KR100294096B1 - 기판세정장치 및 기판세정방법 - Google Patents
기판세정장치 및 기판세정방법 Download PDFInfo
- Publication number
- KR100294096B1 KR100294096B1 KR1019960067940A KR19960067940A KR100294096B1 KR 100294096 B1 KR100294096 B1 KR 100294096B1 KR 1019960067940 A KR1019960067940 A KR 1019960067940A KR 19960067940 A KR19960067940 A KR 19960067940A KR 100294096 B1 KR100294096 B1 KR 100294096B1
- Authority
- KR
- South Korea
- Prior art keywords
- cleaning
- substrate
- high pressure
- ultrasonic
- nozzle
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B2203/00—Details of cleaning machines or methods involving the use or presence of liquid or steam
- B08B2203/02—Details of machines or methods for cleaning by the force of jets or sprays
- B08B2203/0288—Ultra or megasonic jets
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
Claims (22)
- 기판의 세정을 행하는 장치에 있어서,(a) 기판을 향하여 액체를 토출하면서 상기 액체에 초음파를 발사하여 상기 기판의 초음파 세정을 행하는 초음파 세정수단과,(b) 상기 초음파 세정수단과는 다른 위치에 설치되고, 고압세정노즐을 구비하여, 그 고압세정노즐에 공급되는 세정액의 압력이 약 5㎏/㎠ 이상인 고압액체를 상기 기판을 향하여 분출하여 상기 기판의 고압세정을 행하는 고압세정 수단을 구비하고, 상기 고압세정노즐은 초음파세정수단으로부터 토출되어 기판의 피세정면에 도달하여 그 도달점으로부터 피세정면을 따라 유출된 초음파세정액을 향하여 고압액체를 분출하는 것인, 상기 기판에 대하여 상기 초음파 세정과 상기 고압세정의 복합 세정을 행하는 것을 특징으로 하는 기판세정장치.
- 제1항에 있어서, (c) 상기 기판을 소정의 방향으로 회전하는 기판회전 수단을 더 구비하고, 상기 기판의 회전을 행하면서 상기 복합 세정을 행하는 것을 특징으로 하는 기판세정장치.
- 제2항에 있어서, 상기 초음파 세정수단은,(a-1) 상기 기판의 피세정면상에 규정된 초음파 세정라인을 향하여 초음파가 발사된 상기 액체를 슬리트로부터 토출하는 초음파 세정노즐을 구비함과 동시에, 상기 고압세정수단은,(b-1) 상기 기판의 피세정면상에 규정된 고압세정 스포트를 향하여, 상기 고압액체를 분출하는 고압세정노즐을 구비하는 것을 특징으로 하는 기판세정장치.
- 제3항에 있어서, (d) 상기 기판의 회전중심의 상방을 통하며, 또한 상기 기판의 면에 실질적으로 평행한 궤적을 따라 상기 고압세정노즐을 요동시키는 고압세정노즐 요동수단을 더 구비하는 것을 특징으로 하는 기판세정장치.
- 제4항에 있어서, 상기 고압세정스포트가 상기 초음파 세정라인의 근방이며, 또한 상기 기판의 회전에 있어서, 상기 초음파 세정라인보다 먼저 상기 기판을 주사하는 위치에 설정되어 있는 것을 특징으로 하는 기판세정장치.
- 제5항에 있어서, 상기 고압세정스포트가 상기 초음파 세정라인의 양 끝점중 상기 기판의 회전중심으로부터 먼쪽의 끝점측에 치우쳐 설정되어 있는 것을 특징으로 하는 기판세정장치.
- 기판의 세정을 행하는 데 있어서, 초음파가 발사된 액체를 상기 기판을 향해 토출하는 초음파 세정과, 고압세정노즐에 대하여 세정액을 약 5㎏/㎠ 이상의 압력으로 공급하고, 기판에 대하여 고압액체를 분출하여 행하는 고압세정을 시간적으로 병행하여 동일 장치내에서 행하고, 상기 고압세정노즐로부터 분출되는 고압액체는, 초음파세정수단으로부터 토출되어 기판의 피세정면에 도달하여 그 도달점으로부터 피세정면을 따라 유출된 초음파 세정액을 향하여 분출되는 것을 특징으로 하는 기판세정방법.
