KR100244982B1 - Photosensitive ployimide of low shrinkage - Google Patents
Photosensitive ployimide of low shrinkage Download PDFInfo
- Publication number
- KR100244982B1 KR100244982B1 KR1019980003095A KR19980003095A KR100244982B1 KR 100244982 B1 KR100244982 B1 KR 100244982B1 KR 1019980003095 A KR1019980003095 A KR 1019980003095A KR 19980003095 A KR19980003095 A KR 19980003095A KR 100244982 B1 KR100244982 B1 KR 100244982B1
- Authority
- KR
- South Korea
- Prior art keywords
- formula
- group
- photosensitive
- polyimide precursor
- compound
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 229920001721 polyimide Polymers 0.000 claims abstract description 55
- 239000004642 Polyimide Substances 0.000 claims abstract description 48
- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 claims abstract description 37
- 239000002243 precursor Substances 0.000 claims abstract description 28
- 239000000178 monomer Substances 0.000 claims abstract description 25
- 150000001875 compounds Chemical class 0.000 claims abstract description 20
- 239000000203 mixture Substances 0.000 claims abstract description 20
- 125000004122 cyclic group Chemical group 0.000 claims abstract description 18
- 125000001931 aliphatic group Chemical group 0.000 claims abstract description 15
- 125000006158 tetracarboxylic acid group Chemical group 0.000 claims abstract description 11
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims abstract description 10
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 claims abstract description 10
- 125000003118 aryl group Chemical group 0.000 claims abstract description 9
- 238000007151 ring opening polymerisation reaction Methods 0.000 claims abstract description 9
- 239000003960 organic solvent Substances 0.000 claims abstract description 8
- 150000004984 aromatic diamines Chemical class 0.000 claims abstract description 5
- -1 cyclic ketene acetal Chemical class 0.000 claims description 25
- 238000000034 method Methods 0.000 claims description 13
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims description 6
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 claims description 6
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 claims description 6
- XXROGKLTLUQVRX-UHFFFAOYSA-N allyl alcohol Chemical compound OCC=C XXROGKLTLUQVRX-UHFFFAOYSA-N 0.000 claims description 6
- 235000019441 ethanol Nutrition 0.000 claims description 5
- ZXEKIIBDNHEJCQ-UHFFFAOYSA-N isobutanol Chemical compound CC(C)CO ZXEKIIBDNHEJCQ-UHFFFAOYSA-N 0.000 claims description 4
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 claims description 3
- 229940125773 compound 10 Drugs 0.000 claims description 3
- ZLVXBBHTMQJRSX-VMGNSXQWSA-N jdtic Chemical compound C1([C@]2(C)CCN(C[C@@H]2C)C[C@H](C(C)C)NC(=O)[C@@H]2NCC3=CC(O)=CC=C3C2)=CC=CC(O)=C1 ZLVXBBHTMQJRSX-VMGNSXQWSA-N 0.000 claims description 3
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 claims description 2
- YIWFBNMYFYINAD-UHFFFAOYSA-N ethenylcyclopropane Chemical compound C=CC1CC1 YIWFBNMYFYINAD-UHFFFAOYSA-N 0.000 claims description 2
- 150000002366 halogen compounds Chemical class 0.000 claims description 2
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- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 claims 1
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- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 9
- 229920005575 poly(amic acid) Polymers 0.000 description 9
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- 239000011248 coating agent Substances 0.000 description 6
- 238000000576 coating method Methods 0.000 description 6
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- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 4
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- 239000001294 propane Substances 0.000 description 4
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- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 3
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- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 description 2
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- GUUVPOWQJOLRAS-UHFFFAOYSA-N Diphenyl disulfide Chemical compound C=1C=CC=CC=1SSC1=CC=CC=C1 GUUVPOWQJOLRAS-UHFFFAOYSA-N 0.000 description 2
- QIGBRXMKCJKVMJ-UHFFFAOYSA-N Hydroquinone Chemical compound OC1=CC=C(O)C=C1 QIGBRXMKCJKVMJ-UHFFFAOYSA-N 0.000 description 2
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- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 150000001298 alcohols Chemical class 0.000 description 2
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- 150000004985 diamines Chemical class 0.000 description 2
- ZZTCPWRAHWXWCH-UHFFFAOYSA-N diphenylmethanediamine Chemical compound C=1C=CC=CC=1C(N)(N)C1=CC=CC=C1 ZZTCPWRAHWXWCH-UHFFFAOYSA-N 0.000 description 2
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- 108091008695 photoreceptors Proteins 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- WQGWDDDVZFFDIG-UHFFFAOYSA-N pyrogallol Chemical compound OC1=CC=CC(O)=C1O WQGWDDDVZFFDIG-UHFFFAOYSA-N 0.000 description 2
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- 239000010703 silicon Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- HJUGFYREWKUQJT-UHFFFAOYSA-N tetrabromomethane Chemical compound BrC(Br)(Br)Br HJUGFYREWKUQJT-UHFFFAOYSA-N 0.000 description 2
- 238000012719 thermal polymerization Methods 0.000 description 2
- DQFBYFPFKXHELB-VAWYXSNFSA-N trans-chalcone Chemical compound C=1C=CC=CC=1C(=O)\C=C\C1=CC=CC=C1 DQFBYFPFKXHELB-VAWYXSNFSA-N 0.000 description 2
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- OIZQEPBFZDVGKV-UHFFFAOYSA-N (4,4-dichlorocyclohexa-1,5-dien-1-yl)-phenylmethanone Chemical compound C1=CC(Cl)(Cl)CC=C1C(=O)C1=CC=CC=C1 OIZQEPBFZDVGKV-UHFFFAOYSA-N 0.000 description 1
