JPS63190798A - Production of diamond-like thin film - Google Patents
Production of diamond-like thin filmInfo
- Publication number
- JPS63190798A JPS63190798A JP2312887A JP2312887A JPS63190798A JP S63190798 A JPS63190798 A JP S63190798A JP 2312887 A JP2312887 A JP 2312887A JP 2312887 A JP2312887 A JP 2312887A JP S63190798 A JPS63190798 A JP S63190798A
- Authority
- JP
- Japan
- Prior art keywords
- diamond
- thin film
- carbon
- hydrocarbon
- cyano group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0057—Reactive sputtering using reactive gases other than O2, H2O, N2, NH3 or CH4
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/0605—Carbon
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、LSI、レーザー等のマイクロエレクトロニ
クス用ヒートシンク、ICW板、ICパッケージング等
きわめて広い分野において利用されるダイヤモンドおよ
びダイヤモンド状炭素膜の合成方法に関する。Detailed Description of the Invention [Field of Industrial Application] The present invention is directed to the synthesis of diamond and diamond-like carbon films that are used in a wide range of fields such as heat sinks for microelectronics such as LSIs and lasers, ICW boards, and IC packaging. Regarding the method.
[従来の技術]
ダイヤモンドは固体で最も硬く、電気抵抗および熱伝導
率が高く、広い範囲にわたり透明であり、広いバンドギ
ャップを有し、ざらに化学的に安定である等の優れた特
性を有している。[Prior art] Diamond has excellent properties such as being the hardest solid, having high electrical resistance and thermal conductivity, being transparent over a wide range, having a wide band gap, and being roughly chemically stable. are doing.
工業材料として優れた特質を有するダイヤモンドはこれ
までメタン等の炭素および水素のみからなる炭化水素と
、水素とを原料として化学蒸着法(CVD法)により薄
膜状のものが合成されている。この技術は、特開昭59
−232991月公報、特開昭60−54995号公報
、特開昭59−63732号公報等にみられる。Diamond, which has excellent properties as an industrial material, has been synthesized in the form of a thin film by chemical vapor deposition (CVD) using hydrocarbons such as methane consisting only of carbon and hydrogen, and hydrogen as raw materials. This technology was developed in Japanese Unexamined Patent Publication No. 59
This can be seen in Japanese Patent Application Laid-Open No. 60-54995, Japanese Patent Application Laid-Open No. 59-63732, etc.
また不活性雰囲気で炭素をターゲットとするスパッタ法
により合成されている。この技術は、特開昭53−10
394号公報、特開昭60−131896号公報等にみ
られる。It is also synthesized by sputtering using carbon as a target in an inert atmosphere. This technology was developed in Japanese Unexamined Patent Publication No. 53-10
This can be seen in JP-A No. 394, JP-A-60-131896, and the like.
[発明が解決しようとする問題点]
しかしながらこれの既存の方法、つまり炭化水素と水素
とを原料とするCVD法、および不活性雰囲気で炭素を
ターゲットとするスパッタリング法ともに合成速度が遅
く、このためダイヤモンド状R9膜は高価なものとなる
ことが問題であり、合成速度の改良が望まれていた。[Problems to be solved by the invention] However, the existing methods for this, namely the CVD method using hydrocarbons and hydrogen as raw materials, and the sputtering method using carbon as a target in an inert atmosphere, both have a slow synthesis rate. The problem is that the diamond-like R9 film is expensive, and it has been desired to improve the synthesis rate.
[問題点を解決するための手段]
本発明は、かかる従来技術の欠点を解消するた、 め
に、下記の構成を有する。[Means for Solving the Problems] In order to solve the drawbacks of the prior art, the present invention has the following configuration.
すなわち、本発明は、基板上にダイヤモンド状炭素薄膜
を製造する方法において、シアノ基を有する炭化水素の
存在下で、炭素をターゲットとしてスパッタリング蒸着
することを特徴とするダイヤモンド状薄膜の製造方法に
関する。That is, the present invention relates to a method for producing a diamond-like carbon thin film on a substrate, which comprises sputtering deposition using carbon as a target in the presence of a hydrocarbon having a cyano group.
