KR100439948B1 - 리모트 플라즈마 ald 장치 및 이를 이용한 ald 박막증착방법 - Google Patents
리모트 플라즈마 ald 장치 및 이를 이용한 ald 박막증착방법 Download PDFInfo
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- KR100439948B1 KR100439948B1 KR10-2002-0021554A KR20020021554A KR100439948B1 KR 100439948 B1 KR100439948 B1 KR 100439948B1 KR 20020021554 A KR20020021554 A KR 20020021554A KR 100439948 B1 KR100439948 B1 KR 100439948B1
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- 238000000034 method Methods 0.000 title claims description 33
- 239000010409 thin film Substances 0.000 title claims description 33
- 238000000151 deposition Methods 0.000 title description 4
- 239000012495 reaction gas Substances 0.000 claims abstract description 188
- 238000006243 chemical reaction Methods 0.000 claims abstract description 172
- 238000010926 purge Methods 0.000 claims abstract description 100
- 239000007789 gas Substances 0.000 claims abstract description 85
- 238000007736 thin film deposition technique Methods 0.000 claims abstract description 32
- 238000007599 discharging Methods 0.000 claims abstract description 4
- 239000011261 inert gas Substances 0.000 claims description 54
- 238000000427 thin-film deposition Methods 0.000 claims description 47
- 239000000758 substrate Substances 0.000 claims description 19
- 229910052739 hydrogen Inorganic materials 0.000 claims description 12
- 238000010438 heat treatment Methods 0.000 claims description 11
- 239000007788 liquid Substances 0.000 claims description 6
- 239000004065 semiconductor Substances 0.000 claims description 5
- 230000007717 exclusion Effects 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 239000000376 reactant Substances 0.000 claims description 3
- 238000000231 atomic layer deposition Methods 0.000 description 30
- 230000005587 bubbling Effects 0.000 description 8
- 238000005229 chemical vapour deposition Methods 0.000 description 5
- 239000000919 ceramic Substances 0.000 description 4
- 230000004913 activation Effects 0.000 description 3
- 239000001257 hydrogen Substances 0.000 description 3
- 239000007791 liquid phase Substances 0.000 description 3
- 239000010936 titanium Substances 0.000 description 3
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- JYGXADMDTFJGBT-VWUMJDOOSA-N hydrocortisone Chemical compound O=C1CC[C@]2(C)[C@H]3[C@@H](O)C[C@](C)([C@@](CC4)(O)C(=O)CO)[C@@H]4[C@@H]3CCC2=C1 JYGXADMDTFJGBT-VWUMJDOOSA-N 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 150000002902 organometallic compounds Chemical class 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
- C23C16/45536—Use of plasma, radiation or electromagnetic fields
- C23C16/45538—Plasma being used continuously during the ALD cycle
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45544—Atomic layer deposition [ALD] characterized by the apparatus
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- Formation Of Insulating Films (AREA)
Abstract
Description
Claims (13)
- 웨이퍼가 내장되는 반응용기(100)와;상기 반응용기(100)의 가스를 외부로 배출하는 배기라인(200)과;제1반응가스를 상기 반응용기(100) 또는 배기라인(200)으로 선택적으로 공급하기 위한 제1반응가스공급부(310)와;상기 제1반응가스공급부(310)와 상기 반응용기(100)를 연결하는 제1반응가스이송라인(320)과;상기 제1반응가스공급부(310)와 상기 배기라인(200)을 연결하는 제1바이패스라인(330)과;제2반응가스에 플라즈마를 인가하여 대응되는 라디칼을 생성한 후 그 라디칼을 상기 반응용기(100) 또는 배기라인(200)으로 선택적으로 공급하기 위한 라디칼공급부(340)와;상기 라디칼공급부(340)와 상기 반응용기(100)를 연결하는 라디칼이송라인(350)과;상기 라디칼공급부(340)와 상기 배기라인(200)을 연결하는 제2바이패스라인(360)과;메인퍼지가스를 상기 제1반응가스이송라인(320) 및/또는 상기 라디칼이송라인(350)으로 공급하는 메인퍼지가스공급부(370);를 포함하는 것을 특징으로 하는 리모트 플라즈마 ALD 박막증착장치.
