KR100199048B1 - 정전기 보호회로 - Google Patents
정전기 보호회로 Download PDFInfo
- Publication number
- KR100199048B1 KR100199048B1 KR1019950046230A KR19950046230A KR100199048B1 KR 100199048 B1 KR100199048 B1 KR 100199048B1 KR 1019950046230 A KR1019950046230 A KR 1019950046230A KR 19950046230 A KR19950046230 A KR 19950046230A KR 100199048 B1 KR100199048 B1 KR 100199048B1
- Authority
- KR
- South Korea
- Prior art keywords
- diode
- static electricity
- power supply
- mos transistor
- circuit
- Prior art date
Links
- 230000005611 electricity Effects 0.000 title claims abstract description 33
- 230000003068 static effect Effects 0.000 title claims abstract description 33
- 230000015556 catabolic process Effects 0.000 claims description 12
- 239000004065 semiconductor Substances 0.000 abstract description 9
- 238000010586 diagram Methods 0.000 description 4
- 230000007423 decrease Effects 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/811—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/611—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using diodes as protective elements
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/911—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using passive elements as protective elements
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (2)
- 정전기 보호 회로에 있어서: 전원 전압(VDD)을 받아들이는 제 1 전원 단자(27)와; 접지 전압(VSS)을 받아들이는 제 2 전원 단자(28)와; 상기 제 1 전원 단자(27)에 연결된 캐소드 그리고 애노드를 가지는 다이오드(25)와; 상기 다이오드(25)의 애노드에 연결된 일단과 상기 제 2 전원 단자에 연결된 타단을 가지는 저항(26) 및; 상기 제 1 전원 단자(27)에 연결된 드레인, 상기 제 2 전원 단자(28)에 연결된 웰 콘택 및 소오스, 그리고 상기 저항(26)의 타단에 연결된 게이트를 가지는 NMOS 트랜지스터(24)를 포함하고, 상기 NMOS 트랜지스터(24)는 다이오드(25)의 브레이크다운 전압보다 큰 브레이크다운 전압을 가지며, 정전기가 발생될 때 순차적으로 형성되는 다이오드(25) 및 저항(26)에 의한 전류 통로 및 NMOS 트랜지스터에 의한 전류 통로를 통해서 상기 제 1 전원 단자(27)의 전압이 상기 다이오드(25)의 브레이크다운 전압 이하로 유지되는 것을 특징으로 하는 정전기 보호 회로.
- 제1항에 있어서, 상기 저항의 저항값은 수Ω ~수백Ω인 것을 특징으로 하는 정전기 보호 회로.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950046230A KR100199048B1 (ko) | 1995-12-02 | 1995-12-02 | 정전기 보호회로 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950046230A KR100199048B1 (ko) | 1995-12-02 | 1995-12-02 | 정전기 보호회로 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970053923A KR970053923A (ko) | 1997-07-31 |
KR100199048B1 true KR100199048B1 (ko) | 1999-06-15 |
Family
ID=19437470
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950046230A KR100199048B1 (ko) | 1995-12-02 | 1995-12-02 | 정전기 보호회로 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR100199048B1 (ko) |
-
1995
- 1995-12-02 KR KR1019950046230A patent/KR100199048B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR970053923A (ko) | 1997-07-31 |
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