KR100779082B1 - 플라즈마 강화 화학적 기상 증착 장치 및 이를 이용한 나노입자의 제조 방법 - Google Patents
플라즈마 강화 화학적 기상 증착 장치 및 이를 이용한 나노입자의 제조 방법 Download PDFInfo
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- KR100779082B1 KR100779082B1 KR1020060030509A KR20060030509A KR100779082B1 KR 100779082 B1 KR100779082 B1 KR 100779082B1 KR 1020060030509 A KR1020060030509 A KR 1020060030509A KR 20060030509 A KR20060030509 A KR 20060030509A KR 100779082 B1 KR100779082 B1 KR 100779082B1
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- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 title claims abstract description 39
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 10
- 239000002245 particle Substances 0.000 title description 3
- 239000002105 nanoparticle Substances 0.000 claims abstract description 26
- 239000007789 gas Substances 0.000 claims abstract description 21
- 239000012495 reaction gas Substances 0.000 claims abstract description 18
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 13
- 239000002041 carbon nanotube Substances 0.000 claims abstract description 12
- 230000005684 electric field Effects 0.000 claims abstract description 12
- 229910021393 carbon nanotube Inorganic materials 0.000 claims abstract description 11
- 239000000758 substrate Substances 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 12
- 229910052751 metal Inorganic materials 0.000 claims description 11
- 239000002184 metal Substances 0.000 claims description 11
- 239000005543 nano-size silicon particle Substances 0.000 claims description 11
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 6
- 235000005039 Brassica rapa var. dichotoma Nutrition 0.000 claims description 4
- 244000130745 brown sarson Species 0.000 claims description 4
- 239000011261 inert gas Substances 0.000 claims description 4
- 239000010453 quartz Substances 0.000 claims description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 229910052721 tungsten Inorganic materials 0.000 claims description 4
- 239000010937 tungsten Substances 0.000 claims description 4
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 239000001307 helium Substances 0.000 claims description 3
- 229910052734 helium Inorganic materials 0.000 claims description 3
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 3
- 229910052757 nitrogen Inorganic materials 0.000 claims description 3
- 229910044991 metal oxide Inorganic materials 0.000 claims description 2
- 150000004706 metal oxides Chemical class 0.000 claims description 2
- 238000007740 vapor deposition Methods 0.000 description 5
- 238000000151 deposition Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000005452 bending Methods 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 241000590428 Panacea Species 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000000376 reactant Substances 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
- C23C16/487—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation using electron radiation
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/15—Nano-sized carbon materials
- C01B32/158—Carbon nanotubes
- C01B32/16—Preparation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/513—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using plasma jets
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Toxicology (AREA)
- Health & Medical Sciences (AREA)
- Inorganic Chemistry (AREA)
- Carbon And Carbon Compounds (AREA)
Abstract
Description
Claims (14)
- 소정 용적의 내부 공간을 갖는 반응 챔버;상기 반응 챔버에 장착되며 플라즈마를 발생하도록 하는 상부 전극과 하부 전극;상기 상,하부 전극에 의해 걸리는 전기장 영역 외의 상기 반응 챔버에 장착되어 전자를 방출하는 필라멘트; 및상기 필라멘트를 통과하여 상기 반응 챔버 내의 상, 하부 전극들 사이로 반응 기체가 유입되도록, 상기 필라멘트 및 상기 상, 하부 전극들을 향하는 기체 유입구;를 포함하는 플라즈마 강화 화학적 기상 증착 장치(Plasma enhanced chemical vapor deposition apparatus; PECVD).
- 삭제
- 제 1 항에 있어서, 상기 필라멘트에 인가되는 제1 전원 및상기 제1 전원과 다른 별도의 전원으로서 상기 상, 하부 전극들에 인가되는 제2 전원을 더 포함하는 것을 특징으로 하는 플라즈마 강화 화학적 기상 증착 장치.