- AVQQQNCBBIEMEU-UHFFFAOYSA-N 1,1,3,3-tetramethylurea Chemical compound CN(C)C(=O)N(C)C AVQQQNCBBIEMEU-UHFFFAOYSA-N 0.000 description 1
- SCEFCWXRXJZWHE-UHFFFAOYSA-N 1,2,3-tribromo-4-(2,3,4-tribromophenyl)sulfonylbenzene Chemical compound BrC1=C(Br)C(Br)=CC=C1S(=O)(=O)C1=CC=C(Br)C(Br)=C1Br SCEFCWXRXJZWHE-UHFFFAOYSA-N 0.000 description 1
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- 125000001664 diethylamino group Chemical group [H]C([H])([H])C([H])([H])N(*)C([H])([H])C([H])([H])[H] 0.000 description 1
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- ANSXAPJVJOKRDJ-UHFFFAOYSA-N furo[3,4-f][2]benzofuran-1,3,5,7-tetrone Chemical compound C1=C2C(=O)OC(=O)C2=CC2=C1C(=O)OC2=O ANSXAPJVJOKRDJ-UHFFFAOYSA-N 0.000 description 1
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- GNOIPBMMFNIUFM-UHFFFAOYSA-N hexamethylphosphoric triamide Chemical compound CN(C)P(=O)(N(C)C)N(C)C GNOIPBMMFNIUFM-UHFFFAOYSA-N 0.000 description 1
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- CXKWCBBOMKCUKX-UHFFFAOYSA-M methylene blue Chemical compound [Cl-].C1=CC(N(C)C)=CC2=[S+]C3=CC(N(C)C)=CC=C3N=C21 CXKWCBBOMKCUKX-UHFFFAOYSA-M 0.000 description 1
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- YPHQUSNPXDGUHL-UHFFFAOYSA-N n-methylprop-2-enamide Chemical compound CNC(=O)C=C YPHQUSNPXDGUHL-UHFFFAOYSA-N 0.000 description 1
- OBKARQMATMRWQZ-UHFFFAOYSA-N naphthalene-1,2,5,6-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=CC2=C(C(O)=O)C(C(=O)O)=CC=C21 OBKARQMATMRWQZ-UHFFFAOYSA-N 0.000 description 1
- SDGKZQFUPQJJLM-UHFFFAOYSA-N naphthalene-1,5-diamine Chemical compound NC1=CC=CC2=C(C=CC=C12)N.NC1=CC=CC2=C(C=CC=C12)N SDGKZQFUPQJJLM-UHFFFAOYSA-N 0.000 description 1
- DASJFYAPNPUBGG-UHFFFAOYSA-N naphthalene-1-sulfonyl chloride Chemical compound C1=CC=C2C(S(=O)(=O)Cl)=CC=CC2=C1 DASJFYAPNPUBGG-UHFFFAOYSA-N 0.000 description 1
- DOBFTMLCEYUAQC-UHFFFAOYSA-N naphthalene-2,3,6,7-tetracarboxylic acid Chemical compound OC(=O)C1=C(C(O)=O)C=C2C=C(C(O)=O)C(C(=O)O)=CC2=C1 DOBFTMLCEYUAQC-UHFFFAOYSA-N 0.000 description 1
- YTVNOVQHSGMMOV-UHFFFAOYSA-N naphthalenetetracarboxylic dianhydride Chemical compound C1=CC(C(=O)OC2=O)=C3C2=CC=C2C(=O)OC(=O)C1=C32 YTVNOVQHSGMMOV-UHFFFAOYSA-N 0.000 description 1
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- CLYVDMAATCIVBF-UHFFFAOYSA-N pigment red 224 Chemical compound C=12C3=CC=C(C(OC4=O)=O)C2=C4C=CC=1C1=CC=C2C(=O)OC(=O)C4=CC=C3C1=C42 CLYVDMAATCIVBF-UHFFFAOYSA-N 0.000 description 1
- 239000003495 polar organic solvent Substances 0.000 description 1
- 238000012643 polycondensation polymerization Methods 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 1
- JRDBISOHUUQXHE-UHFFFAOYSA-N pyridine-2,3,5,6-tetracarboxylic acid Chemical compound OC(=O)C1=CC(C(O)=O)=C(C(O)=O)N=C1C(O)=O JRDBISOHUUQXHE-UHFFFAOYSA-N 0.000 description 1
- MIROPXUFDXCYLG-UHFFFAOYSA-N pyridine-2,5-diamine Chemical compound NC1=CC=C(N)N=C1 MIROPXUFDXCYLG-UHFFFAOYSA-N 0.000 description 1
- 229940079877 pyrogallol Drugs 0.000 description 1
- VHXJRLYFEJAIAM-UHFFFAOYSA-N quinoline-2-sulfonyl chloride Chemical compound C1=CC=CC2=NC(S(=O)(=O)Cl)=CC=C21 VHXJRLYFEJAIAM-UHFFFAOYSA-N 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000007142 ring opening reaction Methods 0.000 description 1
- WXXDJUOZAPZLMX-UHFFFAOYSA-N s-(1-phenyltetrazol-5-yl) benzenecarbothioate Chemical compound C=1C=CC=CC=1C(=O)SC1=NN=NN1C1=CC=CC=C1 WXXDJUOZAPZLMX-UHFFFAOYSA-N 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- RMAQACBXLXPBSY-UHFFFAOYSA-N silicic acid Chemical compound O[Si](O)(O)O RMAQACBXLXPBSY-UHFFFAOYSA-N 0.000 description 1
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G69/00—Macromolecular compounds obtained by reactions forming a carboxylic amide link in the main chain of the macromolecule
- C08G69/02—Polyamides derived from amino-carboxylic acids or from polyamines and polycarboxylic acids
- C08G69/26—Polyamides derived from amino-carboxylic acids or from polyamines and polycarboxylic acids derived from polyamines and polycarboxylic acids
Landscapes
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Organic Chemistry (AREA)
- Macromolecular Compounds Obtained By Forming Nitrogen-Containing Linkages In General (AREA)
Abstract
본 발명은 유기용매에 하기 화학식 1의 테트라카르복실산 이무수물, 하기 화학식 2의 방향족 디아민 및 광반응성 단량체로 이루어지는 실록산 폴리이미드 전구체 조성물에 관한 것이다. 상기 광반응성 단량체는 개환중합형 환형단량체와 광가교형 아크릴 감광기를 갖는 화합물로 이루어지며, 이들 성분의 함유비율은 10 : 90 ∼ 90 : 10의 범위이다.The present invention relates to a siloxane polyimide precursor composition comprising a tetracarboxylic dianhydride of formula (1), an aromatic diamine of formula (2) and a photoreactive monomer in an organic solvent. The photoreactive monomer is composed of a compound having a ring-opening polymerization cyclic monomer and a photocrosslinkable acrylic photosensitive group, and the content ratio of these components is in the range of 10:90 to 90:10.
상기식에서 R2는 방향족 또는 지방족 환상기이고, X는 포화 지방족 또는 불포화 지방기를 갖는 감광성 화합물이다.Wherein R 2 is an aromatic or aliphatic cyclic group and X is a photosensitive compound having a saturated aliphatic or unsaturated aliphatic group.
상기 폴리이미드 전구체 조성물에 광개시제, 증감제, 중합금지제 및/또는 콜로이드성 무기 첨가제를 더 첨가하여 감광도, 열안정성 및 필름의 경도를 향상시킬 수 있다.A photoinitiator, a sensitizer, a polymerization inhibitor and / or a colloidal inorganic additive may be further added to the polyimide precursor composition to improve photosensitivity, thermal stability and hardness of the film.
Description
본 발명은 저수축율의 감광성 폴리이미드 전구체 조성물에 관한 것이다. 보다 구체적으로 본 발명은 테트라카르복실산 이무수물, 방향족 디아민 및 광반응성 단량체로 이루어지는 저수축율의 감광성 폴리이미드 전구체 조성물에 관한 것이다.The present invention relates to a low shrinkage photosensitive polyimide precursor composition. More specifically, the present invention relates to a low shrinkage photosensitive polyimide precursor composition composed of tetracarboxylic dianhydride, aromatic diamine and photoreactive monomer.
