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JPS6459081A - Handler - Google Patents

Handler

Info

Publication number
JPS6459081A
JPS6459081A JP62216008A JP21600887A JPS6459081A JP S6459081 A JPS6459081 A JP S6459081A JP 62216008 A JP62216008 A JP 62216008A JP 21600887 A JP21600887 A JP 21600887A JP S6459081 A JPS6459081 A JP S6459081A
Authority
JP
Japan
Prior art keywords
elements
kinds
measured
semiconductors
plural kinds
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62216008A
Other languages
Japanese (ja)
Inventor
Masami Akumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Kyushu Ltd
Original Assignee
Tokyo Electron Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Kyushu Ltd filed Critical Tokyo Electron Kyushu Ltd
Priority to JP62216008A priority Critical patent/JPS6459081A/en
Publication of JPS6459081A publication Critical patent/JPS6459081A/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To measure and classify plural kinds of elements to be measured by the same handler by providing a conveying mechanism which has many holders for containing the elements to be measured by the kinds of the elements. CONSTITUTION:Many IC conveyance plates 11 equipped with the holders for storing plural kinds of elements, e.g. four kinds of semiconductors IC-A3, IC-B4, IC-C5, and IC-D6, e.g. IC sockets A7, B8, C9, and D10 are mounted on a chain 2. The chain 2 is driven to convey the conveyance plate 11 to the measurement positions of the respective semiconductors IC-A3, IC-B4, IC-C5, and IC-D6 of an IC test part 20. An electric signal is applied to the respective semiconductors IC16 through a measuring terminal 14 contacting a contact 15 connected to an IC tester and an IC socket 12 to measure their electric characteristics, and their categories are decided. Consequently, plural kinds of elements are measured and classified by the same handler.
JP62216008A 1987-08-28 1987-08-28 Handler Pending JPS6459081A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62216008A JPS6459081A (en) 1987-08-28 1987-08-28 Handler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62216008A JPS6459081A (en) 1987-08-28 1987-08-28 Handler

Publications (1)

Publication Number Publication Date
JPS6459081A true JPS6459081A (en) 1989-03-06

Family

ID=16681863

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62216008A Pending JPS6459081A (en) 1987-08-28 1987-08-28 Handler

Country Status (1)

Country Link
JP (1) JPS6459081A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02129566A (en) * 1988-11-10 1990-05-17 Hitachi Electron Eng Co Ltd Device conveyer for ic handler
JPH02129565A (en) * 1988-11-10 1990-05-17 Hitachi Electron Eng Co Ltd Device conveyer for ic handler
US5220991A (en) * 1991-08-21 1993-06-22 Tsubakimoto Chain Co. Conveying apparatus for coating line
US5242044A (en) * 1991-08-06 1993-09-07 Tsubakimoto Chain Co. Apparatus for rotating and conveying an article to be painted on coating line
WO2004001429A1 (en) * 2002-06-25 2003-12-31 Xilinx, Inc. Multi-socket board for open/short tester
JP2013525812A (en) * 2010-05-04 2013-06-20 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド Improved test system and method for electronic equipment

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02129566A (en) * 1988-11-10 1990-05-17 Hitachi Electron Eng Co Ltd Device conveyer for ic handler
JPH02129565A (en) * 1988-11-10 1990-05-17 Hitachi Electron Eng Co Ltd Device conveyer for ic handler
US5242044A (en) * 1991-08-06 1993-09-07 Tsubakimoto Chain Co. Apparatus for rotating and conveying an article to be painted on coating line
US5220991A (en) * 1991-08-21 1993-06-22 Tsubakimoto Chain Co. Conveying apparatus for coating line
WO2004001429A1 (en) * 2002-06-25 2003-12-31 Xilinx, Inc. Multi-socket board for open/short tester
US6891384B2 (en) 2002-06-25 2005-05-10 Xilinx, Inc. Multi-socket board for open/short tester
JP2013525812A (en) * 2010-05-04 2013-06-20 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド Improved test system and method for electronic equipment

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