JPS63138740A - Formation of pattern - Google Patents
Formation of patternInfo
- Publication number
- JPS63138740A JPS63138740A JP28429886A JP28429886A JPS63138740A JP S63138740 A JPS63138740 A JP S63138740A JP 28429886 A JP28429886 A JP 28429886A JP 28429886 A JP28429886 A JP 28429886A JP S63138740 A JPS63138740 A JP S63138740A
- Authority
- JP
- Japan
- Prior art keywords
- pattern
- substrate
- plasma
- electrode
- electrodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- Polymerisation Methods In General (AREA)
- Other Resins Obtained By Reactions Not Involving Carbon-To-Carbon Unsaturated Bonds (AREA)
- Manufacturing Optical Record Carriers (AREA)
- Formation Of Insulating Films (AREA)
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明はパターン形成方法に関し、特にプラズマ重合法
による成膜方法を利用したパターン形成方法に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a pattern forming method, and particularly to a pattern forming method using a film forming method by plasma polymerization.
[従来の技術]
従来、パターン形成方法としては、通常レジストによる
パターン形成方法が用いられている。[Prior Art] Conventionally, as a pattern forming method, a pattern forming method using a resist is usually used.
現在、レジストを用いたパターン形成方法は、例えば、
次のような方法により行なわれている。Currently, pattern forming methods using resists include, for example,
This is done by the following method.
(1)基板にレジストをコーティングする。(1) Coat the substrate with resist.
(2)基板上のレジスト膜に加工用原画を、光、電子ビ
ーム、X線、イオンビームで転写する。(2) The original image for processing is transferred onto the resist film on the substrate using light, electron beam, X-ray, or ion beam.
(3)形成された潜像を酸素プラズマによって現像する
。(3) Develop the formed latent image with oxygen plasma.
(4)レジストに開けられた窓を通して、基板をハロゲ
ンガスのプラズマによって浸食加工する。(4) The substrate is eroded by halogen gas plasma through a window opened in the resist.
(5)残存するレジストを酸素プラズマで灰化除去する
。(5) The remaining resist is removed by ashing with oxygen plasma.
上記の工程を経て、パターンが基板表面に転写される。Through the above steps, the pattern is transferred onto the substrate surface.
また、上記の方法による加工寸法および加工速度はレジ
ストの性能によって決定される。Furthermore, the processing dimensions and processing speed by the above method are determined by the performance of the resist.
一般にレジスト膜には、ポジ型とネガ型とがあり、ネガ
型は密着性は良好であるか解像度が余り良くないので、
電−子線など放射線露光には密着性は充分ではないか解
像度の良いポジ型が主とじて使用されている。Generally, there are two types of resist films: positive and negative.The negative type has good adhesion or poor resolution.
For exposure to radiation such as electron beams, the adhesion is not sufficient, and positive types with good resolution are mainly used.
しかしながら、ポジ型レジストの場合でも膜厚な1μ諺
以上に厚く塗布すると、解像度は低下し。However, even in the case of a positive resist, if it is applied thicker than 1 μm, the resolution will decrease.
また膜厚が薄いとレジスト膜にピンホールが発生してそ
の膜厚の制御が難しい、しかも上記の様に密着性が不充
分なので、湿式エツチングにおいてはエツチング液のし
み込みが大きく、アンダーカットが激しいので、高精度
の微細パターンの形成が難しい欠点があった。In addition, if the resist film is thin, pinholes will occur in the resist film, making it difficult to control the film thickness.Furthermore, as mentioned above, the adhesion is insufficient, so in wet etching, the etching solution will seep into the resist film, resulting in undercuts. This has the disadvantage that it is difficult to form fine patterns with high precision because of the intensity of the process.
この様にレジストを用いるパターン形成方法は、その加
工工程数が多く、また複雑である為に加工速度が遅く、
さらに加工寸法の制御性と信頼性とに問題があった。The pattern forming method using resist has a large number of processing steps and is complicated, so the processing speed is slow.
Furthermore, there were problems in controllability and reliability of processing dimensions.
