KR100788858B1 - 집적 회로 패키지의 구조물 및 어셈블리 방법 - Google Patents
집적 회로 패키지의 구조물 및 어셈블리 방법 Download PDFInfo
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- KR100788858B1 KR100788858B1 KR1020060025286A KR20060025286A KR100788858B1 KR 100788858 B1 KR100788858 B1 KR 100788858B1 KR 1020060025286 A KR1020060025286 A KR 1020060025286A KR 20060025286 A KR20060025286 A KR 20060025286A KR 100788858 B1 KR100788858 B1 KR 100788858B1
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- conductive
- substrate
- packaging
- die
- conductive structure
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Abstract
Description
Claims (48)
- 적어도 하나의 도전성 구조체를 포함하는 기판;다이 접착 재료(die-attach material)에 의해 상기 기판 상에 고정된 다이;표면에 절연 재료가 형성되어 있고, 상기 다이와 상기 기판의 도전성 구조체 사이에 전기적으로 연결된 복수의 도전성 와이어;상기 도전성 와이어 사이에 형성된 도전성 충진 재료(conductively filled material); 및상기 기판의 도전성 구조체와 상기 도전성 충진 재료의 사이와, 상기 도전성 충진 재료와 상기 다이의 사이에, 각각 형성된 절연층을 포함하는 패키징 구조물.
- 제1항에 있어서,상기 도전성 충진 재료에 전기적으로 연결된 접지 구조체(ground structure)를 더 포함하는 패키징 구조물.
- 제1항에 있어서,상기 도전성 구조체가,상기 기판의 일 표면 상에 형성된 적어도 하나의 패드를 가진 제1 도전성 구조체와,상기 기판의 다른 표면 상에 형성된 제2 도전성 구조체와,상기 기판에 형성되어 상기 제1 도전성 구조체와 상기 제2 도전성 구조체의 사이에 연결된 연결 구조체(connective structure)를 포함하여 이루어지는 것을 특징으로 하는 패키징 구조물.
- 제3항에 있어서,상기 기판이 복수의 도전성 비아홀(via)를 포함하고,상기 연결 구조체는 상기 비아홀 내에 형성되어 있고, 상기 제1 도전성 구조체는 상기 도전성 비아홀 옆에 형성되어 있는 것을 특징으로 하는 패키징 구조물.
- 제3항에 있어서,상기 제1 도전성 구조체가 적어도 하나의 패드로 구성되는 것을 특징으로 하는 패키징 구조물.
- 제4항에 있어서,상기 제2 도전성 구조체가 상기 도전성 비아홀 옆에 형성된 복수의 솔더 볼(solder ball)을 포함하는 것을 특징으로 하는 패키징 구조물.
- 제4항에 있어서,상기 제2 구조체가 상기 도전성 비아홀를 덮는 것을 특징으로 하는 패키징 구조물.
- 제1항에 있어서,상기 도전성 충진 재료가 고체 재료, 액체 재료, 콜로이드 재료, 및 상 변환 재료(phase change material)로 구성되는 군으로부터 선택되는 것인 것을 특징으로 하는 패키징 구조물.
- 제1항에 있어서,상기 기판 상에 형성된 절연 구조체를 더 포함하는 패키징 구조물.
- 제9항에 있어서,상기 절연 구조체 상에 형성된 커버 구조체(cover structure)를 더 포함하는 패키징 구조물.
- 적어도 하나의 도전성 구조체 및 접지 구조체를 포함하는 기판;다이 접착 재료에 의해 상기 기판 상에 고정된 다이;표면에 절연 재료가 형성되어 있고, 상기 다이와 상기 기판의 도전성 구조체 사이에 전기적으로 연결되어 있는 복수의 도전성 와이어; 및상기 도전성 와이어 사이에 형성되어 상기 도전성 충진 재료에 전기적으로 연결된 도전성 충진 재료를 포함하는 패키징 구조물.
