KR100818632B1 - 부밴드 천이 반도체 레이저 - Google Patents
부밴드 천이 반도체 레이저 Download PDFInfo
- Publication number
- KR100818632B1 KR100818632B1 KR1020050067857A KR20050067857A KR100818632B1 KR 100818632 B1 KR100818632 B1 KR 100818632B1 KR 1020050067857 A KR1020050067857 A KR 1020050067857A KR 20050067857 A KR20050067857 A KR 20050067857A KR 100818632 B1 KR100818632 B1 KR 100818632B1
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- carrier
- laser
- transition
- active region
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/3401—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers
- H01S5/3402—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers having no PN junction, e.g. unipolar lasers, intersubband lasers, quantum cascade lasers intersubband lasers, e.g. transitions within the conduction or valence bands
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Semiconductor Lasers (AREA)
- Lasers (AREA)
- Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
Abstract
Description
Claims (12)
- 반도체 기판(10) 상에 형성된 제 1 클래딩층(20), 활성층 및 제 2 클래딩층(60)을 포함하며,상기 활성층은, 캐리어를 증배시키는 증배층(43b)을 포함하는 이득구조층(43) 및 상기 캐리어가 주입되어 레이저 천이가 일어나는 활성영역층(41)으로 이루어진 것을 특징으로 하는 부밴드 천이 반도체 레이저.
- 제 1 항에 있어서, 상기 이득구조층(43) 및 상기 활성영역층(41)의 조합이 반복 적층된 것을 특징으로 하는 부밴드 천이 반도체 레이저.
- 반도체 기판(10) 상에 형성된 제 1 클래딩층(20), 활성층 및 제 2 클래딩층(60)을 포함하며,상기 활성층은, 캐리어를 증배시키는 증배층(43b)을 포함하는 이득구조층(43), 상기 캐리어의 에너지를 이완시키고 활성영역층(41)으로 캐리어를 주입시키는 역할을 하는 캐리어 가이드층(42) 및 상기 캐리어가 주입되어 레이저 천이가 일어나는 활성영역층(41)의 조합으로 이루어진 것을 특징으로 하는 부밴드 천이 반도체 레이저.
- 제 3 항에 있어서, 상기 이득구조층(43), 캐리어 가이드층(42) 및 활성영역층(41)의 조합이 반복 적층된 것을 특징으로 하는 부밴드 천이 반도체 레이저.
- 반도체 기판(10) 상에 형성된 제 1 클래딩층(20), 활성층 및 제 2 클래딩층(60)을 포함하며,상기 활성층은, 캐리어를 증배시키는 증배층(43b)을 포함하는 이득구조층(43), 상기 캐리어의 에너지를 이완시키고 활성영역층(41)으로 캐리어를 주입시키는 역할을 하는 캐리어 가이드층(42), 상기 캐리어가 주입되어 레이저 천이가 일어나는 활성영역층(41) 및 상기 천이된 캐리어의 에너지를 이완시키는 역할을 하는 에너지 이완층(44)의 조합으로 이루어진 것을 특징으로 하는 부밴드 천이 반도체 레이저.
- 제 5 항에 있어서, 상기 이득구조층(43), 캐리어 가이드층(42), 활성영역층(41) 및 캐리어의 에너지 이완층(44)의 조합이 반복 적층된 것을 특징으로 하는 부밴드 천이 반도체 레이저.
- 제 5 항 또는 제 6 항에 있어서, 상기 에너지 이완층(44)은 다중 양자우물 또는 초격자 구조로 이루어진 것을 특징으로 하는 부밴드 천이 레이저 반도체.
- 제 3 항 또는 제 5 항에 있어서, 상기 캐리어 가이드층(42)은 다중 양자우물 또는 초격자 구조로 이루어진 것을 특징으로 하는 부밴드 천이 레이저 반도체.
- 제 1 항, 제 3 항 또는 제 5 항 중 어느 한 항에 있어서, 상기 활성영역층(41)은 다중 양자우물 또는 초격자 구조로 이루어진 것을 특징으로 하는 부밴드 천이 레이저 반도체.
