KR0127318B1 - 백바이어스전압 발생기 - Google Patents
백바이어스전압 발생기Info
- Publication number
- KR0127318B1 KR0127318B1 KR1019940007758A KR19940007758A KR0127318B1 KR 0127318 B1 KR0127318 B1 KR 0127318B1 KR 1019940007758 A KR1019940007758 A KR 1019940007758A KR 19940007758 A KR19940007758 A KR 19940007758A KR 0127318 B1 KR0127318 B1 KR 0127318B1
- Authority
- KR
- South Korea
- Prior art keywords
- voltage
- back bias
- bias voltage
- internal
- signal
- Prior art date
Links
- 230000010355 oscillation Effects 0.000 claims abstract description 24
- 238000005086 pumping Methods 0.000 claims description 13
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 10
- 230000005540 biological transmission Effects 0.000 description 6
- 230000005684 electric field Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
- G11C5/146—Substrate bias generators
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
- H02M3/00—Conversion of DC power input into DC power output
- H02M3/02—Conversion of DC power input into DC power output without intermediate conversion into AC
- H02M3/04—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters
- H02M3/06—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider
- H02M3/07—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using resistors or capacitors, e.g. potential divider using capacitors charged and discharged alternately by semiconductor devices with control electrode, e.g. charge pumps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Dram (AREA)
- Dc-Dc Converters (AREA)
- Semiconductor Integrated Circuits (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
Abstract
Description
Claims (6)
- 외부전압(VCC)이 공급되어 일성 레벨을 유지할때 파워온신호(PWRON)를 출력하는 파워온신호발생부(21)와, 상기 파워온신호(PWRON)가 출력되는 시점에서 내부전압제어신호(VREF)를 출력하는 '내부전압제어신호 발생부(22)와, 외부전압(VCC)을 구동전원으로 하여 상기 내부전압제어신호(VREF) 실를 귀환전압과 비교해서 일정레벨의 내부전압(VREG)을 생성하여 그 내부전압(VREG) 및 내외부전압 선택신호(VREGOK)를 출력하는 기준전압 발생부(23)와, 상기 내외부전압선택신호(VREGOK)의 제어를 받아 외부전압(VCC)이 공급되는 초기상태에서는 그 외부전압(VCC)에 따른 발진인에이블신호(OSCEN)로 출력하다가 내부전압(VREG)에 따른 발진 인에이블신호(OSCEN)를 출력하는 백바이어스전압 센서(24)와, 상기 발진인에이블신호(OSCEN)에 따라 소정 주기의 발진신호를 생성하고, 상기 백바이어스전압(VBB)이 일정레벨로 안정화될때 상기 기준전압발생부(23)에 인에이블신호(VBBOKB)를 출력하는 발진기(25)와, 상기 발진기(25)의 출력신호에 따라 전압펌핑기능을 수행하여 원하는 레벨의 백바이어스전압(VBB)을 생성하는 백바이어스전압펌핑부(26)로 구성한.것을 특정으로 하는 백바이어스전압 발생기.
- 제 1 항에 있어서, 기준전압 발생부(23)는 인에이블신호(VBBOKB)에 의해 구동되는 연산증폭기(OP21)의 비반전입력단자에 내부전압제어단자(VREF)를 접속하고, 그 연산증폭기(OP21)의 출력단자를 소오스가 외부전압단자(VCC)에 접속된 피모스(PM21)의 게이트에 접속하며, 그 피모스(OP21)의 드레인을 내부전압단자(VREG)에 접속함과 아울러 그 접속점을 지향(R21)을 통해 일측이 접지된 저항(R22)에 접속하여 그 접속점을 상기 연산중폭기(OP21)의 반전입력단자에 접속하여 구성한 것을 특정으로 하는 백바이어스전압 발생기.
- 제 1 항에 있어서, 백바이어스전압 센서(24)는 내외부전압선택신호(VREGOK)에 따라 전송게이트(TR31),(TR21)를 제어하여 내부전압(VREG)이나 외부전압(VCC)을 선택하도록 구성한 겻을 특징으로하는 백바이어스전압 발생기.
- 제 1 항에 있어서, 백바이어스전압 센서(24)는 상기 전송게이트(TR31)에 공급되는 내부전압(VREG)을 레벨시프트시켜 출력하도록 구성한 것을 특정으로 하는 백바이어스전압 발생기
- 제 1 항에 있어서, 백바이어스전압 센서(24)는 상기 전송게이트(TR31),(TR32)의 출력신호를 파워온신호(PWRON)와 낸드조합한 후 반전시켜 발진인에이블신호(OSCEN)로 출력하도록 구성한 것을 특징으로 하는 백바이어스전압 발생기.
- 제 1 항에 있어서, 백바이어스전압 센서(24)는 백바이어스전압(VBB)이 일정레벨로 하하강될때까지 발진인에이블신호(OSCEN)를 하이로 출력하도록 구성한 것을 특징으로 하는 백바이어스전압 발생기.
