KR100232166B1 - 이산화탄소 가스 검출기 - Google Patents
이산화탄소 가스 검출기 Download PDFInfo
- Publication number
- KR100232166B1 KR100232166B1 KR1019970077148A KR19970077148A KR100232166B1 KR 100232166 B1 KR100232166 B1 KR 100232166B1 KR 1019970077148 A KR1019970077148 A KR 1019970077148A KR 19970077148 A KR19970077148 A KR 19970077148A KR 100232166 B1 KR100232166 B1 KR 100232166B1
- Authority
- KR
- South Korea
- Prior art keywords
- carbon dioxide
- infrared
- dioxide gas
- detector
- optical bench
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
- G01N33/0036—General constructional details of gas analysers, e.g. portable test equipment concerning the detector specially adapted to detect a particular component
- G01N33/004—CO or CO2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
- G01N2201/06113—Coherent sources; lasers
- G01N2201/0612—Laser diodes
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- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
Description
Claims (3)
- 이산화탄소 흡수 대역의 파장을 갖는 적외선을 방사하는 적외선 다이오드; 상기 적외선이 이산화탄소에 의해 흡수가 일어나는 광학 벤치; 상기 광학 벤치에서 적외선의 흡수율 변화를 감지하는 써모파일부; 상기 화합물 반도체 적외선 다이오드 및 써모파일부를 제어하고 이산화탄소 가스농도에 따른 신호를 출력하는 회로부로 구성됨을 특징으로 하는 이산화탄소 가스 검출기.
- 제1항에 있어서, 상기 적외선 다이오드는 화합물 반도체 발광다이오드이거나 또는 레이저 다이오드임을 특징으로 하는 이산화탄소 가스 검출기.
- 제1항에 있어서, 상기 광학 벤치는 반사경들이 배열되어 상기 적외선 다이오드에서 방사되는 적외선을 반사경으로 반사시켜 적외선 검지기로 입사시킴을 특징으로 하는 이산화탄소 가스 검출기.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970077148A KR100232166B1 (ko) | 1997-12-29 | 1997-12-29 | 이산화탄소 가스 검출기 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970077148A KR100232166B1 (ko) | 1997-12-29 | 1997-12-29 | 이산화탄소 가스 검출기 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR19990057107A KR19990057107A (ko) | 1999-07-15 |
KR100232166B1 true KR100232166B1 (ko) | 1999-12-01 |
Family
ID=19529494
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970077148A Expired - Fee Related KR100232166B1 (ko) | 1997-12-29 | 1997-12-29 | 이산화탄소 가스 검출기 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100232166B1 (ko) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW495812B (en) | 2000-03-06 | 2002-07-21 | Semiconductor Energy Lab | Thin film forming device, method of forming a thin film, and self-light-emitting device |
DE102004028433B4 (de) * | 2004-06-14 | 2006-08-31 | Danfoss A/S | IR-Sensor, insbesondere CO2-Sensor |
KR100929343B1 (ko) * | 2009-02-23 | 2009-12-03 | (주)하나엔지니어링 | 벽걸이형 실내환경모니터장치 및 이를 이용한 빌딩공조기 제어시스템 |
KR102747450B1 (ko) * | 2022-07-29 | 2024-12-31 | (주)에스팩솔루션 | 광 도파관을 갖는 ndir 센서 및 이를 포함하는 toc 측정 시스템 |
-
1997
- 1997-12-29 KR KR1019970077148A patent/KR100232166B1/ko not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR19990057107A (ko) | 1999-07-15 |
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A201 | Request for examination | ||
PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19971229 |
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PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 19971229 Comment text: Request for Examination of Application |
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E701 | Decision to grant or registration of patent right | ||
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Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 19990723 |
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Comment text: Registration of Establishment Patent event date: 19990903 Patent event code: PR07011E01D |
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