최근 반도체 및 액정표시 소자를 중심으로 하는 반도체 소자분야에서는 전자 디바이스의 고집적화, 고밀도화, 고신뢰화, 고속화 등의 움직임이 급격히 확산됨에 따라, 가공성과 고순도화가 용이한 유기 재료의 장점을 이용하려는 연구가 활발히 진행되고 있다. 그러나 이들 분야에서 유기고분자가 사용되기 위해서는 소자 제조시 200℃ 이상이 요구되는 공정에서 열적으로 안정되어야 한다. 폴리이미드 수지는 고내열성, 우수한 기계적 강도, 저유전율 및 고절연성 등의 우수한 전기적 특성 이외에도 코팅 표면의 평탄화 특성이 좋고 소자의 신뢰성을 저하시키는 불순물의 함유량이 매우 낮으며 미세 형상을 용이하게 형성할 수 있어 상기의 목적에 가장 적합한 수지이다. 폴리이미드를 합성하는 일반적인 방법은 2단계 축중합으로서 디아민 성분과 산이무수물을 NMP(N-methyl-2-pyrrolidone), DMAc(demethylacetamide), DMF(dimethylformamide)와 같은 극성 유기용매에서 중합시켜 폴리이미드 전구체 용액을 얻고, 이를 실리콘 웨이퍼 또는 유리에 코팅한 후 열처리에 의해 경화시켜 폴리이미드 필름을 얻는다. 상업화된 전자 재료용 폴리이미드 제품은 폴리이미드 전구체 용액 또는 폴리이미드 필름 형태로 공급되며, 반도체 소자 분야에는 주로 폴리이미드 전구체 용액 상태로 공급된다. 수지봉지 LSI에 있어, 봉지후의 수지의 체적 수축 및 칩(chip)과 수지의 열팽창계수의 차에 의한 열응력에 의해 칩의 패시베이션(passivation)막에 크랙이 발생하거나 금속 배선이 손상을 입기도 한다. 이와 같은 문제는 칩과 봉지제 사이의 폴리이미드가 완충층으로 사용되어 해결되어지며, 폴리이미드막 두께가 10μm 이상 되어야 완충 역할을 하게되며 코팅막 두께가 두꺼울수록 완충 효과가 좋아져 반도체 제품의 수율을 향상시킬 수 있다. 폴리이미드에는 전극간 연결 및 와이어 본딩 패드(wire bonding pad)와 같은 미세 패턴(via hole)의 형성이 요구되어진다. 폴리이미드의 미세패턴 형성을 위해서는 기존의 폴리이미드에 포토레지스트를 코팅하여 에칭하는 방법이 많이 이용되고 있으나, 최근 들어 폴리이미드에 감광기능을 부여한 감광성 폴리이미드의 적용이 시도되고 있다.Recently, in the semiconductor device field mainly on semiconductors and liquid crystal display devices, as the movement of high integration, high density, high reliability, and high speed of electronic devices are rapidly spreading, active researches are being made to take advantage of organic materials that are easy to process and high purity. It's going on. However, in order for the organic polymer to be used in these fields, it must be thermally stable in a process requiring 200 ° C. or more during device fabrication. In addition to the excellent electrical properties such as high heat resistance, excellent mechanical strength, low dielectric constant and high insulation, the polyimide resin has good planarization characteristics of the coating surface, very low impurity content which degrades the reliability of the device, and can easily form fine shapes. There is a resin most suitable for the above purpose. A general method for synthesizing polyimide is a two-stage condensation polymerization, in which a diamine component and an acid dianhydride are polymerized in a polar organic solvent such as NMP (N-methyl-2-pyrrolidone), DMAc (demethylacetamide) or DMF (dimethylformamide) to form a polyimide precursor. A solution is obtained, which is coated on a silicon wafer or glass and then cured by heat treatment to obtain a polyimide film. Polyimide products for commercialized electronic materials are supplied in the form of polyimide precursor solutions or polyimide films, and are mainly supplied in the polyimide precursor solution state in the semiconductor device field. In resin-encapsulated LSIs, cracks in the passivation film of chips or damage to metal wiring may occur due to the thermal shrinkage of the resin after encapsulation and the thermal stress caused by the difference between the chip and the thermal expansion coefficient of the resin. . This problem is solved by using a polyimide between the chip and the encapsulant as a buffer layer, and a polyimide film thickness of 10 μm or more plays a buffer role. As the thickness of the coating film becomes thicker, the buffer effect is improved to improve the yield of semiconductor products. Can be. Polyimides require the formation of micro holes (via holes) such as inter-electrode connections and wire bonding pads. In order to form a fine pattern of polyimide, a method of coating a photoresist on an existing polyimide and etching is widely used, but recently, application of a photosensitive polyimide having a photosensitive function to the polyimide has been attempted.
기존의 비감광성 폴리이미드를 사용할 경우 와이어 본딩(wire-bonding) 및 금속배선간의 연결을 위해 별도의 포토레지스트를 사용하여 홀(hole)을 가공하기 위한 에칭 공정이 필요하나, 감광성 폴리이미드를 사용하게 되면 일부 공정의 생략이 가능하여 생산성을 크게 높일 수 있다. 실용적인 감광성 폴리이미드는 Siemen사의 Rubner 등에 의해 개발되었다(US-A-3957512). 이는 폴리이미드 전구체인 폴리아믹산에 감광기가 에스테르 결합을 통해 결합한 형태이다. 감광성 폴리이미드 전구체 용액을 기판에 코팅해 피막을 형성하고 자외선을 노광하면 노광 부분에 광중합이 일어나 가교구조로 된다. 이 상태에서 유기용제로 현상하는 동안 미노광부가 제거되며 최종 가열처리에 의해 이미드화 반응과 동시에 에스테르 결합된 감광성분이 분해 제거되어 폴리이미드의 원하는 패턴을 얻을 수 있게 된다. 한편 일본 Toray사는 폴리아믹산에 감광기와 아미노 성분을 갖는 화합물이 이온 결합된 감광성 폴리이미드를 개발 했다(US-A-4243743). 이와 같은 감광성 폴리이미드는 기존의 감광성 폴리이미드에 비해 제조가 용이하고 유해 부산물의 발생이 적은 장점이 있다.Conventional non-photosensitive polyimide requires an etching process to process holes using a separate photoresist for wire-bonding and metal wiring, but the use of photosensitive polyimide If it is possible to omit some of the processes can greatly increase the productivity. Practical photosensitive polyimide was developed by Rubner et al. Of Siemen (US-A-3957512). This is a form in which the photosensitive group is bonded to the polyamic acid as a polyimide precursor through an ester bond. When the photosensitive polyimide precursor solution is coated on a substrate to form a film and exposed to ultraviolet light, photopolymerization occurs in the exposed portion to form a crosslinked structure. In this state, the unexposed portion is removed during development with the organic solvent, and the final heat treatment causes the ester-bonded photosensitive component to be decomposed and removed at the same time as the imidization reaction to obtain a desired pattern of polyimide. Meanwhile, Toray Corp., Japan, has developed a photosensitive polyimide in which a compound having a photosensitive group and an amino component in a polyamic acid is ion-bonded (US-A-4243743). Such photosensitive polyimide has advantages in that it is easy to manufacture and generates less harmful by-products than conventional photosensitive polyimide.
그러나 상기 방법에 의한 감광성 폴리이미드의 제조를 위해서는 고분자량의 폴리이미드 전구체에 감광성 아크릴 화합물을 공유결합형태나 이온결합 형태로 도입하여 광가교에 의해 감광 패턴을 형성하므로 광가교시 2∼6%정도의 체적수축이 발생하여 정확한 해상도를 얻기 어렵게 되고 웨이퍼와 폴리이미드 전구체 간의 접착성 부족, 현상 및 린스 공정의 패턴형성 과정 중에 크랙발생의 주요원인이 된다.However, in order to manufacture the photosensitive polyimide by the above method, the photosensitive acrylic compound is introduced into the high molecular weight polyimide precursor in the form of a covalent bond or an ionic bond to form a photosensitive pattern by photocrosslinking. It is difficult to obtain accurate resolution due to the volume shrinkage of, and it is a major cause of cracking during the pattern formation process of the lack of adhesion between the wafer and the polyimide precursor, the development and the rinsing process.
이에 본 발명자들은 감광성 조성물 중의 일부로 라디칼 개환 중합형 단량체를 사용함으로써 아크릴 화합물들의 광경화 반응에 따른 수축을 방지하여 정확한 해상도, 폴리이미드 전구체와 웨이퍼 간의 접착성 향상 및 패턴형성 공정 중에서의 크랙발생 정도를 저하시킬 수 있는 감광성 폴리이미드 전구체 조성물을 제조하기에 이르렀다.Accordingly, the present inventors use the radical ring-opening polymerization monomer as part of the photosensitive composition to prevent shrinkage due to the photocuring reaction of the acrylic compounds, thereby improving accuracy, adhesion between the polyimide precursor and the wafer, and the degree of cracking during the pattern forming process. It came to manufacture the photosensitive polyimide precursor composition which can be reduced.
