JPS6471047A - Ion beam parallel scanning system - Google Patents
Ion beam parallel scanning systemInfo
- Publication number
- JPS6471047A JPS6471047A JP62227234A JP22723487A JPS6471047A JP S6471047 A JPS6471047 A JP S6471047A JP 62227234 A JP62227234 A JP 62227234A JP 22723487 A JP22723487 A JP 22723487A JP S6471047 A JPS6471047 A JP S6471047A
- Authority
- JP
- Japan
- Prior art keywords
- pair
- deflecting member
- electrodes
- ion beams
- electromagnets
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010884 ion-beam technique Methods 0.000 title abstract 6
Abstract
PURPOSE:To make it possible to reduce the length of all the system, by obtaining ion beams parallel to the third direction vertical to the first and the second directions by using the first deflecting member which consists of a pair of first electrodes and a pair of first magnetic poles, and the second deflecting member which consists of a pair of second electrodes and a pair of second magnetic poles. CONSTITUTION:The first deflecting member is composed of a pair of electrodes 21a and 21b, and a pair of electromagnets 22a and 22b, and ion beams (i) are deflected in the (x) direction and the (y) direction at a time. At the lower stream side of the first deflecting member composed in such a way, the second deflecting member composed of a pair of electrodes 23a and 23b, and a pair of electromagnets 24a and 24b furnished contacting to the rear of the electrodes, is arranged. The ion beams (i) are deflected in the (x) direction also by the electrodes 23a and 23b, but at the same angle in the reverse direction to the deflection by the first deflecting member. And the ion beams (i) are deflected in the (y) direction by the magnetic fields of the electromagnets 24a and 24b at the same angle and in the reverse direction to the deflection by the first deflecting member. Consequently, the ion beams (i) led from the second deflecting member are made parallel in the (z) direction, and injected to a wafer 3.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62227234A JPS6471047A (en) | 1987-09-10 | 1987-09-10 | Ion beam parallel scanning system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62227234A JPS6471047A (en) | 1987-09-10 | 1987-09-10 | Ion beam parallel scanning system |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6471047A true JPS6471047A (en) | 1989-03-16 |
Family
ID=16857614
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62227234A Pending JPS6471047A (en) | 1987-09-10 | 1987-09-10 | Ion beam parallel scanning system |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6471047A (en) |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61292843A (en) * | 1985-06-20 | 1986-12-23 | Toshiba Corp | Ion implanting device |
JPS6212041A (en) * | 1985-07-09 | 1987-01-21 | Nec Kyushu Ltd | Parallel scanner |
JPS62276738A (en) * | 1986-05-26 | 1987-12-01 | Fuji Electric Co Ltd | Ion beam device |
-
1987
- 1987-09-10 JP JP62227234A patent/JPS6471047A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61292843A (en) * | 1985-06-20 | 1986-12-23 | Toshiba Corp | Ion implanting device |
JPS6212041A (en) * | 1985-07-09 | 1987-01-21 | Nec Kyushu Ltd | Parallel scanner |
JPS62276738A (en) * | 1986-05-26 | 1987-12-01 | Fuji Electric Co Ltd | Ion beam device |
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