- 제 1 항, 제 3 항 또는 제 5 항 중 어느 한 항에 있어서, 상기 이득구조층(43)은 p-전하층(43c), 상기 캐리어를 증배시키는 증배층(43b) 및 n+ 버퍼층(43a)으로 이루어진 것을 특징으로 하는 부밴드 천이 반도체 레이저.
- 제 1 항, 제 3 항 또는 제 5 항 중 어느 한 항에 있어서, 상기 반도체 기판(10)의 하부에 형성된 제 1 전극(81),상기 반도체 기판(10) 및 상기 활성층 사이에 형성된 제 1 웨이브 가이드층(30),상기 활성층 및 상기 제 2 클래딩층(60) 사이에 형성된 제 2 웨이브 가이드층(50),상기 제 2 클래딩층(60) 상에 형성된 제 2 전극(82)을 더 포함하는 것을 특징으로 하는 부밴드 천이 반도체 레이저.
- 제 1 항, 제 3 항 또는 제 5 항 중 어느 한 항에 있어서, 상기 제 2 클래딩층(60)과 상기 제 2 전극(82) 사이에 오믹 콘택을 향상시키기 위해 형성된 콘택층(70)을 더 포함하는 것을 특징으로 하는 부밴드 천이 반도체 레이저.
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050067857A KR100818632B1 (ko) | 2005-07-26 | 2005-07-26 | 부밴드 천이 반도체 레이저 |
CH01204/06A CH696569A5 (de) | 2005-07-26 | 2006-07-25 | Lawinen-Quanten-Intersubbandübergangs-Halbleiterlaser |
JP2006203693A JP4620007B2 (ja) | 2005-07-26 | 2006-07-26 | アバランシェ量子サブバンド遷移半導体レーザ |
US11/492,920 US20070064757A1 (en) | 2005-07-26 | 2006-07-26 | Avalanche quantum intersubband transition semiconductor laser |
CNB2006101263601A CN100486064C (zh) | 2005-07-26 | 2006-07-26 | 雪崩量子子能带间跃迁半导体激光器 |
GB0614792A GB2428884B (en) | 2005-07-26 | 2006-07-26 | Avalanche quantum intersubband transition semiconductor laser |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020050067857A KR100818632B1 (ko) | 2005-07-26 | 2005-07-26 | 부밴드 천이 반도체 레이저 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20070013503A KR20070013503A (ko) | 2007-01-31 |
KR100818632B1 true KR100818632B1 (ko) | 2008-04-02 |
Family
ID=37006149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020050067857A Expired - Fee Related KR100818632B1 (ko) | 2005-07-26 | 2005-07-26 | 부밴드 천이 반도체 레이저 |
Country Status (6)
Country | Link |
---|---|
US (1) | US20070064757A1 (ko) |
JP (1) | JP4620007B2 (ko) |
KR (1) | KR100818632B1 (ko) |
CN (1) | CN100486064C (ko) |
CH (1) | CH696569A5 (ko) |
GB (1) | GB2428884B (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8358673B2 (en) * | 2011-02-17 | 2013-01-22 | Corning Incorporated | Strain balanced laser diode |
CN110323668B (zh) * | 2019-07-05 | 2020-12-11 | 清华大学 | 一种红外窄带辐射器 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05218591A (ja) * | 1992-01-31 | 1993-08-27 | Furukawa Electric Co Ltd:The | 半導体レーザ素子および半導体受光素子 |
JPH0888440A (ja) * | 1994-09-16 | 1996-04-02 | Nippon Telegr & Teleph Corp <Ntt> | 半導体レーザ装置 |
JP2001144382A (ja) | 1999-09-03 | 2001-05-25 | Univ Tohoku | サブバンド間発光素子 |
JP2005039045A (ja) | 2003-07-14 | 2005-02-10 | Hamamatsu Photonics Kk | 量子カスケードレーザ |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5401952A (en) * | 1991-10-25 | 1995-03-28 | Canon Kabushiki Kaisha | Signal processor having avalanche photodiodes |
US5631664A (en) * | 1992-09-18 | 1997-05-20 | Olympus Optical Co., Ltd. | Display system utilizing electron emission by polarization reversal of ferroelectric material |
US5570386A (en) * | 1994-04-04 | 1996-10-29 | Lucent Technologies Inc. | Semiconductor laser |
US5457709A (en) * | 1994-04-04 | 1995-10-10 | At&T Ipm Corp. | Unipolar semiconductor laser |
US5509025A (en) * | 1994-04-04 | 1996-04-16 | At&T Corp. | Unipolar semiconductor laser |
US5727010A (en) * | 1996-03-20 | 1998-03-10 | Lucent Technologies Inc. | Article comprising an improved quantum cascade laser |
US5745516A (en) * | 1996-11-06 | 1998-04-28 | Lucent Technologies Inc. | Article comprising a unipolar superlattice laser |
US6404791B1 (en) * | 1999-10-07 | 2002-06-11 | Maxion Technologies, Inc. | Parallel cascade quantum well light emitting device |