본 발명이 이루고자하는 기술적 과제는 개환중합형 환형단량체와 광가교형 아크릴 감광기를 갖는 화합물 10 : 90 ∼ 90 : 10 비율인 광반응성 단량체를 사용함으로써 아크릴 화합물들의 광경화 반응에 따른 수축을 방지할 수 있는 저수축율의 감광성 폴리이미드 전구체 조성물을 제공하는 것이다.The technical problem to be achieved by the present invention is to prevent the shrinkage due to the photocuring reaction of the acrylic compounds by using a photoreactive monomer having a compound 10: 90 to 90: 10 ratio of the ring-opening polymerization cyclic monomer and a photocrosslinkable acrylic photosensitive group It is to provide a low shrinkage photosensitive polyimide precursor composition.
본 발명이 이루고자하는 다른 기술적 과제는 개환중합형 환형단량체와 광가교형 아크릴 감광기를 갖는 화합물 10 : 90 ∼ 90 : 10 비율인 광반응성 단량체를 사용하여 아크릴화합물들의 수축을 방지함으로써 해상도와 접착성이 향상되고 크랙발생이 저하된 감광성 폴리이미드 전구체 조성물을 제공하는 것이다.Another technical problem to be achieved by the present invention is to prevent the shrinkage of acrylic compounds by using a photoreactive monomer having a compound ring ratio of 10:90 to 90:10 having a ring-opening-type cyclic monomer and a photocrosslinkable acrylic photoreceptor, thereby preventing resolution and adhesiveness. It is to provide a photosensitive polyimide precursor composition that has been improved and cracking is reduced.
본 발명의 상기 및 기타의 이루고자하는 기술적 과제들은 하기 설명되는 본 발명에 의하여 모두 달성될 수 있다.The above and other technical problems of the present invention can be achieved by the present invention described below.
본 발명은 유기용매에 하기 화학식 1의 테트라카르복실산 이무수물, 하기 화학식 2의 방향족 디아민 및 광반응성 단량체로 이루어지는 실록산 폴리이미드 전구체 조성물에 관한 것이다. 상기 광반응성 단량체는 개환중합형 환형단량체와 광가교형 아크릴 감광기를 갖는 화합물로 이루어지며, 이들 성분의 함유비율은 10 : 90 ∼ 90 : 10의 범위이다.The present invention relates to a siloxane polyimide precursor composition comprising a tetracarboxylic dianhydride of formula (1), an aromatic diamine of formula (2) and a photoreactive monomer in an organic solvent. The photoreactive monomer is composed of a compound having a ring-opening polymerization cyclic monomer and a photocrosslinkable acrylic photosensitive group, and the content ratio of these components is in the range of 10:90 to 90:10.
화학식 1Formula 1
화학식 2Formula 2
H2N-R2-NH2 H 2 NR 2 -NH 2
상기식에서 R2는 방향족 또는 지방족 환상기이고, X는 포화 지방족 또는 불포화 지방기를 갖는 감광성 화합물이다.Wherein R 2 is an aromatic or aliphatic cyclic group and X is a photosensitive compound having a saturated aliphatic or unsaturated aliphatic group.
상기 유기용매에는 하기 화학식 3의 방향족 테트라카르본산 이무수물을 알코올로 전처리한 것으로 사용할 수도 있으며, 이 경우 화학식 1의 방향족 테트라카르본산 이무수물의 일부가 화학식 3의 화합물로 바뀌게 된다.In the organic solvent, an aromatic tetracarboxylic dianhydride of Formula 3 may be used as a pretreatment with alcohol, in which case a part of the aromatic tetracarboxylic dianhydride of Formula 1 is converted into a compound of Formula 3.
상기식에서 R1은 방향족 또는 지방족 환상기이고, X는 포화지방족 또는 불포화 지방기를 갖는 감광성 화합물이다.Wherein R 1 is an aromatic or aliphatic cyclic group, and X is a photosensitive compound having a saturated aliphatic or unsaturated aliphatic group.
상기 각각의 성분을 하기에 상세히 설명한다.Each of these components is described in detail below.
테트라카르복실산 이무수물은 크게 방향족 테트라카르복실산 이무수물, 알리사이클릭 이무수물로 분류된다. 상기 테트라카르복실산 이무수물로는 시클로펜탄테트라카르복실산 이무수물(cyclopentanetetracarboxylic dianhydride), 바이시클로펜탄테트라카르복실산 이무수물(bicyclopentanetetracarboxylic dianhydride), 시클로프로판테트라카르복실산 이무수물(cyclopropanetetracarboxylic dianhydride), 메틸시클로헥산테트라카르복실산 이무수물(methylcyclohexanetetracarboxylic dianhydride), 3,3',4,4'-벤조페논테트라카르복실산 이무수물(3,3',4,4'-benzophenonetetracarboxylic dianhydride), 피로멜리틱산 이무수물(pyromellitic acid dianhydride), 3,4,9,10-페릴렌테트라카르복실산 이무수물 (3,4,9,10-perylenetetracaboxylic dianhydride), 4,4-술포닐디프탈산 이무수물(4,4-sulfonyldiphthalic dianhydride), 3,3'4,4'-바이페닐 테트라카르복실산 이무수물(3,3'4,4'-biphenyltetracarboxylic dianhydride), 1,2,5,6-나프탈렌테트라카르복실산 이무수물 (1,2,5,6-naphthalenetetracaboxylic dianhydride), 2,3,6,7-나프탈렌테트라카르복실산 이무수물 (2,3,6,7-naphthalenetetracaboxylic dianhydride), 1,4,5,8-나프탈렌테트라카르복실산 이무수물 (1,4,5,8-naphthalenetetracaboxylic dianhydride), 2,3,5,6-피리딘테트라카르복실산 이무수물 (2,3,5,6-pyridinetetracaboxylic dianhydride), m-터페닐-3,3',4,4',-테트라카르복실산 이무수물 (m-terphenyl-3,3',4,4',-tetracaboxylic dianhydride), p-터페닐-3,3',4,4',-테트라카르복실산 이무수물 (p-terphenyl-3,3',4,4',-tetracaboxylic dianhydride), 4,4-옥시디프탈산 이무수물(4,4-oxydiphthalic dianhydride), 1,1,1,3,3,3,-헥사플루오로-2,2-비스(2,3 or 3,4-디카르복시페녹시)페닐프로판 이무수물(1,1,1,3,3,3,-hexafluoro-2,2-bis(2,3 or 3,4-dicarboxyphenoxy)phenylpropane dianhydride), 2,2-비스[4-(2,3 또는 3,4-디카르복시페녹시)페닐]프로판 이무수물(2,2-bis[4-(2,3 or 3,4-dicarboxyphenoxy)phenyl]propane dianhydride), 및 1,1,1,3,3,3,-헥사플루오로-2,2-비스[4-(2,3 또는 3,4-디카르복시페녹시)페놀]프로판 이무수물 (1,1,1,3,3,3,-hexafluoro-2,2-bis[4-(2,3 or 3,4-dicarboxyphenoxy)phenyl] propane dianhydride) 등이 있다.Tetracarboxylic dianhydride is classified into aromatic tetracarboxylic dianhydride and alicyclic dianhydride. The tetracarboxylic dianhydride includes cyclopentanetetracarboxylic dianhydride, bicyclopentanetetracarboxylic dianhydride, cyclopropanetetracarboxylic dianhydride, methyl Methylcyclohexanetetracarboxylic dianhydride, 3,3 ', 4,4'-benzophenonetetracarboxylic dianhydride (3,3', 4,4'-benzophenonetetracarboxylic dianhydride), pyromellitic dianhydride Water (pyromellitic acid dianhydride), 3,4,9,10-perylenetetracarboxylic dianhydride (3,4,9,10-perylenetetracaboxylic dianhydride), 4,4-sulfonyldiphthalic dianhydride (4,4- sulfonyldiphthalic dianhydride), 3,3'4,4'-biphenyl tetracarboxylic dianhydride (3,3'4,4'-biphenyltetracarboxylic dianhydride), 1,2,5,6-naphthalenetetracarboxylic dianhydride (1,2,5,6-naphthalenetetraca boxylic dianhydride), 2,3,6,7-naphthalenetetracarboxylic dianhydride (2,3,6,7-naphthalenetetracaboxylic dianhydride), 1,4,5,8-naphthalenetetracarboxylic dianhydride (1, 4,5,8-naphthalenetetracaboxylic dianhydride), 2,3,5,6-pyridinetetracarboxylic dianhydride (2,3,5,6-pyridinetetracaboxylic dianhydride), m-terphenyl-3,3 ', 4, 4 ',-tetracarboxylic dianhydride (m-terphenyl-3,3', 4,4 ',-tetracaboxylic dianhydride), p-terphenyl-3,3', 4,4 ',-tetracarboxylic acid Dianhydrides (p-terphenyl-3,3 ', 4,4',-tetracaboxylic dianhydride), 4,4-oxydiphthalic dianhydride, 1,1,1,3,3, 3, -hexafluoro-2,2-bis (2,3 or 3,4-dicarboxyphenoxy) phenylpropane dianhydride (1,1,1,3,3,3, -hexafluoro-2,2- bis (2,3 or 3,4-dicarboxyphenoxy) phenylpropane dianhydride), 2,2-bis [4- (2,3 or 3,4-dicarboxyphenoxy) phenyl] propane dianhydride (2,2-bis [ 4- (2,3 or 3,4-dicarboxyphenoxy) phenyl] propane dianhydride), and 1,1,1,3,3,3,- Safluoro-2,2-bis [4- (2,3 or 3,4-dicarboxyphenoxy) phenol] propane dianhydride (1,1,1,3,3,3, -hexafluoro-2,2 -bis [4- (2,3 or 3,4-dicarboxyphenoxy) phenyl] propane dianhydride).
