KR100592478B1 - 핀 다이오드를 이용한 초소형 동위원소 전지 - Google Patents
핀 다이오드를 이용한 초소형 동위원소 전지 Download PDFInfo
- Publication number
- KR100592478B1 KR100592478B1 KR1020030051506A KR20030051506A KR100592478B1 KR 100592478 B1 KR100592478 B1 KR 100592478B1 KR 1020030051506 A KR1020030051506 A KR 1020030051506A KR 20030051506 A KR20030051506 A KR 20030051506A KR 100592478 B1 KR100592478 B1 KR 100592478B1
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- KR
- South Korea
- Prior art keywords
- semiconductor region
- semiconductor
- present
- radioisotope
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000004065 semiconductor Substances 0.000 claims abstract description 43
- 230000005855 radiation Effects 0.000 claims abstract description 12
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 7
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 7
- 239000010703 silicon Substances 0.000 claims abstract description 7
- 239000000758 substrate Substances 0.000 claims abstract description 7
- 239000000615 nonconductor Substances 0.000 claims abstract description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 239000004020 conductor Substances 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 230000002285 radioactive effect Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F10/00—Individual photovoltaic cells, e.g. solar cells
- H10F10/10—Individual photovoltaic cells, e.g. solar cells having potential barriers
- H10F10/17—Photovoltaic cells having only PIN junction potential barriers
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/548—Amorphous silicon PV cells
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- Micromachines (AREA)
- Hybrid Cells (AREA)
- Photovoltaic Devices (AREA)
Abstract
Description
Claims (4)
- 실리콘 기판위에 형성된 핀 반도체 소자와,상기 핀 반도체 소자의 P-반도체영역 상부에 형성되는 양전극 및 N-반도체영역 상부에 형성되는 음전극과,상기 양전극과 상기 음전극사이에 위치하고, I-반도체 영역에 접해 있으며, 방사선을 방출하는 방사능동위원소층과,상기 전극 및 방사능 동위원소층 상부에 피복되며 방사능 누설을 방지하는 전기부도체를 포함하고 있으며,상기 핀 반도체 소자층의 두께가 방사선의 정지비정보다 얕게 설정되어 있는 것을 특징으로 하는 초소형 동위원소 전지.
- 제1항에 있어서, 상기 방사능동위원소층은 Sr-90 또는 기체상의 H-3를 포함함을 특징으로 하는 초소형 동위원소 전지.
- 삭제
- 실리콘 기판위에 형성된 복수의 핀 반도체 소자와,상기 핀 반도체 소자 각각의 P-반도체영역 상부에 형성되는 양전극 및 상기 N-반도체 영역 상부에 형성되는 음전극과,상기 양전극과 상기 음전극사이에 각각 위치하고, I-반도체 영역에 접해 있으며, 방사선을 방출하는 방사능동위원소층과,상기 전극 및 방사능 동위원소층 상부에 피복되며 방사능 누설을 방지하는 전기부도체를 포함하고 있으며,상기 핀 반도체 소자층의 두께가 방사선의 정지비정보다 얕게 설정되어 있는 것을 특징으로 하는 초소형 동위원소 전지.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030051506A KR100592478B1 (ko) | 2003-07-25 | 2003-07-25 | 핀 다이오드를 이용한 초소형 동위원소 전지 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020030051506A KR100592478B1 (ko) | 2003-07-25 | 2003-07-25 | 핀 다이오드를 이용한 초소형 동위원소 전지 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20050012519A KR20050012519A (ko) | 2005-02-02 |
KR100592478B1 true KR100592478B1 (ko) | 2006-06-23 |
Family
ID=37224472
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020030051506A Expired - Fee Related KR100592478B1 (ko) | 2003-07-25 | 2003-07-25 | 핀 다이오드를 이용한 초소형 동위원소 전지 |
Country Status (1)
Country | Link |
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KR (1) | KR100592478B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100861317B1 (ko) | 2007-01-15 | 2008-10-01 | 이진민 | 방사성동위원소 전지 및 그 제조방법 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100858490B1 (ko) * | 2007-01-15 | 2008-09-12 | 이진민 | 방사성동위원소 전지를 이용한 물리량 감지장치 |
KR100861385B1 (ko) * | 2007-03-26 | 2008-10-01 | 이진민 | 방사성동위원소 전지 및 그 제조방법 |
KR101257588B1 (ko) * | 2009-03-12 | 2013-04-26 | 더 큐레이터스 오브 더 유니버시티 오브 미주리 | 고 에너지 밀도를 갖는 마이크로 방사성동위원소 파워 소스 장치 |
-
2003
- 2003-07-25 KR KR1020030051506A patent/KR100592478B1/ko not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100861317B1 (ko) | 2007-01-15 | 2008-10-01 | 이진민 | 방사성동위원소 전지 및 그 제조방법 |
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Publication number | Publication date |
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KR20050012519A (ko) | 2005-02-02 |
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