- 제1항에 있어서,상기 제1반응가스공급부(310)는, 제1반응가스가 되는 액상의 제1반응물질이 일정량 채워진 소스컨테이너(311)와, 상기 소스컨테이너(311)로 흐르는 불활성가스의 흐름량을 조절하는 MFC(1)과, 상기 불활성가스 또는 제1반응가스를 상기 제1반응가스이송라인(320) 또는 상기 제1바이패스라인(330)으로 선택적으로 흐르게 하기 위한 제1유로변환부(316)를 포함하는 것을 특징으로 하는 리모트 플라즈마 ALD 박막증착장치.
- 제1항에 있어서,라디칼공급부(340)는, 유입되는 제2반응가스의 흐름량을 조절하는 MFC(2)와, 유입되는 불활성가스의 흐름량을 조절하는 MFC(3)와, 상기 MFC(2) 및 MFC(3)를 경유한 상기 제2반응가스 및/또는 불활성가스가 유입되며 유입된 제2반응가스에 플라즈마를 인가하여 대응하는 라디칼로 만드는 리모트 플라즈마 생성기(341)와, 생성된 라디칼을 라디칼이송라인(350) 및/또는 제2바이패스라인(360)으로 선택적으로 흐르게 하기 위한 제2유로변환부(346)를 포함하는 것을 특징으로 하는 리모트 플라즈마 ALD 박막증착장치.
- 제3항에 있어서,상기 MFC(2)를 경유한 제2반응가스를 상기 제2바이패스라인(360)으로 선택적으로 흐르게 하는 제3바이패스라인(380)을 더 포함하는 것을 특징으로 하는 리모트 플라즈마 ALD 박막증착장치.
- 제1항에 있어서,상기 메인퍼지가스공급부(370)는, 메인퍼지가스의 흐름량을 제어하는 MFC(4)와, 상기 메인퍼지가스를 제1반응가스이송라인(320) 또는 라디칼이송라인(350)으로 흐르게 하는 제3유로변환부(376)를 포함하는 것을 특징으로 하는 리모트 플라즈마 ALD 박막증착장치.
- 제1항 내지 제5항 중 어느 한 항의 리모트 플라즈마 ALD 박막증착장치를 이용하는 것으로서,상기 반응용기(100)와 배기라인(200) 사이의 러핑밸브(210)를 항시 개방하고 상기 제1유로변환부(316), 제2유로변환부(346) 각각의 내부 포인트 A,B 를 흐르는 가스를 상기 반응용기(100) 내지는 바이패스라인으로 항시 흐르게 하며, 리디칼을 반응용기(100)로 피딩시키는 상태에서, 제1반응가스를 반응용기(100)로 피딩하는 제1반응가스 피딩단계(S1)와, 반응용기(100) 내부로 피딩된 제1반응가스를 퍼지하는 제1반응가스 퍼지단계(S2)를 반복 수행함으로써, 상기 반응용기(100)에 위치된기판에 박막을 형성하는 것을 특징으로 하는 ALD 박막증착방법.
- 제6항에 있어서,박막 증착 단계 완료후 O, N, H, OH, NH로 이뤄진 군으로부터 선택된 적어도 하나 이상의 반응가스 또는 반응가스 조합의 라디칼과 불활성 가스를 반응용기로 분사하며 열처리하는 단계를 더 거치는 것을 특징으로 하는 반도체 박막 증착 방법
- 제1항 내지 제5항 중 어느 한 항의 리모트 플라즈마 ALD 박막증착장치를 이용하는 것으로서,상기 반응용기(100)와 배기라인(200) 사이의 러핑밸브(210)를 항시 개방한 상태에서, 상기 제1유로변환부(316), 제2유로변환부(346), 제3유로변환부(376) 각각의 내부 포인트 A, B, C 를 흐르는 가스를 상기 반응용기(100) 내지는 바이패스라인으로 항시 흐르게 하며, 라디칼을 반응용기(100)로 피딩시키는 라디칼 피딩단계(S3)와, 반응용기(100)에서 라디칼을 퍼지시키는 라디칼 퍼지단계(S4)와, 반응용기(100)로 제1반응가스를 피딩하는 제1반응가스 피딩단계(S1)와. 반응용기(100)에서 제1반응가스를 퍼지하는 제1반응가스 퍼지단계(S2)를 반복 수행함으로써, 상기 반응용기(100)에 위치된 기판에 박막을 형성하고,상기 라디칼 퍼지단계(S4)는, 상기 메인퍼지가스공급부(370)의 MFC(4)에 의하여 유량제어된 메인퍼지가스를 라디칼이송라인(350)을 통하여 상기 반응용기(100)로 분사하는 것을 특징으로 하는 ALD 박막증착방법.
