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JPS6353494B2 - - Google Patents

Info

Publication number
JPS6353494B2
JPS6353494B2 JP55136004A JP13600480A JPS6353494B2 JP S6353494 B2 JPS6353494 B2 JP S6353494B2 JP 55136004 A JP55136004 A JP 55136004A JP 13600480 A JP13600480 A JP 13600480A JP S6353494 B2 JPS6353494 B2 JP S6353494B2
Authority
JP
Japan
Prior art keywords
light
terminal
receiving surface
crimped
electric wire
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55136004A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5760249A (en
Inventor
Kyoji Fukui
Tadashi Inoe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinmaywa Industries Ltd
Original Assignee
Shin Meiva Industry Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shin Meiva Industry Ltd filed Critical Shin Meiva Industry Ltd
Priority to JP13600480A priority Critical patent/JPS5760249A/ja
Publication of JPS5760249A publication Critical patent/JPS5760249A/ja
Publication of JPS6353494B2 publication Critical patent/JPS6353494B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP13600480A 1980-09-29 1980-09-29 Terminal compression status inspecter for terminal compressed wire Granted JPS5760249A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13600480A JPS5760249A (en) 1980-09-29 1980-09-29 Terminal compression status inspecter for terminal compressed wire

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13600480A JPS5760249A (en) 1980-09-29 1980-09-29 Terminal compression status inspecter for terminal compressed wire

Publications (2)

Publication Number Publication Date
JPS5760249A JPS5760249A (en) 1982-04-12
JPS6353494B2 true JPS6353494B2 (de) 1988-10-24

Family

ID=15164934

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13600480A Granted JPS5760249A (en) 1980-09-29 1980-09-29 Terminal compression status inspecter for terminal compressed wire

Country Status (1)

Country Link
JP (1) JPS5760249A (de)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5942436A (ja) * 1982-08-09 1984-03-09 Sumitomo Electric Ind Ltd 圧着端子の検査方法
US4555799A (en) * 1983-10-24 1985-11-26 Sumitomo Electric Industries, Ltd. Method for inspecting crimp bonded terminals
JPS60183543A (ja) * 1984-02-29 1985-09-19 Shin Meiwa Ind Co Ltd 端子圧着電線の端子圧着状態検査方法
JPS60198473A (ja) * 1984-03-21 1985-10-07 Shin Meiwa Ind Co Ltd 端子圧着電線の端子圧着状態検査装置
JP2562430B2 (ja) * 1984-11-08 1996-12-11 古河電気工業株式会社 圧着端子の不良検査方法
JP2795044B2 (ja) * 1992-03-26 1998-09-10 住友電装株式会社 圧着端子画像処理検査における照明方法及び画像処理方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5245956A (en) * 1975-10-09 1977-04-12 Kurabo Ind Ltd Method and system for measuring distribution of substance sticked to s urface of string
JPS54136888A (en) * 1978-04-14 1979-10-24 Kobayashi Akira Surface defect detecting device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5245956A (en) * 1975-10-09 1977-04-12 Kurabo Ind Ltd Method and system for measuring distribution of substance sticked to s urface of string
JPS54136888A (en) * 1978-04-14 1979-10-24 Kobayashi Akira Surface defect detecting device

Also Published As

Publication number Publication date
JPS5760249A (en) 1982-04-12

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