KR100833939B1 - 리이드 프레임의 도금 결함 검사 장치 - Google Patents
리이드 프레임의 도금 결함 검사 장치 Download PDFInfo
- Publication number
- KR100833939B1 KR100833939B1 KR1020020019291A KR20020019291A KR100833939B1 KR 100833939 B1 KR100833939 B1 KR 100833939B1 KR 1020020019291 A KR1020020019291 A KR 1020020019291A KR 20020019291 A KR20020019291 A KR 20020019291A KR 100833939 B1 KR100833939 B1 KR 100833939B1
- Authority
- KR
- South Korea
- Prior art keywords
- lead frame
- camera
- plating
- cameras
- frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
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- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
Claims (2)
- 릴(reel)로부터 연속적으로 풀려나와 제공되는 리이드 프레임의 가장자리를 지지하도록 배치된 복수의 가이드 롤러;상기 리이드 프레임의 저면에 배치되어 상기 리이드 프레임의 도금 상태를 촬상하는 것으로서, 3 축 이송이 가능하게 설치된 복수의 카메라; 및,상기 카메라와 상기 리이드 프레임의 저면 사이에 비임 스프리터가 구비되며, 상기 비임 스프리터(beam splitter)는 조명광을 상기 리이드 프레임의 도금면에 반사시킴과 동시에 상기 리이드 프레임의 도금면으로부터 반사된 광을 상기 카메라로 투과시키도록 배치되고상기 복수의 가이드 롤러중 하나를 신장시킬 수 있도록 설치됨으로써 상기 리이드 프레임에 소정의 마킹 작용을 할 수 있는 실린더;를 구비하는 리이드 프레임의 도금 결함 검사 장치.
- 제 1 항에 있어서,상기 리이드 프레임의 이송과 상기 카메라에 의한 촬상을 동기화시키도록 상기 리이드 프레임을 감지하는 레이저 광 센서가 더 구비되는 것을 특징으로 하는 리이드 프레임의 도금 결함 검사 장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020019291A KR100833939B1 (ko) | 2002-04-09 | 2002-04-09 | 리이드 프레임의 도금 결함 검사 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020019291A KR100833939B1 (ko) | 2002-04-09 | 2002-04-09 | 리이드 프레임의 도금 결함 검사 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030080588A KR20030080588A (ko) | 2003-10-17 |
KR100833939B1 true KR100833939B1 (ko) | 2008-05-30 |
Family
ID=32378327
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020019291A Expired - Lifetime KR100833939B1 (ko) | 2002-04-09 | 2002-04-09 | 리이드 프레임의 도금 결함 검사 장치 |
Country Status (1)
Country | Link |
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KR (1) | KR100833939B1 (ko) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110082357A (zh) * | 2019-05-05 | 2019-08-02 | 苏州艾科瑞思智能装备股份有限公司 | 集成电路引线框架缺陷检测装置 |
CN110044903B (zh) * | 2019-05-14 | 2023-12-08 | 宁波鑫爱天沃智能设备有限公司 | 电镀产品在线影像检测设备 |
CN118888484B (zh) * | 2024-08-19 | 2025-06-27 | 鑫祥微电子(南通)有限公司 | 一种用于芯片封装的引线框架、封装设备及封装方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05272945A (ja) * | 1992-03-30 | 1993-10-22 | Toshiba Corp | リードの曲がり検査装置 |
KR980005993A (ko) * | 1997-12-16 | 1998-03-30 | 양승택 | Ic 리드프레임 자동검사 시스템 및 그 운용방법 |
KR19990078662A (ko) * | 1999-07-22 | 1999-11-05 | 김주환 | 리드프레임검사장치 |
KR19990041164U (ko) * | 1998-05-14 | 1999-12-15 | 김영환 | 반도체 제조장비의 리드프레임 검사장치 |
-
2002
- 2002-04-09 KR KR1020020019291A patent/KR100833939B1/ko not_active Expired - Lifetime
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05272945A (ja) * | 1992-03-30 | 1993-10-22 | Toshiba Corp | リードの曲がり検査装置 |
KR980005993A (ko) * | 1997-12-16 | 1998-03-30 | 양승택 | Ic 리드프레임 자동검사 시스템 및 그 운용방법 |
KR19990041164U (ko) * | 1998-05-14 | 1999-12-15 | 김영환 | 반도체 제조장비의 리드프레임 검사장치 |
KR19990078662A (ko) * | 1999-07-22 | 1999-11-05 | 김주환 | 리드프레임검사장치 |
Also Published As
Publication number | Publication date |
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KR20030080588A (ko) | 2003-10-17 |
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