KR0132504B1 - 데이타 출력버퍼 - Google Patents
데이타 출력버퍼Info
- Publication number
- KR0132504B1 KR0132504B1 KR1019930028855A KR930028855A KR0132504B1 KR 0132504 B1 KR0132504 B1 KR 0132504B1 KR 1019930028855 A KR1019930028855 A KR 1019930028855A KR 930028855 A KR930028855 A KR 930028855A KR 0132504 B1 KR0132504 B1 KR 0132504B1
- Authority
- KR
- South Korea
- Prior art keywords
- transistor
- data output
- data
- buffer
- voltage
- Prior art date
Links
- 230000001105 regulatory effect Effects 0.000 claims description 6
- 230000001276 controlling effect Effects 0.000 claims description 3
- 230000003139 buffering effect Effects 0.000 claims 2
- 101100489713 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) GND1 gene Proteins 0.000 description 11
- 230000007704 transition Effects 0.000 description 11
- 238000010586 diagram Methods 0.000 description 7
- 101100489717 Saccharomyces cerevisiae (strain ATCC 204508 / S288c) GND2 gene Proteins 0.000 description 6
- 230000003071 parasitic effect Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 3
- 101000590281 Homo sapiens 26S proteasome non-ATPase regulatory subunit 14 Proteins 0.000 description 2
- 101001114059 Homo sapiens Protein-arginine deiminase type-1 Proteins 0.000 description 2
- 102100023222 Protein-arginine deiminase type-1 Human genes 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 101100123053 Arabidopsis thaliana GSH1 gene Proteins 0.000 description 1
- 101100298888 Arabidopsis thaliana PAD2 gene Proteins 0.000 description 1
- 101150092599 Padi2 gene Proteins 0.000 description 1
- 102100035735 Protein-arginine deiminase type-2 Human genes 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 230000001629 suppression Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/08—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
- H03K19/094—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/003—Modifications for increasing the reliability for protection
- H03K19/00346—Modifications for eliminating interference or parasitic voltages or currents
- H03K19/00361—Modifications for eliminating interference or parasitic voltages or currents in field effect transistor circuits
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Computing Systems (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Power Engineering (AREA)
- Logic Circuits (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Abstract
Description
Claims (7)
- 제1신호에 응하여 동작하는 풀업수단과 제2신호에 응하여 동작하는 풀다운수단으로 된 데이타 출력드라이버와, 제1접지전위에 연결되고 상기 데이타 출력드라이브에 흐르는 전류 및 상기 제1접지전위의 노이즈의 크기를 감지하는 감지수단과, 상기 제1접지전위와 다른 접지전위를 갖는 제2접지전위에 연결되고 상기 감지수단의 출력신호에 따라 구동하여 상기 데이타 출력드라이브의 풀다운 수단의 게이트전압을 조절하는 전압조절수단으로 구성되는 데이타출력버퍼.
- 제1항에 있어서, 상기 감지수단은 인버터의 출력신호를 수신하는 게이트 전극 및 데이타 출력드라이버의 출력에 접속되는 드레인 전극을 갖는 제1N-모스트랜지스터 및 N-모스트랜지스터의 소스전극과 제1접지전위 사이에 직렬 접속되는 전류감지저항으로 구성되는 데이타 출력버퍼.
- 제1항에 있어서, 상기 전압조절수단은 제1접지전위를 인가받는 게이트 전극, 전압원을 공급받는 드레인 전극 및, 인버터에 접속되는 소스전극을 갖는 P-모스트랜지스터와, 제1N-모스트랜지스터의 소스전극과 전류 감지저항 사이의 절점의 전위를 인가받는 게이트 전극, 제2접지전위에 접속되는 소스전극 및, P-모스트랜지스터의 소스전극에 접속되는 드레인 전극을 갖는 제2N-모스트랜지스터로 이루어진 데이타 출력버퍼.
