KR100249309B1 - 반도체 제조용 포토 레지스트 코팅 장치 - Google Patents
반도체 제조용 포토 레지스트 코팅 장치 Download PDFInfo
- Publication number
- KR100249309B1 KR100249309B1 KR1019970006793A KR19970006793A KR100249309B1 KR 100249309 B1 KR100249309 B1 KR 100249309B1 KR 1019970006793 A KR1019970006793 A KR 1019970006793A KR 19970006793 A KR19970006793 A KR 19970006793A KR 100249309 B1 KR100249309 B1 KR 100249309B1
- Authority
- KR
- South Korea
- Prior art keywords
- photoresist
- wafer
- main body
- bowl
- cover
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/02—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface
- B05C11/08—Spreading liquid or other fluent material by manipulating the work, e.g. tilting
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- B05B15/00—Details of spraying plant or spraying apparatus not otherwise provided for; Accessories
- B05B15/50—Arrangements for cleaning; Arrangements for preventing deposits, drying-out or blockage; Arrangements for detecting improper discharge caused by the presence of foreign matter
- B05B15/55—Arrangements for cleaning; Arrangements for preventing deposits, drying-out or blockage; Arrangements for detecting improper discharge caused by the presence of foreign matter using cleaning fluids
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Coating Apparatus (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Materials For Photolithography (AREA)
Abstract
Description
Claims (5)
- (정정)상부가 개방된 용기 형태의 본체와, 상기 본체 내부에 위치되고 웨이퍼를 고정하여 일정속도로 회전시키는 스핀척 및 상기 본체의 상부를 개폐하게 되는 덮개를 구비한 반도체 제조용 포토 레지스트 코팅장치에 있어서,상기 본체의 내측에 설치되어 포토 레지스트가 본체에 묻지 않도록 하는 보울;상기 본체의 내부와 연통되도록 상기 덮개에 형성되어 있는 관통구멍;상기 관통구멍을 통해 상기 웨이퍼 상에 수직방향으로 상하 이동하도록 설치되어 포토 레지스트를 분출하는 포토 레지스트 디스펜스 노즐;상기 관통구멍을 통해 웨이퍼 상에 수직 방향으로 상하 이동하도록 설치되어 웨이퍼의 모서리부에 묻은 포토 레지스트를 제거하는 사이드 린스 노즐; 및상기 덮개의 밑면 중앙부에 설치되어 상기 보울을 클리닝하기 위한 클리닝수단;을 포함하여 됨을 특징으로 하는 반도체 제조용 포토 레지스트 코팅장치.
- (정정)제1항에 있어서,상기 클리닝 수단은, 상기 덮개 중앙부에 관통되게 설치되어 내부의 보울에 린스액을 분출하는 스프링 쿨러(spring cooler); 및린스액 저장탱크에서 린스액을 펌핑하여 상기 스프링 쿨러로 공급하는 펌프;로 구성됨을 특징으로 하는 상기 반도체 제조용 포토 레지스트 코팅장치.
- 제2항에 있어서,상기 린스액은 솔벤트인 것을 특징으로 하는 상기 반도체 제조용 포토 레지스트 코팅장치.
- (정정)상부가 개방된 용기 형태의 본체와, 상기 본체 내부에 위치되고 웨이퍼를 고정하여 일정속도로 회전시키는 스핀척 및 상기 본체의 상부를 개폐하게 되는 덮개를 구비한 반도체 제조용 포토 레지스트 코팅장치에 있어서,상기 본체의 내측에 설치되어 포토 레지스트가 본체에 묻지 않도록 하는 보울;상기 웨이퍼 상에 포토 레지스트를 분출하는 포토 레지스트 디스펜스 노즐 및 웨이퍼의 모서리부에 묻은 포토 레지스트를 제거하는 사이드 린스 노즐이 고정 설치되고 상기 본체의 상부가 개폐 가능하도록 개방위치 및 폐쇄위치로 이동 가능하게 설치되어 있는 덮개; 및상기 덮개의 밑면 중앙부에 설치되어 상기 보울을 클리닝하기 위한 클리닝수단;을 포함하여 됨을 특징으로 하는 반도체 제조용 포토 레지스트 코팅장치.