본 발명에서 사용될 수 있는 방향족 디아민으로는 m-페닐렌디아민(m-phenylene diamine), p-페닐렌디아민(p-phenylenediamine), m-자일렌디아민(m-xylylenediamine), 1,5-디아미노나프탈렌(1,5-diaminonaphthalene), 3,3'-디메틸벤지딘(3,3'-dimethylbenzidine), 4,4-(또는 3,4'-, 3,3'-, 2,4'- 또는 2,2'-)디아미노디페닐메탄(4,4-(or 3,4'-, 3,3'- 2,4'- or 2,2'-)diaminodiphenylmethane), 4,4-(또는 3,4'-, 3,3'-, 2,4'- 또는 2,2'-)디아미노디페닐에테르(4,4-(or 3,4'-, 3,3'-, 2,4'- or 2,2'-)diaminodiphenylether), 4,4-(또는 3,4'-, 3,3'-, 2,4'- 또는 2,2'-)디아미노디페닐술파이드(4,4-(or 3,4'-,3,3'-2,4' or-2,2'-)diaminodiphenylsulfide), 4,4-(또는 3,4'-, 3,3'-, 2,4'- 또는 2,2'-)디아미노디페닐술폰(4,4-(or 3,4'-,3,3'-2,4' or-2,2'-)diaminodiphenylsulfide), 1,1,1,3,3,3,-헥사플루오로-2,2-비스(4-아미노페닐)프로판((1,1,1,3,3,3,-hexafluoro-2,2-bis(4-aminophenyl)propane), 2,2-비스(4-(4-아미노페녹시)페닐)프로판(2,2-bis(4-(4-aminophenoxy)phenyl)propane), 4,4-벤조페논디아민(4,4-benzophenonediamine), 4,4'-디-(4-아미노페녹시)페닐술폰(4,4'-di-(4-aminophenoxy)phenylsulfone), 3,3-디메틸-4,4-디아미노디페닐메탄(3,3-dimethyl-4,4-diaminodiphenylmethane), 4,4'-디-(3-아미노페녹시)페닐술폰(4,4'-di-(3-aminophenoxy)phenylsulfone), 2,4-디아미노톨루엔(2,4-diaminotoluene), 2,5-디아미노톨루엔(2,5-diaminotoluene), 2,6-디아미노톨루엔(2,6-diaminotoluene), 벤지딘(benzidine), o-톨리딘(o-tolidine), 4,4'-디아미노터페닐(4,4'-diaminoterphenyl), 2,5-디아미노피리딘(2,5-diaminopyridine), 4,4'-비스(p-아미노페녹시)바이페닐(4,4'-bis(p-aminophenoxy)biphenyl), 및 헥사하이드로-4,7-메타노인다닐렌 디메틸렌 디아민 (hexahydro-4,7-methanoindanylene dimethylene diamine) 등이 있다.Aromatic diamines that can be used in the present invention include m-phenylene diamine, p-phenylenediamine, m-xylylenediamine, 1,5-diamino Naphthalene (1,5-diaminonaphthalene), 3,3'-dimethylbenzidine, 4,4- (or 3,4'-, 3,3'-, 2,4'- or 2 , 2 '-) diaminodiphenylmethane (4,4- (or 3,4'-, 3,3'-2,4'- or 2,2'-) diaminodiphenylmethane), 4,4- (or 3 , 4'-, 3,3'-, 2,4'- or 2,2 '-) diaminodiphenylether (4,4- (or 3,4'-, 3,3'-, 2,4 '-or 2,2'-) diaminodiphenylether), 4,4- (or 3,4'-, 3,3'-, 2,4'- or 2,2 '-) diaminodiphenylsulfide (4 , 4- (or 3,4 '-, 3,3'-2,4' or-2,2 '-) diaminodiphenylsulfide), 4,4- (or 3,4'-, 3,3'-, 2 , 4'- or 2,2 '-) diaminodiphenylsulfone (4,4- (or 3,4'-, 3,3'-2,4 'or-2,2'-) diaminodiphenylsulfide), 1 , 1,1,3,3,3, -hexafluoro-2,2-bis (4-aminophenyl) propane ((1,1,1,3,3,3, -hexafluoro-2,2-bis (4-aminophenyl) propane), 2,2-bis (4- (4-aminophenoxy) phene Yl) propane (2,2-bis (4- (4-aminophenoxy) phenyl) propane), 4,4-benzophenonediamine, 4,4'-di- (4-aminophenoxy ) Phenyl sulfone (4,4'-di- (4-aminophenoxy) phenylsulfone), 3,3-dimethyl-4,4-diaminodiphenylmethane, 4,4 4'-di- (3-aminophenoxy) phenylsulfone (4,4'-di- (3-aminophenoxy) phenylsulfone), 2,4-diaminotoluene, 2,5-dia Minotoluene (2,5-diaminotoluene), 2,6-diaminotoluene, benzidine, o-tolidine, 4,4'-diaminoterphenyl ( 4,4'-diaminoterphenyl), 2,5-diaminopyridine, 4,4'-bis (p-aminophenoxy) biphenyl (4,4'-bis (p-aminophenoxy) biphenyl), and hexahydro-4,7-methanoindanylene dimethylene diamine.
또한 실록산 디아민 또는 실록산 이무수물 성분이 웨이퍼 등과 같은 기재에 대한 접착력을 향상시키기 위해서 사용될 수 있다.In addition, siloxane diamine or siloxane dianhydride components may be used to improve adhesion to substrates such as wafers and the like.
본 발명에서 실록산계 디아민이나 실록산계 이무수물은 단량체에 대해서 1 내지 10몰%를 사용한다. 실록산계 디아민의 양이 1몰% 이하이면 접착력이 떨어지며, 10몰% 이상을 사용하면 열적 특성이 떨어진다.In the present invention, the siloxane diamine or siloxane dianhydride is used in an amount of 1 to 10 mol% based on the monomers. If the amount of the siloxane-based diamine is less than 1 mol%, the adhesive strength is lowered, and if more than 10 mol% is used, the thermal properties are poor.