[発明が解決しようとする問題点]
本発明の目的は、上述の如き欠点を解決し、加工工程が
簡単で、加工寸法の制御が容易に行なわれ、加工精度の
高いプラズマ重合法によるパターン形成方法を提供する
ものである。[Problems to be Solved by the Invention] The purpose of the present invention is to solve the above-mentioned drawbacks, and to form a pattern by plasma polymerization that has a simple processing process, easy control of processing dimensions, and high processing precision. The present invention provides a method.
[問題点を解決するための手段]
すなわち1本発明は真空系内において、平行電極と、表
面に微細な凹凸を設けてパターンを形成したパターン電
極とを対向して設け、前記平行電極に基板を装着し、電
極間に電圧を印加して不均質な電場中でプラズマ重合を
行ない、基板上にパターン形状を有するプラズマ重合膜
を形成することを特徴とするパターン形成方法である。[Means for Solving the Problems] In other words, one aspect of the present invention is to provide parallel electrodes and patterned electrodes whose surfaces are patterned with fine irregularities in a vacuum system, and to attach a substrate to the parallel electrodes. This is a pattern forming method characterized by forming a plasma polymerized film having a pattern shape on a substrate by applying a voltage between the electrodes and performing plasma polymerization in a non-uniform electric field.
以下、本発明を図面に基づいて説明する。Hereinafter, the present invention will be explained based on the drawings.
第1図は本発明のパターン形成方法に用いるプラズマ重
合装置の一例を示す説明図である。同第1図において、
本発明のパターン形成方法は、まず基板lを上部の平行
電極3のアノード側に装着し、プラズマ重合を行なう反
応槽2内をI X 10−’Torrまで排気する。FIG. 1 is an explanatory diagram showing an example of a plasma polymerization apparatus used in the pattern forming method of the present invention. In the same Figure 1,
In the pattern forming method of the present invention, first, the substrate 1 is mounted on the anode side of the upper parallel electrode 3, and the inside of the reaction tank 2 in which plasma polymerization is to be performed is evacuated to I.times.10-'Torr.
基板1の膜形成側の平行電極3に対向するカソード側の
パターン電極4の表面形状は、基板上に形成されるプラ
ズマ重合H8のパターン形状に合わせて凹凸9を形成し
ておく。The surface shape of the pattern electrode 4 on the cathode side opposite to the parallel electrode 3 on the film formation side of the substrate 1 is formed with unevenness 9 in accordance with the pattern shape of the plasma polymerization H8 formed on the substrate.
次に、モノマーガスを反応槽2内にモノマーガ 。Next, the monomer gas is introduced into the reaction tank 2.
ス取り入れ口5より1種もしくは2種以上導入し、平衡
に保つ0次に、電極3.4間に13.56MHzの高周
波電源6を用い、不均質プラズマを発生し、基板lの表
面上にパターン形状のプラズマ重合膜8を形成する。One or more types of plasma are introduced through the intake port 5 and kept in equilibrium. Next, a 13.56 MHz high frequency power source 6 is used between the electrodes 3 and 4 to generate a heterogeneous plasma, which is then deposited on the surface of the substrate l. A patterned plasma polymerized film 8 is formed.
本発明において用いられる基板lは、その形状、寸法、
材質は問わないが、好ましくは厚さ5■以下の平板で、
表面が平滑なものが好ましく。The substrate l used in the present invention has its shape, size,
The material does not matter, but preferably a flat plate with a thickness of 5 cm or less,
Preferably, the surface is smooth.
材質としては耐プラズマ性が良好なガラス質、金属質、
プラスチック等が好ましい。Materials include glass, metal, and other materials with good plasma resistance.
Plastic etc. are preferable.
8は本発明によるパターン形状を有する基板l上に形成
されたプラズマ重合膜である。8 is a plasma polymerized film formed on a substrate l having a patterned shape according to the present invention.
プラズマ重合膜とは有機上ツマ−が低温プラズマ状態の
中でその高い速度エネルギーを持つ分子、イオン、電子
の衝突によって励起され、高分子化する重合方法によっ
てf&膜されたもので、一般には、低圧に保った真空系
内の基板上に形成される。Plasma-polymerized membranes are F& membranes produced by a polymerization method in which organic polymers are excited by collisions of molecules, ions, and electrons with high velocity energy in a low-temperature plasma state and become polymers. Formed on a substrate in a vacuum system maintained at low pressure.
