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JPS6314307B2 - - Google Patents

Info

Publication number
JPS6314307B2
JPS6314307B2 JP54129211A JP12921179A JPS6314307B2 JP S6314307 B2 JPS6314307 B2 JP S6314307B2 JP 54129211 A JP54129211 A JP 54129211A JP 12921179 A JP12921179 A JP 12921179A JP S6314307 B2 JPS6314307 B2 JP S6314307B2
Authority
JP
Japan
Prior art keywords
circuit board
printed circuit
inspected
elastic body
conductive elastic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54129211A
Other languages
Japanese (ja)
Other versions
JPS5654096A (en
Inventor
Mikio Takashima
Masanao Shimada
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP12921179A priority Critical patent/JPS5654096A/en
Publication of JPS5654096A publication Critical patent/JPS5654096A/en
Publication of JPS6314307B2 publication Critical patent/JPS6314307B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)

Description

【発明の詳細な説明】 本発明はプリント基板のパターン、特に高密度
プリントパターン検査装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a printed circuit board pattern, and more particularly to a high-density printed pattern inspection apparatus.

従来、この種の検査装置ではプリント基板のス
ルーホール基本格子、例えば2.54mmピツチにスプ
リングプローブを配置しプリント基板のスルーホ
ールとスプリングプローブの電気的接触を得るこ
とによりプリントパターンの導通、絶縁の検査を
行なつていたが、最近の電子部品の小形化に伴い
プリントパターンが高密度化され、スルーホール
基本格子も従来に比し1/2あるいは1/4になりスプ
リングプローブをスルーホール基本格子に配置す
ることが困難になつてきている。
Conventionally, this type of inspection equipment inspects the continuity and insulation of a printed pattern by placing spring probes on the basic grid of through holes on a printed circuit board, such as 2.54 mm pitch, and establishing electrical contact between the through holes on the printed circuit board and the spring probes. However, with the recent miniaturization of electronic components, printed patterns have become denser, and the basic through-hole grid has become 1/2 or 1/4 of that of the past, making it possible to replace spring probes with through-hole basic grids. It is becoming difficult to place them.

本発明の目的はこのような欠点を除去し得るプ
リント基板検査装置を提供することにある。
An object of the present invention is to provide a printed circuit board inspection device that can eliminate such drawbacks.

すなわち本発明によれば、被検査プリント基板
の回路形成面に表面が電気的に接触する厚み方向
にのみ導電性をもつ導電弾性体と、この導電弾性
体の裏面に表面が接触して被検査プリント基板の
スルーホールと電気的に接触しかつ裏面では被検
査プリント基板のすべてのスルーホール位置が基
本格子上に配置されるように位置を変換する位置
変換体と、被検査プリント基板の回路形成面と
略々等しい領域の基本格子すベてに対応して植え
られた多数本のスプリングプローブと、このスプ
リングプローブを互に電気的に絶縁し固定する絶
縁材料からなる平板と、被検査プリント基板と前
記導電弾性体と前記位置変換体の順に積層密着さ
せかつ前記位置変換体下面のスルーホールを前記
スプリングプローブに接触させる加圧機構と、前
記スプリングプローブの一端と電気的に接続され
被検査プリンド基板のプリントパターンを良否判
定する自動回路検査部とから構成されることを特
徴とするプリント基板検査装置が得られる。
That is, according to the present invention, there is a conductive elastic body having conductivity only in the thickness direction whose surface is electrically in contact with the circuit forming surface of the printed circuit board to be inspected, and a conductive elastic body whose surface is in contact with the back surface of the conductive elastic body to be inspected. A position converter that electrically contacts the through holes of the printed circuit board and converts the positions of all the through holes of the printed circuit board to be inspected on the basic grid on the back side, and a circuit formation of the printed circuit board to be inspected. A large number of spring probes planted corresponding to all the basic grids in an area approximately equal to the surface, a flat plate made of an insulating material that electrically insulates and fixes the spring probes from each other, and a printed circuit board to be inspected. a pressurizing mechanism for laminating the conductive elastic body and the position converting body in this order and bringing a through hole in the lower surface of the position converting body into contact with the spring probe; and a pressurizing mechanism electrically connected to one end of the spring probe to be inspected. There is obtained a printed circuit board inspection apparatus characterized in that it is comprised of an automatic circuit inspection section that determines whether the printed pattern of the circuit board is acceptable or not.