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019940007758A KR0127318B1 (ko) | 1994-04-13 | 1994-04-13 | 백바이어스전압 발생기 |
DE4445750A DE4445750C2 (de) | 1994-04-13 | 1994-12-21 | Geregelter Substratvorspannungsgenerator |
US08/362,299 US5602506A (en) | 1994-04-13 | 1994-12-22 | Back bias voltage generator |
JP7005532A JP2854533B2 (ja) | 1994-04-13 | 1995-01-18 | バックバイアス電圧発生器 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019940007758A KR0127318B1 (ko) | 1994-04-13 | 1994-04-13 | 백바이어스전압 발생기 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950030146A KR950030146A (ko) | 1995-11-24 |
KR0127318B1 true KR0127318B1 (ko) | 1998-04-02 |
Family
ID=19380974
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019940007758A KR0127318B1 (ko) | 1994-04-13 | 1994-04-13 | 백바이어스전압 발생기 |
Country Status (4)
Country | Link |
---|---|
US (1) | US5602506A (ko) |
JP (1) | JP2854533B2 (ko) |
KR (1) | KR0127318B1 (ko) |
DE (1) | DE4445750C2 (ko) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR0142967B1 (ko) * | 1995-04-26 | 1998-08-17 | 김광호 | 반도체 메모리장치의 기판 전압 제어회로 |
KR100223770B1 (ko) * | 1996-06-29 | 1999-10-15 | 김영환 | 반도체 장치의 문턱전압 제어회로 |
KR100234701B1 (ko) * | 1996-12-05 | 1999-12-15 | 김영환 | 외부전압에 둔감한 백바이어스전압 레벨 감지기 |
US5945869A (en) * | 1997-05-23 | 1999-08-31 | Texas Instruments Incorporated | Voltage detector using body effect |
KR100554112B1 (ko) * | 1997-05-30 | 2006-02-20 | 미크론 테크놀로지,인코포레이티드 | 256 메가 다이내믹 랜덤 액세스 메모리 |
US6194954B1 (en) * | 1997-12-31 | 2001-02-27 | Hyundai Electronics Industries Co., Ltd. | Voltage controlled generator for semiconductor devices |
US6016072A (en) * | 1998-03-23 | 2000-01-18 | Vanguard International Semiconductor Corporation | Regulator system for an on-chip supply voltage generator |
KR100309459B1 (ko) * | 1998-04-13 | 2001-12-17 | 김영환 | 반도체장치의기판전압발생기 |
KR100307525B1 (ko) * | 1998-11-26 | 2001-11-15 | 김영환 | 기판전압감지제어회로 |
EP1124313B1 (en) * | 2000-02-08 | 2006-01-25 | STMicroelectronics S.r.l. | Voltage boosting device |
JP4093705B2 (ja) * | 2000-06-30 | 2008-06-04 | 富士通株式会社 | 半導体集積回路 |
US6933769B2 (en) * | 2003-08-26 | 2005-08-23 | Micron Technology, Inc. | Bandgap reference circuit |
KR100794992B1 (ko) * | 2005-12-29 | 2008-01-16 | 주식회사 하이닉스반도체 | 기판 바이어스 전압 발생 장치 및 방법 |
KR100850290B1 (ko) * | 2007-01-11 | 2008-08-04 | 삼성전자주식회사 | 멀티레벨 바이어스 전압 발생기 및 이를 구비하는 반도체메모리 장치 |
US7911261B1 (en) | 2009-04-13 | 2011-03-22 | Netlogic Microsystems, Inc. | Substrate bias circuit and method for integrated circuit device |
JP2011259407A (ja) * | 2010-05-13 | 2011-12-22 | Sony Corp | 信号処理回路、固体撮像素子およびカメラシステム |
US10921839B2 (en) | 2017-08-30 | 2021-02-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Switchable power supply |
DE102017125543A1 (de) * | 2017-08-30 | 2019-02-28 | Taiwan Semiconductor Manufacturing Co. Ltd. | Schaltbare stromversorgung |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57199335A (en) * | 1981-06-02 | 1982-12-07 | Toshiba Corp | Generating circuit for substrate bias |
US4794278A (en) * | 1987-12-30 | 1988-12-27 | Intel Corporation | Stable substrate bias generator for MOS circuits |
KR0133933B1 (ko) * | 1988-11-09 | 1998-04-25 | 고스기 노부미쓰 | 기판바이어스 발생회로 |
JPH0783254B2 (ja) * | 1989-03-22 | 1995-09-06 | 株式会社東芝 | 半導体集積回路 |
US5157278A (en) * | 1990-10-30 | 1992-10-20 | Samsung Electronics Co., Ltd. | Substrate voltage generator for semiconductor device |
JP2870277B2 (ja) * | 1991-01-29 | 1999-03-17 | 日本電気株式会社 | ダイナミック型ランダムアクセスメモリ装置 |
FR2677771A1 (fr) * | 1991-06-17 | 1992-12-18 | Samsung Electronics Co Ltd | Circuit de detection de niveau de polarisation inverse dans un dispositif de memoire a semiconducteurs. |
KR940008286B1 (ko) * | 1991-08-19 | 1994-09-09 | 삼성전자 주식회사 | 내부전원발생회로 |
JPH0554650A (ja) * | 1991-08-26 | 1993-03-05 | Nec Corp | 半導体集積回路 |
US5329168A (en) * | 1991-12-27 | 1994-07-12 | Nec Corporation | Semiconductor integrated circuit device equipped with substrate biasing system selectively powered from internal and external power sources |
US5394026A (en) * | 1993-02-02 | 1995-02-28 | Motorola Inc. | Substrate bias generating circuit |
-
1994
- 1994-04-13 KR KR1019940007758A patent/KR0127318B1/ko not_active IP Right Cessation
- 1994-12-21 DE DE4445750A patent/DE4445750C2/de not_active Expired - Fee Related
- 1994-12-22 US US08/362,299 patent/US5602506A/en not_active Expired - Lifetime
-
1995
- 1995-01-18 JP JP7005532A patent/JP2854533B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE4445750A1 (de) | 1995-10-26 |
KR950030146A (ko) | 1995-11-24 |
JP2854533B2 (ja) | 1999-02-03 |
US5602506A (en) | 1997-02-11 |
DE4445750C2 (de) | 1996-11-28 |
JPH07283371A (ja) | 1995-10-27 |
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