- 제7항에 있어서, 상기 기판을 소정의 방향으로 회전시키면서, 상기 초음파 세정과 상기 고압세정의 복합세정의 주사를 상기 기판에 대하여 행하는 것을 특징으로 하는 기판세정방법.
- 제8항에 있어서, 상기 초음파 세정은, 상기 기판의 피세정면상에 규정된 초음파 세정라인을 향하여, 초음파가 발사된 상기 액체를 초음파 세정노즐에서 토출함으로써 행해지고, 상기 고압세정은, 상기 기판의 피세정면상에 규정된 고압세정 스포트를 향하여, 상기 고압액체를 고압세정노즐에서 분출함으로써 행해지는 것을 특징으로 하는 기판세정방법.
- 제9항에 있어서, 상기 기판의 회전중심의 상방을 지나고, 또한 상기 기판의 면에 실질적으로 평행한 궤적을 따라 상기 고압세정노즐을 요동시키면서 상기 고압세정을 행하는 것을 특징으로 하는 기판세정방법.
- 제10항에 있어서, 상기 고압세정스포트가 상기 초음파 세정라인의 근방이며, 또한 상기 기판의 회전에 있어서 상기 초음파 세정라인보다 먼저 상기 기판을 주사하는 위치에 설정되어 있는 것을 특징으로 하는 기판세정방법.
- 제11항에 있어서, 상기 고압 세정 스포트가 상기 초음파 세정라인의 양 끝점중 상기 기판의 회전중심에서 먼쪽의 끝점측에 치우쳐 설정되어 있는 것을 특징으로 하는 기판세정방법.
- 제1항에 있어서, (c) 상기 초음파 세정수단 및 상기 고압세정 수단과 상기 기판을 상대적으로 병진시키는 병진(竝進)수단을 더 구비하고, 상기 병진을 행하면서 상기 기판의 세정 주사를 행하는 것을 특징으로 하는 기판세정장치.
- 제13항에 있어서, 상기 초음파 세정수단은(a-1) 상기 기판의 피세정면상에 규정된 초음파 세정라인을 향하여 초음파가 발사된 상기 액체를 슬리트에서 토출하는 초음파 세정노즐을 구비함과 동시에, 상기 고압세정수단은(b-1) 상기 기판의 피세정면상에 규정된 고압세정 스포트의 배열을 향하여, 상기 고압액체를 분출하는 고압세정노즐을 구비하는 것을 특징으로 하는 기판세정장치.
- 제14항에 있어서, (d) 상기 고압세정스포트의 배열의 방향을 따라 상기 고압세정노즐을 요동시키는 고압세정노즐 요동수단을 더 구비하는 것을 특징으로 하는 기판세정장치.
- 제15항에 있어서, 상기 고압세정노즐이 상기 초음파 세정노즐의 양측에 마련됨으로써, 상기 고압세정스포트의 배열이 상기 초음파 세정라인의 양측에 규정되어 이루어지는 것을 특징으로 하는 기판세정장치.
- 제16항에 있어서, 상기 초음파 세정노즐은 상기 기판의 피세정면에 대하여 거의 직각으로 상기 액체를 토출하고, 상기 고압세정노즐은 상기 초음파 세정노즐로부터의 상기 액체의 토출방향과 거의 동일 또는 그것으로부터 떨어진 방향으로 기울어져 상기 고압 액체를 분출하는 것을 특징으로 하는 기판세정장치.
- 제15항에 있어서, 상기 기판은, 상기 초음파 세정수단 및 상기 고압세정수단에 대하여 소정의 하나의 방향으로 상대적으로 반송되고, 상기 고압세정 스포트의 배열은, 상기 소정의 하나의 방향에 있어서 상기 초음파 세정라인보다 전에 상기 기판을 주사하는 위치에 설정되어 있는 것을 특징으로 하는 기판세정장치.
- 제18항에 있어서, 상기 초음파 세정노즐은, 상기 기판의 피세정면에 대하여 상기 소정의 방향측으로 기울어져 상기 액체를 토출하고, 상기 고압세정노즐은, 상기 초음파 세정노즐의 양측 중 상기 반송에서의 상기 소정 방향의 역방향에 상당하는 측에만 설치되고, 상기 초음파 세정노즐로부터의 상기 액체의 토출방향과 거의 동일 또는 그것보다 크게 기울은 방향으로 상기 고압액체를 분출하는 것을 특징으로 하는 기판세정장치.
