JPS63163182A - Printed board test connection device - Google Patents
Printed board test connection deviceInfo
- Publication number
- JPS63163182A JPS63163182A JP31491986A JP31491986A JPS63163182A JP S63163182 A JPS63163182 A JP S63163182A JP 31491986 A JP31491986 A JP 31491986A JP 31491986 A JP31491986 A JP 31491986A JP S63163182 A JPS63163182 A JP S63163182A
- Authority
- JP
- Japan
- Prior art keywords
- printed
- printed board
- contact
- adapter
- board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims description 18
- 238000010998 test method Methods 0.000 description 13
- 238000003780 insertion Methods 0.000 description 9
- 230000037431 insertion Effects 0.000 description 9
- 239000000523 sample Substances 0.000 description 8
- 238000007747 plating Methods 0.000 description 6
- 238000000605 extraction Methods 0.000 description 3
- 229920001342 Bakelite® Polymers 0.000 description 2
- 239000004677 Nylon Substances 0.000 description 2
- 239000004637 bakelite Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229920001778 nylon Polymers 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
【発明の詳細な説明】
〔概要〕
形状の異なる各種プリント板を保持するガイドレールと
コネクタを有する基板に、各種類に共通した端子群を形
成したバッファ用プリント板を固着したアダプタと、伸
縮する接触子を前記端子群と対向して配設した一対のヘ
ッドを近接するように組み立てた接触部を形成し、試験
されるプリント板を装着したアダプタの端子群に、接触
部の接触子を圧接するプリント板の自動試験方式。[Detailed Description of the Invention] [Summary] An adapter in which a buffer printed board having a group of terminals common to each type is fixed to a board having guide rails and connectors that hold various printed boards of different shapes, and an expandable and retractable board. A contact section is formed by assembling a pair of heads in close proximity to each other, and the contacts of the contact section are pressure-welded to the terminal group of the adapter on which the printed circuit board to be tested is mounted. An automatic test method for printed circuit boards.
本発明は各種電子機器の構成に広く使用されるプリント
板の自動試験方式に関するものである。The present invention relates to an automatic test method for printed circuit boards that are widely used in the construction of various electronic devices.
特に、外形が千差万別で、コネクタの形状が異なる多品
種少量生産のプリント板のファンクションテストにおい
て、自動化が可能な新しいプローブ接触によるプリント
板の自動試験方式が要求されている。In particular, there is a need for a new automatic test method for printed boards using probe contact that can be automated, in the function testing of printed boards that are produced in small quantities in a wide variety of products and have a wide variety of external shapes and different connector shapes.
従来広く使用されているプリント板の自動試験方式は、
第3図に示すようにガイドレール3に形成したガイド溝
を対向させて、プリント板1の幅方向、即ち矢印B−C
方向の両側縁が前記ガイド溝に挿入できるような間隔で
テーブル5の主面に平行に固定し、プリント板1の端子
メッキ部1−1を差し込むことによりコンタクトと接触
して接続するコネクタ2を、前記ガイドレール3の間で
プリント板1の挿入方向、即ち矢印A方向側に上面視コ
字形状で固着して、そのコネクタ2のコンタクトと図示
しない試験機本体とをケーブル7で接続した試験機を使
用している。The automatic test method for printed circuit boards that has been widely used in the past is
As shown in FIG.
A connector 2 is fixed parallel to the main surface of the table 5 at intervals such that both side edges of the direction can be inserted into the guide groove, and is connected by contacting the contacts by inserting the terminal plated portion 1-1 of the printed board 1. , a test in which the printed board 1 is fixed between the guide rails 3 in the insertion direction, that is, in the direction of arrow A, in a U-shape when viewed from above, and the contacts of the connector 2 are connected to the test machine main body (not shown) with a cable 7. using a machine.
そして、突出した端子メッキ部1−1に電気的に接続さ
せて電源と信号用のパターンを形成し、各種電子部品を
実装したプリント板1を、ロボットのハンドリング、又
は専用の挿抜機構によりガイドレール3のガイド溝を矢
印A方向に摺動させてコネクタ2に差し込み、試験機本
体よりケーブル7とコネクタ2を介して給電と信号の入
力を行いプリント板1の出力信号を試験している。Then, the printed circuit board 1, which is electrically connected to the protruding terminal plating part 1-1 to form a power supply and signal pattern, and has various electronic components mounted thereon, is moved to the guide rail by handling by a robot or by a dedicated insertion/extraction mechanism. 3 is slid in the direction of arrow A and inserted into the connector 2, and the output signal of the printed board 1 is tested by supplying power and inputting signals from the testing machine body via the cable 7 and the connector 2.