本発明におけるダイヤモンド状炭素とは炭素−炭素間の
結合の70%以上がSp3結合であり、かつ炭素および
水素以外の成分が20重量%以下である組成物であり、
結晶性である必要はかならずしもないaさらに本発明に
おけるダイヤモンド状炭素は窒素を20モル%以下の範
囲において含有し1qる。この窒素はダイヤモンドの炭
素を買換した状態、いわゆるドーパントの形で存在して
もよく(この場合N型ダイヤモンドとなる)、また非晶
質部分に存在してもよい。The diamond-like carbon in the present invention is a composition in which 70% or more of carbon-carbon bonds are Sp3 bonds, and components other than carbon and hydrogen are 20% by weight or less,
Further, the diamond-like carbon in the present invention does not necessarily need to be crystalline. Furthermore, the diamond-like carbon in the present invention contains nitrogen in a range of 20 mol% or less. This nitrogen may exist in the form of a so-called dopant, replacing carbon in the diamond (in this case, it becomes an N-type diamond), or it may exist in an amorphous portion.
本発明においで特に好適に利用されるシアノ13を有す
る炭化水素はシアノアセチレン、ジシアノアセチレン、
)7クリロニトリル、メタクリロニトリル、シアン化ビ
ニリデン等である。これ以外のシアン基との三重結合ま
たは二重結合を合む揮発性の化合物も用いることができ
、とくに炭素数6以下の、シアノ基との三重結合および
/または三重結合を含む化合物が利用される。炭素数か
6以上でもスパッタ法において必要とされる揮発性を有
するものであれば使用可能である。ざらに揮発性のアセ
トニトリル、プロピオニトリル等の飽和ニトリルも使用
可能である。これらの化合物は単独で用いてもよく、ま
た2種以上混合して用いてもよい。スパッタは、これら
の炭化水素のほかに通常用いられるアルゴン、水素等の
不活性ガスの存在下で行なわれる。反応系に添加するシ
アノ基を有する炭化水素の濃度は広い幅で選択可能であ
るが、シアノ基を有する炭化水素が、系に存在するガス
状分子の10モル%以下で充分である。Hydrocarbons having cyano-13 that are particularly preferably used in the present invention include cyanoacetylene, dicyanoacetylene,
)7 Acrylonitrile, methacrylonitrile, vinylidene cyanide, etc. Volatile compounds that have a triple bond or double bond with a cyano group other than these can also be used, and in particular, compounds that have 6 or less carbon atoms and have a triple bond and/or a triple bond with a cyano group are used. Ru. Even if the number of carbon atoms is 6 or more, it can be used as long as it has the volatility required in the sputtering method. Roughly volatile saturated nitrites such as acetonitrile and propionitrile can also be used. These compounds may be used alone or in combination of two or more. Sputtering is performed in the presence of a commonly used inert gas such as argon or hydrogen in addition to these hydrocarbons. Although the concentration of the hydrocarbon having a cyano group to be added to the reaction system can be selected within a wide range, it is sufficient that the hydrocarbon having a cyano group accounts for 10 mol% or less of the gaseous molecules present in the system.
スパッタの圧力はスパッタリングの方法により最適値が
変化するので一該には言えないが、通常10−3↑or
rから5〜61orrの範囲で選択される。しかしこの
範囲以外の圧力でも可能である。The optimal value for sputtering pressure varies depending on the sputtering method, so it cannot be said with certainty, but it is usually 10-3↑or
It is selected from r in the range of 5 to 61 orr. However, pressures outside this range are also possible.
スパッタの方法も秤杆選択可能であり、例を挙て説明す
れば、二、三、四極のDCおよびRFスパッタ法、マグ
ネトロンスパッタ法、基板にバイアス電位をか【プる方
法、およびその伯の方法が挙げられる。The sputtering method can also be selected using a scale rod; examples include two-, three-, and four-pole DC and RF sputtering methods, magnetron sputtering methods, methods that apply a bias potential to the substrate, and methods of countermeasures. can be mentioned.
スパッタに際し、通常基板を冷却し常温〜150℃程度
の温度以下に基板を保持することが良好なダイヤモンド
状薄膜を作製する上で好ましい。During sputtering, it is usually preferable to cool the substrate and maintain it at a temperature of about room temperature to about 150° C. in order to produce a good diamond-like thin film.