- 제7항에 있어서, 상기 초음파 세정과 상기 고압세정을 행하는 복합세정기구와 기판을 상대적으로 병진시키면서 상기 기판의 세정주사를 행하는 것을 특징으로 하는 기판세정방법.
- 제20항에 있어서, 상기 초음파 세정은, 상기 기판의 피세정면상에 규정된 초음파 세정라인을 향하여, 초음파가 발사된 상기 액체를 초음파 세정노즐에서 토출함으로써 행해지고, 상기 고압세정은, 상기 기판의 피세정면상에 규정된 고압세정스포트의 배열을 향해, 상기 고압액체를 고압세정노즐에서 분출함으로써 행하여지는 것을 특징으로 하는 기판세정방법.
- 제21항에 있어서, 상기 고압 세정스포트의 배열방향을 따라 상기 고압세정노즐을 요동시키면서 상기 고압세정을 행하는 것을 특징으로 하는 기판세정방법.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP33312195A JP3323385B2 (ja) | 1995-12-21 | 1995-12-21 | 基板洗浄装置および基板洗浄方法 |
JP95-333120 | 1995-12-21 | ||
JP95-333121 | 1995-12-21 | ||
JP33312095A JP3323384B2 (ja) | 1995-12-21 | 1995-12-21 | 基板洗浄装置および基板洗浄方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970052718A KR970052718A (ko) | 1997-07-29 |
KR100294096B1 true KR100294096B1 (ko) | 2001-11-14 |
Family
ID=26574402
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960067940A KR100294096B1 (ko) | 1995-12-21 | 1996-12-19 | 기판세정장치 및 기판세정방법 |
Country Status (2)
Country | Link |
---|---|
US (1) | US5975098A (ko) |
KR (1) | KR100294096B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101210297B1 (ko) | 2011-08-01 | 2012-12-10 | 주식회사 케이씨텍 | 화학 기계적 연마 장치의 세정 기구 |
Families Citing this family (93)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6039059A (en) | 1996-09-30 | 2000-03-21 | Verteq, Inc. | Wafer cleaning system |
US20050034745A1 (en) * | 1997-05-09 | 2005-02-17 | Semitool, Inc. | Processing a workpiece with ozone and a halogenated additive |
US7416611B2 (en) * | 1997-05-09 | 2008-08-26 | Semitool, Inc. | Process and apparatus for treating a workpiece with gases |
US7163588B2 (en) * | 1997-05-09 | 2007-01-16 | Semitool, Inc. | Processing a workpiece using water, a base, and ozone |
US20050194356A1 (en) * | 1997-05-09 | 2005-09-08 | Semitool, Inc. | Removing photoresist from a workpiece using water and ozone and a photoresist penetrating additive |
US20020157686A1 (en) * | 1997-05-09 | 2002-10-31 | Semitool, Inc. | Process and apparatus for treating a workpiece such as a semiconductor wafer |
US6701941B1 (en) * | 1997-05-09 | 2004-03-09 | Semitool, Inc. | Method for treating the surface of a workpiece |
JPH1154471A (ja) * | 1997-08-05 | 1999-02-26 | Tokyo Electron Ltd | 処理装置及び処理方法 |
US6260562B1 (en) * | 1997-10-20 | 2001-07-17 | Dainippon Screen Mfg. Co., Ltd. | Substrate cleaning apparatus and method |
JP3563605B2 (ja) * | 1998-03-16 | 2004-09-08 | 東京エレクトロン株式会社 | 処理装置 |
US6343609B1 (en) * | 1998-08-13 | 2002-02-05 | International Business Machines Corporation | Cleaning with liquified gas and megasonics |
US6460552B1 (en) * | 1998-10-05 | 2002-10-08 | Lorimer D'arcy H. | Method and apparatus for cleaning flat workpieces |
US6202658B1 (en) | 1998-11-11 | 2001-03-20 | Applied Materials, Inc. | Method and apparatus for cleaning the edge of a thin disc |
US20050229946A1 (en) * | 1998-11-12 | 2005-10-20 | Dainippon Screen Mfg. Co., Ltd. | Substrate treating method and apparatus |
US6511914B2 (en) * | 1999-01-22 | 2003-01-28 | Semitool, Inc. | Reactor for processing a workpiece using sonic energy |
JP3395696B2 (ja) | 1999-03-15 | 2003-04-14 | 日本電気株式会社 | ウェハ処理装置およびウェハ処理方法 |
US6328814B1 (en) * | 1999-03-26 | 2001-12-11 | Applied Materials, Inc. | Apparatus for cleaning and drying substrates |
TW464970B (en) * | 1999-04-21 | 2001-11-21 | Sharp Kk | Ultrasonic cleaning device and resist-stripping device |