以上説明の従来のプリント板の自動試験方式で問題とな
るのは、プリント板を挿入するガイドレールは一定の間
隔で平行に固着し、プリント板と接続するコネクタをガ
イドレールに対して上面視コ字形状で固着しているため
に、外形及び端子メッキ部の形状が異なる多品種少量生
産のプリント板の試験において、そのロフト毎に被試験
のプリント板の端子メッキ部に対応する接続ケーブルと
結合したコネクタの取り替えと、ガイドレールの間隔調
整が必要となる点である。The problem with the conventional automatic test method for printed circuit boards described above is that the guide rails into which printed boards are inserted are fixed in parallel at regular intervals, and the connectors that connect to the printed boards are fixed in a top view relative to the guide rails. When testing printed boards that are produced in a wide variety of small quantities and have different external shapes and terminal plating shapes because they are fixed in a shape, each loft is connected to a connecting cable that corresponds to the terminal plating part of the printed board under test. It is necessary to replace the connector and adjust the spacing of the guide rails.
そのため、プリント板挿抜の自動化が困難となり、且つ
取り替え及び調整作業により試験機の稼動率低下の原因
となっている。This makes it difficult to automate the insertion and removal of printed boards, and replacement and adjustment work causes a decrease in the operating rate of the testing machine.
本発明は以上のような状況からプリント板挿抜の自動化
が容易に行えるプローブ接触によるプリント板の自動試
験方式の提供を目的と゛したものである。SUMMARY OF THE INVENTION The present invention aims to provide an automatic test method for printed boards using probe contact, which can easily automate the insertion and removal of printed boards under the above-mentioned circumstances.
上記問題点は第1図に示すように、表裏両面に少なくと
も試験されるプリント板1の最大端子数の端子を形成し
た、各種プリント板1に共通の端子群15−2を有する
基板15−1に、試験される各種プリント板1を挿入で
きるようにガイドレール3を平行に固定し、それぞれの
プリント板1の端子メッキ部1−1に対応するコネクタ
15−3を実装した多種類のアダプタ15と、
絶縁性を有したブロックの前記バッファ用プリント板1
5−2の端子と対応する位置に、コイルバネを内臓して
一方向に伸縮する接触子群16−2を配設してケーブル
17を介して試験機本体8と接続した一対のプローブ式
接触部16とで構成し、試験されるプリント板1のアダ
プタ15を選定して、プリント板1の端子メッキ部1−
1をコネクタ15−3に差し込んで、そのアダプタ15
をロボット又は専用の挿抜機構により対向した接触部1
6に挿入し、その接触部16の間隔を狭めて接触子群1
6−2をアダプタ15の端子群15−2と圧接させて接
続し、試験機本体8よりケーブル17とコネクタ15−
3を介して、給電と信号を入力する本発明のプローブ接
触によるプリント板の自動試験方式により解決される。As shown in FIG. 1, the above-mentioned problem is caused by a board 15-1 having a group of terminals 15-2 common to various printed boards 1, on both the front and back sides of which at least the maximum number of terminals of the printed board 1 to be tested are formed. , guide rails 3 are fixed in parallel so that various printed boards 1 to be tested can be inserted, and various types of adapters 15 are mounted with connectors 15-3 corresponding to the terminal plated portions 1-1 of the respective printed boards 1. and the buffer printed board 1 which is a block having insulation properties.
A pair of probe-type contact parts connected to the testing machine main body 8 via a cable 17, with a contact group 16-2 that has a built-in coil spring and expands and contracts in one direction arranged at a position corresponding to the terminal 5-2. 16, select the adapter 15 of the printed board 1 to be tested, and connect the terminal plating part 1- of the printed board 1.
1 into the connector 15-3, and the adapter 15
The contact part 1 is connected by a robot or a dedicated insertion/extraction mechanism.
6 and narrow the interval between the contact portions 16 to form the contact group 1.
6-2 to the terminal group 15-2 of the adapter 15, and then connect the cable 17 and the connector 15-2 from the testing machine main body 8.
This problem is solved by the automatic test method of the printed circuit board by the probe contact of the present invention, which inputs the power supply and signal through 3.
即ち本発明においては、試験されるプリント板lの最大
端子数の端子を形成した共通の端子群15−2と、各種
プリント板1を挿入できるガイドレール3とコネクタ1
5−3を実装したアダプタ15を多数枚準備することに
より、多品種少量生産で外形。That is, in the present invention, there is a common terminal group 15-2 forming the maximum number of terminals of the printed board 1 to be tested, a guide rail 3 into which various printed boards 1 can be inserted, and a connector 1.