- 제11항에 있어서,상기 접지 구조체가 상기 기판에 형성된 접지 개구(ground opening)를 포함하는 것을 특징으로 하는 패키징 구조물.
- 제11항에 있어서,상기 도전성 구조체가,상기 기판의 일 표면 상에 형성된 적어도 하나의 패드를 가진 제1 도전성 구조체와,상기 기판의 다른 표면 상에 형성된 제2 도전성 구조체와,상기 기판에 형성되어 상기 제1 도전성 구조체와 상기 제2 도전성 구조체의 사이에 연결된 연결 구조체를 포함하는 것을 특징으로 하는 패키징 구조물.
- 제13항에 있어서,상기 기판이 복수의 도전성 비아홀(via)를 포함하고,상기 연결 구조체는 상기 비아홀 내에 형성되어 있고, 상기 제1 도전성 구조체는 상기 도전성 비아홀 옆에 형성되어 있는 것을 특징으로 하는 패키징 구조물.
- 제13항에 있어서,상기 제1 도전성 구조체가 적어도 하나의 패드로 구성되어 있는 것을 특징으로 하는 패키징 구조물.
- 제14항에 있어서,상기 제2 도전성 구조체가 상기 도전성 비아홀 옆에 형성되어 있는 복수의 솔더 볼을 포함하는 것을 특징으로 하는 패키징 구조물.
- 제14항에 있어서,상기 제2 구조체가 상기 도전성 비아홀를 덮는 것을 특징으로 하는 패키징 구조물.
- 제11항에 있어서,상기 다이 접착 재료는 도전성이면서, 또 상기 접지 구조체에 전기적으로 연결되어 있는 것을 특징으로 하는 패키징 구조물.
- 제11항에 있어서,상기 도전성 충진 재료가 고체 재료, 액체 재료, 콜로이드 재료, 및 상 변환 재료로 구성되는 군으로부터 선택되는 것인 것을 특징으로 하는 패키징 구조물.
- 제11항에 있어서,상기 기판 상에 형성된 절연 구조체를 더 포함하는 패키징 구조물.
- 제20항에 있어서,상기 절연 구조체 상에 형성된 커버 구조체를 더 포함하는 패키징 구조물.
- 제13항에 있어서,일단은 상기 패드에 연결되고, 타단은 상기 도전성 충진 재료에 연결되어 있는, 리드 도전체(leading conductor)를 더 포함하는 패키징 구조물.
- 제13항에 있어서,일단은 상기 패드에 연결되고, 타단은 상기 도전성 충진 재료 내에 플로팅(floating)되어 있는, 리드 도전체를 더 포함하는 패키징 구조물.
- 제13항에 있어서,상기 제1 도전성 구조체의 일부가 노출되어 상기 도전성 충진 재료에 연결되어 있는 것을 특징으로 하는 패키징 구조물.
- 제11항에 있어서,일단은 상기 다이의 패드에 연결되고, 타단은 상기 도전성 충진 재료에 연결되어 있는, 리드 도전체를 더 포함하는 패키징 구조물.
- 적어도 하나의 다이와, 절연체가 코팅되어 있는 복수의 도전성 와이어를 가진 패키징 구조물에 적합한 패키징 기판에 있어서,복수의 도전성 비아홀(via) 및 접지 개구를 가진 기판; 및상기 기판에 형성된 도전성 구조체를 포함하고,상기 도전성 와이어가 상기 다이와 상기 기판의 도전성 구조체 사이에 전기적으로 연결되어 있는 것을 특징으로 하는 패키징 기판.
- 제26항에 있어서,상기 도전성 구조체가 핀(pin)을 포함하는 것을 특징으로 하는 패키징 기판.
- 제26항에 있어서,상기 기판에 형성된 접지 구조체를 더 포함하는 패키징 기판.
- 제28항에 있어서,상기 접지 구조체가 상기 기판의 접지 개구 내에 형성되어 있는 것을 특징으로 하는 패키징 기판.