EP1050899B1 (en) * | 1999-05-04 | 2003-12-17 | Honda Electronics Co., Ltd. | An ultrasonic washing apparatus |
US6405399B1 (en) | 1999-06-25 | 2002-06-18 | Lam Research Corporation | Method and system of cleaning a wafer after chemical mechanical polishing or plasma processing |
EP1192642A1 (en) * | 1999-07-01 | 2002-04-03 | Lam Research Corporation | Spin, rinse, and dry station with adjustable nozzle assembly for semiconductor wafer backside rinsing |
KR100360399B1 (ko) * | 2000-03-07 | 2002-11-13 | 삼성전자 주식회사 | 반구형입자(hsg)막을 구비한 반도체소자의 제조방법 |
US7234477B2 (en) * | 2000-06-30 | 2007-06-26 | Lam Research Corporation | Method and apparatus for drying semiconductor wafer surfaces using a plurality of inlets and outlets held in close proximity to the wafer surfaces |
US7584761B1 (en) | 2000-06-30 | 2009-09-08 | Lam Research Corporation | Wafer edge surface treatment with liquid meniscus |
US7000622B2 (en) * | 2002-09-30 | 2006-02-21 | Lam Research Corporation | Methods and systems for processing a bevel edge of a substrate using a dynamic liquid meniscus |
US6951221B2 (en) * | 2000-09-22 | 2005-10-04 | Dainippon Screen Mfg. Co., Ltd. | Substrate processing apparatus |
WO2002054472A1 (fr) * | 2000-12-28 | 2002-07-11 | Yoshiharu Yamamoto | Appareil pour nettoyer une plaquette de semi-conducteur |
US6691719B2 (en) * | 2001-01-12 | 2004-02-17 | Applied Materials Inc. | Adjustable nozzle for wafer bevel cleaning |
US6679272B2 (en) | 2001-08-03 | 2004-01-20 | Verteq, Inc. | Megasonic probe energy attenuator |
US6904637B2 (en) | 2001-10-03 | 2005-06-14 | Applied Materials, Inc. | Scrubber with sonic nozzle |
TWI285911B (en) * | 2001-11-02 | 2007-08-21 | Applied Materials Inc | Single wafer dryer and drying methods |
US6890388B2 (en) * | 2002-01-07 | 2005-05-10 | International Business Machines Corporation | Apparatus and method for using an acoustic-jet for cleaning hard disk drive heads in manufacturing |
US7287537B2 (en) * | 2002-01-29 | 2007-10-30 | Akrion Technologies, Inc. | Megasonic probe energy director |
US20030192570A1 (en) * | 2002-04-11 | 2003-10-16 | Applied Materials, Inc. | Method and apparatus for wafer cleaning |
US6645782B1 (en) * | 2002-04-25 | 2003-11-11 | Advanced Micro Devices, Inc. | Qualitative method for troubleshooting a dielectric tool |
KR100468110B1 (ko) * | 2002-07-12 | 2005-01-26 | 삼성전자주식회사 | 웨이퍼 처리 장치 |
US7389783B2 (en) * | 2002-09-30 | 2008-06-24 | Lam Research Corporation | Proximity meniscus manifold |
US7383843B2 (en) | 2002-09-30 | 2008-06-10 | Lam Research Corporation | Method and apparatus for processing wafer surfaces using thin, high velocity fluid layer |
US7367345B1 (en) | 2002-09-30 | 2008-05-06 | Lam Research Corporation | Apparatus and method for providing a confined liquid for immersion lithography |
US7198055B2 (en) * | 2002-09-30 | 2007-04-03 | Lam Research Corporation | Meniscus, vacuum, IPA vapor, drying manifold |
US7513262B2 (en) * | 2002-09-30 | 2009-04-07 | Lam Research Corporation | Substrate meniscus interface and methods for operation |
US7632376B1 (en) | 2002-09-30 | 2009-12-15 | Lam Research Corporation | Method and apparatus for atomic layer deposition (ALD) in a proximity system |
US7069937B2 (en) * | 2002-09-30 | 2006-07-04 | Lam Research Corporation | Vertical proximity processor |
US7997288B2 (en) * | 2002-09-30 | 2011-08-16 | Lam Research Corporation | Single phase proximity head having a controlled meniscus for treating a substrate |