次に本発明の詳細について図面を参照して説明
する。第1図は本発明の一実施例の構造を示す斜
視図で、1は被検査プリント基板、2は導電弾性
体、3は位置変換体でそれぞれ所定の位置に位置
決め穴4を有し、順次プリント基板ホルダ5の位
置決めピン6により積層位置決めされる。プリン
ト基板ホルダ5は複数本のスプリングガイド7に
よりベース8上に支持され上下方向に摺動できる
構造になつている。9は絶縁材料からなる平板
で、平板上には2.54mmピツチの基本格子上にスプ
リングプローブ10が挿入固定されており、スプ
リングプローブ10の一端はプリントパターンの
良否判定をする自動回路検査部11と電気的に接
続されている。
Next, details of the present invention will be explained with reference to the drawings. FIG. 1 is a perspective view showing the structure of an embodiment of the present invention, in which 1 is a printed circuit board to be inspected, 2 is a conductive elastic body, and 3 is a position converting body, each having a positioning hole 4 at a predetermined position. The stacking position is determined by the positioning pin 6 of the printed circuit board holder 5. The printed circuit board holder 5 is supported on a base 8 by a plurality of spring guides 7, and is structured to be able to slide vertically. Reference numeral 9 denotes a flat plate made of an insulating material, and a spring probe 10 is inserted and fixed onto the flat plate on a basic grid with a pitch of 2.54 mm, and one end of the spring probe 10 is connected to an automatic circuit testing section 11 for determining the quality of the printed pattern. electrically connected.

12は加圧機構で第2図のように積層された被
検査プリント基板1と導電弾性体2と位置変換体
3をプリント基板ホルダ5に固定し、さらにプリ
ント基板ホルダ5を加圧下降させて位置変換体3
の裏面に形成されたスルーホール13をスプリン
グプローブ10に接触させるものである。次に位
置変換体3の機能について説明する。第2図にお
いて被検査プリント基板1のスルーホール14は
0.635mmまたは1.27mmの基本格子上に配置されて
おり、平板9上のスプリングプローブ10の基本
格子2.54mmの1/4または1/2の高密度パターンであ
る。位置変換体3の導電弾性体2と接触する面に
は被検査プリント基板1のスルーホール位置に対
応してスルーホールまたはランド15を形成し、
スプリングプローブ10と接触する面には2.54mm
基本格子上にスルーホール13を形成し、前記ラ
ンド15との間をプリントパターン16で結合し
た構造になつている。一般に400mm角のプリント
基板上には4000から5000個のスルーホールが形成
されており、前記位置変換体はプリント基板製造
法のうちの内層パターン構造技術によれば容易に
製造できることはいうまでもない。このような位
置変換体と厚み方向にのみ導電性を有する導電弾
性体を組合せて用いれば2.54mm基本格子の1/4ま
たは1/2等の格子上のスルーホールとスプリング
プローブを電気的に接続することが可能となり、
高密度プリント基板のプリントパターンの良否を
従来のスプリングプローブにより検査できる。
Reference numeral 12 denotes a pressure mechanism that fixes the printed circuit board 1 to be inspected, the conductive elastic body 2, and the position changing body 3 stacked as shown in FIG. Position converter 3
A through hole 13 formed on the back surface of the spring probe 10 is brought into contact with the spring probe 10. Next, the function of the position converter 3 will be explained. In FIG. 2, the through hole 14 of the printed circuit board 1 to be inspected is
It is arranged on a basic grid of 0.635 mm or 1.27 mm, and is a high-density pattern of 1/4 or 1/2 of the basic grid of 2.54 mm of the spring probe 10 on the flat plate 9. Through-holes or lands 15 are formed on the surface of the position converting body 3 that contacts the conductive elastic body 2 in correspondence with the through-hole positions of the printed circuit board 1 to be inspected,
2.54mm on the surface that contacts the spring probe 10
It has a structure in which through holes 13 are formed on the basic lattice and are connected to the lands 15 by printed patterns 16. Generally, 4,000 to 5,000 through holes are formed on a 400 mm square printed circuit board, and it goes without saying that the position converter can be easily manufactured using the inner layer pattern structure technology of the printed circuit board manufacturing method. . If such a position converter is used in combination with a conductive elastic body that is conductive only in the thickness direction, the spring probe can be electrically connected to the through hole on the 1/4 or 1/2 grid of the 2.54 mm basic grid. It becomes possible to
The quality of printed patterns on high-density printed circuit boards can be inspected using conventional spring probes.

