KR100359795B1 - 액정표시장치및그제조방법 - Google Patents
액정표시장치및그제조방법 Download PDFInfo
- Publication number
- KR100359795B1 KR100359795B1 KR1019950025950A KR19950025950A KR100359795B1 KR 100359795 B1 KR100359795 B1 KR 100359795B1 KR 1019950025950 A KR1019950025950 A KR 1019950025950A KR 19950025950 A KR19950025950 A KR 19950025950A KR 100359795 B1 KR100359795 B1 KR 100359795B1
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- South Korea
- Prior art keywords
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- gate
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- electrode
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0312—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes
- H10D30/0314—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes of lateral top-gate TFTs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
- H10D30/6713—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes
- H10D30/6715—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes characterised by the doping profiles, e.g. having lightly-doped source or drain extensions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/481—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs integrated with passive devices, e.g. auxiliary capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Liquid Crystal (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
Claims (7)
- 절연기판과;상기 절연기판상에 형성되며 소정영역에 고농도 불순물영역을 가진 활성층;상기 활성층 상부에 형성된 게이트절연막;상기 게이트절연막 상부에 차례로 형성되며 서로 다른 폭을 갖는 하부게이트전극과 상부게이트전극;상기 활성층의 고농도 불순물영역을 노출시키는 콘택홀을 가지면서, 콘택홀이외의 전면에 형성된 층간절연막;상기 콘택홀을 통해 상기 활성층의 고농도 불순물영역에 각각 접속되는 소오스전극 및 드레인전극을 포함하여 이루어지는 것을 특징으로 하는 액정표시장치.
- 제1항에 있어서, 상기 상부게이트전극은 상기 하부게이트전극보다 큰 폭을 갖는 것을 특징으로 하는 액정표시장치.
- 제2항에 있어서, 상기게이트전극은 상기 하부게이트전극의 상측 양단부위에서 각각 일정거리 돌출되어 형성된 것을 특징으로 하는 액정표시장치.
- 절연기판상에 활성층을 형성하는 단계와;상기 절연기판 전면에 게이트절연막을 형성하는 단계;상지 게이트절연막위에 제1도전층 및 제2도전층을 차례로 형성하는 단계;상기 제2도전층 및 제1도전층을 선택적으로 식각하여 제1, 제2게이트패턴을 동시에 형성하는 단계;상기 제2게이트패턴을 마스크로 이용하여 상기 제1도전층을 오버에칭하여 상기 제2게이트패턴으로 이루어진 상부게이트전극과 제1게이트패턴으로 이루어진 하부게이트전극을 형성하는 단계;상기 상부게이트 전극을 마스크로 사용하여 상기 게이트 절연막 패턴을 형성하는 단계;상기 활성층의 노출된 부위에 고농도 불순물영역을 형성하는 단계;상기 절연기판 전면에 층간절연막을 형성하는 단계;상기 층간절연막을 선택적으로, 식각하여 상기 활성중의 고농도 불순물영역을 노출시키는 콘택홀을 형성하는 단계;상기 층간절연악 전면에 금속층을 형성하는 단계; 및상기 금속층을 패터닝하여 상기 콘택홀을 통해 상기 고농도 불순물영역에 각각 접속되는 소오스전극과 드레인전극을 형성하는 단계를 포함하여 이루어지는 것을 특징으로 하는 액정표시장치 제조방법.
- 제4항에 있어서, 상기 제1도전층/제2도전층은 각각 Al, TiSix, Cr, Ta, Mo중에서 식각 선택성이 있는 물질로 적층하여 형성하는 것을 특징으로 하는 액정표시장치 제조방법.
- 제4항에 있어서, 상기 제1, 제2게이트패턴과 상기 게이트 절연막 패턴은 게이트 전극용 마스크를 이용하여 상기 제2도전층, 상기 제1도전층, 상기 게이트절연막을 연속적으로 식각하여 형성함을 특징으로 하는 액정표시장치 제조방법.