JP2001308368A (ja) * | 2000-04-26 | 2001-11-02 | Mitsubishi Electric Corp | 光共振器構造素子 |
US6556604B1 (en) * | 2000-11-08 | 2003-04-29 | Lucent Technologies Inc. | Flat minibands with spatially symmetric wavefunctions in intersubband superlattice light emitters |
US6819696B1 (en) * | 2001-09-21 | 2004-11-16 | The United States Of America As Represented By The Secretary Of The Army | Intersubband semiconductor lasers with enhanced subband depopulation rate |
JP4494721B2 (ja) * | 2003-02-13 | 2010-06-30 | 浜松ホトニクス株式会社 | 量子カスケードレーザ |
US7558305B2 (en) * | 2003-12-31 | 2009-07-07 | Wisconsin Alumni Research Foundation | Intersubband mid-infrared electroluminescent semiconductor devices |
-
2005
- 2005-07-26 KR KR1020050067857A patent/KR100818632B1/ko not_active Expired - Fee Related
-
2006
- 2006-07-25 CH CH01204/06A patent/CH696569A5/de not_active IP Right Cessation
- 2006-07-26 GB GB0614792A patent/GB2428884B/en not_active Expired - Fee Related
- 2006-07-26 JP JP2006203693A patent/JP4620007B2/ja not_active Expired - Fee Related
- 2006-07-26 US US11/492,920 patent/US20070064757A1/en not_active Abandoned
- 2006-07-26 CN CNB2006101263601A patent/CN100486064C/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH05218591A (ja) * | 1992-01-31 | 1993-08-27 | Furukawa Electric Co Ltd:The | 半導体レーザ素子および半導体受光素子 |
JPH0888440A (ja) * | 1994-09-16 | 1996-04-02 | Nippon Telegr & Teleph Corp <Ntt> | 半導体レーザ装置 |
JP2001144382A (ja) | 1999-09-03 | 2001-05-25 | Univ Tohoku | サブバンド間発光素子 |
JP2005039045A (ja) | 2003-07-14 | 2005-02-10 | Hamamatsu Photonics Kk | 量子カスケードレーザ |
Also Published As
Publication number | Publication date |
---|---|
CN1921244A (zh) | 2007-02-28 |
KR20070013503A (ko) | 2007-01-31 |
CN100486064C (zh) | 2009-05-06 |
JP4620007B2 (ja) | 2011-01-26 |
GB0614792D0 (en) | 2006-09-06 |
GB2428884A (en) | 2007-02-07 |
JP2007036258A (ja) | 2007-02-08 |
GB2428884B (en) | 2009-12-02 |
US20070064757A1 (en) | 2007-03-22 |
CH696569A5 (de) | 2007-07-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7558305B2 (en) | Intersubband mid-infrared electroluminescent semiconductor devices | |
US8948226B2 (en) | Semiconductor device and method for producing light and laser emission | |
JP5248881B2 (ja) | 量子カスケードレーザ | |
JP2008060396A (ja) | 量子カスケードレーザ | |
US6148012A (en) | Multiple wavelength quantum cascade light source | |
Anders et al. | Electroluminescence of a quantum dot cascade structure | |
KR100842288B1 (ko) | 인터밴드 터널링 부밴드 천이 반도체 레이저 | |
JP2004119814A (ja) | ユニポーラ多重量子井戸デバイスとその製造方法 | |
Cao | Research progress in terahertz quantum cascade lasers | |
KR100818632B1 (ko) | 부밴드 천이 반도체 레이저 | |
Dupont et al. | Demonstration of cascade process in InAs/GaInSb/AlSb mid-infrared light emitting devices | |
Balkan et al. | Tunable wavelength hot electron light emitter | |
US11600969B2 (en) | Quantum cascade laser element | |
Kohler et al. | Quantum cascade lasers emitting at lambda greater than 100 µm | |
BHATTACHARYA | Tunnel injection lasers | |
Kononenko | Dynamical processes in asymmetric quantum well lasers | |
Yakovlev et al. | High-power mid-infrared lasers based on type-II heterostructures with asymmetric band offset confinement | |
Benjamin et al. | Time-resolved phonon-assisted stimulated emission in quantum-well heterostructures | |
Höfling et al. | Low threshold interband cascade lasers | |