상기 폴리아믹산의 제조에 사용되는 유기 용매로는 N-메틸-2-피롤리돈, N,N-디메틸포름아미드, 디메틸술폭사이드, 테트라메틸우레아, 헥사메틸포스포릭트리아미드, 감마-부티로락톤 등의 일반 유기용매가 있다.Organic solvents used in the preparation of the polyamic acid include N-methyl-2-pyrrolidone, N, N-dimethylformamide, dimethyl sulfoxide, tetramethylurea, hexamethylphosphoric triamide, gamma-butyrolactone And common organic solvents.
상기에서 얻어진 폴리이미드 전구체 용액에 감광기능을 부여하기 위해 광반응성 단량체 성분, 광중합 개시제, 광증감제 등이 첨가될 수 있다. 본 발명에서 사용되는 광반응성 단량체 성분으로는 개환 중합형의 환형 모노머 성분과 부가형의 탄소-탄소 불포화그룹을 지닌 화합물이 이용된다.A photoreactive monomer component, a photopolymerization initiator, a photosensitizer and the like may be added to impart a photosensitive function to the polyimide precursor solution obtained above. As the photoreactive monomer component used in the present invention, a compound having a ring-opening polymerization type cyclic monomer component and an addition type carbon-carbon unsaturated group is used.
폴리이미드 전구체 용액에 첨가되는 개환 중합형의 환형 단량체로는 하기 화학식 4a의 비닐 사이클로 프로판 성분, 하기 화학식 4b의 사이클릭 케텐 아세탈 성분, 및 하기 화학식 4c 및 하기 화학식 4d의 사이클릭 아크릴레이트 성분이 사용될 수 있다.As the ring-opening polymerization type cyclic monomer added to the polyimide precursor solution, a vinyl cyclopropane component of Formula 4a, a cyclic ketene acetal component of Formula 4b, and a cyclic acrylate component of Formula 4c and Formula 4d may be used. Can be.
상기 식에서 X, Y는 할로겐 화합물이고, R'는 지방족기 화합물이고, Z는 H 또는 CH3이다.Wherein X and Y are halogen compounds, R 'is an aliphatic group compound, and Z is H or CH 3 .
폴리이미드 전구체 용액에 첨가되는 광반응성이 있는 부가형의 탄소-탄소 불포화그룹을 갖는 화합물로는 N-메틸아크릴아미드, N-메틸메타아크릴아미드, N-에틸메타아크릴아미드, N,N-디메틸아크릴아미드, N,N-디에틸아크릴아미드, N-아크릴오일몰포린, N-비닐피롤리돈 등이 있다. 본 발명에서 사용하는 탄소-탄소 불포화기를 포함한 화합물에 대한 제한은 없다. 그러나 상기 불포화기가 아미노기와 결합한 경우에 폴리아믹산의 카르복실기와 염의 형태로 결합되어 바람직하며 아미노기를 함유하지 않은 광반응성 화합물을 사용한 경우보다 광반응성이 우수하다. 광반응성을 갖는 상기 탄소-탄소 불포화기 및 아미노기를 둘다 포함하는 화합물로는 N,N-디메틸아미노에틸아크릴레이트, N,N-디에틸아미노에틸아크릴레이트, N,N-디메틸아미노프로필아크릴레이트, N,N-디에틸아미노프로필아크릴레이트, N,N-디메틸아미노부틸아크릴레이트 등이며 아크릴레이트 대신 2-비닐피리딘, 4-비닐피리딘, 아릴아민, 2-메틸아릴아민, 디아릴아민 등이 있으며 이들 화합물에 대한 제한은 없다.Examples of the compound having a photoreactive addition type carbon-carbon unsaturated group added to the polyimide precursor solution include N-methylacrylamide, N-methylmethacrylamide, N-ethylmethacrylamide, and N, N-dimethylacrylamide. , N, N-diethylacrylamide, N-acryloyl yl morpholine, N-vinylpyrrolidone and the like. There is no restriction on the compound including the carbon-carbon unsaturated group used in the present invention. However, when the unsaturated group is bonded to an amino group, the carboxyl group of the polyamic acid is preferably bonded in the form of a salt, and the photoreactivity is superior to that of the photoreactive compound containing no amino group. Examples of the compound including both the carbon-carbon unsaturated group and the amino group having photoreactivity include N, N-dimethylaminoethyl acrylate, N, N-diethylaminoethyl acrylate, N, N-dimethylaminopropyl acrylate, N, N-diethylaminopropylacrylate, N, N-dimethylaminobutylacrylate, and the like. Instead of acrylate, 2-vinylpyridine, 4-vinylpyridine, arylamine, 2-methylarylamine, diarylamine, etc. There is no restriction on these compounds.
본 발명에서 사용되는 광반응성 단량체 성분 중의 개환 중합형의 단량체 성분과 부가형의 탄소-탄소 불포화 그룹을 지닌 화합물의 사용비율은 10 : 90∼90 : 10 범위가 바람직하다.The use ratio of the ring-opening polymerization monomer component and the compound having an additional type carbon-carbon unsaturated group in the photoreactive monomer component used in the present invention is preferably in the range of 10:90 to 90:10.
본 발명에서 화학식 의 R1OH에 사용되는 알코올 화합물로서는 메틸알코올, 에틸알코올, 이소프로필알코올, 이소부틸알코올 및 알릴알코올(allyl alcohol), 2-히드록시에틸아크릴레이트, 2-히드록시에틸메타아크릴레이트 등의 감광기를 갖는 알코올류가 있다.Alcohol compounds used for R 1 OH in the present invention include methyl alcohol, ethyl alcohol, isopropyl alcohol, isobutyl alcohol and allyl alcohol, 2-hydroxyethyl acrylate, 2-hydroxyethyl methacryl. There are alcohols having a photoreceptor such as a rate.
본 발명에서 사용할 수 있는 광중합 개시제로는 2,6-디-(p-아지도벤잘)-4-메틸시클로헥사논(2,6-di-(p-azidobenzal)-4-methylcyclohexanone)), 및 2,6-디-(p-아지도벤잘)-시클로헥사논 등의 비스아지드 화합물, 벤조페논(benzophenone), 메틸 o-벤조일벤조에이트, 4,4'-비스(디메틸아미노벤조페논), 4,4-비스(디에틸아미노벤조페논), 4,4-디클로르벤조페논, 4-벤조일-4'-메틸디페닐케톤, 디벤질케톤, 플로렌논, 2,2'디에톡시아세토페논, 1-페닐-1,2-부탄디온-2-(o-에톡시칼보닐)옥심(1-phenyl-butandione-2-(o-ethoxycarbonyl)oxime), 1,3-디페닐-프로판디온-2-(o-에톡시칼보닐)옥심(1,3-diphenyl-propandione-2-(o-ethoxycarbonyl)oxime, 1-페닐-3-에톡시-프로판디온-2-(o-벤질)옥심(1-phenyl-3-ethoxy-propandione-2-(o-benzyl)oxime), 미하라즈케톤, N-페닐글리시딘, 3-페닐-5-이소옥살졸론, 1-히드록시시클로헥실페닐케톤, 2-메틸-(4-(메틸티오)페닐)-2-모폴리노-1-프로파논, 나프탈렌술포닐클로라이드, 퀴노린술포닐 클로라이드, N-페닐티오아크리돈, 4,4'-아조비스이소부티로니트릴, 디페닐디술파이드, 벤즈티아졸디술파이드, 트리페닐폴스핀, 캄폴퀴논, 카본테트라브로미드, 트리브로모페닐술폰, 및 벤조일퍼옥사이드 등이 있고, 아스코빅산 및 트리에탄올아민과 같은 환원제를 함유한 에오신 및 메틸렌블루와 같은 광환원염료와 조합하여 사용할 수 있다. 상기 광중합개시제는 한가지 또는 둘 이상을 조합하여 사용할 수 있다.Photopolymerization initiators that can be used in the present invention include 2,6-di- (p-azidobenzal) -4-methylcyclohexanone (2,6-di- (p-azidobenzal) -4-methylcyclohexanone), and Bisazide compounds such as 2,6-di- (p-azidobenzal) -cyclohexanone, benzophenone, methyl o-benzoylbenzoate, 4,4'-bis (dimethylaminobenzophenone), 4,4-bis (diethylaminobenzophenone), 4,4-dichlorbenzophenone, 4-benzoyl-4'-methyldiphenylketone, dibenzylketone, florenone, 2,2'diethoxyacetophenone , 1-phenyl-1,2-butanedione-2- (o-ethoxycarbonyl) oxime (1-phenyl-butandione-2- (o-ethoxycarbonyl) oxime), 1,3-diphenyl-propanedione- 2- (o-ethoxycarbonyl) oxime (1,3-diphenyl-propandione-2- (o-ethoxycarbonyl) oxime, 1-phenyl-3-ethoxy-propanedione-2- (o-benzyl) oxime ( 1-phenyl-3-ethoxy-propandione-2- (o-benzyl) oxime), miharazketone, N-phenylglycidine, 3-phenyl-5-isoxazolone, 1-hydroxycyclohexylphenylketone, 2-methyl- (4- (methyltea ) Phenyl) -2-morpholino-1-propanone, naphthalenesulfonylchloride, quinolinesulfonyl chloride, N-phenylthioacridone, 4,4'-azobisisobutyronitrile, diphenyldisulfide , Benzthiazoledisulfide, triphenylpolspin, campolquinone, carbon tetrabromide, tribromophenylsulfone, and benzoyl peroxide; and eosin and methylene blue containing reducing agents such as ascorbic acid and triethanolamine; It can be used in combination with the same photoreducing dye The photoinitiator can be used in combination of one or two or more.
