JPS6351824B2 - - Google Patents
Info
- Publication number
- JPS6351824B2 JPS6351824B2 JP59221357A JP22135784A JPS6351824B2 JP S6351824 B2 JPS6351824 B2 JP S6351824B2 JP 59221357 A JP59221357 A JP 59221357A JP 22135784 A JP22135784 A JP 22135784A JP S6351824 B2 JPS6351824 B2 JP S6351824B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing pad
- polishing
- polished
- elastic force
- force distribution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Landscapes
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は研摩パツドに関し、特に光学素子を高
精度に研摩するのに好適な研摩パツドに関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a polishing pad, and particularly to a polishing pad suitable for polishing optical elements with high precision.
従来、光学素子たとえばレンズ、プリズムまた
は反射鏡等の表面精度を極めて高い精度に仕上げ
るために、一旦ある程度の精度に研摩された表面
を小径の研摩パツドにより部分的に修正研摩する
ことが行なわれる。
Conventionally, in order to finish the surface of an optical element such as a lens, prism, or reflecting mirror to extremely high precision, the surface, which has been polished to a certain degree of precision, is partially corrected and polished using a small-diameter polishing pad.
第3図は、この様な修正研摩の具体例を説明す
るための概略斜視図である。図において、12は
被研摩材である光学ガラス平行平面板であり、該
被研摩材12は円形である。被研摩材12はその
下面が支持体14に接着されて固定支持されてい
る。支持体14は軸Xのまわりに回転可能であ
り、被研摩材12は該軸Xに関し回転対称となる
様に支持体14に固定されている。被研摩材12
の上面は前加工により予め鏡面研摩されている。
但し、この前加工によつて、図示される輪帯Yの
部分が凸になつているとする。 FIG. 3 is a schematic perspective view for explaining a specific example of such corrective polishing. In the figure, reference numeral 12 denotes an optical glass parallel plane plate which is a material to be polished, and the material to be polished 12 is circular. The material to be polished 12 is fixedly supported with its lower surface adhered to a support 14 . The support body 14 is rotatable around an axis X, and the material to be polished 12 is fixed to the support body 14 so as to be rotationally symmetrical about the axis X. Polished material 12
The upper surface of the is mirror-polished in advance.
However, it is assumed that the illustrated ring zone Y has become convex due to this pre-processing.
修正研摩においては被研摩材12の大きさに比
べて、小さい研摩パツド16が用いられる。研摩
パツド16は支持体18に接着されて固定支持さ
れており、該支持体18の上面中央部に形成され
た凹部には棒体20の一端が突当てられている。
該棒体20は被研摩材12の径方向に適宜の幅で
揺動可能である。22は研摩液供給手段である。 In corrective polishing, a polishing pad 16 that is smaller than the size of the material 12 to be polished is used. The polishing pad 16 is fixedly supported by adhesion to a support 18, and one end of a rod 20 is abutted against a recess formed in the center of the upper surface of the support 18.
The rod 20 is swingable in the radial direction of the material to be polished 12 by an appropriate width. 22 is a polishing liquid supply means.
研摩液供給手段22から被研摩材12の上面上
へと研摩液を供給しながら支持体14を矢印A方
向に回転させ、同時に支持体18を矢印B方向に
揺動させることによつて修正研摩が行なわれる。 Corrective polishing is performed by rotating the support body 14 in the direction of arrow A while supplying polishing liquid from the polishing liquid supply means 22 onto the upper surface of the material to be polished 12, and simultaneously swinging the support body 18 in the direction of arrow B. will be carried out.
しかしながら、従来の修正研摩においては研摩
パツド16が全面にわたつて均一の圧力にて被研
摩材12に接触しながら研摩加工を行なうため、
被研摩材12の上面において修正研摩を受けた部
分と受けない部分とで段差を生じ易いという問題
があつた。
However, in conventional corrective polishing, the polishing process is performed while the polishing pad 16 is in contact with the material to be polished 12 with uniform pressure over the entire surface.
There has been a problem in that a level difference is likely to occur between a portion of the upper surface of the material to be polished 12 that has undergone correction polishing and a portion that has not undergone correction polishing.