以上説明したように本発明によれば、従来のス
プリングプローブを用いてスルーホールが1.27mm
または0.635mm等の基本格子上に配置された高密
度プリント基板のプリントパターン検査を行なう
ことができ、かつプリントパターンの違うプリン
ト基板については位置変換体を新たに用意するだ
けで検査でき、非常に汎用性がある等種々の効果
がある。
As explained above, according to the present invention, a through hole of 1.27 mm can be formed using a conventional spring probe.
Alternatively, it is possible to inspect the printed patterns of high-density printed circuit boards arranged on a basic grid such as 0.635 mm, and to inspect printed circuit boards with different printed patterns by simply preparing a new position converter. It has various effects such as versatility.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す斜視図、第2
図はその一部を拡大した断面図である。図におい
て、1は被検査プリント基板、2は導電弾性体、
3は位置変換体、4は位置決め穴、5はプリント
基板ホルダ、6は位置決めピン、7はスプリング
ガイド、8はベース、9は平板、10はスプリン
グプローブ、11は自動回路検査部、12は加圧
機構、13は位置変換体裏面スルーホール、14
は被検査プリント基板スルーホール、15は位置
変換体表面ランド、16はプリントパターンであ
る。
Fig. 1 is a perspective view showing one embodiment of the present invention;
The figure is a partially enlarged sectional view. In the figure, 1 is a printed circuit board to be inspected, 2 is a conductive elastic body,
3 is a position converter, 4 is a positioning hole, 5 is a printed circuit board holder, 6 is a positioning pin, 7 is a spring guide, 8 is a base, 9 is a flat plate, 10 is a spring probe, 11 is an automatic circuit inspection unit, and 12 is a processing unit. Pressure mechanism, 13 is a through hole on the back side of the position converter, 14
15 is a through hole of the printed circuit board to be inspected, 15 is a land on the surface of the position converter, and 16 is a printed pattern.

Claims (1)

【特許請求の範囲】[Claims] 1 被検査プリント基板の回路形成面に表面が電
気的に接触する厚み方向にのみ導電性をもつ導電
弾性体と、この導電弾性体の裏面に表面が接触し
て被検査プリント基板のスルーホールと電気的に
接触しかつ裏面では被検査プリント基板のすべて
のスルーホール位置が基本格子上に配置されるよ
うに位置を変換する位置変換体と、被検査プリン
ト基板の回路形成面と略々等しい領域の基本格子
すべてに対応して植えられた多数本のスプリング
プローブと、このスプリングプローブを互に電気
的に絶縁し固定する絶縁材料からなる平板と、被
検査プリント基板と前記導電弾性体と前記位置交
換体の順に積層密着させかつ前記位置変換体下面
のスルーホールを前記スプリングプローブに接触
させる加圧機構と、前記スプリングプローブの一
端と電気的に接続され被検査プリント基板のプリ
ントパターンを良否判定する自動回路検査部とか
ら構成されることを特徴とするプリント基板検査
装置。
1. A conductive elastic body whose surface is electrically conductive only in the thickness direction and whose surface electrically contacts the circuit formation surface of the printed circuit board to be inspected, and a through-hole of the printed circuit board whose surface is in contact with the back surface of this conductive elastic body. A position converter that electrically contacts and converts the positions of all through holes of the printed circuit board to be inspected on the basic grid on the back surface, and an area approximately equal to the circuit formation surface of the printed circuit board to be inspected. a large number of spring probes planted corresponding to all the basic grids; a flat plate made of an insulating material that electrically insulates and fixes the spring probes from each other; a printed circuit board to be inspected; the conductive elastic body; a pressurizing mechanism that brings the exchangers into close contact with each other in order and brings a through hole on the lower surface of the position converter into contact with the spring probe; and a pressurizing mechanism that is electrically connected to one end of the spring probe and determines the quality of the printed pattern of the printed circuit board to be inspected. A printed circuit board inspection device comprising an automatic circuit inspection section.
JP12921179A 1979-10-05 1979-10-05 Device for inspecting printed board Granted JPS5654096A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12921179A JPS5654096A (en) 1979-10-05 1979-10-05 Device for inspecting printed board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12921179A JPS5654096A (en) 1979-10-05 1979-10-05 Device for inspecting printed board

Publications (2)

Publication Number Publication Date
JPS5654096A JPS5654096A (en) 1981-05-13
JPS6314307B2 true JPS6314307B2 (en) 1988-03-30

Family

ID=15003873

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12921179A Granted JPS5654096A (en) 1979-10-05 1979-10-05 Device for inspecting printed board

Country Status (1)

Country Link
JP (1) JPS5654096A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1151998A (en) * 1997-08-04 1999-02-26 Matsushita Electric Ind Co Ltd Inspection device for printed wiring board

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57132392A (en) * 1981-02-09 1982-08-16 Mitsubishi Electric Corp Method of inspecting printed circuit board
FR2557701B1 (en) * 1983-12-28 1986-04-11 Crouzet Sa CONTINUITY CHECK DEVICE FOR PRINTED CIRCUITS
JPS61154137A (en) * 1984-12-27 1986-07-12 Seiichiro Sogo Test probe assembly
JPS62294980A (en) * 1986-06-13 1987-12-22 Kaneko Denki Seisakusho:Kk Adaptor for altering pitch of contact array
JPS62294979A (en) * 1986-06-13 1987-12-22 Kaneko Denki Seisakusho:Kk Adaptor for alternating pitch of contact array

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1151998A (en) * 1997-08-04 1999-02-26 Matsushita Electric Ind Co Ltd Inspection device for printed wiring board

Also Published As

Publication number Publication date
JPS5654096A (en) 1981-05-13

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