By preparing a large number of adapters 15 mounted with 5-3, the outer shape can be achieved in high-mix, low-volume production.
及び端子メッキ部1−1の異なる各種プリント板1をそ
れぞれのアダプタ15で保持することができ、そのため
、コネクタ15−3の取り替えとガイドレールの間隔調
整が不必要となると共に、アダプタ15が一定の大きさ
を有するので対向した接触子群16−2の間に挿抜が容
易となって自動化が可能となる。Various types of printed circuit boards 1 having different terminal plated portions 1-1 can be held by the respective adapters 15. Therefore, there is no need to replace the connectors 15-3 or adjust the spacing between the guide rails, and the adapters 15 can be held at a constant level. Since it has a size of 16-2, it is easy to insert and remove the contacts between the opposed contact groups 16-2, and automation becomes possible.
又、端子メッキ部Llとコネクタ15−3の接触不良が
発生した場合は予備のアダプタ15と交換し、接触子群
16−2と端子群15−2の間に接触不良え生じた場合
には、接触子群16−2の当該接触ピンのみを取り替え
ることにより容易に保守できるので試験機の稼動率向上
が可能となる。In addition, if a poor contact occurs between the terminal plated portion Ll and the connector 15-3, replace it with a spare adapter 15, and if a poor contact occurs between the contact group 16-2 and the terminal group 15-2, replace it with a spare adapter 15. Since maintenance can be easily performed by replacing only the contact pin of the contact group 16-2, the operating rate of the testing machine can be improved.
以下図面に示した実施例に基づいて本発明の詳細な説明
する。The present invention will be described in detail below based on embodiments shown in the drawings.
第2図は本実施例によるプローブ接触によるプリント板
の自動試験方式を斜視図で示し、図中において、第3図
と同一部材には同一記号が付しであるが、その他の15
は外形、及びコネクタの形状が異なる多品種のプリント
板を保持するアダプタ。FIG. 2 is a perspective view showing the automatic test method for printed circuit boards using probe contact according to this embodiment. In the figure, the same members as in FIG.
is an adapter that holds various types of printed boards with different external shapes and connector shapes.
16はアダプタの端子群と試験機本体とを接続するプロ
ーブ式の接触部、17は試験機本体とプローブ接触部を
接続するケーブルである。Reference numeral 16 denotes a probe type contact portion that connects the terminal group of the adapter and the tester body, and 17 a cable that connects the tester body and the probe contact portion.
アダプタ15は、矩形形状で一定の大きさを有する平板
3例えばアルミニュウム合金板のプリント板1の挿入方
向、即ち矢印A方向側に、端子群。The adapter 15 has a terminal group in the insertion direction of the printed board 1, which is a flat plate 3 having a rectangular shape and a certain size, such as an aluminum alloy plate, that is, in the direction of arrow A.
即ちバッファ用プリント板15−2が固着できる太きさ
の切り欠き15−1aを形成した基板15−1と、その
切り欠き15−1aを冠着できる大きさで、表裏両面に
試験されるプリント板1の最大端子数以上のランド15
−2aと、そのランド15−2aよりコネクタ2のリー
ド挿入孔まで配線パターンを形成したバラ ′フ
ァ用プリント板15−2を製作して、前記基板15−1
に形成した切り欠き15−1a部にバッファ用プリント
板15−2を固定する。That is, a substrate 15-1 with a notch 15-1a large enough to securely attach the buffer printed board 15-2, and a printed circuit board 15-1 large enough to attach the notch 15-1a to be tested on both the front and back surfaces. Land 15 that exceeds the maximum number of terminals on board 1
-2a, and a printed circuit board 15-2 for wiring on which a wiring pattern is formed from the land 15-2a to the lead insertion hole of the connector 2 is manufactured.
A buffer printed board 15-2 is fixed to the notch 15-1a formed in the cutout 15-1a.
そして、外形が異なるプリント板1の幅寸法で分別して
その分別単位でそれぞれのプリント板1が挿入できるよ
うに、プリント板1の挿入側にガイドレール3を対向さ
せて基板15−1に固着し、更に、上記分別単位のもの
に対してプリント板1の端子メッキ部LLに対応するコ
ネクタ15−3で分別して、そのコネクタ15−3をバ
ッファ用プリント板15−2に実装して各種のプリント
板1が保持できるように組み立てたものである。Then, the guide rail 3 is fixed to the board 15-1 with the guide rail 3 facing the insertion side of the printed board 1 so that the printed boards 1 having different external shapes can be sorted by width dimension and each printed board 1 can be inserted in the sorted unit. Furthermore, the above-mentioned sorting units are separated by the connector 15-3 corresponding to the terminal plating part LL of the printed board 1, and the connector 15-3 is mounted on the buffer printed board 15-2 to print various types of prints. It is assembled so that the plate 1 can be held.
