KR100812172B1 - 검사 속도와 영역이 증강된 미분간섭현미경 - Google Patents
검사 속도와 영역이 증강된 미분간섭현미경 Download PDFInfo
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- KR100812172B1 KR100812172B1 KR1020070026733A KR20070026733A KR100812172B1 KR 100812172 B1 KR100812172 B1 KR 100812172B1 KR 1020070026733 A KR1020070026733 A KR 1020070026733A KR 20070026733 A KR20070026733 A KR 20070026733A KR 100812172 B1 KR100812172 B1 KR 100812172B1
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- barrel
- illumination
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- microscope
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- 238000007689 inspection Methods 0.000 claims abstract description 33
- 238000005286 illumination Methods 0.000 claims abstract description 25
- 238000006073 displacement reaction Methods 0.000 claims abstract description 21
- 230000004069 differentiation Effects 0.000 claims 1
- 230000010287 polarization Effects 0.000 abstract description 8
- 238000000386 microscopy Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 1
- 238000007373 indentation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/082—Condensers for incident illumination only
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/362—Mechanical details, e.g. mountings for the camera or image sensor, housings
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- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Microscoopes, Condenser (AREA)
Abstract
Description
Claims (5)
- 경통의 일단에 위치하는 대물렌즈;상기 대물렌즈에 인접하게 상기 경통 안에 마련되는 2중굴절프리즘;상기 2중굴절프리즘의 아래쪽에 위치하게 상기 경통 밖에 마련되는 조명;상기 경통의 축과 상기 조명의 축이 교차하는 위치하는 지점에 상기 경통 안에 마련되는 하프미러;상기 하프미러의 아래쪽에 위치하게 상기 경통 안에 마련되는 에널라이저;상기 하프미러와 상기 조명 사이에 위치하게 상기 경통 밖에 마련되는 편광필터;상기 조명의 반대편에 위치하게 상기 경통 밖에 마련되며, 최초 및 최종 상대변위 값에 따라 현미경의 피검사체쪽으로의 수직 이동을 제어하기 위한 레이저변위센서; 및상기 경통의 타단에 위치하는 검사카메라를 포함하는 것을 특징으로 하는 검사 속도와 영역이 증강된 미분간섭현미경.
- 제1항에 있어서, 상기 레이저변위센서는 검사 진행 방향으로 상기 경통의 앞쪽 상기 대물렌즈와 인접한 위치에 마련되는 것을 특징으로 하는 미분간섭현미경.
- 제1항 또는 제2항에 있어서, 상기 검사카메라는 라인 카메라인 것을 특징으로 하는 미분간섭현미경.
- 제3항에 있어서, 상기 2중굴절프리즘은 상기 경통의 바깥쪽에 마련되는 조절 모터에 의해 각도가 조절되는 것을 특징으로 하는 미분간섭현미경.
- 제1항에 있어서, 상기 조명은 초고휘도 엘이디(LED)와 집광렌즈계로 구성되는 것을 특징으로 하는 미분간섭현미경.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070026733A KR100812172B1 (ko) | 2007-03-19 | 2007-03-19 | 검사 속도와 영역이 증강된 미분간섭현미경 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070026733A KR100812172B1 (ko) | 2007-03-19 | 2007-03-19 | 검사 속도와 영역이 증강된 미분간섭현미경 |
Publications (1)
Publication Number | Publication Date |
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KR100812172B1 true KR100812172B1 (ko) | 2008-03-12 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020070026733A Active KR100812172B1 (ko) | 2007-03-19 | 2007-03-19 | 검사 속도와 영역이 증강된 미분간섭현미경 |
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KR (1) | KR100812172B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101000047B1 (ko) * | 2008-04-18 | 2010-12-09 | 주식회사 미르기술 | 비전 검사 시스템 |
CN108897153A (zh) * | 2018-08-10 | 2018-11-27 | 宁波舜宇仪器有限公司 | 液晶面板导电粒子自动视觉检测装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20070023354A (ko) * | 2005-08-24 | 2007-02-28 | 전북대학교산학협력단 | 미분간섭효과 현미경 기술과 전반사형광 현미경 기술을결합하여 이용한 세포 내 단일 분자의 검출 방법 및 그장치 |
-
2007
- 2007-03-19 KR KR1020070026733A patent/KR100812172B1/ko active Active
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20070023354A (ko) * | 2005-08-24 | 2007-02-28 | 전북대학교산학협력단 | 미분간섭효과 현미경 기술과 전반사형광 현미경 기술을결합하여 이용한 세포 내 단일 분자의 검출 방법 및 그장치 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101000047B1 (ko) * | 2008-04-18 | 2010-12-09 | 주식회사 미르기술 | 비전 검사 시스템 |
CN108897153A (zh) * | 2018-08-10 | 2018-11-27 | 宁波舜宇仪器有限公司 | 液晶面板导电粒子自动视觉检测装置 |
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