- 데이타 신호들을 버퍼링하는 데이타 버퍼수단과, 반전데이타 신호들을 버퍼링하는 반전데이타 버퍼수단과, 상기 데이타 버퍼수단의 출력신호에 응하여 동작하는 풀-업트랜지스터와 반전데이타 버퍼수단의 출력신호에 응하여 동작하는 풀-다운 트랜지스터된 데이타 출력드라이버와, 피드백을 통하여 상기 데이타 출력드라이버의 풀-다운 수단에 흐르는 전류를 감지하고 감지된 전류에 따라 제2신호의 슬로프를 제어하는 제어수단으로 구성되는 데이타 출력버퍼.
- 제4항에 있어서, 상기 제어수단은 데이타 구동시 풀-다운수단에 흐르는 전류 및 그에 따라 실제접지선의 노이즈의 크기를 감지하는 감지수단과, 감지수단의 출력신호에 따라 동작하여 풀-다운수단의 게이트 전압을 조절하는 전압 조절수단을 포함하는 데이타 출력버퍼.
- 제5항에 있어서, 상기 감지수단은 인버터의 출력신호를 수신하는 게이트 전극 및 데이타 출력드라이버의 출력에 접속되는 드레인 전극을 갖는 제1N-모스트랜지스터 및 제1N-모스트랜지스터의 소스전극과 제1접지전위 사이에 직렬 접속되는 전류감지저항으로 구성되는 데이타 출력버퍼.
- 제5항에 있어서, 상기 전압조절수단은 제1접지전위를 인가받는 게이트 전극, 전압원을 공급받는 드레인 전극 및, 인버터에 접속되는 소스전극을 갖는 P-모스트랜지스터와, 제1N-모스트랜지스터의 소스전극과 전류 감지저항 사이의 절점의 전위를 인가받는 게이트 전극, 제2접지 전위에 접속되는 소스전극 및, P-모스트랜지스터의 소스전극에 접속되는 드레인 전극을 갖는 제2N-모스트랜지스터로 이루어진 데이타 출력버퍼.
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019930028855A KR0132504B1 (ko) | 1993-12-21 | 1993-12-21 | 데이타 출력버퍼 |
US08/200,818 US5438545A (en) | 1993-12-21 | 1994-02-23 | Data output buffer of semiconductor memory device for preventing noises |
JP6113407A JP2754160B2 (ja) | 1993-12-21 | 1994-05-02 | データ出力バッファ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019930028855A KR0132504B1 (ko) | 1993-12-21 | 1993-12-21 | 데이타 출력버퍼 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950021494A KR950021494A (ko) | 1995-07-26 |
KR0132504B1 true KR0132504B1 (ko) | 1998-10-01 |
Family
ID=19371945
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019930028855A KR0132504B1 (ko) | 1993-12-21 | 1993-12-21 | 데이타 출력버퍼 |
Country Status (3)
Country | Link |
---|---|
US (1) | US5438545A (ko) |
JP (1) | JP2754160B2 (ko) |
KR (1) | KR0132504B1 (ko) |
Families Citing this family (45)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5430404A (en) * | 1992-10-28 | 1995-07-04 | Integrated Device Technology, Inc. | Output driver circuits with enhanced supply-line bounce control and improved VOH characteristic |
KR960013859B1 (ko) * | 1994-02-07 | 1996-10-10 | 현대전자산업 주식회사 | 반도체 소자의 데이타 출력버퍼 |
KR970005574B1 (ko) * | 1994-08-24 | 1997-04-17 | 현대전자산업 주식회사 | 노이즈 감쇠 출력 버퍼 |
KR100320672B1 (ko) * | 1995-12-30 | 2002-05-13 | 김덕중 | 스위칭 제어 집적회로 |
US5644258A (en) * | 1996-01-04 | 1997-07-01 | Winbond Electronics Corp. | Driver circuit, with low idle power consumption, for an attachment unit interface |
US5838631A (en) | 1996-04-19 | 1998-11-17 | Integrated Device Technology, Inc. | Fully synchronous pipelined ram |
US5872736A (en) * | 1996-10-28 | 1999-02-16 | Micron Technology, Inc. | High speed input buffer |
US5917758A (en) | 1996-11-04 | 1999-06-29 | Micron Technology, Inc. | Adjustable output driver circuit |
US5949254A (en) * | 1996-11-26 | 1999-09-07 | Micron Technology, Inc. | Adjustable output driver circuit |
US6115318A (en) * | 1996-12-03 | 2000-09-05 | Micron Technology, Inc. | Clock vernier adjustment |
US5838177A (en) * | 1997-01-06 | 1998-11-17 | Micron Technology, Inc. | Adjustable output driver circuit having parallel pull-up and pull-down elements |
US6912680B1 (en) | 1997-02-11 | 2005-06-28 | Micron Technology, Inc. | Memory system with dynamic timing correction |
US5920518A (en) * | 1997-02-11 | 1999-07-06 | Micron Technology, Inc. | Synchronous clock generator including delay-locked loop |
