006-05-25 | Lockheed Martin Corporation | Bessel beam interferometer and measurement method |
Non-Patent Citations (3)
Title |
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Journal of optical society of korea vol. 6, no. 4, 1995.12 p365~372 |
한국광학회지 vol.12, no. 4, 2001.8, p300~304 |
한국광학회지 vol.18, no. 2, 2007.4, p105~110 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR100982487B1 (ko) | 2008-05-13 | 2010-09-16 | 전북대학교산학협력단 | 더블 패스 마하젠더 간섭계를 이용한 광섬유 센서 시스템 |
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