US6988327B2 (en) * | 2002-09-30 | 2006-01-24 | Lam Research Corporation | Methods and systems for processing a substrate using a dynamic liquid meniscus |
US7293571B2 (en) * | 2002-09-30 | 2007-11-13 | Lam Research Corporation | Substrate proximity processing housing and insert for generating a fluid meniscus |
EP1500128B1 (en) * | 2002-09-30 | 2007-06-20 | Lam Research Corporation | Method and apparatus for drying semiconductor wafer surfaces using a plurality of inlets and outlets held in close proximity to the wafer surfaces |
US7045018B2 (en) * | 2002-09-30 | 2006-05-16 | Lam Research Corporation | Substrate brush scrubbing and proximity cleaning-drying sequence using compatible chemistries, and method, apparatus, and system for implementing the same |
US7093375B2 (en) * | 2002-09-30 | 2006-08-22 | Lam Research Corporation | Apparatus and method for utilizing a meniscus in substrate processing |
US7153400B2 (en) * | 2002-09-30 | 2006-12-26 | Lam Research Corporation | Apparatus and method for depositing and planarizing thin films of semiconductor wafers |
US7614411B2 (en) | 2002-09-30 | 2009-11-10 | Lam Research Corporation | Controls of ambient environment during wafer drying using proximity head |
US8236382B2 (en) * | 2002-09-30 | 2012-08-07 | Lam Research Corporation | Proximity substrate preparation sequence, and method, apparatus, and system for implementing the same |
US6988326B2 (en) * | 2002-09-30 | 2006-01-24 | Lam Research Corporation | Phobic barrier meniscus separation and containment |
US6954993B1 (en) | 2002-09-30 | 2005-10-18 | Lam Research Corporation | Concentric proximity processing head |
US7051743B2 (en) * | 2002-10-29 | 2006-05-30 | Yong Bae Kim | Apparatus and method for cleaning surfaces of semiconductor wafers using ozone |
US7306002B2 (en) * | 2003-01-04 | 2007-12-11 | Yong Bae Kim | System and method for wet cleaning a semiconductor wafer |
JP4428014B2 (ja) * | 2003-02-25 | 2010-03-10 | パナソニック電工株式会社 | 超音波生体洗浄装置 |
US7675000B2 (en) * | 2003-06-24 | 2010-03-09 | Lam Research Corporation | System method and apparatus for dry-in, dry-out, low defect laser dicing using proximity technology |
US20050034742A1 (en) * | 2003-08-11 | 2005-02-17 | Kaijo Corporation | Cleaning method and cleaning apparatus |
US7431040B2 (en) * | 2003-09-30 | 2008-10-07 | Tokyo Electron Limited | Method and apparatus for dispensing a rinse solution on a substrate |
US20050109371A1 (en) * | 2003-10-27 | 2005-05-26 | Applied Materials, Inc. | Post CMP scrubbing of substrates |
US8062471B2 (en) * | 2004-03-31 | 2011-11-22 | Lam Research Corporation | Proximity head heating method and apparatus |
US20060027248A1 (en) * | 2004-08-09 | 2006-02-09 | Applied Materials, Inc. | Megasonic cleaning with minimized interference |
DE102005008939A1 (de) * | 2005-02-26 | 2006-09-21 | Sms Demag Ag | Verfahren und Vorrichtung zum Reiningen eines Metallbandes |
JP4514700B2 (ja) * | 2005-12-13 | 2010-07-28 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
US7928366B2 (en) * | 2006-10-06 | 2011-04-19 | Lam Research Corporation | Methods of and apparatus for accessing a process chamber using a dual zone gas injector with improved optical access |
US20080017219A1 (en) * | 2006-07-12 | 2008-01-24 | Cole Franklin | Transducer assembly incorporating a transmitter having through holes, and method and system for cleaning a substrate utilizing the same |