尚、本発明で使用されるプラズマ重合膜を生成する有機
モノマーとしては、有機化合物であれば特に限定するこ
となく広範囲のものを用いることができるが、例えば、
次のような化合物が好適である。Note that as the organic monomer for producing the plasma polymerized film used in the present invention, a wide range of organic compounds can be used without particular limitation, but for example,
The following compounds are suitable.
(1)メタン、エタン、プロパン、ブタン、ヘプタンな
どの脂肪族飽和炭化水素。(1) Aliphatic saturated hydrocarbons such as methane, ethane, propane, butane, and heptane.
(2)エチレン、プロピレン、ブテン、ブタジェン、ペ
ンテン、メチルペンテン、イソプレン、ジメチルペンテ
ンなどのオレフィン類。(2) Olefins such as ethylene, propylene, butene, butadiene, pentene, methylpentene, isoprene, and dimethylpentene.
(3)アセチレン、プロピン、ブチン、ヘプチンなどの
脂肪族アルキン類。(3) Aliphatic alkynes such as acetylene, propyne, butyne, and heptyne.
(4)トルエン、ベンゼン、キシレン、エチルベンゼン
、スチレンなどの芳香族炭化水素。(4) Aromatic hydrocarbons such as toluene, benzene, xylene, ethylbenzene, and styrene.
(5)メチルメタクリレート、酢酸ビニル、メチルビニ
ルケトン、エチレンオキシドなどの含酸素化合物。(5) Oxygen-containing compounds such as methyl methacrylate, vinyl acetate, methyl vinyl ketone, and ethylene oxide.
(6)塩化ビニル、塩化ビニリデン、弗化ビニル、弗化
ビニリデン、6−フッ化プロピレン、テトラフルオロエ
チレン、クロロトリフルオロエチレン、トリフルオロイ
ソプロピルメタクリレート。(6) Vinyl chloride, vinylidene chloride, vinyl fluoride, vinylidene fluoride, 6-fluorinated propylene, tetrafluoroethylene, chlorotrifluoroethylene, trifluoroisopropyl methacrylate.
ジクロロテトラフルオロエタン、ジクロロジフルオロメ
タンなどのハロゲン化炭化水素
(7)テトラメチルシラン、ビニルトリエトキシシラン
、テトラメトキシシラン、ジメチルジメトキシシラン、
ヘキサメチルジシロキサンなどのケイ素系化合物。Halogenated hydrocarbons such as dichlorotetrafluoroethane and dichlorodifluoromethane (7) Tetramethylsilane, vinyltriethoxysilane, tetramethoxysilane, dimethyldimethoxysilane,
Silicon-based compounds such as hexamethyldisiloxane.
(8)メチルアミン、ジアリルアミン、エチレンジアミ
ン、ピリジン、ピリミジン、キノリン、4−ビニルピリ
ジン、アセトニトリル、アクリルニトリルなどの含窒素
化合物。(8) Nitrogen-containing compounds such as methylamine, diallylamine, ethylenediamine, pyridine, pyrimidine, quinoline, 4-vinylpyridine, acetonitrile, and acrylonitrile.
(9)テトラメチルチン、テトラメチルゲルマニウム、
銅フタロシアニンなどの有機金属化合物。(9) Tetramethyltin, tetramethylgermanium,
Organometallic compounds such as copper phthalocyanine.
これ等の有機上ツマ−を第1図のモノマーガス取り入れ
口5より1種もしくは2種以上導入するか、あるいは他
の無機ガス種、例えば、N2.02゜H2,He、 A
r等を上記有機モノマーガス種に少なくとも一種以上を
同時に導入することでプラズマ重合膜を作製することが
できる。Either one or more of these organic gases are introduced from the monomer gas intake port 5 in FIG. 1, or other inorganic gas species such as N2.02°H2, He, A
A plasma polymerized film can be produced by simultaneously introducing at least one type of organic monomer gas such as r.