第4図a及びbは第3図における−断面に
相当する被研摩材12の断面図である。第4図a
は修正研摩前の状態を示し、第4図bは修正研摩
後の状態を示すものであり、これから分る様に、
修正研摩時の研摩パツド16の揺動幅に応じた位
置に光学的にみてかなり大きな段差24が形成さ
れる。 FIGS. 4a and 4b are cross-sectional views of the material to be polished 12 corresponding to the negative cross-section in FIG. Figure 4a
shows the state before corrective polishing, and Fig. 4b shows the state after corrective polishing, and as can be seen from this,
Optically, a considerably large step 24 is formed at a position corresponding to the swing width of the polishing pad 16 during corrective polishing.
このため、研摩パツド16の揺動幅を固定した
ものとせず、徐々に揺動幅を変えることで段差の
発生を防止することが提案されている。しかしな
がら、この様な揺動幅の連続的変化のための機構
はかなり複雑であり、研摩装置が高価なものとな
るという欠点がある。 For this reason, it has been proposed that the swing width of the polishing pad 16 is not fixed, but is gradually changed to prevent the occurrence of the step. However, such a mechanism for continuously changing the oscillation width is quite complicated and has the disadvantage that the polishing device becomes expensive.
本発明によれば、以上の如き従来技術の問題点
を解決するものとして、
被研摩材に圧接して研摩する研摩パツドにおい
て、該研摩パツドはそれ自体が弾性体からなり、
該研摩パツドの弾性力分布は中央部から周辺部に
かけて次第に減少するものとされており、該弾性
力分布が弾性体に含まれる多数の気孔の分布に基
づき形成されていることを特徴とする、研摩パツ
ド、及び
被研摩材に圧接して研摩する研摩パツドにおい
て、該研摩パツドはそれ自体が弾性体からなり、
該研摩パツドの弾性力分布は中央部から周辺部に
かけて次第に減少するものとされており、該弾性
力分布が弾性体の弾性に寄与する素材の混入率の
分布に基づき形成されていることを特徴とする、
研摩パツド、
が提供される。
According to the present invention, in order to solve the above-mentioned problems of the prior art, there is provided a polishing pad that is brought into pressure contact with a material to be polished for polishing, the polishing pad itself being made of an elastic body,
The elastic force distribution of the polishing pad is said to gradually decrease from the center to the periphery, and is characterized in that the elastic force distribution is formed based on the distribution of a large number of pores contained in the elastic body. In the polishing pad, and the polishing pad that polishes by pressing against the material to be polished, the polishing pad itself is made of an elastic body,
The elastic force distribution of the polishing pad is said to gradually decrease from the center to the periphery, and the elastic force distribution is formed based on the distribution of the mixing rate of a material that contributes to the elasticity of the elastic body. and
Abrasive pads are provided.
以下、図面を参照しながら本発明の研摩パツド
の具体的実施例を説明する。
Hereinafter, specific embodiments of the polishing pad of the present invention will be described with reference to the drawings.
第1図aは本発明研摩パツド及びその支持体の
第1の実施例を示す概略断面図である。 FIG. 1a is a schematic cross-sectional view showing a first embodiment of the polishing pad and its support according to the present invention.
本実施例の研摩パツド16は均一な厚さをもつ
円板状の形状を有する。Zはその対称軸である。
研摩パツド16はその上面に下面が平面の支持体
18が接着されている。本実施例研摩パツドは支
持体18に固定された状態にて剛体平面上に圧接
せしめられると、第1図bに示される様に圧縮さ
れ、この際各部分は対称軸Zからの距離により異
なる反発力を受ける。即ち、本実施例研摩パツド
は圧接時に第1図cに示される様な弾性力分布を
示す。 The polishing pad 16 of this embodiment has a disk-like shape with a uniform thickness. Z is its axis of symmetry.
A support 18 having a flat bottom surface is bonded to the upper surface of the polishing pad 16. When the polishing pad of this embodiment is pressed against a rigid plane while being fixed to the support 18, it is compressed as shown in FIG. receive repulsive force. That is, the polishing pad of this embodiment exhibits an elastic force distribution as shown in FIG. 1c when pressed.