- 제26항에 있어서,상기 도전성 구조체가,상기 기판의 일 표면 상에 형성된 적어도 하나의 패드를 가진 제1 도전성 구조체와,상기 기판의 다른 표면 상에 형성된 제2 도전성 구조체와,상기 기판에 형성되어 상기 제1 도전성 구조체와 상기 제2 도전성 구조체의 사이에 연결된 연결 구조체를 포함하여 이루어지는 것을 특징으로 하는 패키징 기판.
- 제30항에 있어서,상기 패드가 볼 형상을 가지는 것을 특징으로 하는 패키징 기판.
- 제30항에 있어서,상기 제1 도전성 구조체가 상기 도전성 비아홀의 상부에 형성되어 있는 것을 특징으로 하는 패키징 기판.
- 제30항에 있어서,상기 제1 도전성 구조체가 상기 도전성 비아홀 옆에 형성되어 있는 것을 특징으로 하는 패키징 기판.
- 제30항에 있어서,상기 제2 도전성 구조체가 복수의 솔더 볼을 포함하는 것을 특징으로 하는 패키징 기판.
- 제30항에 있어서,상기 제2 도전성 구조체가 상기 도전성 비아홀 하부에 형성되어 있는 것을 특징으로 하는 패키징 기판.
- 제30항에 있어서,상기 제2 도전성 구조체가 상기 도전성 비아홀 옆에 형성되어 있는 것을 특징으로 하는 패키징 기판.
- 적어도 하나의 도전성 구조체를 가진 기판을 제공하는 단계;다이 접착 재료에 의해 상기 기판 상에 다이를 고정시키는 단계;상기 다이와 상기 기판의 도전성 구조체 사이에, 그 표면에 절연 재료가 형성되어 있는 복수의 도전성 와이어를 연결하는 단계;상기 도전성 와이어 사이에 도전성 충진 재료를 형성하는 단계; 및상기 도전성 충진 재료에 전기적으로 연결되고, 상기 다이 접착 재료와 함께 접지에 연결된, 접지 구조체를 형성하는 단계를 포함하는 패키징 방법.
- 삭제
- 제37항에 있어서,상기 접지 구조체가 상기 기판의 접지 개구 내에 형성되는 것을 특징으로 하는 패키징 방법.
- 제37항에 있어서,상기 도전성 구조체와 상기 도전성 충진 재료의 사이와, 상기 도전성 충진 재료와 상기 다이 사이에, 절연층을 형성하는 단계를 더 포함하는 패키징 방법.
- 제37항에 있어서,상기 도전성 충진 재료와 상기 접지 구조체에 연결된 리드 도전체를 형성하는 단계를 더 포함하는 패키징 방법.
- 제37항에 있어서,상기 도전성 구조체가,상기 기판의 일 표면 상에 형성된 적어도 하나의 패드를 가진 제1 도전성 구조체를 형성하는 단계와,상기 기판의 다른 표면 상에 제2 도전성 구조체를 형성하는 단계와,상기 기판의 도전성 비아홀 내에 상기 제1 도전성 구조체와 상기 제2 도전성 구조체의 사이에 연결된 연결 구조체를 형성하는 단계에 의해 형성되는 것을 특징으로 하는 패키징 방법.
- 제42항에 있어서,상기 도전성 비아홀 옆에 상기 제2 도전성 구조체로서 복수의 솔더 볼을 형성하는 단계를 더 포함하는 패키징 방법.
- 제37항에 있어서,상기 도전성 충진 재료의 확산을 제한하기 위해 절연 구조체를 형성하는 단계를 더 포함하는 패키징 방법.
- 제44항에 있어서,상기 절연 구조체 상에 커버 구조체를 형성하는 단계를 더 포함하는 패키징 방법.
- 제42항에 있어서,일단은 상기 패드에 연결되고, 타단이 상기 도전성 충진 재료에 연결되는, 리드 도전체를 형성하는 단계를 더 포함하는 패키징 방법.