ダイヤモンド状薄膜の基板としては種々のものが用いら
れ、たとえば、ダイヤ[ンド、[リブデン、タングステ
ン、タンタル、銅、金、シリコン、黒鉛、炭素、ガラス
、ザフフイア、窒化硼素、窒化アルミニウム、サーメッ
ト等多岐にわたる。基板の形態も膜状、繊維状、および
バルク等必要に応じ適宜選択OJ能である。繊維状また
はフィルム状の基板を用いる場合には連続的に繊維また
はフィルムを反応部に供給し、ダイヤモンド状薄膜を作
製することも可能である。これらの基板の表面をダイヤ
上ンドペーストおよびその伯の研磨材で研@することに
よりダイヤモンド核の発生速度を向上できる。A variety of substrates are used for diamond-like thin films, including diamond, livedenum, tungsten, tantalum, copper, gold, silicon, graphite, carbon, glass, saphire, boron nitride, aluminum nitride, and cermet. span. The shape of the substrate can also be selected as required, such as film, fiber, or bulk. When using a fibrous or film-like substrate, it is also possible to produce a diamond-like thin film by continuously supplying the fiber or film to the reaction section. By polishing the surfaces of these substrates with diamond-on-board paste and its similar abrasives, the rate of diamond nucleus generation can be improved.
[実施例]
以下の実施例において更に詳細に説明するが、本発明は
これらに限定されるものではない。[Example] The present invention will be described in more detail in the following examples, but the present invention is not limited thereto.
実施例1
直径3Qcm、高さ3Qcmのステンレス製チャンバー
、真空系、マグネッi〜、13.5MHz、500Wの
rf電源から成るrfマグネトロンスパッタ装置のター
ゲラ1〜ホルダーに2インヂのグラファイトを、水冷し
た基板ホルダーに1インチのシリコンウェハー(001
面、p型)を取りつけた。系を1O−7torrまで減
圧した後、40℃で7クリロニトリルを飽和した水素を
系の圧力が1tOrrとなるように流し、rf大入力1
0W/cm2とし、60分間スパッタした。基板の温度
は100’C以下となるように冷却した。反応後、表面
に生成した薄膜を評価した。試料のラマンスペクトルは
1334cm−1にダイヤモンド特有のラマン線を示し
た。またESCAのスペクトルはSp3炭素の存在を示
した。生成したwJ膜の厚さは1.5μであった。Example 1 Targeter 1 of an RF magnetron sputtering device consisting of a stainless steel chamber with a diameter of 3 Q cm and a height of 3 Q cm, a vacuum system, a magnet I~, a 13.5 MHz, 500 W RF power source, and a water-cooled substrate with 2 inches of graphite in the holder. Place a 1 inch silicon wafer (001) in the holder.
(p-type) was attached. After reducing the pressure in the system to 10-7 torr, hydrogen saturated with 7crylonitrile was flowed at 40°C so that the system pressure became 1 tOrr, and the RF input was increased to 1
Sputtering was performed at 0 W/cm2 for 60 minutes. The temperature of the substrate was cooled to 100'C or less. After the reaction, the thin film formed on the surface was evaluated. The Raman spectrum of the sample showed a Raman line characteristic of diamond at 1334 cm-1. The ESCA spectrum also showed the presence of Sp3 carbon. The thickness of the produced wJ film was 1.5μ.
比較例1
実施例1と同じ方法により、40℃でアクリロニトリル
を飽和した水素の代りに水素のみを用いた以外は、実施
例1と同様の方法でスパッタした。Comparative Example 1 Sputtering was performed in the same manner as in Example 1, except that only hydrogen was used instead of hydrogen saturated with acrylonitrile at 40°C.
反応後、表面に生成したaや膜を評価した。試料のラマ
ンスペクトルは1334Cm−1にダイヤモンド特有の
ラマン線を示した。またESCへのスペクトルはSp3
炭素の存在を示した。生成した薄膜の厚さは0.3μで
あった。After the reaction, the a and film formed on the surface were evaluated. The Raman spectrum of the sample showed a Raman line characteristic of diamond at 1334 Cm-1. Also, the spectrum to ESC is Sp3
It showed the presence of carbon. The thickness of the produced thin film was 0.3μ.
生成した幼豚の厚さから、アクリニトリルの存在により
薄膜の生成速度が顕著に向上することがわかった。The thickness of the young pigs produced showed that the presence of acrinitrile significantly improved the rate of thin film production.
実施例2
実施例1と同じ装置を用い、ターゲットホルダーに2イ
ンチの炭素板を、水冷した基板ボルダ−にダイヤモンド
状薄膜1〜により研磨した1インチのシリ:1ンウエハ
−(001面、p型)を取りつけた。系を1O−7to
rrまで減圧した俊、室温でシアノアセブレンを飽和し
た水素を系の圧力かQ、5torrとなるように流し、
rf大入力20W/Cm2とし、eomr nスパッ’
) L/ タ。基板の温度は150℃以下となるように
冷却した。Example 2 Using the same equipment as in Example 1, a 2-inch carbon plate was used as a target holder, and a 1-inch silicon wafer (001 plane, p-type ) was installed. system to 1O-7to
Shun reduced the pressure to rr, then poured hydrogen saturated with cyanoacerene at room temperature so that the pressure of the system was Q, 5 torr.