接触部16は、絶縁材料1例えばベークライトナイロン
等の合成樹脂ブロックを一対成形し、それぞれのブロッ
クに前記バッファ用プリント板15−2の表面と裏面の
形成したランド15−2aと対応する位置に、コイルバ
ネを内臓して一方向に伸縮する接触子群、即ち接触ピン
16−2を植設したものである。そして、一対の接触部
16に植設した各接触子16−2と試験機本体8をケー
ブル17で接続し、前記接触ピン16−2を対向させて
それぞれ上下方向。The contact portion 16 is formed by molding a pair of insulating material 1, for example, synthetic resin blocks such as Bakelite nylon, and each block is provided with a pair of insulating material 1, for example, a pair of synthetic resin blocks such as Bakelite nylon, at positions corresponding to the lands 15-2a formed on the front and back surfaces of the buffer printed board 15-2. A group of contacts, ie, contact pins 16-2, which have a built-in coil spring and expand and contract in one direction are implanted. Then, each contactor 16-2 implanted in the pair of contact portions 16 and the testing machine main body 8 are connected by a cable 17, and the contact pins 16-2 are made to face each other in the vertical direction.
即ち矢印B−C方向に移動できるように組み立てている
。That is, it is assembled so that it can move in the direction of arrow B-C.
上記部材を使用してプリント板の自動試験方式は、分別
したアダプタ15を選択して各種電子部品を実装したプ
リント板lの端子メッキ部1−1をコネクタ15−3に
差し込んで保持する。そのアダプタ15をロボットのハ
ンドリング、又は専用の挿抜機構により対向した接触部
16の間に挿入して間隔を狭めるように移動し、バッフ
ァ用プリント板15−2の表裏に形成したランド15−
2aにそれぞれの接触ピン16−2の先端を圧接するこ
とにより、試験機本体8とプリント板1が接続されて自
動試験が可能となる。In an automatic test method for printed circuit boards using the above-mentioned members, a separated adapter 15 is selected, and the terminal plated portion 1-1 of the printed board l mounted with various electronic components is inserted into the connector 15-3 and held. The adapter 15 is inserted between the opposing contact portions 16 by robot handling or a dedicated insertion/extraction mechanism, and moved to narrow the gap between the lands 15- formed on the front and back sides of the buffer printed board 15-2.
By press-contacting the tips of the respective contact pins 16-2 to 2a, the tester main body 8 and the printed circuit board 1 are connected, and automatic testing becomes possible.
尚、プリント板コネクタを実装したプリント板1に対し
ては、前記プリント板コネクタと結合できるコネクタを
バッファ用プリント板15−2に実装することにより、
上記自動試験方式に対処することができる。In addition, for the printed board 1 on which the printed board connector is mounted, by mounting a connector that can be coupled with the printed board connector on the buffer printed board 15-2,
It can cope with the above automatic test method.
以上説明したように本発明によれば極めて簡単な構成と
試験方式で、多品種少量生産を行うプリント板のファン
クションテストの自動化が可能となり、且つその接触部
の保守が簡単となる等の利点があり、著しい経済的効果
が期待でき工業的には極めて有用なものである。As explained above, according to the present invention, it is possible to automate the function test of printed circuit boards for high-mix, low-volume production with an extremely simple configuration and testing method, and there are advantages such as easy maintenance of the contact parts. Therefore, it is expected to have a significant economic effect and is extremely useful industrially.
第1図は本発明の一実施例によるプローブ接触によるプ
リント板の自動試験方式の原理図、第2図りよ本実施例
によるプローブ接触によるプリント板の自動試験方式を
示す斜視図、第3図は従来のプリント板の自動試験方式
を示す斜視図である。
図において、
1はプリント板、
■−1は端子メッキ部、
3はガイドレール、
8は試験機本体、
15はアダプタ、
15−1は基板、
15−1aは切り欠き、
15−2はバッファ用プリント板、
15−2a はランド、
15−3はコネクタ、
16は接触部、
16−2は接触子、
17はケーブル、
を示す。FIG. 1 is a principle diagram of an automatic test method for printed boards using probe contact according to an embodiment of the present invention, FIG. 2 is a perspective view showing the automatic test method for printed boards using probe contact according to this embodiment, and FIG. FIG. 2 is a perspective view showing a conventional automatic test method for printed circuit boards. In the figure, 1 is a printed board, -1 is a terminal plating part, 3 is a guide rail, 8 is a testing machine body, 15 is an adapter, 15-1 is a board, 15-1a is a notch, 15-2 is for a buffer 15-2a is a printed board, 15-2a is a land, 15-3 is a connector, 16 is a contact portion, 16-2 is a contact, and 17 is a cable.