TWI352628B (en) * | 2006-07-21 | 2011-11-21 | Akrion Technologies Inc | Nozzle for use in the megasonic cleaning of substr |
US8813764B2 (en) | 2009-05-29 | 2014-08-26 | Lam Research Corporation | Method and apparatus for physical confinement of a liquid meniscus over a semiconductor wafer |
WO2008042238A1 (en) * | 2006-09-29 | 2008-04-10 | Lam Research Corporation | Reduction of entrance and exit marks left by a substrate-processing meniscus |
US7946303B2 (en) * | 2006-09-29 | 2011-05-24 | Lam Research Corporation | Carrier for reducing entrance and/or exit marks left by a substrate-processing meniscus |
US8146902B2 (en) | 2006-12-21 | 2012-04-03 | Lam Research Corporation | Hybrid composite wafer carrier for wet clean equipment |
US8464736B1 (en) | 2007-03-30 | 2013-06-18 | Lam Research Corporation | Reclaim chemistry |
US7975708B2 (en) * | 2007-03-30 | 2011-07-12 | Lam Research Corporation | Proximity head with angled vacuum conduit system, apparatus and method |
US8141566B2 (en) * | 2007-06-19 | 2012-03-27 | Lam Research Corporation | System, method and apparatus for maintaining separation of liquids in a controlled meniscus |
US8978673B2 (en) * | 2007-08-09 | 2015-03-17 | Asm Assembly Automation Ltd | Megasonic cleaning system |
TW200934590A (en) * | 2008-02-05 | 2009-08-16 | Gudeng Prec Industral Co Ltd | Semiconductor cleaning apparatus, photomask cleaning apparatus and the cleaning method thereof |
DE102008039160A1 (de) * | 2008-08-21 | 2010-02-25 | Meiko Maschinenbau Gmbh & Co. Kg | Reinigungs- und Desinfektionsgerät mit verstellbarer Düse |
JP5270263B2 (ja) * | 2008-08-29 | 2013-08-21 | 大日本スクリーン製造株式会社 | 基板処理装置および基板処理方法 |
US8585826B2 (en) * | 2008-11-25 | 2013-11-19 | 3M Innovative Properties Company | Apparatus and method for cleaning flexible webs |
US20100163078A1 (en) * | 2008-12-31 | 2010-07-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Spinner and method of cleaning substrate using the spinner |
JP5852898B2 (ja) * | 2011-03-28 | 2016-02-03 | 株式会社Screenホールディングス | 基板処理装置および基板処理方法 |
US10096461B2 (en) | 2011-06-23 | 2018-10-09 | Brooks Automation Germany, GmbH | Semiconductor cleaner systems and methods |
CN102416391A (zh) * | 2011-11-17 | 2012-04-18 | 北京七星华创电子股份有限公司 | 晶片表面清洗装置及清洗方法 |
CN102989705A (zh) * | 2012-11-28 | 2013-03-27 | 北京七星华创电子股份有限公司 | 防止液体飞溅的清洗装置及具有该装置的清洗系统 |
US20140261572A1 (en) | 2013-03-15 | 2014-09-18 | Dainippon Screen Mfg.Co., Ltd. | Substrate treatment apparatus and substrate treatment method |
CN103639144A (zh) * | 2013-11-25 | 2014-03-19 | 湖州市妙西镇资产经营有限公司 | 一种磁性元件清洗装置 |
US10343193B2 (en) | 2014-02-24 | 2019-07-09 | The Boeing Company | System and method for surface cleaning |
KR102285832B1 (ko) * | 2014-07-25 | 2021-08-05 | 삼성전자주식회사 | 기판 처리 장치 및 기판 처리 방법 |
US10388537B2 (en) | 2016-04-15 | 2019-08-20 | Samsung Electronics Co., Ltd. | Cleaning apparatus, chemical mechanical polishing system including the same, cleaning method after chemical mechanical polishing, and method of manufacturing semiconductor device including the same |
KR20170128801A (ko) | 2016-05-16 | 2017-11-24 | 삼성전자주식회사 | 기판 세정 방법 및 이를 수행하기 위한 장치 |
CN206440916U (zh) * | 2017-01-23 | 2017-08-25 | 合肥鑫晟光电科技有限公司 | 封框胶涂布装置 |
