KR100789364B1 - Cmos 기반 광전 주파수 변환 장치 - Google Patents
Cmos 기반 광전 주파수 변환 장치 Download PDFInfo
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- KR100789364B1 KR100789364B1 KR1020060074024A KR20060074024A KR100789364B1 KR 100789364 B1 KR100789364 B1 KR 100789364B1 KR 1020060074024 A KR1020060074024 A KR 1020060074024A KR 20060074024 A KR20060074024 A KR 20060074024A KR 100789364 B1 KR100789364 B1 KR 100789364B1
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/25—Arrangements specific to fibre transmission
- H04B10/2575—Radio-over-fibre, e.g. radio frequency signal modulated onto an optical carrier
- H04B10/25752—Optical arrangements for wireless networks
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/02—Manufacture or treatment characterised by using material-based technologies
- H10D84/03—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
- H10D84/038—Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
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Abstract
Description
Claims (8)
- CMOS 공정으로 제조되고, 브레이크다운 전압을 동작 전압으로 사용하여, 광 전송 링크를 통해 수신한 광 신호를 검출하며, 국부 발진기로부터의 출력 신호가 인가됨에 따라 상기 검출된 광 신호와 상기 국부 발진기로부터의 출력 신호로부터 주파수 변환된 신호를 출력하는 것을 특징으로 하는 CMOS 기반 광전 주파수 변환 장치.
- CMOS 공정으로 제조되고, 브레이크다운 전압을 동작 전압으로 사용하여, 광 전송 링크를 통해 수신한 광 신호를 검출하며, 국부 발진기로부터의 출력 신호가 인가됨에 따라 상기 검출된 광 신호와 상기 국부 발진기로부터의 출력 신호로부터 주파수 변환된 신호를 출력하는 CMOS 기반 광전 주파수 변환 장치로서,상기 광 전송 링크를 통해 수신되는 광 신호가 조광되는 광 검출기;전압 공급부와 상기 광 검출기의 일단에 접속되어 상기 국부 발진기로부터의 출력 신호가 인가되는 캐소드; 및상기 광 검출기의 타단과 접지단 간에 접속되어 주파수 변환된 신호가 출력되는 애노드;를 포함하는 것을 특징으로 하는 CMOS 기반 광전 주파수 변환 장치.
- 삭제
- CMOS 공정으로 제조되고, 역브레이크다운 전압을 동작 전압으로 사용하여, 광 전송 링크를 통해 수신한 광 신호를 검출하며, 국부 발진기로부터의 출력 신호가 인가됨에 따라 상기 검출된 광 신호와 상기 국부 발진기로부터의 출력 신호로부터 주파수 변환된 신호를 출력하는 것을 특징으로 하는 CMOS 기반 광전 주파수 변환 장치.
- 삭제
- 삭제
- 삭제
- CMOS 공정으로 제조되고, 역브레이크다운 전압을 동작 전압으로 사용하여, 광 전송 링크를 통해 수신한 광 신호를 검출하며, 국부 발진기로부터의 출력 신호가 인가됨에 따라 상기 검출된 광 신호와 상기 국부 발진기로부터의 출력 신호로부터 주파수 변환된 신호를 출력하는 CMOS 기반 광전 주파수 변환 장치로서,상기 광 전송 링크를 통해 수신되는 광 신호가 조광되는 광 검출기;전압 공급부와 상기 광 검출기의 일단에 접속되어 상기 국부 발진기로부터의 출력 신호가 인가되는 캐소드; 및상기 광 검출기의 타단과 접지단 간에 접속되어 주파수 변환된 신호가 출력되는 애노드;를 포함하는 것을 특징으로 하는 CMOS 기반 광전 주파수 변환 장치.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR101252727B1 (ko) | 2011-10-05 | 2013-04-10 | 연세대학교 산학협력단 | 광전 주파수 변환 장치 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20000023236A (ko) * | 1998-09-18 | 2000-04-25 | 추후제출 | 개선된 광검출기, 및 상기 광검출기를 사용하여 광 신호를전기 신호로 변환하기 위한 장치 |
KR20010050422A (ko) * | 1999-09-13 | 2001-06-15 | 니시무로 타이죠 | 무선통신시스템 |
JP2003234959A (ja) | 2002-02-06 | 2003-08-22 | Fujitsu Ltd | Cmosイメージセンサ |
WO2004019609A2 (en) * | 2002-08-23 | 2004-03-04 | Micron Technology, Inc. | A cmos aps with stacked avalanche multiplication layer and low voltage readout electronics |
KR100680012B1 (ko) | 2006-03-22 | 2007-02-09 | 연세대학교 산학협력단 | 광 검출 트랜지스터를 구비한 rof 시스템 |
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Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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KR20000023236A (ko) * | 1998-09-18 | 2000-04-25 | 추후제출 | 개선된 광검출기, 및 상기 광검출기를 사용하여 광 신호를전기 신호로 변환하기 위한 장치 |
KR20010050422A (ko) * | 1999-09-13 | 2001-06-15 | 니시무로 타이죠 | 무선통신시스템 |
JP2003234959A (ja) | 2002-02-06 | 2003-08-22 | Fujitsu Ltd | Cmosイメージセンサ |
WO2004019609A2 (en) * | 2002-08-23 | 2004-03-04 | Micron Technology, Inc. | A cmos aps with stacked avalanche multiplication layer and low voltage readout electronics |
WO2004019609A3 (en) | 2002-08-23 | 2004-05-13 | Micron Technology Inc | A cmos aps with stacked avalanche multiplication layer and low voltage readout electronics |
KR100680012B1 (ko) | 2006-03-22 | 2007-02-09 | 연세대학교 산학협력단 | 광 검출 트랜지스터를 구비한 rof 시스템 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101252727B1 (ko) | 2011-10-05 | 2013-04-10 | 연세대학교 산학협력단 | 광전 주파수 변환 장치 |
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