Claims (1)
対応したガイドレール(3)、及びコネクタ(15−3
)と、各種類に共通した端子群(15−2)とを有する
アダプタ(15)と、 上記アダプタ(15)の該端子群(15−2)に対応し
た接触子群(16−2)を有し、試験機本体(8)と接
続された接触部(16)とを具備し、 試験される上記プリント板(1)の種類に応じて上記ア
ダプタ(15)を選択し、該アダプタ(15)を該プリ
ント板(1)と上記接触部(16)との間に介在させて
試験を行うことを特徴とするプローブ接触によるプリン
ト板の自動試験方式。[Claims] A guide rail (3) and a connector (15-3) corresponding to each of a plurality of types of printed boards (1) with different shapes.
), an adapter (15) having a terminal group (15-2) common to each type, and a contact group (16-2) corresponding to the terminal group (15-2) of the adapter (15). and a contact part (16) connected to the testing machine main body (8), the adapter (15) is selected according to the type of the printed board (1) to be tested, and the adapter (15) is ) is interposed between the printed board (1) and the contact portion (16) to perform the test.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61314919A JPH0690263B2 (en) | 1986-12-24 | 1986-12-24 | Printed board test connection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61314919A JPH0690263B2 (en) | 1986-12-24 | 1986-12-24 | Printed board test connection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63163182A true JPS63163182A (en) | 1988-07-06 |
JPH0690263B2 JPH0690263B2 (en) | 1994-11-14 |
Family
ID=18059224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61314919A Expired - Fee Related JPH0690263B2 (en) | 1986-12-24 | 1986-12-24 | Printed board test connection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0690263B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013527438A (en) * | 2010-04-15 | 2013-06-27 | エルジー・ケム・リミテッド | Test system and method for battery cell test |
JP2020118608A (en) * | 2019-01-25 | 2020-08-06 | 株式会社村田製作所 | measuring device |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4938956U (en) * | 1972-07-07 | 1974-04-05 | ||
JPS4991376U (en) * | 1972-11-27 | 1974-08-07 |
-
1986
- 1986-12-24 JP JP61314919A patent/JPH0690263B2/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4938956U (en) * | 1972-07-07 | 1974-04-05 | ||
JPS4991376U (en) * | 1972-11-27 | 1974-08-07 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013527438A (en) * | 2010-04-15 | 2013-06-27 | エルジー・ケム・リミテッド | Test system and method for battery cell test |
JP2020118608A (en) * | 2019-01-25 | 2020-08-06 | 株式会社村田製作所 | measuring device |
Also Published As
Publication number | Publication date |
---|---|
JPH0690263B2 (en) | 1994-11-14 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CA1274887A (en) | Daughter board/backplane assembly | |
US4535536A (en) | Method of assembling adaptor for automatic testing equipment | |
US5994894A (en) | Testboard for IC tester | |
US5558540A (en) | Multi-connector assembly | |
US4939454A (en) | Connector system for printed circuit board test facility | |
US4870356A (en) | Multi-component test fixture | |
EP0278869A2 (en) | Circuit board contact guide pattern | |
US4503608A (en) | Card edge connector tool and a method of joining a card edge connector | |
JP2575643B2 (en) | Electronic device surface mounting device | |
JPS63163182A (en) | Printed board test connection device | |
JP2003149296A (en) | Inspection jig for printed circuit board | |
JPS62226591A (en) | Assembly tool for printed circuit card and contactor | |
JP3307166B2 (en) | Circuit board inspection equipment | |
JP3094779B2 (en) | Circuit board inspection apparatus and inspection method | |
US7459921B2 (en) | Method and apparatus for a paddle board probe card | |
EP0352929B1 (en) | Connector system for printed circuit board test facility | |
JP3128442B2 (en) | Burn-in test board | |
JPH0448539Y2 (en) | ||
JP3025324U (en) | Connector mounting jig | |
JPH0121507Y2 (en) | ||
JPS6340391A (en) | Surface mount printed circuit board | |
JPH0730486U (en) | Printed circuit board terminal and IC socket | |
JPS61278768A (en) | Interface of printed circuit board inspecting device | |
JP2007281101A (en) | Printed wiring structure of control board | |
JPS612336A (en) | Connector |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |