[go: up one dir, main page]

JPS6453157A - Method and instrument for measuring characteristic of cutaneous cell - Google Patents

Method and instrument for measuring characteristic of cutaneous cell

Info

Publication number
JPS6453157A
JPS6453157A JP20956987A JP20956987A JPS6453157A JP S6453157 A JPS6453157 A JP S6453157A JP 20956987 A JP20956987 A JP 20956987A JP 20956987 A JP20956987 A JP 20956987A JP S6453157 A JPS6453157 A JP S6453157A
Authority
JP
Japan
Prior art keywords
sample
measurement
microscope
stage
magnification
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20956987A
Other languages
Japanese (ja)
Inventor
Mototsugu Takahashi
Masami Aizawa
Shojiro Yamada
Takahiro Ishiyama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shiseido Co Ltd
Kyokuto Boeki Kaisha Ltd
Original Assignee
Shiseido Co Ltd
Kyokuto Boeki Kaisha Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shiseido Co Ltd, Kyokuto Boeki Kaisha Ltd filed Critical Shiseido Co Ltd
Priority to JP20956987A priority Critical patent/JPS6453157A/en
Publication of JPS6453157A publication Critical patent/JPS6453157A/en
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analysing Biological Materials (AREA)

Abstract

PURPOSE:To make measurement with high accuracy in a short period of time by using an image processor and microscope and automatically checking the position of the cutaneous cells in a sample by low-magnification scanning, then measuring the characteristics of the cutaneous cells existing in the checked position at a high magnification. CONSTITUTION:The microscope 10 is set at the low magnification and the sample 24 is placed on an X-Y stage 16. The X-Y stage is moved by the command of the image processor 28 and the sample 24 is scanned. Whether the object on the sample 24 is the cutaneous cells or not is judged from the area thereof while said object is taken by a television camera 26. The X-, Y- coordinates thereof are then stored. The microscope 10 is set at the high magnification when the number of the cells attains a specified number. The stored X-, Y-coordinates are then read out and the X-Y stage 16 is moved to that position where the measurement is made. Namely, the measurement of the characteristics such as area and peripheral length of the object are made until the specified number is attained. The high-accuracy measurement is thereby enabled in a short period of time.
JP20956987A 1987-08-24 1987-08-24 Method and instrument for measuring characteristic of cutaneous cell Pending JPS6453157A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20956987A JPS6453157A (en) 1987-08-24 1987-08-24 Method and instrument for measuring characteristic of cutaneous cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20956987A JPS6453157A (en) 1987-08-24 1987-08-24 Method and instrument for measuring characteristic of cutaneous cell

Publications (1)

Publication Number Publication Date
JPS6453157A true JPS6453157A (en) 1989-03-01

Family

ID=16575003

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20956987A Pending JPS6453157A (en) 1987-08-24 1987-08-24 Method and instrument for measuring characteristic of cutaneous cell

Country Status (1)

Country Link
JP (1) JPS6453157A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05177364A (en) * 1992-01-08 1993-07-20 Chiyoda Corp Friction press welding machine
US5276550A (en) * 1990-04-16 1994-01-04 Olympus Optical Co., Ltd. Optical microscope with variable magnification
JPH11264941A (en) * 1998-01-20 1999-09-28 Kyungil High Technol Co Ltd Video processing system for microscope utilizing digital camera
JP2002514762A (en) * 1998-05-09 2002-05-21 アイコニシス,インコーポレーテッド Method and apparatus for computer controlled rare cell based diagnosis including fetal cells
JP2002541494A (en) * 1999-04-13 2002-12-03 クロマビジョン メディカル システムズ インコーポレイテッド Histological reconstruction and automatic image analysis
JP2008145109A (en) * 2006-12-06 2008-06-26 Pola Chem Ind Inc Evaluation device of horny layer cell
WO2009125547A1 (en) * 2008-04-09 2009-10-15 株式会社ニコン Culture apparatus controller and control program

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS503397A (en) * 1973-05-11 1975-01-14
JPS5974525A (en) * 1982-10-21 1984-04-27 Toshiba Corp Automatic cell diagnosing device
JPS6132182A (en) * 1984-07-24 1986-02-14 Hitachi Ltd cell sorting device
JPS6194014A (en) * 1984-09-14 1986-05-12 ブランコ・パルシツク Microscopic image processing dynamic scanner

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS503397A (en) * 1973-05-11 1975-01-14
JPS5974525A (en) * 1982-10-21 1984-04-27 Toshiba Corp Automatic cell diagnosing device
JPS6132182A (en) * 1984-07-24 1986-02-14 Hitachi Ltd cell sorting device
JPS6194014A (en) * 1984-09-14 1986-05-12 ブランコ・パルシツク Microscopic image processing dynamic scanner

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5276550A (en) * 1990-04-16 1994-01-04 Olympus Optical Co., Ltd. Optical microscope with variable magnification
EP0453239B1 (en) * 1990-04-16 1995-08-16 Olympus Optical Co., Ltd. Optical microscope with variable magnification
JPH05177364A (en) * 1992-01-08 1993-07-20 Chiyoda Corp Friction press welding machine
JPH11264941A (en) * 1998-01-20 1999-09-28 Kyungil High Technol Co Ltd Video processing system for microscope utilizing digital camera
JP2002514762A (en) * 1998-05-09 2002-05-21 アイコニシス,インコーポレーテッド Method and apparatus for computer controlled rare cell based diagnosis including fetal cells
JP2002541494A (en) * 1999-04-13 2002-12-03 クロマビジョン メディカル システムズ インコーポレイテッド Histological reconstruction and automatic image analysis
JP2008145109A (en) * 2006-12-06 2008-06-26 Pola Chem Ind Inc Evaluation device of horny layer cell
WO2009125547A1 (en) * 2008-04-09 2009-10-15 株式会社ニコン Culture apparatus controller and control program

Similar Documents

Publication Publication Date Title
Brenner et al. An automated microscope for cytologic research a preliminary evaluation.
ATE114186T1 (en) POSITION MEASUREMENT DEVICE WITH SEVERAL SENSING POINTS.
DE69030733D1 (en) Two-color camera microscope and methodology for staining cells and analysis
EP0177566A4 (en) Method for precision sem measurements.
JPS6453157A (en) Method and instrument for measuring characteristic of cutaneous cell
JPS54114264A (en) Screw inspection method
US5123735A (en) Method of measuring the power of a lens
JPS6447948A (en) Automatic cell sorter
Ayres et al. Grid circle analyzer-computer aided measurement of deformation
ES2035793A1 (en) High-resolution vision system for part inspection
Becker et al. Test and evaluation of new GEMs with an automatic scanner
JPS6452113A (en) Method and device for microscope image measurement
EP0111635A3 (en) Method of selecting the optimum focusing adjustment for an optical instrument
Dvorak et al. A simple video method for the quantification of microscopic objects
JPS5759115A (en) Calibrating data writing method applied externally to information measuring device and information measuring device stored with calibra ting data
CN214894893U (en) Novel automatic point measurement machine of serial port communication protocol
JPS54107254A (en) Scanning-type electron microscope
JPS6269527A (en) Inspection equipment
JPS5590840A (en) Method and device for measuring flexural rigidity of filament-like material
JPS6473241A (en) Foreign matter inspecting device
JPS5683045A (en) Wafer probe
JPS6429702A (en) Shape measuring instrument
JPS6250719A (en) Indexing method for scanning position in image measurement by microscope or the like
KR960025924A (en) Curvature Measurement System and Method of Shadow Mask
JPS54138427A (en) Focus detecting method