Wang et al. | High performance room temperature quantum cascade lasers based on three-phonon-resonance depopulation | |
Gmachl et al. | High power quantum cascade lasers | |
INJECTORS | of electrons and heavy holes through the quasiminibands. 5, 6, 7 This diode was grown by molecular-beam epitaxy on a n+-type GaAs sub | |
Xu et al. | Room-temperature, mid-IR (/spl lambda/= 4.7/spl mu/m) electroluminescence from single-stage intersubband GaAs-based edge emitters | |
Chang-Hasnain et al. | Temperature-dependent behavior of 980 nm strained quantum well lasers | |
Mendez | Novel Electro-Optical Device Structures Based on Quantum Wells |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
A201 | Request for examination | ||
PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
|
D14-X000 | Search report completed |
St.27 status event code: A-1-2-D10-D14-srh-X000 |
|
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
AMND | Amendment | ||
P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
E601 | Decision to refuse application | ||
PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
|
J201 | Request for trial against refusal decision | ||
PJ0201 | Trial against decision of rejection |
St.27 status event code: A-3-3-V10-V11-apl-PJ0201 |
|
AMND | Amendment | ||
P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
PB0901 | Examination by re-examination before a trial |
St.27 status event code: A-6-3-E10-E12-rex-PB0901 |
|
E801 | Decision on dismissal of amendment | ||
B601 | Maintenance of original decision after re-examination before a trial | ||
PB0601 | Maintenance of original decision after re-examination before a trial |
St.27 status event code: N-3-6-B10-B17-rex-PB0601 |
|
J301 | Trial decision |
Free format text: TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20070605 Effective date: 20080222 |
|
PJ1301 | Trial decision |
St.27 status event code: A-3-3-V10-V15-crt-PJ1301 Decision date: 20080222 Appeal event data comment text: Appeal Kind Category : Appeal against decision to decline refusal, Appeal Ground Text : 2005 0067857 Appeal request date: 20070605 Appellate body name: Patent Examination Board Decision authority category: Office appeal board Decision identifier: 2007101006031 |
|
PS0901 | Examination by remand of revocation |
St.27 status event code: A-6-3-E10-E12-rex-PS0901 |
|
S901 | Examination by remand of revocation | ||
GRNO | Decision to grant (after opposition) | ||
PS0701 | Decision of registration after remand of revocation |
St.27 status event code: A-3-4-F10-F13-rex-PS0701 |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
L13-X000 | Limitation or reissue of ip right requested |
St.27 status event code: A-2-3-L10-L13-lim-X000 |
|
U15-X000 | Partial renewal or maintenance fee paid modifying the ip right scope |
St.27 status event code: A-4-4-U10-U15-oth-X000 |
|
FPAY | Annual fee payment |
Payment date: 20130304 Year of fee payment: 6 |
|
PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
FPAY | Annual fee payment |
Payment date: 20140303 Year of fee payment: 7 |
|
PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
FPAY | Annual fee payment |
Payment date: 20150226 Year of fee payment: 8 |
|
PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
LAPS | Lapse due to unpaid annual fee | ||
PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20160327 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20160327 |