본 발명의 실록산 폴리이미드 전구체에 함유되는 광중합개시제의 양은 폴리아믹산 수지를 기준으로 0.1∼30중량%이며, 2∼15중량%가 바람직하다. 광중합개시제의 양이 0.1중량% 이하이면 조성물의 감광도가 떨어지고, 30중량% 이상이면 필름의 기계적 물성이 감소한다.The quantity of the photoinitiator contained in the siloxane polyimide precursor of this invention is 0.1-30 weight% based on a polyamic acid resin, and 2-15 weight% is preferable. If the amount of the photopolymerization initiator is 0.1% by weight or less, the photosensitivity of the composition is lowered.
본 발명에서는 감광도를 향상시키기 위해 증감제를 사용할 수 있다. 이러한 증감제로는 2,5-비스(4'-디에틸아미노벤잘)시클로펜타논, 2,6-비스(4'-디메틸아미노벤잘)시클로헥사논, 미하라즈케톤, 4,4'-비스(디에틸아미노)벤조페논, 4,4'-비스(디메틸아미노)찰콘, 4,4'-비스(디에틸아미노)찰콘, p-디메틸아미노벤질리덴인단논, 2-(p-디메틸아미노페닐비닐렌)-이소나프토티아졸, 2-(p-디메틸아미노페닐비닐렌)벤조티아졸, 1,3-비스(4'-디메틸아미노벤잘)아세톤, 1,3-비스(4'-디에틸아미노벤잘)아세톤, 3,3'-카르보닐-비스-(7-디에틸아미노큐말린), N-페닐디에탄올디아민, N-톨릴디에탄올아민, N-페닐에탄올디아민, 디메틸아미노벤조산 이소아밀, 3-페닐-5-이소옥사졸론, 1-페닐-5-벤조일티오-테트라졸, 및 1-5-에톡시칼보닐티오-테트라졸 등이 있다. 상기 증감제는 한가지 이상을 사용할 수 있으며, 폴리아믹산을 기준으로 0.1∼30중량%를 사용하고 0.5∼15중량%가 바람직하다. 증감제의 첨가량이 30중량% 이상이면 필름의 큐어링(curing)시 필름의 두께가 감소하고 기계적 특성이 열화되고, 0.1중량% 이하이면 조성물의 감광도가 떨어진다.In the present invention, a sensitizer may be used to improve photosensitivity. Such sensitizers include 2,5-bis (4'-diethylaminobenzal) cyclopentanone, 2,6-bis (4'-dimethylaminobenzal) cyclohexanone, miharazketone, 4,4'-bis ( Diethylamino) benzophenone, 4,4'-bis (dimethylamino) chalcone, 4,4'-bis (diethylamino) chalcone, p-dimethylaminobenzylidene indanone, 2- (p-dimethylaminophenylvinyl Ene) -isonnaphthothiazole, 2- (p-dimethylaminophenylvinylene) benzothiazole, 1,3-bis (4'-dimethylaminobenzal) acetone, 1,3-bis (4'-diethylamino Benzal) acetone, 3,3'-carbonyl-bis- (7-diethylaminocumalin), N-phenyldiethanoldiamine, N-tolyldiethanolamine, N-phenylethanoldiamine, dimethylaminobenzoic acid isoamyl, 3-phenyl-5-isoxazolone, 1-phenyl-5-benzoylthio-tetrazole, 1-5-ethoxycarbonylthio-tetrazole and the like. One or more sensitizers may be used, and 0.1 to 30% by weight based on the polyamic acid is preferably 0.5 to 15% by weight. If the added amount of the sensitizer is 30% by weight or more, the thickness of the film decreases and the mechanical properties deteriorate during curing of the film. If the amount is less than 0.1% by weight, the photosensitivity of the composition is lowered.
본 발명의 실록산 폴리이미드 전구체를 보존할 경우 열안정성을 향상시키기 위해 열중합금지제를 첨가할 수 있다. 상기 열중합금지제의 예로는 하이드로퀴논, N-니트로소디페닐아민, 페녹시아진, p-t-부틸카테콜, N-페닐나프틸아민, 2,6-디-t-부틸-p-메틸페놀, 차로나닐, 피로갈롤 등이 있다.When preserving the siloxane polyimide precursor of the present invention, a thermal polymerization inhibitor may be added to improve thermal stability. Examples of the thermal polymerization inhibitor include hydroquinone, N-nitrosodiphenylamine, phenoxyazine, pt-butylcatechol, N-phenylnaphthylamine, 2,6-di-t-butyl-p-methylphenol, and Nanil, pyrogallol and the like.
또한 형성된 폴리이미드 필름의 경도를 향상시키기 위해 콜로이드 형태의 무기 미세입자를 첨가할 수 있다. 상기 무기 미세입자로는 실리카 졸, 티타니아 졸, 지르코니아 졸 등이 있다. 콜로이드 형태의 무기 미세입자의 사용량은 폴리아믹산을 기준으로 1∼50중량%이고, 2∼30중량%가 바람직하다. 실록산 폴리이미드 전구체 조성물을 구성하는 모든 성분들을 혼합할 때 또는 조성물에 첨가제를 용해시킬 때 콜로이드 형태의 무기 미세입자 등을 첨가시켜 코팅용액으로 제조할 수 있다.In addition, in order to improve the hardness of the formed polyimide film, colloidal inorganic fine particles may be added. The inorganic fine particles include silica sol, titania sol, zirconia sol and the like. The amount of the colloidal inorganic fine particles used is 1 to 50% by weight based on the polyamic acid, preferably 2 to 30% by weight. When mixing all the components constituting the siloxane polyimide precursor composition or when dissolving the additive in the composition, it can be prepared as a coating solution by adding colloidal inorganic fine particles and the like.