- 제8항에 있어서,상기 제1반응가스의 퍼지시 제1반응가스이송라인(320)과 라디칼이송라인(350)을 흐르는 불활성 가스 유량의 총합은 항시 일정하게 하는 것을 특징으로 하는 ALD 박막 증착 방법
- 제8항에 있어서,상기 박막증착단계 완료후 O, N, H, OH, NH로 이뤄진 군으로부터 적어도 하나 이상 선택된 반응가스 또는 반응가스 조합의 라디칼과 불활성 가스를 반응용기로 분사하며 열처리하는 단계를 더 거치는 것을 특징으로 하는 ALD 반도체 박막 증착 방법.
- 제1항 내지 제5항중 어느 한 항의 리모트 플라즈마 ALD 박막증착장치를 이용하는 것으로서,상기 반응용기(100)와 배기라인(200) 사이의 러핑밸브(210)를 항시 개방한 상태에서, 상기 제1유로변환부(316), 라디칼공급부(340) 각각의 내부 포인트 A, D 를 흐르는 가스의 흐름을 상기 반응용기(100) 내지는 바이패스라인으로 항시 흐르게 하며, 라디칼을 반응용기(100)로 피딩시키는 라디칼 피딩단계(S3)와, 반응용기(100)에서 라디칼을 퍼지시키는 라디칼 퍼지단계(S4')와, 반응용기(100)로 제1반응가스를 피딩하는 제1반응가스 피딩단계(S1)와. 반응용기(100)에서 제1반응가스를 퍼지하는 제1반응가스 퍼지단계(S2)를 반복 수행함으로써, 상기 반응용기(100)에 위치된 기판에 박막을 형성하고,상기 라디칼 퍼지단계(S4')는, 상기 라디칼공급부의 MFC(3)에 유량제어된 불활성가스(제2반응가스배제)만을 라디칼이송라인(350)을 통하여 상기 반응용기(100)로 분사하는 것을 특징으로 하는 박막증착방법.
- 제11항에 있어서,상기 제1반응가스의 퍼지시 제1반응가스이송라인(320)과 라디칼이송라인(350)을 흐르는 불활성 가스 유량의 총합은 항시 일정하게 하는 것을 특징으로 하는 ALD 박막 증착 방법
- 제11항에 있어서,상기 박막증착단계 완료후 O, N, H, OH, NH로 이뤄진 군으로부터 적어도 하나 이상 선택된 반응가스 또는 반응가스 조합의 라디칼과 불활성 가스를 반응용기로 분사하며 열처리하는 단계를 더 거치는 것을 특징으로 하는 ALD 반도체 박막 증착 방법.
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KR102429546B1 (ko) | 2022-03-17 | 2022-08-05 | 주식회사 에이아이티 | 리니어 증발 소스를 구비한 박막 증착 시스템 |
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Also Published As
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TW200307995A (en) | 2003-12-16 |
WO2003089683A1 (en) | 2003-10-30 |
US20050223982A1 (en) | 2005-10-13 |
JP4191617B2 (ja) | 2008-12-03 |
AU2003223126A1 (en) | 2003-11-03 |
JP2005523580A (ja) | 2005-08-04 |
KR20030083132A (ko) | 2003-10-30 |
TWI233638B (en) | 2005-06-01 |
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