本実施例の研摩パツドは、たとえば現在光学素
子研摩用に一般に広く用いられているポリウレタ
ンパツドを製造する際に弾性に寄与する素材を適
宜の分布にて混入せしめたり、気孔率に寄与する
素材を適宜の分布にて混入せしめたりすることに
より得られる。 The polishing pad of this example is made by mixing materials that contribute to elasticity in an appropriate distribution when manufacturing polyurethane pads, which are currently widely used for polishing optical elements, or materials that contribute to porosity. It can be obtained by mixing in an appropriate distribution.
第2図a及びbは本実施例研摩パツドを用いて
修正研摩を行なつた場合の被研摩材12の変化を
示す断面図である。第2図aは修正研摩前の状態
を示し、第2図bは修正研摩後の状態を示すもの
である。本実施例研摩パツドによれば、パツドが
研摩加工時において第1図cに示される様な弾性
力分布を示すため、段差を生ずることなく輪帯状
凸部を平坦化する修正研摩を良好に行なうことが
できる。 FIGS. 2a and 2b are cross-sectional views showing changes in the material to be polished 12 when corrective polishing is performed using the polishing pad of this embodiment. FIG. 2a shows the state before the corrective polishing, and FIG. 2b shows the state after the corrective polishing. According to the polishing pad of this embodiment, since the pad exhibits an elastic force distribution as shown in FIG. be able to.
以上の実施例においては研摩パツドは平面研摩
用のものとして示されているが、本発明研摩パツ
ドには凸面または凹面研摩用のものも包含され
る。凹面または凸面研摩用の研摩パツドは該凸面
または凹面に圧接した際における弾性力分布を適
宜設定することにより同様に構成することができ
ることは明らかであろう。 Although the polishing pads in the above embodiments are shown as being for polishing flat surfaces, the polishing pads of the present invention also include pads for polishing convex or concave surfaces. It will be obvious that a polishing pad for polishing a concave or convex surface can be similarly constructed by appropriately setting the elastic force distribution when pressed against the convex or concave surface.
以上の実施例においては修正研摩を例にとり説
明したが、本発明研摩パツドはその他の通常の研
摩にも利用できることはもちろんである。 Although the above embodiments have been explained by taking corrective polishing as an example, it goes without saying that the polishing pad of the present invention can also be used for other ordinary polishing.
また本発明研摩パツドは、上記実施例に記載の
様な使用方法において研摩時間を適宜設定するこ
とにより、非球面量の少ない軸対称非球面を創成
研摩するのに利用することもできる。 The polishing pad of the present invention can also be used to create and polish an axially symmetric aspherical surface with a small amount of aspherical surface by appropriately setting the polishing time in the method described in the above embodiment.
以上の如き本発明研摩パツドによれば、複雑な
機構を有する研摩装置を用いることなしに、被研
摩材に段差を生ずることなく高精度な研摩を行な
うことができる。
According to the polishing pad of the present invention as described above, highly accurate polishing can be performed without creating a step on the material to be polished, without using a polishing device having a complicated mechanism.
第1図a及びbは本発明研摩パツドの断面図で
あり、第1図cは弾性力のグラフである。第2図
a及びb、ならびに第4図a及びbは被研摩材の
断面図である。第3図は研摩方法を示す斜視図で
ある。
12:被研摩材、14:支持体、16:研摩パ
ツド、18:支持体。
1a and 1b are cross-sectional views of the polishing pad of the present invention, and FIG. 1c is a graph of elastic force. Figures 2a and b and Figures 4a and b are cross-sectional views of the material to be polished. FIG. 3 is a perspective view showing the polishing method. 12: Polished material, 14: Support, 16: Polishing pad, 18: Support.