DE102019116307A1 (de) * | 2019-05-08 | 2020-11-12 | Ecoclean Gmbh | Reinigungsvorrichtung und Verfahren zum Reinigen von Bauteilen |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4064885A (en) * | 1976-10-26 | 1977-12-27 | Branson Ultrasonics Corporation | Apparatus for cleaning workpieces by ultrasonic energy |
JPS54103266A (en) * | 1978-01-30 | 1979-08-14 | Matsushita Electric Works Ltd | Ultrasonic cleaner |
US4326553A (en) * | 1980-08-28 | 1982-04-27 | Rca Corporation | Megasonic jet cleaner apparatus |
JPS61181134A (ja) * | 1985-02-07 | 1986-08-13 | Hitachi Ltd | 洗浄装置 |
JPS62188323A (ja) * | 1986-02-14 | 1987-08-17 | Dainippon Screen Mfg Co Ltd | 基板の洗浄並びに乾燥方法及び装置 |
JPH0695382B2 (ja) * | 1987-10-17 | 1994-11-24 | 東京エレクトロン株式会社 | ディスクの洗浄方法 |
JP2653511B2 (ja) * | 1989-03-30 | 1997-09-17 | 株式会社東芝 | 半導体装置の洗浄方法及びその洗浄装置 |
JPH0314230A (ja) * | 1989-06-13 | 1991-01-22 | Toshiba Corp | 半導体ウェーハの洗浄方法及び装置 |
US5186389A (en) * | 1990-04-03 | 1993-02-16 | S & C Co.,Ltd. | Spray tube ultrasonic washing apparatus |
JPH04213827A (ja) * | 1990-12-11 | 1992-08-04 | Nec Yamagata Ltd | 半導体製造用ウェーハ表面洗浄装置 |
JPH05175184A (ja) * | 1991-12-20 | 1993-07-13 | Sharp Corp | ウエハの洗浄方法 |
JPH06120136A (ja) * | 1992-10-05 | 1994-04-28 | Canon Sales Co Inc | 基板エッジ洗浄方法 |
US5368054A (en) * | 1993-12-17 | 1994-11-29 | International Business Machines Corporation | Ultrasonic jet semiconductor wafer cleaning apparatus |
US5512335A (en) * | 1994-06-27 | 1996-04-30 | International Business Machines Corporation | Fluid treatment device with vibrational energy means |
US5601655A (en) * | 1995-02-14 | 1997-02-11 | Bok; Hendrik F. | Method of cleaning substrates |
-
1996
- 1996-12-17 US US08/775,712 patent/US5975098A/en not_active Expired - Lifetime
- 1996-12-19 KR KR1019960067940A patent/KR100294096B1/ko not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101210297B1 (ko) | 2011-08-01 | 2012-12-10 | 주식회사 케이씨텍 | 화학 기계적 연마 장치의 세정 기구 |
Also Published As
Publication number | Publication date |
---|---|
US5975098A (en) | 1999-11-02 |
KR970052718A (ko) | 1997-07-29 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100294096B1 (ko) | 기판세정장치 및 기판세정방법 | |
KR100458211B1 (ko) | 세정장치 | |
KR101277614B1 (ko) | 기판처리장치 및 기판처리방법 | |
JP7224403B2 (ja) | 基板洗浄装置および基板洗浄方法 | |
JP5955601B2 (ja) | 基板処理装置および基板処理方法 | |
JP3323385B2 (ja) | 基板洗浄装置および基板洗浄方法 | |
JP3323384B2 (ja) | 基板洗浄装置および基板洗浄方法 | |
JP2002280343A (ja) | 洗浄処理装置、切削加工装置 | |
JPH10308374A (ja) | 洗浄方法及び洗浄装置 | |
TWI522185B (zh) | Ultrasonic cleaning device and ultrasonic cleaning method | |
JPH1187288A (ja) | 基板洗浄方法および該洗浄方法に用いられる洗浄装置 | |
JP2000147787A (ja) | 現像方法及び現像装置 | |
JPH09148295A (ja) | 回転式基板処理装置 | |
JP2005131602A (ja) | 洗浄装置 | |
JP3286286B2 (ja) | 洗浄装置 | |
KR20090015856A (ko) | 메가소닉 세정 시스템 | |
JPH1064868A (ja) | 基板洗浄装置および基板洗浄方法 | |
JP2004260099A (ja) | 処理流体供給装置およびこれを適用した基板処理装置、ならびに基板処理方法 | |
JPH05175184A (ja) | ウエハの洗浄方法 | |
JP2004146439A (ja) | 基板洗浄方法および基板洗浄装置 | |
CN114270475A (zh) | 基板清洗方法及基板清洗装置 | |
JP2008103423A (ja) | 基板洗浄装置及びこれを用いた基板洗浄方法 | |
JPH11214333A (ja) | ダイシングマシンの洗浄装置 | |
TWI866063B (zh) | 晶片清洗裝置 | |
TWI774498B (zh) | 超音波清洗方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19961219 |
|
PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 19961219 Comment text: Request for Examination of Application |
|
PG1501 | Laying open of application | ||
E902 | Notification of reason for refusal | ||
PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 19990420 Patent event code: PE09021S01D |