- (삭제)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970006793A KR100249309B1 (ko) | 1997-02-28 | 1997-02-28 | 반도체 제조용 포토 레지스트 코팅 장치 |
TW086114637A TW472312B (en) | 1997-02-28 | 1997-10-07 | Apparatus of coating photoresist in semiconductor device manufacturing process |
US09/019,118 US6019843A (en) | 1997-02-28 | 1998-02-05 | Apparatus for coating a semiconductor wafer with a photoresist |
JP10047943A JP2846879B2 (ja) | 1997-02-28 | 1998-02-27 | 半導体製造用フォトレジストコーティング装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970006793A KR100249309B1 (ko) | 1997-02-28 | 1997-02-28 | 반도체 제조용 포토 레지스트 코팅 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR19980069633A KR19980069633A (ko) | 1998-10-26 |
KR100249309B1 true KR100249309B1 (ko) | 2000-03-15 |
Family
ID=19498500
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970006793A Expired - Fee Related KR100249309B1 (ko) | 1997-02-28 | 1997-02-28 | 반도체 제조용 포토 레지스트 코팅 장치 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6019843A (ko) |
JP (1) | JP2846879B2 (ko) |
KR (1) | KR100249309B1 (ko) |
TW (1) | TW472312B (ko) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6248171B1 (en) * | 1998-09-17 | 2001-06-19 | Silicon Valley Group, Inc. | Yield and line width performance for liquid polymers and other materials |
US6689215B2 (en) | 1998-09-17 | 2004-02-10 | Asml Holdings, N.V. | Method and apparatus for mitigating cross-contamination between liquid dispensing jets in close proximity to a surface |
US6202658B1 (en) * | 1998-11-11 | 2001-03-20 | Applied Materials, Inc. | Method and apparatus for cleaning the edge of a thin disc |
US6516816B1 (en) * | 1999-04-08 | 2003-02-11 | Applied Materials, Inc. | Spin-rinse-dryer |
US6516815B1 (en) * | 1999-07-09 | 2003-02-11 | Applied Materials, Inc. | Edge bead removal/spin rinse dry (EBR/SRD) module |
KR100327045B1 (ko) * | 1999-12-31 | 2002-03-06 | 황인길 | 코팅장비의 내부 오염 방지 장치 |
US6746826B1 (en) | 2000-07-25 | 2004-06-08 | Asml Holding N.V. | Method for an improved developing process in wafer photolithography |
US7153364B1 (en) * | 2000-10-23 | 2006-12-26 | Advance Micro Devices, Inc. | Re-circulation and reuse of dummy-dispensed resist |
US6691719B2 (en) * | 2001-01-12 | 2004-02-17 | Applied Materials Inc. | Adjustable nozzle for wafer bevel cleaning |
US6824612B2 (en) | 2001-12-26 | 2004-11-30 | Applied Materials, Inc. | Electroless plating system |
US6770565B2 (en) | 2002-01-08 | 2004-08-03 | Applied Materials Inc. | System for planarizing metal conductive layers |
WO2003105200A1 (en) * | 2002-06-06 | 2003-12-18 | Ebara Corporation | Substrate processing apparatus and substrate processing method |
WO2004012242A1 (en) * | 2002-07-26 | 2004-02-05 | Applied Materials, Inc. | Hydrophilic components for a spin-rinse-dryer |
US6938629B2 (en) * | 2002-11-13 | 2005-09-06 | Taiwan Semiconductor Manufacturing Co., Ltd | Rinsing lid for wet bench |
US6770424B2 (en) * | 2002-12-16 | 2004-08-03 | Asml Holding N.V. | Wafer track apparatus and methods for dispensing fluids with rotatable dispense arms |
KR100926308B1 (ko) * | 2003-04-23 | 2009-11-12 | 삼성전자주식회사 | 세정 유닛, 이를 갖는 코팅 장치 및 방법 |
US20070214620A1 (en) * | 2003-06-11 | 2007-09-20 | Mitsuru Miyazaki | Substrate processing apparatus and substrate processing method |
US7368016B2 (en) * | 2004-04-28 | 2008-05-06 | Ebara Corporation | Substrate processing unit and substrate processing apparatus |
KR100958196B1 (ko) * | 2009-08-21 | 2010-05-14 | 주식회사 티케이씨 | 습식공정장비의 도어 일체형 오실레이션 노즐장치 |
JP5693438B2 (ja) * | 2011-12-16 | 2015-04-01 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法および記憶媒体 |
CN102814251A (zh) * | 2012-07-20 | 2012-12-12 | 樊荣 | 一种封闭式旋转喷漆机 |
KR101512560B1 (ko) | 2012-08-31 | 2015-04-15 | 가부시키가이샤 스크린 홀딩스 | 기판처리장치 |
JP7007869B2 (ja) * | 2017-11-14 | 2022-01-25 | 東京エレクトロン株式会社 | 基板処理装置、基板処理方法及びコンピュータ読み取り可能な記録媒体 |
KR102480540B1 (ko) * | 2020-09-29 | 2022-12-23 | 주식회사화신 | 부품 도포장치 |
TWI770727B (zh) * | 2020-12-18 | 2022-07-11 | 南亞科技股份有限公司 | 晶圓清洗裝置及清洗晶圓的方法 |
CN113457894B (zh) * | 2021-05-30 | 2022-07-15 | 唐山国芯晶源电子有限公司 | 用于光刻胶喷嘴的封堵接头 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5882521A (ja) * | 1981-07-10 | 1983-05-18 | Hitachi Ltd | スピンナ |
JPH08115867A (ja) * | 1994-10-18 | 1996-05-07 | Hitachi Ltd | レジスト塗布装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5565034A (en) * | 1993-10-29 | 1996-10-15 | Tokyo Electron Limited | Apparatus for processing substrates having a film formed on a surface of the substrate |
JP3388628B2 (ja) * | 1994-03-24 | 2003-03-24 | 東京応化工業株式会社 | 回転式薬液処理装置 |
JP3099054B2 (ja) * | 1994-09-09 | 2000-10-16 | 東京エレクトロン株式会社 | 塗布装置及びその方法 |
-
1997
- 1997-02-28 KR KR1019970006793A patent/KR100249309B1/ko not_active Expired - Fee Related
- 1997-10-07 TW TW086114637A patent/TW472312B/zh not_active IP Right Cessation
-
1998
- 1998-02-05 US US09/019,118 patent/US6019843A/en not_active Expired - Lifetime
- 1998-02-27 JP JP10047943A patent/JP2846879B2/ja not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5882521A (ja) * | 1981-07-10 | 1983-05-18 | Hitachi Ltd | スピンナ |
JPH08115867A (ja) * | 1994-10-18 | 1996-05-07 | Hitachi Ltd | レジスト塗布装置 |
Also Published As
Publication number | Publication date |
---|---|
JP2846879B2 (ja) | 1999-01-13 |
US6019843A (en) | 2000-02-01 |
KR19980069633A (ko) | 1998-10-26 |
JPH10270358A (ja) | 1998-10-09 |
TW472312B (en) | 2002-01-11 |
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