本発明において、パターン電極の表面に形成された微細
な凹凸を設けたパターンは、プラズマ重合膜に形成され
るパターン形状と同一の形状のものが用いられ、パター
ンの使用目的に応じて所望の形状に形成することができ
る。In the present invention, the pattern with fine irregularities formed on the surface of the patterned electrode has the same shape as the pattern formed on the plasma polymerized film, and the desired shape can be adjusted depending on the purpose of use of the pattern. can be formed into
[作用]
本発明のパターン形成方法は、真空系内において、平行
電極と、表面に微細な凹凸を設けてパターンを形成した
パターン電極とを対向して設け、前記平行電極に基板を
装着し、電極間に電圧を印加して不均質な電場中でプラ
ズマ重合を行なうので、低圧に保たれた真空系内に於て
平行電極板に対向するパターン電極の表面形状が微細な
凹凸のパターンを有するために、不均一な電場か形成さ
れた雰囲気中でプラズマを生成し、それにより基板上に
パターン電極に形成されたと同一の微細なパターン形状
を有するプラズマ重合膜か形成されるものと推定される
。[Function] The pattern forming method of the present invention includes providing parallel electrodes and patterned electrodes whose surfaces are provided with fine irregularities to form a pattern in a vacuum system, and mounting a substrate on the parallel electrodes. Plasma polymerization is performed in a non-uniform electric field by applying a voltage between the electrodes, so the surface shape of the patterned electrode facing the parallel electrode plate has a fine uneven pattern in a vacuum system maintained at low pressure. Therefore, it is assumed that plasma is generated in an atmosphere with a non-uniform electric field, thereby forming a plasma polymerized film on the substrate with the same fine pattern shape as that formed on the patterned electrode. .
[実施例] 以下、実施例を示し本発明をさらに具体的に説明する。[Example] Hereinafter, the present invention will be explained in more detail with reference to Examples.
実施例1
ガラス基板を対向電極を有する真空装置の反応槽内の対
向電極面側の上部の平行電極に装着し、I X 10−
’Torrまて排気した。Example 1 A glass substrate was attached to the upper parallel electrode on the opposite electrode surface side in a reaction tank of a vacuum device having opposite electrodes, and I
'Torr was exhausted.
尚、パターン電極の表面には三角形状の底辺Igの微細
な凹凸のパターンを形成した電極を使用した。Incidentally, an electrode was used in which a pattern of fine irregularities with a triangular base Ig was formed on the surface of the patterned electrode.
次に、モノマーガス取り入れ口よりテトラメチルシラン
モノマーガスを0.2Torrまで導入し、平衡にして
から、RF 100Wて、90分間、不均質電場中でプ
ラズマを発生させ、プラズマ重合膜の形成を行なった。Next, tetramethylsilane monomer gas was introduced from the monomer gas intake port to 0.2 Torr, and after equilibration, plasma was generated in a heterogeneous electric field using RF 100 W for 90 minutes to form a plasma polymerized film. Ta.
重合終了後、反応槽内をI X 10−’Torrまで
排気し、5分間放置した後、Arガスにより大気圧に戻
して基板を取り出した。After the polymerization was completed, the inside of the reaction tank was evacuated to I.times.10-'Torr, and after being left for 5 minutes, the pressure was returned to atmospheric pressure with Ar gas, and the substrate was taken out.
取り出した基板には、無色透明で、密着性が良好で、ピ
ンホールフリーで、精度が良く、前記パターン電極の表
面に形成されたパターンと同一の形状にパターニングさ
れたプラズマ重合膜が得られた。On the taken-out substrate, a plasma polymerized film was obtained that was colorless and transparent, had good adhesion, was free of pinholes, had good precision, and was patterned in the same shape as the pattern formed on the surface of the patterned electrode. .
実施例2
ポリカーボネート(pc)基板を対向電極を有する真空
装置の反応槽内の対向電極面側の上部の平行電極に装着
し、10−’Torrまで排気した。Example 2 A polycarbonate (PC) substrate was attached to the upper parallel electrode on the side of the opposing electrode in a reaction tank of a vacuum apparatus having opposing electrodes, and the reaction vessel was evacuated to 10-'Torr.
下部のパターン電極の対向面側の電極形状は40amの
線条画に加工しておいた。The shape of the electrode on the opposing surface side of the lower patterned electrode was processed into a 40 am line drawing.