RF large input 20W/Cm2, eomr n spa'
) L/ Ta. The temperature of the substrate was cooled to 150° C. or less.
反応後、表面に生成した薄膜を評価した。試料のラマン
スペクトルは1334cm−1にダイヤモンド特有のラ
マン線を示した。またESCAのスペクトルはSp3炭
素の存在を示した。生成した薄膜の厚さは0.8μであ
った。After the reaction, the thin film formed on the surface was evaluated. The Raman spectrum of the sample showed a Raman line characteristic of diamond at 1334 cm-1. The ESCA spectrum also showed the presence of Sp3 carbon. The thickness of the produced thin film was 0.8μ.
比較例2
室温でシアンアセチレンを飽和した水素の代りに水素の
みを用いた以外は、実施例2と同様にスパッタした。反
応後、表面に生成した薄膜を評価した。試料のラマンス
ペクトルは1334Cm’にダイヤモンド特有のラマン
線を示した。またESCAのスペゲトルはSp3炭素の
存在を示した。Comparative Example 2 Sputtering was carried out in the same manner as in Example 2, except that only hydrogen was used instead of hydrogen saturated with cyanacetylene at room temperature. After the reaction, the thin film formed on the surface was evaluated. The Raman spectrum of the sample showed a Raman line characteristic of diamond at 1334 Cm'. The ESCA spegetol also showed the presence of Sp3 carbon.
生成した薄膜の厚さは0.2μでめった。The thickness of the produced thin film was 0.2μ.
生成した8膜の摩ざから、シアンアセチレンの存在によ
り薄膜の生成速度が顕著に向上することがわかった。From the abrasion of the eight films produced, it was found that the presence of cyanacetylene significantly improved the rate of thin film formation.
[発明の効果]
本発明により、従来の方法に比較してより速い速度での
ダイヤモンド状薄膜の製造方法を提供することができる
。[Effects of the Invention] According to the present invention, it is possible to provide a method for producing a diamond-like thin film at a faster rate than conventional methods.
Claims (3)
において、シアノ基を有する炭化水素の存在下で、炭素
をターゲットとしてスパッタリング蒸着することを特徴
とするダイヤモンド状薄膜の製造方法。(1) A method for producing a diamond-like carbon thin film on a substrate, the method comprising sputtering deposition using carbon as a target in the presence of a hydrocarbon having a cyano group.
炭素不飽和結合を含むことを特徴とする特許請求の範囲
第(1)項記載のダイヤモンド状薄膜の製造方法。(2) A hydrocarbon having a cyano group has a cyano group and a carbon-
A method for producing a diamond-like thin film according to claim 1, characterized in that the diamond-like thin film contains carbon unsaturated bonds.
、ジシアノアセチレン、アクリロニトリル、メタクリロ
ニトリルから選ばれる少なくとも1種であることを特徴
とする特許請求の範囲第(1)項記載のダイヤモンド状
薄膜の製造方法。(3) A diamond-like thin film according to claim (1), wherein the hydrocarbon having a cyano group is at least one selected from cyanoacetylene, dicyanoacetylene, acrylonitrile, and methacrylonitrile. Production method.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2312887A JPS63190798A (en) | 1987-02-03 | 1987-02-03 | Production of diamond-like thin film |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2312887A JPS63190798A (en) | 1987-02-03 | 1987-02-03 | Production of diamond-like thin film |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63190798A true JPS63190798A (en) | 1988-08-08 |
Family
ID=12101883
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2312887A Pending JPS63190798A (en) | 1987-02-03 | 1987-02-03 | Production of diamond-like thin film |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63190798A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001068790A3 (en) * | 2000-03-16 | 2001-12-06 | Mat Gmbh | Low-friction protective layers that reduce wear and tear and a method for depositing same |
JP2007297698A (en) * | 2006-04-28 | 2007-11-15 | Tatung Co | Method for manufacturing dlc film |
-
1987
- 1987-02-03 JP JP2312887A patent/JPS63190798A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001068790A3 (en) * | 2000-03-16 | 2001-12-06 | Mat Gmbh | Low-friction protective layers that reduce wear and tear and a method for depositing same |
JP2007297698A (en) * | 2006-04-28 | 2007-11-15 | Tatung Co | Method for manufacturing dlc film |
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