- 제42항에 있어서,일단은 상기 패드에 연결되고, 타단은 상기 도전성 충진 재료 내에 플로팅되는, 리드 도전체를 형성하는 단계를 더 포함하는 패키징 방법.
- 제42항에 있어서,상기 제1 도전성 구조체의 일부를 노출시켜 상기 도전성 충진 재료에 연결하는 단계를 더 포함하는 패키징 방법.
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JP5340912B2 (ja) * | 2006-03-23 | 2013-11-13 | 台灣積體電路製造股▲ふん▼有限公司 | 電気的に強化されたワイヤボンドパッケージ |
CN103178032B (zh) * | 2007-07-31 | 2017-06-20 | 英闻萨斯有限公司 | 使用穿透硅通道的半导体封装方法 |
US7893548B2 (en) * | 2008-03-24 | 2011-02-22 | Fairchild Semiconductor Corporation | SiP substrate |
TWI511252B (zh) * | 2013-09-12 | 2015-12-01 | 國立交通大學 | 一種連接結構及其使用方法 |
KR20160099440A (ko) * | 2015-02-12 | 2016-08-22 | 타이완 세미콘덕터 매뉴팩쳐링 컴퍼니 리미티드 | 기판 분리 및 비도핑 채널을 갖는 집적 회로 구조물 |
US9461009B1 (en) * | 2015-05-27 | 2016-10-04 | Freescale Semiconductor, Inc. | Method and apparatus for assembling a semiconductor package |
MY202414A (en) * | 2018-11-28 | 2024-04-27 | Intel Corp | Embedded reference layers fo semiconductor package substrates |
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KR100218635B1 (ko) * | 1996-12-30 | 1999-09-01 | 김규현 | 볼 그리드 어레이 반도체 패키지용 가요성 회로 기판의 다이 플래그 구조 |
WO2003043774A1 (en) * | 2001-11-20 | 2003-05-30 | Microbonds, Inc. | A wire bonder for ball bonding insulated wire and method of using same |
US6855626B2 (en) * | 2001-06-27 | 2005-02-15 | Shinko Electric Industries Co., Ltd. | Wiring substrate having position information |
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US5767447A (en) * | 1995-12-05 | 1998-06-16 | Lucent Technologies Inc. | Electronic device package enclosed by pliant medium laterally confined by a plastic rim member |
US6962829B2 (en) * | 1996-10-31 | 2005-11-08 | Amkor Technology, Inc. | Method of making near chip size integrated circuit package |
KR100309957B1 (ko) * | 1997-09-08 | 2002-08-21 | 신꼬오덴기 고교 가부시키가이샤 | 반도체장치 |
US6084297A (en) * | 1998-09-03 | 2000-07-04 | Micron Technology, Inc. | Cavity ball grid array apparatus |
DE10332009B4 (de) * | 2003-07-14 | 2008-01-31 | Infineon Technologies Ag | Halbleiterbauelement mit elektromagnetischer Abschirmvorrichtung |
US20050110168A1 (en) * | 2003-11-20 | 2005-05-26 | Texas Instruments Incorporated | Low coefficient of thermal expansion (CTE) semiconductor packaging materials |
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KR100218635B1 (ko) * | 1996-12-30 | 1999-09-01 | 김규현 | 볼 그리드 어레이 반도체 패키지용 가요성 회로 기판의 다이 플래그 구조 |
US6855626B2 (en) * | 2001-06-27 | 2005-02-15 | Shinko Electric Industries Co., Ltd. | Wiring substrate having position information |
WO2003043774A1 (en) * | 2001-11-20 | 2003-05-30 | Microbonds, Inc. | A wire bonder for ball bonding insulated wire and method of using same |
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TW200635016A (en) | 2006-10-01 |
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US20060226534A1 (en) | 2006-10-12 |
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