- 절연기판상에 활성층을 형성하는 단계와;상기 전면에 게이트절연막을 형성하는 단계;상기 게이트절연막위에 제1도전층 및 제2도전층을 차례로 형성하는 단계;상기 제2도전층 및 제1도전층을 선택적으로 식각하여 상부 게이트전극과 하부게이트전극을 형성함과 동시에 제1, 제2스토리지전극을 형성하는 단계;상기 활성층의 노출된 부위에 고농도 불순물영역을 형성하는 단계;상기 전면에 층간절연막을 형성하는 단계;상기 층간절연막을 선택적으로 식각하여 상기 활성층의 고농도 불순물영역을 노출시키는 콘택홀을 형성하는 단계;상기 층간절연막 전면에 금속층을 형성하는 단계;상기 금속층을 패터닝하여 상기 콘택홀을 통해 상기 고농도 불순물영역에 각각 접속되는 소오스전극과 드레인전극을 형성함과 동시에 상기 제1, 제2스토리지전극 상부에 도전층을 형성하는 단계;기판 전면에 보호막을 형성하는 단계;상기 제2스토리지전극 상부의 상기 보호막과 상기 도전층의 소정 부분을 선택적으로 제거하는 단계; 및상기 스토리지전극 부분을 포함하는 상기 보호막 상부영역에 화소전극을 형성하는 단계를 포함하여 이루어지는 것을 특징으로 하는 액정표시장치 제조방법.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950025950A KR100359795B1 (ko) | 1995-08-22 | 1995-08-22 | 액정표시장치및그제조방법 |
US08/700,789 US5742363A (en) | 1995-08-22 | 1996-08-21 | Liquid crystal display and method for fabricating the same in which the gate electrode is formed from two layers having differing widths |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950025950A KR100359795B1 (ko) | 1995-08-22 | 1995-08-22 | 액정표시장치및그제조방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970011965A KR970011965A (ko) | 1997-03-29 |
KR100359795B1 true KR100359795B1 (ko) | 2003-01-14 |
Family
ID=19424086
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950025950A Expired - Fee Related KR100359795B1 (ko) | 1995-08-22 | 1995-08-22 | 액정표시장치및그제조방법 |
Country Status (2)
Country | Link |
---|---|
US (1) | US5742363A (ko) |
KR (1) | KR100359795B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106773418A (zh) * | 2012-05-09 | 2017-05-31 | 株式会社日本显示器 | 显示装置 |
Families Citing this family (30)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100205388B1 (ko) * | 1995-09-12 | 1999-07-01 | 구자홍 | 액정표시장치 및 그 제조방법 |
JPH10163501A (ja) * | 1996-11-29 | 1998-06-19 | Semiconductor Energy Lab Co Ltd | 絶縁ゲイト型トランジスタ |
US6501094B1 (en) * | 1997-06-11 | 2002-12-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising a bottom gate type thin film transistor |
KR100243297B1 (ko) * | 1997-07-28 | 2000-02-01 | 윤종용 | 다결정실리콘 박막 트랜지스터-액정표시장치 및그 제조방법 |
JP3935246B2 (ja) * | 1997-08-18 | 2007-06-20 | エルジー フィリップス エルシーディー カンパニー リミテッド | 液晶表示装置 |
US6104077A (en) * | 1998-04-14 | 2000-08-15 | Advanced Micro Devices, Inc. | Semiconductor device having gate electrode with a sidewall air gap |
US6396147B1 (en) | 1998-05-16 | 2002-05-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device with metal-oxide conductors |
US6140162A (en) * | 1998-06-19 | 2000-10-31 | Lg Electronics Inc. | Reduction of masking and doping steps in a method of fabricating a liquid crystal display |
US6617644B1 (en) | 1998-11-09 | 2003-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing the same |
KR100288772B1 (ko) * | 1998-11-12 | 2001-05-02 | 윤종용 | 액정 표시 장치 및 그 제조 방법 |
US6518594B1 (en) * | 1998-11-16 | 2003-02-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor devices |
US6909114B1 (en) | 1998-11-17 | 2005-06-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having LDD regions |