US5940608A (en) | 1997-02-11 | 1999-08-17 | Micron Technology, Inc. | Method and apparatus for generating an internal clock signal that is synchronized to an external clock signal |
US5946244A (en) | 1997-03-05 | 1999-08-31 | Micron Technology, Inc. | Delay-locked loop with binary-coupled capacitor |
US5956502A (en) * | 1997-03-05 | 1999-09-21 | Micron Technology, Inc. | Method and circuit for producing high-speed counts |
US5898638A (en) * | 1997-03-11 | 1999-04-27 | Micron Technology, Inc. | Latching wordline driver for multi-bank memory |
US5870347A (en) * | 1997-03-11 | 1999-02-09 | Micron Technology, Inc. | Multi-bank memory input/output line selection |
KR100474547B1 (ko) * | 1997-05-15 | 2005-06-07 | 주식회사 하이닉스반도체 | 반도체메모리소자의데이타출력버퍼 |
US6014759A (en) * | 1997-06-13 | 2000-01-11 | Micron Technology, Inc. | Method and apparatus for transferring test data from a memory array |
US6173432B1 (en) | 1997-06-20 | 2001-01-09 | Micron Technology, Inc. | Method and apparatus for generating a sequence of clock signals |
US5953284A (en) * | 1997-07-09 | 1999-09-14 | Micron Technology, Inc. | Method and apparatus for adaptively adjusting the timing of a clock signal used to latch digital signals, and memory device using same |
US6044429A (en) | 1997-07-10 | 2000-03-28 | Micron Technology, Inc. | Method and apparatus for collision-free data transfers in a memory device with selectable data or address paths |
US6011732A (en) * | 1997-08-20 | 2000-01-04 | Micron Technology, Inc. | Synchronous clock generator including a compound delay-locked loop |
US5926047A (en) | 1997-08-29 | 1999-07-20 | Micron Technology, Inc. | Synchronous clock generator including a delay-locked loop signal loss detector |
US6101197A (en) | 1997-09-18 | 2000-08-08 | Micron Technology, Inc. | Method and apparatus for adjusting the timing of signals over fine and coarse ranges |
US5923594A (en) * | 1998-02-17 | 1999-07-13 | Micron Technology, Inc. | Method and apparatus for coupling data from a memory device using a single ended read data path |
US6115320A (en) | 1998-02-23 | 2000-09-05 | Integrated Device Technology, Inc. | Separate byte control on fully synchronous pipelined SRAM |
US6269451B1 (en) | 1998-02-27 | 2001-07-31 | Micron Technology, Inc. | Method and apparatus for adjusting data timing by delaying clock signal |
US6016282A (en) * | 1998-05-28 | 2000-01-18 | Micron Technology, Inc. | Clock vernier adjustment |
US6405280B1 (en) | 1998-06-05 | 2002-06-11 | Micron Technology, Inc. | Packet-oriented synchronous DRAM interface supporting a plurality of orderings for data block transfers within a burst sequence |
US6338127B1 (en) | 1998-08-28 | 2002-01-08 | Micron Technology, Inc. | Method and apparatus for resynchronizing a plurality of clock signals used to latch respective digital signals, and memory device using same |
US6349399B1 (en) | 1998-09-03 | 2002-02-19 | Micron Technology, Inc. | Method and apparatus for generating expect data from a captured bit pattern, and memory device using same |
US6279090B1 (en) | 1998-09-03 | 2001-08-21 | Micron Technology, Inc. | Method and apparatus for resynchronizing a plurality of clock signals used in latching respective digital signals applied to a packetized memory device |
