JPS63115767U - - Google Patents
Info
- Publication number
- JPS63115767U JPS63115767U JP705587U JP705587U JPS63115767U JP S63115767 U JPS63115767 U JP S63115767U JP 705587 U JP705587 U JP 705587U JP 705587 U JP705587 U JP 705587U JP S63115767 U JPS63115767 U JP S63115767U
- Authority
- JP
- Japan
- Prior art keywords
- pin
- spring
- upper plate
- jig
- pin block
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第1図は、本考案の回路検査用ユニバーサルテ
スター治具の一実施例の縦断面図であり、第2図
は、第1図のピンブロツクの上板の平面図であり
、第3図は、第1図のピンブロツクの下板の底面
図であり、第4図は、プローブを検査点に当接さ
せるための従来の回路検査用ユニバーサルテスタ
ー治具の要部断面図である。
10:オフグリツド治具、11:オフグリツド
治具10の上板、12:オフグリツド治具10の
下板、15,16:ピンブロツク、17:ピンブ
ロツク15の上板、18:スプリングプローブ、
19:ピンブロツク15の下板、20:固定ピン
、22:組付けねじ、24:リード線、25:穴
、27:固定ねじ、31:ユニバーサルピンボー
ド、32:スプリングピン、33:当接部。
FIG. 1 is a longitudinal sectional view of one embodiment of the universal tester jig for circuit inspection of the present invention, FIG. 2 is a plan view of the upper plate of the pin block shown in FIG. 1, and FIG. FIG. 4 is a bottom view of the lower plate of the pin block shown in FIG. 1, and FIG. 4 is a sectional view of essential parts of a conventional universal tester jig for circuit testing for bringing a probe into contact with a test point. 10: off-grid jig, 11: upper plate of off-grid jig 10, 12: lower plate of off-grid jig 10, 15, 16: pin block, 17: upper plate of pin block 15, 18: spring probe,
19: Lower plate of pin block 15, 20: Fixing pin, 22: Assembly screw, 24: Lead wire, 25: Hole, 27: Fixing screw, 31: Universal pin board, 32: Spring pin, 33: Contact part.
Claims (1)
抗して後退できるスプリングピンを所定のピツチ
でマトリツクス状に多数配設し、ピンブロツクの
上板に前記検査点に対応させてスプリングプロー
ブを配設し下板に前記スプリングピンに対応させ
て固定ピンを配設するとともに前記スプリングプ
ローブと対応する前記固定ピンをリード線でそれ
ぞれに接続し、このピンブロツクをオフグリツド
治具に配設し、前記ピンブロツクの前記スプリン
グプローブを前記検査点に当接させ、前記固定ピ
ンを前記スプリングピンの当接部に当接させたこ
とを特徴とする回路検査用ユニバーサルテスター
治具。 (2) 前記オフグリツド治具の上板に検査点に対
応させて貫通孔を穿設し下板に前記スプリングピ
ンに対応させて貫通孔を穿設し、これらの前記オ
フグリツド治具の上板と下板の貫通孔に前記ピン
ブロツクの前記スプリングプローブと前記固定ピ
ンをそれぞれ遊貫させ、前記ピンブロツクを前記
オフグリツド治具の上板と下板との間に前記ピン
ブロツクの上板を前記オフグリツド治具の上板に
固定して介装したことを特徴とする実用新案登録
請求の範囲第1項記載の回路検査用ユニバーサル
テスター治具。 (3) 前記ピンブロツクの上板と下板が、前記ス
プリングプローブの軸と直交する面で位置調整で
きるように構成されていることを特徴とする実用
新案登録請求の範囲第1項または第2項記載の回
路検査用ユニバーサルテスター治具。[Claims for Utility Model Registration] (1) A large number of spring pins whose abutting portions can retreat against elasticity are arranged in a matrix at a predetermined pitch on a universal pin board, and the upper plate of the pin block is provided with a plurality of spring pins that can be retracted against elasticity, and the upper plate of the pin block is provided with a plurality of spring pins that can retreat against elasticity. A spring probe is arranged in a corresponding manner, a fixing pin is arranged on the lower plate in correspondence with the spring pin, and the spring probe and the corresponding fixing pin are connected to each other with a lead wire, and this pin block is attached to an off-grid jig. A universal tester jig for circuit inspection, characterized in that the spring probe of the pin block is brought into contact with the test point, and the fixing pin is brought into contact with the contact portion of the spring pin. (2) Drill through holes in the upper plate of the off-grid jig in correspondence with the inspection points, and drill through holes in the lower plate in correspondence with the spring pins, and The spring probe and the fixing pin of the pin block are loosely passed through the through holes of the lower plate, and the upper plate of the pin block is inserted between the upper plate and the lower plate of the off-grid jig. A universal tester jig for circuit inspection according to claim 1, characterized in that the jig is fixed to and interposed on an upper plate. (3) The upper plate and the lower plate of the pin block are configured so that their positions can be adjusted in a plane orthogonal to the axis of the spring probe. Universal tester jig for circuit inspection as described.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP705587U JPS63115767U (en) | 1987-01-20 | 1987-01-20 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP705587U JPS63115767U (en) | 1987-01-20 | 1987-01-20 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63115767U true JPS63115767U (en) | 1988-07-26 |
Family
ID=30790153
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP705587U Pending JPS63115767U (en) | 1987-01-20 | 1987-01-20 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63115767U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6138575A (en) * | 1984-07-31 | 1986-02-24 | Kyoei Sangyo Kk | Adapter unit for printed circuit board checking machine |
JPS6130876B2 (en) * | 1982-10-12 | 1986-07-16 | Torio Kk |
-
1987
- 1987-01-20 JP JP705587U patent/JPS63115767U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6130876B2 (en) * | 1982-10-12 | 1986-07-16 | Torio Kk | |
JPS6138575A (en) * | 1984-07-31 | 1986-02-24 | Kyoei Sangyo Kk | Adapter unit for printed circuit board checking machine |
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