次に、モノマーガス取り入れ口よりメタンガスを0.2
Torrまで導入し、流量20SCCMて平衡にしてか
ら、 RF 70Wで、 100分間、不均質電場中て
プラズマを発生させ、プラズマ重合膜の形成を行なった
。Next, add 0.2 methane gas from the monomer gas intake port.
Torr was introduced, the flow rate was set to 20 SCCM to achieve equilibrium, and then plasma was generated in a heterogeneous electric field using RF 70 W for 100 minutes to form a plasma polymerized film.
重合終了後1反応槽内をI X 10−”Torrまて
排気し、5分間放置した後、Arガスにより大気圧に戻
して基板を取り出した。After the polymerization was completed, the inside of the reactor was evacuated to I.times.10-'' Torr, left for 5 minutes, returned to atmospheric pressure with Ar gas, and the substrate was taken out.
取り出した基板には、無色透明で、密着性が良好で、ピ
ンホールフリーで、精度が良く、前記パターン電極の表
面に形成されたパターンと同一の形状にバターニングさ
れたプラズマ重合膜が得られた。A plasma polymerized film that is colorless and transparent, has good adhesion, is free from pinholes, has good precision, and is patterned in the same shape as the pattern formed on the surface of the patterned electrode is obtained on the taken out substrate. Ta.
[発明の効果]
以上説明した様に1本発明のパターン形成方法は、プラ
ズマ重合法により、加工工程か簡虫で、加工寸法の制御
が容易で、加工精度の高いパターンを容易に形成するこ
とができる利点かある。[Effects of the Invention] As explained above, the pattern forming method of the present invention uses a plasma polymerization method to easily form a pattern with a simple processing process, easy control of processing dimensions, and high processing accuracy. There are advantages to being able to do so.
第1図は本発明のパターン形成方法に用いるプラズマ重
合装置の一例を示す説明図である。
1−・・基板
2・・・反応槽
3・・・平行電極
4・・・パターン電極
5・・・モノマーガス取り入れ口
6・・・高周波電源
7・・・排気口
8・・・プラズマ重合膜FIG. 1 is an explanatory diagram showing an example of a plasma polymerization apparatus used in the pattern forming method of the present invention. 1-... Substrate 2... Reaction tank 3... Parallel electrode 4... Pattern electrode 5... Monomer gas intake port 6... High frequency power source 7... Exhaust port 8... Plasma polymerized film
Claims (1)
けてパターンを形成したパターン電極とを対向して設け
、前記平行電極に基板を装着し、電極間に電圧を印加し
て不均質な電場中でプラズマ重合を行ない、基板上にパ
ターン形状を有するプラズマ重合膜を形成することを特
徴とするパターン形成方法。In a vacuum system, parallel electrodes and patterned electrodes with fine irregularities formed on the surface are provided facing each other, a substrate is attached to the parallel electrodes, and a voltage is applied between the electrodes to create a non-uniform pattern. A pattern forming method characterized by performing plasma polymerization in an electric field to form a plasma polymerized film having a pattern shape on a substrate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28429886A JPS63138740A (en) | 1986-12-01 | 1986-12-01 | Formation of pattern |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP28429886A JPS63138740A (en) | 1986-12-01 | 1986-12-01 | Formation of pattern |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63138740A true JPS63138740A (en) | 1988-06-10 |
Family
ID=17676717
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP28429886A Pending JPS63138740A (en) | 1986-12-01 | 1986-12-01 | Formation of pattern |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63138740A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0449261A2 (en) * | 1990-03-29 | 1991-10-02 | Kabushiki Kaisha Toshiba | Resin composition for an optical disc and an optical disc using it |
-
1986
- 1986-12-01 JP JP28429886A patent/JPS63138740A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0449261A2 (en) * | 1990-03-29 | 1991-10-02 | Kabushiki Kaisha Toshiba | Resin composition for an optical disc and an optical disc using it |
US5242731A (en) * | 1990-03-29 | 1993-09-07 | Kabushiki Kaisha Toshiba | Resin composition for an optical disc and an optical disc using it |
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