Claims (1)
いて、該研摩パツドはそれ自体が弾性体からな
り、該研摩パツドの弾性力分布は中央部から周辺
部にかけて次第に減少するものとされており、該
弾性力分布が弾性体に含まれる多数の気孔の分布
に基づき形成されていることを特徴とする、研摩
パツド。 2 被研摩材に圧接して研摩する研摩パツドにお
いて、該研摩パツドはそれ自体が弾性体からな
り、該研摩パツドの弾性力分布は中央部から周辺
部にかけて次第に減少するものとされており、該
弾性力分布が弾性体の弾性に寄与する素材の混入
率の分布に基づき形成されていることを特徴とす
る、研摩パツド。[Scope of Claims] 1. A polishing pad that polishes by pressing against the material to be polished, the polishing pad itself being made of an elastic body, and the elastic force distribution of the polishing pad gradually decreasing from the center to the periphery. A polishing pad characterized in that the elastic force distribution is formed based on the distribution of a large number of pores contained in the elastic body. 2. In a polishing pad that polishes by pressing against the material to be polished, the polishing pad itself is made of an elastic body, and the elastic force distribution of the polishing pad is said to gradually decrease from the center to the periphery. An abrasive pad characterized in that the elastic force distribution is formed based on the distribution of the mixing ratio of materials that contribute to the elasticity of the elastic body.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59221357A JPS61100358A (en) | 1984-10-23 | 1984-10-23 | Abrasive pad |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59221357A JPS61100358A (en) | 1984-10-23 | 1984-10-23 | Abrasive pad |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS61100358A JPS61100358A (en) | 1986-05-19 |
JPS6351824B2 true JPS6351824B2 (en) | 1988-10-17 |
Family
ID=16765525
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59221357A Granted JPS61100358A (en) | 1984-10-23 | 1984-10-23 | Abrasive pad |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61100358A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0347383A (en) * | 1989-07-13 | 1991-02-28 | Honda Lock Mfg Co Ltd | Door lock device for car |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61103768A (en) * | 1984-10-25 | 1986-05-22 | Olympus Optical Co Ltd | Polishing and grinding tool |
US6439979B1 (en) | 1992-02-12 | 2002-08-27 | Tokyo Electron Limited | Polishing apparatus and polishing method using the same |
JP3708167B2 (en) * | 1995-05-17 | 2005-10-19 | 株式会社荏原製作所 | Polishing cloth and polishing apparatus provided with the polishing cloth |
DE102004003131A1 (en) | 2004-01-15 | 2005-08-11 | Carl Zeiss | Apparatus and method for polishing an optical surface, optical component, and method of manufacturing a polishing tool |
JP4933957B2 (en) * | 2007-05-18 | 2012-05-16 | 住友ゴム工業株式会社 | Sponge scourer |
-
1984
- 1984-10-23 JP JP59221357A patent/JPS61100358A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0347383A (en) * | 1989-07-13 | 1991-02-28 | Honda Lock Mfg Co Ltd | Door lock device for car |
Also Published As
Publication number | Publication date |
---|---|
JPS61100358A (en) | 1986-05-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5601474A (en) | Polishing disc of spherical surface polishing device for optical fiber end surface and method for polishing spherical surface of optical fiber end surface | |
US5683290A (en) | Apparatus for forming a convex tip on a workpiece | |
EP1205280B1 (en) | Wafer polishing method and wafer polishing device | |
US6929534B2 (en) | Polisher and polishing method | |
US3860399A (en) | Liquid blocking technique for working a member to precise optical tolerances | |
JPS6351824B2 (en) | ||
JPH06155259A (en) | Method of producing board having main flat surface and two parallel main surfaces and device suited for said methods | |
US3830021A (en) | Spherical bearing workpiece holder in an optical lens generating machine | |
JPH06208980A (en) | Polishing apparatus | |
JP2001054862A (en) | Polishing toy and curved surface polishing method using the same | |
JPH08206952A (en) | Curved surface polishing tool | |
JP2002126986A (en) | Lens machining method | |
JPH03208552A (en) | Polishing method | |
JP3630950B2 (en) | Manufacturing method of spherical lens | |
JP2004082324A (en) | Method of polishing optical lens | |
JP7604026B1 (en) | Grinding member for aspheric convex lens and grinding device for aspheric convex lens | |
JPH0314588B2 (en) | ||
JPS63232953A (en) | Polishing tool | |
US3828483A (en) | Optical lens generating machine having spherical bearing workpiece holder | |
JPS63283859A (en) | Wafer polishing jig | |
JP2002144205A (en) | Polishing device and manufacturing method for optical member | |
JPS649141B2 (en) | ||
JPS63109969A (en) | End face forming and polishing method for optical fiber | |
JP2001121391A (en) | Polishing plate combining method | |
JP2004351574A (en) | Precision polishing tool and precision polishing method |