본 발명은 하기의 실시예에 의하여 보다 구체화될 것이며, 하기의 실시예는 본 발명을 예시하기 위한 목적으로 기재될 뿐이며 본 발명의 보호범위를 한정하고자 하는 것은 아니다.The present invention will be further illustrated by the following examples, which are only described for the purpose of illustrating the present invention and are not intended to limit the protection scope of the present invention.
실시예Example
실시예 1Example 1
3,3', 4,4'-바이페닐 테트라카르복실산 이무수물 147.1 g(0.5몰), 옥시디아닐린 95 g(0.475몰), 비스-3-(아미노프로필)테트라메틸실록산 6.2 g(0.025몰), N-메틸-2-피롤리돈 1200 g을 중합조에 넣고 질소기류하의 60 ℃에서 5시간 동안 교반하여 실온에서 13,000 센티포아즈의 점도를 갖는 중합체인 폴리아믹산 용액을 얻었다. 상기 제조된 폴리아믹산 20 g에 부가형의 탄소-탄소 불포화 그룹을 지닌 화합물로서 디메틸아미노에틸메타아크릴레이트 3.2 g과 개환중합형의 환형 단량체 성분으로 환형 메타아크릴레이트성분 3g을 첨가한 후 광개시제 2,6-디-(p-아지도벤잘)-4-메틸사이클로헥산온 0.01 g, 및 증감제 1-페닐-1,2-부타디온-2-(o-메톡시카르보닐)옥심 0.05 g을 혼합하여 30분간 교반하여 12,500 센티포아즈의 점도를 갖는 실록산 폴리이미드 전구체 조성물을 얻었다. 상기 점도는 브룩필드 점도계 40번 스핀들을 사용하여 측정하였다. 얻어진 실록산 폴리이미드 조성물을 2,300 rpm의 회전 속도로 30초간 실리콘 웨이퍼 위에 코팅한 후 95 ℃에서 4분간 경화시 18 ㎛의 두께의 코팅을 갖는 폴리이미드 전구체의 피막을 형성할 수 있었다. 여기에 포토마스크를 씌워 자외선 조사 후 N-메틸피롤리돈 용액에 의해 현상했을 때 포토마스크의 8 ㎛ 패턴이 웨이퍼 상에서도 ±0.2㎛이내의 편차범위를 갖는 해상도를 나타내었다. 이후 200℃에서 30분, 350℃에서 30분 질소가스 분위기에서 경화 후 폴리이미드의 막 두께는 10 ㎛로서 매우 두터운 코팅막을 형성할 수 있었다. 폴리이미드의 접착 특성은 웨이퍼 위에 최종경화시킨 폴리이미드 막을 PCT(Pressure Cooking Test)하에서 100시간 보존한 후 스카치 테이프에 의해 이형성을 평가하였으며 이형부분이 전혀 없는 양호한 접착특성을 나타내었다. 얻어진 폴리이미드 필름의 내열성은 TGA를 이용하여 질소 분위기 하에서 평가하였으며 5 % 중량 감소 온도가 515 ℃로서 매우 양호한 내열 특성을 나타내었다. 필름의 기계적 강도는 인스트롱에 의해 측정하였으며 인장 강도 130 MPa, 신율 50 % 이상의 양호한 값을 얻을 수 있었다.147.1 g (0.5 mole) of 3,3 ', 4,4'-biphenyl tetracarboxylic dianhydride, 95 g (0.475 mole) of oxydianiline, 6.2 g (0.025) of bis-3- (aminopropyl) tetramethylsiloxane Mole) and 1200 g of N-methyl-2-pyrrolidone were placed in a polymerization tank and stirred at 60 ° C. for 5 hours under a nitrogen stream to obtain a polyamic acid solution as a polymer having a viscosity of 13,000 centipoise at room temperature. 20 g of the polyamic acid prepared above was added with 3.2 g of dimethylaminoethyl methacrylate and 3 g of a cyclic methacrylate component as a ring-opening polymerization type cyclic monomer component as a compound having an additional type carbon-carbon unsaturated group. 0.01 g of -di- (p-azidobenzal) -4-methylcyclohexanone and 0.05 g of sensitizer 1-phenyl-1,2-butadione-2- (o-methoxycarbonyl) oxime The mixture was stirred for 30 minutes to obtain a siloxane polyimide precursor composition having a viscosity of 12,500 centipoise. The viscosity was measured using a Brookfield Viscometer No. 40 spindle. The obtained siloxane polyimide composition was coated on a silicon wafer for 30 seconds at a rotational speed of 2,300 rpm and then cured at 95 ° C. for 4 minutes to form a film of polyimide precursor having a coating having a thickness of 18 μm. When the photomask was covered and developed with an N-methylpyrrolidone solution after ultraviolet irradiation, the 8 µm pattern of the photomask showed a resolution having a deviation range within ± 0.2 µm even on the wafer. Then, after curing at 200 ° C. for 30 minutes and 350 ° C. for 30 minutes in a nitrogen gas atmosphere, the film thickness of the polyimide was 10 μm, thereby forming a very thick coating film. The adhesion characteristics of the polyimide were evaluated by scotch tape after preliminary storage of the polyimide film on the wafer for 100 hours under PCT (Pressure Cooking Test). The heat resistance of the obtained polyimide film was evaluated under a nitrogen atmosphere using TGA, and showed a very good heat resistance property with a 5% weight reduction temperature of 515 ° C. The mechanical strength of the film was measured by Instron, and good values of tensile strength of 130 MPa and elongation of 50% or more were obtained.
비교실시예 1Comparative Example 1
개환형 아크릴 성분을 첨가하지 않은 것을 제외하고는 상기 실시예와 동일한 방법으로 실시하였다. 상기의 방법으로 형성된 웨이퍼 상의 감광패턴은 포토마스크 상의 8 ㎛ 패턴 기준으로 -0.2㎛ 이상의 편차를 갖는 감광패턴이 나타나 광경화시의 수축율로 인한 편차 범위가 크게 나타남을 알 수 있었다. 또한 현상 시간이 길어질수록 상기 실시예에 비하여 필름 상의 크랙 발생 정도가 증가하였으며 일부 패턴상의 박리 현상이 관찰되었다. 최종 경화 후의 폴리이미드의 기타 기계적 강도 등의 특성은 상기 실시예와 큰 차이가 없었다.The same procedure as in the above example was carried out except that the ring-opening acrylic component was not added. The photosensitive pattern on the wafer formed by the above method showed a photosensitive pattern having a deviation of -0.2 μm or more on the basis of the 8 μm pattern on the photomask, indicating that the deviation range due to shrinkage at the time of photocuring was large. In addition, as the development time was longer, the degree of crack generation on the film was increased as compared with the above example, and some pattern peeling phenomenon was observed. The properties such as other mechanical strength of the polyimide after the final curing were not significantly different from those of the above examples.
본 발명은 개환중합형 환형단량체와 광가교형 아크릴 감광기를 갖는 화합물 10 : 90 ∼ 90 : 10 비율인 광반응성 단량체를 사용함으로써 광경화시의 부피감소가 최소화되고,. 고해상도 영역에서 마스크패턴과 거의 동일한 선폭을 얻는 효과를 갖는다.The present invention minimizes volume reduction during photocuring by using a photoreactive monomer having a compound 10:90 to 90:10 ratio having a ring-opening-type cyclic monomer and a photocrosslinkable acrylic photosensitive group. It has the effect of obtaining a line width substantially the same as the mask pattern in the high resolution region.
본 발명의 단순한 변형 내지 변경은 이 분야의 통상의 지식을 가진 자에 의하여 용이하게 실시될 수 있으며, 이러한 변형이나 변경은 모두 본 발명의 영역에 포함되는 것으로 볼 수 있다.Simple modifications or changes of the present invention can be easily carried out by those skilled in the art, and all such modifications or changes can be seen to be included in the scope of the present invention.
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