US6365917B1 (en) * | 1998-11-25 | 2002-04-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US6277679B1 (en) | 1998-11-25 | 2001-08-21 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing thin film transistor |
US7235810B1 (en) | 1998-12-03 | 2007-06-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of fabricating the same |
KR100361467B1 (ko) * | 2000-02-24 | 2002-11-21 | 엘지.필립스 엘시디 주식회사 | 액정표시장치의 박막트랜지스터 기판 |
US7525165B2 (en) * | 2000-04-17 | 2009-04-28 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and manufacturing method thereof |
KR100342306B1 (ko) * | 2000-09-05 | 2002-07-02 | 윤종용 | 트랜지스터 및 이의 형성 방법 |
JP3520417B2 (ja) | 2000-12-14 | 2004-04-19 | セイコーエプソン株式会社 | 電気光学パネルおよび電子機器 |
US6686605B2 (en) * | 2001-07-27 | 2004-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display device, and method of manufacturing the same |
JP4101533B2 (ja) * | 2002-03-01 | 2008-06-18 | 株式会社半導体エネルギー研究所 | 半透過型の液晶表示装置の作製方法 |
KR100915233B1 (ko) * | 2002-11-05 | 2009-09-02 | 삼성전자주식회사 | 박막 트랜지스터 어레이 기판 |
KR100532087B1 (ko) * | 2003-06-20 | 2005-11-30 | 엘지.필립스 엘시디 주식회사 | 액정표시장치 |
US7105391B2 (en) * | 2004-03-04 | 2006-09-12 | International Business Machines Corporation | Planar pedestal multi gate device |
KR101043991B1 (ko) * | 2004-07-28 | 2011-06-24 | 엘지디스플레이 주식회사 | 액정표시소자 및 그 제조방법 |
JP6063766B2 (ja) * | 2013-02-20 | 2017-01-18 | 株式会社ジャパンディスプレイ | 半導体装置 |
KR102285384B1 (ko) * | 2014-09-15 | 2021-08-04 | 삼성디스플레이 주식회사 | 박막 트랜지스터 어레이 기판, 그 제조방법 및 표시 장치 |
CN104952934B (zh) * | 2015-06-25 | 2018-05-01 | 京东方科技集团股份有限公司 | 薄膜晶体管及制造方法、阵列基板、显示面板 |
WO2020089726A1 (ja) * | 2018-11-02 | 2020-05-07 | 株式会社半導体エネルギー研究所 | 半導体装置 |
CN113224172B (zh) * | 2021-04-30 | 2022-11-08 | 合肥维信诺科技有限公司 | 薄膜晶体管及其制备方法 |
Citations (2)
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KR920003084A (ko) * | 1990-07-12 | 1992-02-29 | 아오이 죠이찌 | 액정표시장치 |
KR940010306A (ko) * | 1992-10-14 | 1994-05-24 | 이헌조 | 박막트랜지스터 제조방법 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5543646A (en) * | 1988-09-08 | 1996-08-06 | Mitsubishi Denki Kabushiki Kaisha | Field effect transistor with a shaped gate electrode |
JP2702338B2 (ja) * | 1991-10-14 | 1998-01-21 | 三菱電機株式会社 | 半導体装置、及びその製造方法 |
-
1995
- 1995-08-22 KR KR1019950025950A patent/KR100359795B1/ko not_active Expired - Fee Related
-
1996
- 1996-08-21 US US08/700,789 patent/US5742363A/en not_active Expired - Lifetime
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR920003084A (ko) * | 1990-07-12 | 1992-02-29 | 아오이 죠이찌 | 액정표시장치 |
KR940010306A (ko) * | 1992-10-14 | 1994-05-24 | 이헌조 | 박막트랜지스터 제조방법 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106773418A (zh) * | 2012-05-09 | 2017-05-31 | 株式会社日本显示器 | 显示装置 |
Also Published As
Publication number | Publication date |
---|---|
US5742363A (en) | 1998-04-21 |
KR970011965A (ko) | 1997-03-29 |
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