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JPS641271A - Memory cell - Google Patents

Memory cell

Info

Publication number
JPS641271A
JPS641271A JP62157294A JP15729487A JPS641271A JP S641271 A JPS641271 A JP S641271A JP 62157294 A JP62157294 A JP 62157294A JP 15729487 A JP15729487 A JP 15729487A JP S641271 A JPS641271 A JP S641271A
Authority
JP
Japan
Prior art keywords
oxide film
memory capacitor
memory
fet
become
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62157294A
Other languages
Japanese (ja)
Other versions
JPH011271A (en
Inventor
Masaya Kabasawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP62157294A priority Critical patent/JPS641271A/en
Publication of JPH011271A publication Critical patent/JPH011271A/en
Publication of JPS641271A publication Critical patent/JPS641271A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)

Abstract

PURPOSE:To obtain the capacity of a memory capacitor sufficient for a memory cell with a half area of a conventional memory capacitor for realizing high integration, by making a silicon oxide film become the memory capacitor of two-layered structure. CONSTITUTION:A field oxide film 2 for element isolation, a source-drain region 3 an FET, the first silicon oxide film 4 to become a memory capacitor, a gate oxide film 5 of the FET and the first polycrystalline silicon film 6 to become an electrode of the memory capacitor are formed respectively on a silicon substrate 1. Then, the second silicon oxide film 7 is formed by oxidizing the upper part of the first polycrystalline silicon film 6 with a thermal oxidation method, and thereon the third polycrystalline silicon film 8 is formed so as to be electrically connected with the source side of the FET. Thereby, a memory cell structure having two memory capacitors like an equivalent circuit can be obtained so as to reduce an area of a conventional memory capacitor to half and to realize high integration of a semiconductor device.
JP62157294A 1987-06-23 1987-06-23 Memory cell Pending JPS641271A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62157294A JPS641271A (en) 1987-06-23 1987-06-23 Memory cell

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62157294A JPS641271A (en) 1987-06-23 1987-06-23 Memory cell

Publications (2)

Publication Number Publication Date
JPH011271A JPH011271A (en) 1989-01-05
JPS641271A true JPS641271A (en) 1989-01-05

Family

ID=15646516

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62157294A Pending JPS641271A (en) 1987-06-23 1987-06-23 Memory cell

Country Status (1)

Country Link
JP (1) JPS641271A (en)

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