US6121789A (en) | 1998-09-04 | 2000-09-19 | Winbond Electronics Corporation | Output buffer with control circuitry |
US6029250A (en) * | 1998-09-09 | 2000-02-22 | Micron Technology, Inc. | Method and apparatus for adaptively adjusting the timing offset between a clock signal and digital signals transmitted coincident with that clock signal, and memory device and system using same |
US6430696B1 (en) | 1998-11-30 | 2002-08-06 | Micron Technology, Inc. | Method and apparatus for high speed data capture utilizing bit-to-bit timing correction, and memory device using same |
US6374360B1 (en) | 1998-12-11 | 2002-04-16 | Micron Technology, Inc. | Method and apparatus for bit-to-bit timing correction of a high speed memory bus |
US6470060B1 (en) | 1999-03-01 | 2002-10-22 | Micron Technology, Inc. | Method and apparatus for generating a phase dependent control signal |
US7069406B2 (en) | 1999-07-02 | 2006-06-27 | Integrated Device Technology, Inc. | Double data rate synchronous SRAM with 100% bus utilization |
US6801989B2 (en) | 2001-06-28 | 2004-10-05 | Micron Technology, Inc. | Method and system for adjusting the timing offset between a clock signal and respective digital signals transmitted along with that clock signal, and memory device and computer system using same |
DE10243603B4 (de) * | 2002-09-19 | 2007-04-19 | Infineon Technologies Ag | Verfahren zur Verwendung beim Trimmen, Halbleiter-Bauelement-Test-Gerät zum Durchführen des Verfahrens und Halbleiter-Bauelement-Test-System |
US7168027B2 (en) | 2003-06-12 | 2007-01-23 | Micron Technology, Inc. | Dynamic synchronization of data capture on an optical or other high speed communications link |
US7234070B2 (en) | 2003-10-27 | 2007-06-19 | Micron Technology, Inc. | System and method for using a learning sequence to establish communications on a high-speed nonsynchronous interface in the absence of clock forwarding |
KR102125569B1 (ko) * | 2019-12-17 | 2020-06-23 | 에스케이하이닉스 주식회사 | 데이터 전송 회로 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01140494A (ja) * | 1987-11-26 | 1989-06-01 | Mitsubishi Electric Corp | 半導体記憶装置の出力バッファ回路 |
JP2623918B2 (ja) * | 1990-06-04 | 1997-06-25 | 日本電気株式会社 | 出力バッファ回路 |
JP2900559B2 (ja) * | 1990-08-09 | 1999-06-02 | 日本電気株式会社 | データ出力回路 |
US5059823A (en) * | 1990-10-22 | 1991-10-22 | Advanced Micro Devices, Inc. | Supply bounce controlled output buffer circuit |
KR930008656B1 (ko) * | 1991-07-19 | 1993-09-11 | 삼성전자 주식회사 | 노이즈가 억제되는 데이타 출력 버퍼 |
US5815172A (en) * | 1996-08-23 | 1998-09-29 | Pitney Bowes, Inc. | Method and structure for controlling the energizing of an ink jet printhead in a value dispensing device such as a postage meter |
-
1993
- 1993-12-21 KR KR1019930028855A patent/KR0132504B1/ko not_active IP Right Cessation
-
1994
- 1994-02-23 US US08/200,818 patent/US5438545A/en not_active Expired - Lifetime
- 1994-05-02 JP JP6113407A patent/JP2754160B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2754160B2 (ja) | 1998-05-20 |
US5438545A (en) | 1995-08-01 |
JPH07211070A (ja) | 1995-08-11 |
KR950021494A (ko) | 1995-07-26 |
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EXPY | Expiration of term | ||
PC1801 | Expiration of term |
Termination date: 20140621 Termination category: Expiration of duration |