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JPS6442153A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6442153A
JPS6442153A JP62198106A JP19810687A JPS6442153A JP S6442153 A JPS6442153 A JP S6442153A JP 62198106 A JP62198106 A JP 62198106A JP 19810687 A JP19810687 A JP 19810687A JP S6442153 A JPS6442153 A JP S6442153A
Authority
JP
Japan
Prior art keywords
metal layer
barrier metal
bump
passivation film
etchant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62198106A
Other languages
Japanese (ja)
Inventor
Yuko Kubota
Nobuo Hayashi
Hirotaka Nakano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP62198106A priority Critical patent/JPS6442153A/en
Publication of JPS6442153A publication Critical patent/JPS6442153A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods

Landscapes

  • Weting (AREA)

Abstract

PURPOSE:To increase an adhesion intensity of a bump with a substrate without eroding a phosphorus glass film at the time of wet etching of a barrier metal layer, by extending the barrier metal layer outside an outer edge of a contact surface between the bump and the barrier metal layer. CONSTITUTION:A barrier metal layer 12 is constructed such that it extends outside an outer edge of a contact surface between a bump 13 and the a barrier metal layer 12. Therefore, when the barrier metal layer 12 is formed by etching, etchant is not soaked into a vertical interface between the barrier metal layer 12 positioned right beneath a lateral face of the bump and a passivation film 11. As a result, since a phosphorus glass film 11a serving as a lower layer of the passivation film 11 does not react with the etchant, it is possible to prevent the decrease in adhesion intensity of the bump and the decrease in characteristics due to the exposure of an Al pad 10 beneath the passivation film 11.
JP62198106A 1987-08-10 1987-08-10 Semiconductor device Pending JPS6442153A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62198106A JPS6442153A (en) 1987-08-10 1987-08-10 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62198106A JPS6442153A (en) 1987-08-10 1987-08-10 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6442153A true JPS6442153A (en) 1989-02-14

Family

ID=16385587

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62198106A Pending JPS6442153A (en) 1987-08-10 1987-08-10 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6442153A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5661081A (en) * 1994-09-30 1997-08-26 United Microelectronics Corporation Method of bonding an aluminum wire to an intergrated circuit bond pad

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5661081A (en) * 1994-09-30 1997-08-26 United Microelectronics Corporation Method of bonding an aluminum wire to an intergrated circuit bond pad
US5734200A (en) * 1994-09-30 1998-03-31 United Microelectronics Corporation Polycide bonding pad structure

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