- 제 1 항에 있어서, 상기 필라멘트는 텅스텐 계열의 금속으로 이루어진 것을 특징으로 하는 플라즈마 강화 화학적 기상 증착 장치.
- 제 4 항에 있어서, 상기 필라멘트는 토리아, 또는 탄소나노튜브로 코팅된 것임을 특징으로 하는 플라즈마 강화 화학적 기상 증착 장치.
- 제 1 항에 있어서, 상기 필라멘트는 복수의 금속선들이 서로 수평 또는 수직으로 배열된 것을 특징으로 하는 플라즈마 강화 화학적 기상 증착 장치.
- 제 1 항에 있어서, 상기 필라멘트를 덮는 쿼츠(quarts) 튜브를 더 포함하는 것을 특징으로 하는 플라즈마 강화 화학적 기상 증착 장치.
- 제 1 항에 있어서, 상기 하부 전극에 기판이 놓이는 것을 특징으로 하는 플라즈마 강화 화학적 기상 증착 장치.
- 제 8 항에 있어서, 상기 기판의 온도를 조절하는 가열 장치를 더 포함하는 것을 특징으로 하는 플라즈마 강화 화학적 기상 증착 장치.
- 기체 유입구를 통해 반응 챔버의 필라멘트 및 상,하부 전극들을 향해 반응 기체를 유입하는 단계,상기 필라멘트에 의해 전자를 방출하는 단계,상기 유입된 반응 기체와 상기 방출된 전자가 상기 상, 하부 전극 사이로 유입되어 플라즈마를 형성하는 단계, 및상기 플라즈마를 이용하여 기판상에 나노 입자를 형성하는 단계를 포함하는 나노 입자 제조 방법.
- 제 10 항에 있어서, 상기 기판을 200℃ 내지 600℃ 온도를 갖도록 가열하는 단계를 더 포함하는 것을 특징으로 하는 나노 입자 제조 방법.
- 제 10 항에 있어서, 비활성 기체를 상기 필라멘트로 유입하는 단계를 더 포함하는 것을 특징으로 하는 나노 입자 제조 방법.
- 제 12 항에 있어서, 상기 비활성 기체는 아르곤, 헬륨, 및 질소로 이루어진 군에서 선택되는 어느 하나임을 특징으로 하는 나노 입자 제조 방법.
- 제 10 항에 있어서, 상기 나노 입자는 탄소나노튜브, 실리콘 나노 입자, 및 금속 산화물 나노 입자로 이루어진 군에서 선택되는 어느 하나임을 특징으로 하는 나노 입자 제조 방법.
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KR1020050120168 | 2005-12-08 | ||
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KR20070061014A KR20070061014A (ko) | 2007-06-13 |
KR100779082B1 true KR100779082B1 (ko) | 2007-11-27 |
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KR102083448B1 (ko) | 2012-12-20 | 2020-03-03 | 삼성디스플레이 주식회사 | 기상 증착 장치, 이를 이용한 증착 방법 및 유기 발광 표시 장치 제조 방법 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61251038A (ja) | 1985-04-26 | 1986-11-08 | Matsushita Electric Ind Co Ltd | プラズマcvd装置 |
JPH01270320A (ja) * | 1988-04-22 | 1989-10-27 | Seiko Epson Corp | 絶縁薄膜堆積装置 |
JPH0645254A (ja) * | 1992-03-13 | 1994-02-18 | Limes:Kk | アモルファスシリコン膜の製造方法及び製造装置 |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61251038A (ja) | 1985-04-26 | 1986-11-08 | Matsushita Electric Ind Co Ltd | プラズマcvd装置 |
JPH01270320A (ja) * | 1988-04-22 | 1989-10-27 | Seiko Epson Corp | 絶縁薄膜堆積装置 |
JPH0645254A (ja) * | 1992-03-13 | 1994-02-18 | Limes:Kk | アモルファスシリコン膜の製造方法及び製造装置 |
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