KR100439647B1 - 휴대용 앵글미터 - Google Patents
휴대용 앵글미터 Download PDFInfo
- Publication number
- KR100439647B1 KR100439647B1 KR10-2001-0049707A KR20010049707A KR100439647B1 KR 100439647 B1 KR100439647 B1 KR 100439647B1 KR 20010049707 A KR20010049707 A KR 20010049707A KR 100439647 B1 KR100439647 B1 KR 100439647B1
- Authority
- KR
- South Korea
- Prior art keywords
- portable
- power
- voltage
- phase
- phase difference
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R25/00—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents
- G01R25/02—Arrangements for measuring phase angle between a voltage and a current or between voltages or currents in circuits having distributed constants
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/40—Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect
- G01R13/404—Arrangements for displaying electric variables or waveforms using modulation of a light beam otherwise than by mechanical displacement, e.g. by Kerr effect for discontinuous display, i.e. display of discrete values
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
- G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
- G01R15/186—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using current transformers with a core consisting of two or more parts, e.g. clamp-on type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/133—Arrangements for measuring electric power or power factor by using digital technique
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
- G06F17/14—Fourier, Walsh or analogous domain transformations, e.g. Laplace, Hilbert, Karhunen-Loeve, transforms
- G06F17/141—Discrete Fourier transforms
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Power Engineering (AREA)
- Data Mining & Analysis (AREA)
- Computational Mathematics (AREA)
- Mathematical Analysis (AREA)
- Mathematical Optimization (AREA)
- Pure & Applied Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Discrete Mathematics (AREA)
- Databases & Information Systems (AREA)
- Software Systems (AREA)
- General Engineering & Computer Science (AREA)
- Algebra (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
Description
Claims (3)
- 전력계통(Power System) 장치의 상차각(Phase Difference Angle)을 측정하는 전력계통 상차각 계측장치에 있어서,상기 전력계통과의 전기적 연결을 위한 전원단자, 전압신호단자 및 전류신호단자를 포함한 단자블록과,측정된 신호를 기본고조파의 페이저(phasor)로 변환하는 페이저 측정 알고리즘, 각종 인터페이스 알고리즘이 내장된 기능부와, 모선에 접속된 구성요소와 데이터 및 제어신호를 수수하여 시스템을 관장하기 위한 마이크로 프로세서를 포함한 중앙처리장치(CPU)와,상기 단자블록의 전압신호단자 및 전류신호단자로부터 입력된 신호를 외부와 내부 신호간의 전기적 절연을 위한 신호절연회로, 잡음을 제거하기 위한 필터링회로, 신호를 소정 레벨로 변환하기 위한 증폭회로 및 측정신호 레벨의 Auto-Ranging을 실현하기 위한 증폭기 이득 조정용 저항 어레이(array)와 디코더(decoder)로 구성된 Auto-Ranging 회로를 포함한 전압전류 검출회로를 구비하여 페이저(Phasor) 연산에 의해 상차각을 측정하는 것을 특징으로 하는 휴대용 앵글미터.
- 제1항에 있어서, 상기 중앙처리장치내는,상기 전력계통 장치의 각 출력 전압신호 및 전류신호의 기본 고조파의 페이저(Phasor) 크기와 주파수 성분을 구하는 DFT 연산모듈과,상기 DFT 연산모듈의 각 출력 주파수 성분으로부터 각 신호의 위상을 구하는 위상각 연산모듈과,상기 위상각 연산모듈에서 계산된 각 신호의 위상간의 상차각을 구하는 상차각 연산모듈을 구비하여 페이저(Phasor) 연산에 의해 상차각을 측정하는 것을 특징으로 하는 휴대용 앵글미터.
- 제1항에 있어서, 전압전류 검출회로에서 Auto-Ranging 회로는,전압전류신호 검출레벨에 따라 측정범위(Measuring Range)가 자동으로 조정되는 Auto-Ragnging을 실현하기 위하여, 증폭도 설정치를 로직신호로 변환하여 전압전류 검출회로내의 디코더에서 출력하는 이득제어 회로를 추가적으로 더 포함하는 것을 특징으로 하는 휴대용 앵글미터.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0049707A KR100439647B1 (ko) | 2001-08-17 | 2001-08-17 | 휴대용 앵글미터 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0049707A KR100439647B1 (ko) | 2001-08-17 | 2001-08-17 | 휴대용 앵글미터 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030015801A KR20030015801A (ko) | 2003-02-25 |
KR100439647B1 true KR100439647B1 (ko) | 2004-07-12 |
Family
ID=27719637
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0049707A Expired - Fee Related KR100439647B1 (ko) | 2001-08-17 | 2001-08-17 | 휴대용 앵글미터 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100439647B1 (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101811800B1 (ko) | 2016-02-25 | 2018-01-12 | 와이테크 주식회사 | 스마트폰 연결형 멀티미터와 이를 구성한 계측시스템 및 계측방법 |
CN109239504A (zh) * | 2018-08-03 | 2019-01-18 | 同济大学 | 一种旋转式转换开关触点通断角度时序波形的测试方法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100597895B1 (ko) * | 2004-08-09 | 2006-07-06 | 한국전력공사 | 휴대용 위상각 측정기 |
KR100620760B1 (ko) * | 2004-12-10 | 2006-09-12 | 경북대학교 산학협력단 | 가상 2상을 이용한 계통전압 위상 검출장치 |
EP3237915A4 (en) * | 2014-12-25 | 2018-01-03 | Texas Instruments Incorporated | Bi-directional electric energy meter |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4316254A (en) * | 1979-05-25 | 1982-02-16 | Electric Power Research Institute, Inc. | Portable phase angle meter instrument |
JPS57203967A (en) * | 1981-06-10 | 1982-12-14 | Shikoku Electric Power Co Inc | Digital meter of voltage, current and phase defference |
KR19990085704A (ko) * | 1998-05-21 | 1999-12-15 | 장정곤 | 디지털 계전 계측장치 |
KR200198074Y1 (ko) * | 2000-03-28 | 2000-10-02 | 주식회사흥창 | 역률 판별기 |
-
2001
- 2001-08-17 KR KR10-2001-0049707A patent/KR100439647B1/ko not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4316254A (en) * | 1979-05-25 | 1982-02-16 | Electric Power Research Institute, Inc. | Portable phase angle meter instrument |
JPS57203967A (en) * | 1981-06-10 | 1982-12-14 | Shikoku Electric Power Co Inc | Digital meter of voltage, current and phase defference |
KR19990085704A (ko) * | 1998-05-21 | 1999-12-15 | 장정곤 | 디지털 계전 계측장치 |
KR200198074Y1 (ko) * | 2000-03-28 | 2000-10-02 | 주식회사흥창 | 역률 판별기 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101811800B1 (ko) | 2016-02-25 | 2018-01-12 | 와이테크 주식회사 | 스마트폰 연결형 멀티미터와 이를 구성한 계측시스템 및 계측방법 |
CN109239504A (zh) * | 2018-08-03 | 2019-01-18 | 同济大学 | 一种旋转式转换开关触点通断角度时序波形的测试方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20030015801A (ko) | 2003-02-25 |
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