|
E601 | Decision to refuse application | ||
PE0601 | Decision on rejection of patent |
Patent event date: 19990726 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 19990420 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |
|
J201 | Request for trial against refusal decision | ||
PJ0201 | Trial against decision of rejection |
Patent event date: 19990824 Comment text: Request for Trial against Decision on Refusal Patent event code: PJ02012R01D Patent event date: 19990726 Comment text: Decision to Refuse Application Patent event code: PJ02011S01I Appeal kind category: Appeal against decision to decline refusal Decision date: 20001130 Appeal identifier: 1999101003050 Request date: 19990824 |
|
J301 | Trial decision |
Free format text: TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 19990824 Effective date: 20001130 |
|
PJ1301 | Trial decision |
Patent event code: PJ13011S01D Patent event date: 20001201 Comment text: Trial Decision on Objection to Decision on Refusal Appeal kind category: Appeal against decision to decline refusal Request date: 19990824 Decision date: 20001130 Appeal identifier: 1999101003050 |
|
PS0901 | Examination by remand of revocation | ||
S901 | Examination by remand of revocation | ||
GRNO | Decision to grant (after opposition) | ||
PS0701 | Decision of registration after remand of revocation |
Patent event date: 20010110 Patent event code: PS07012S01D Comment text: Decision to Grant Registration Patent event date: 20001220 Patent event code: PS07011S01I Comment text: Notice of Trial Decision (Remand of Revocation) |
|
GRNT | Written decision to grant | ||
PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20010411 Patent event code: PR07011E01D |
|
PR1002 | Payment of registration fee |
Payment date: 20010411 End annual number: 3 Start annual number: 1 |
|
PG1601 | Publication of registration | ||
PR1001 | Payment of annual fee |
Payment date: 20040331 Start annual number: 4 End annual number: 4 |
|
PR1001 | Payment of annual fee |
Payment date: 20050408 Start annual number: 5 End annual number: 5 |
|
PR1001 | Payment of annual fee |
Payment date: 20060410 Start annual number: 6 End annual number: 6 |
|
PR1001 | Payment of annual fee |
Payment date: 20070411 Start annual number: 7 End annual number: 7 |
|
PR1001 | Payment of annual fee |
Payment date: 20080411 Start annual number: 8 End annual number: 8 |
|
PR1001 | Payment of annual fee |
Payment date: 20090410 Start annual number: 9 End annual number: 9 |
|
PR1001 | Payment of annual fee |
Payment date: 20100412 Start annual number: 10 End annual number: 10 |
|
PR1001 | Payment of annual fee |
Payment date: 20110318 Start annual number: 11 End annual number: 11 |
|
PR1001 | Payment of annual fee |
Payment date: 20120322 Start annual number: 12 End annual number: 12 |
|
FPAY | Annual fee payment |
Payment date: 20130321 Year of fee payment: 13 |
|
PR1001 | Payment of annual fee |
Payment date: 20130321 Start annual number: 13 End annual number: 13 |
|
FPAY | Annual fee payment |
Payment date: 20140320 Year of fee payment: 14 |
|
PR1001 | Payment of annual fee |
Payment date: 20140320 Start annual number: 14 End annual number: 14 |
|
PR1001 | Payment of annual fee |
Payment date: 20150320 Start annual number: 15 End annual number: 15 |
|
LAPS | Lapse due to unpaid annual fee | ||
PC1903 | Unpaid annual fee |