JPS63107177A - Device for detecting wavelength of laser beam - Google Patents
Device for detecting wavelength of laser beamInfo
- Publication number
- JPS63107177A JPS63107177A JP25349286A JP25349286A JPS63107177A JP S63107177 A JPS63107177 A JP S63107177A JP 25349286 A JP25349286 A JP 25349286A JP 25349286 A JP25349286 A JP 25349286A JP S63107177 A JPS63107177 A JP S63107177A
- Authority
- JP
- Japan
- Prior art keywords
- laser beam
- optical fiber
- etalon
- wavelength
- monitor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013307 optical fiber Substances 0.000 claims abstract description 25
- 238000001514 detection method Methods 0.000 claims description 13
- 230000003287 optical effect Effects 0.000 claims description 5
- 238000012544 monitoring process Methods 0.000 claims description 2
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 abstract description 21
- 238000010586 diagram Methods 0.000 description 9
- 230000000694 effects Effects 0.000 description 2
- 239000000835 fiber Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/0014—Monitoring arrangements not otherwise provided for
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Optics & Photonics (AREA)
- Lasers (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明はレーザ光の波長検出を行う波長検出装置に関す
るものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a wavelength detection device for detecting the wavelength of laser light.
(従来の技術)
従来のレーザ光の波長検出装置としては例えば第7図に
示すようなものがある。同図においてエキシマレーザ1
はレーザ光3を発生させる。ビームスプリッタ5はレー
ザ光3の光路中に配置されレーザ光の一部を透過しその
一部を反射させる。(Prior Art) As a conventional laser beam wavelength detection device, there is one shown in FIG. 7, for example. In the figure, excimer laser 1
generates laser light 3. The beam splitter 5 is placed in the optical path of the laser beam 3, and transmits a portion of the laser beam and reflects a portion of the laser beam.
レンズ7はビームスプリッタ5で反射されたレーザ光を
光フアイバマウント9に導く。光フアイバマウント9は
モニタエタロン11に光ファイバ13によって連結され
る。Lens 7 guides the laser beam reflected by beam splitter 5 to optical fiber mount 9. The fiber optic mount 9 is connected to the monitor etalon 11 by an optical fiber 13.
ビームスプリッタ5で反射された光はレンズ7゜光フア
イバマウント9.光ファイバ13を介してモニタエタロ
ン11に送られ、モニタエタロン11においてそのレー
ザ光の干渉縞が検出されその結果レーザ光の線巾及び波
長が検出される。The light reflected by the beam splitter 5 passes through a lens 7° and an optical fiber mount 9. The laser beam is sent to the monitor etalon 11 via the optical fiber 13, and the interference fringes of the laser beam are detected in the monitor etalon 11, and as a result, the line width and wavelength of the laser beam are detected.
しかしながらこのような波長検出装置ではビームスプリ
ッタ5.レンズ7等を用いていたのでアライメントが困
難でかつ装置が大きくなるという問題点があった。However, in such a wavelength detection device, the beam splitter 5. Since the lens 7 and the like were used, there were problems in that alignment was difficult and the apparatus became large.
本発明はこのような問題点に鑑みてなされたものでアラ
イメントを行う必要がなくかつ装置の小型化をはかるこ
とができるレーザ光の波長検出装置を提供することにあ
る。The present invention has been made in view of these problems, and it is an object of the present invention to provide a laser beam wavelength detection device that does not require alignment and can be miniaturized.
前記目的を達成するために本発明は、端部がレーザ光の
光路中に挿入されこのレーザ光の一部を取り出す光ファ
イバと、前記光ファイバによって導かれるレーザ光の干
渉縞を形成しこの干渉縞からレーザ光の波長を検出する
モニタ手段とを具備することを特徴とする。In order to achieve the above object, the present invention includes an optical fiber whose end is inserted into the optical path of a laser beam and takes out a part of the laser beam, and an optical fiber that forms interference fringes of the laser beam guided by the optical fiber and eliminates this interference. The apparatus is characterized by comprising a monitor means for detecting the wavelength of the laser beam from the stripes.
レーザ光は光ファイバによって直接モニタ手段に導かれ
るので装置のアライメントを行う必要がなくまた装置の
小型化をはかることができる。Since the laser beam is directly guided to the monitoring means by the optical fiber, there is no need to perform alignment of the device, and the device can be made smaller.
以下図面に基づいて本発明の実施例を詳細に説明する。 Embodiments of the present invention will be described in detail below based on the drawings.
第1図は本発明の一実施例に係わる波長検出装置の構成
を示すものである。エキシマレーザ1はレーザ光3を発
生する。レーザ光3の光路中に集光部15を介して光フ
ァイバ17が挿入されこの光ファイバの他端はモニタエ
タロン19に接続される。FIG. 1 shows the configuration of a wavelength detection device according to an embodiment of the present invention. Excimer laser 1 generates laser light 3. An optical fiber 17 is inserted into the optical path of the laser beam 3 via a condenser 15, and the other end of this optical fiber is connected to a monitor etalon 19.
第2図は集光部15をA−A方向から見た図でありマグ
ネットスタンド21にロッド23を介して頭部25が設
けられる。ロッド23中には光ファイバ17が貫通しこ
の光ファイバ17の先端27は頭部25に露出する。FIG. 2 is a view of the condensing unit 15 viewed from the direction AA, and a head 25 is provided on the magnetic stand 21 via a rod 23. An optical fiber 17 passes through the rod 23, and the tip 27 of the optical fiber 17 is exposed to the head 25.
第3図はモニタエタロン19の構成図であり同図に示さ
れるようにこのモニタエタロン19は光ファイバの終端
に設けられた投射部29.エタロン31.ラインディテ
クタ33.パワーモニタディテクタ35を有する。投射
部29は光ファイバ17を介して送られてくるレーザ光
をエタロン31に投射する。エタロン31はレーザ光の
うち特定の波長のものだけ透過させる。ラインディテク
タ33はレーザ光の干渉縞を発生させてレーザ光の線巾
及び波長を検出する。FIG. 3 is a configuration diagram of the monitor etalon 19. As shown in the figure, the monitor etalon 19 has a projection section 29 provided at the end of the optical fiber. Etalon 31. Line detector 33. It has a power monitor detector 35. The projection unit 29 projects the laser beam sent through the optical fiber 17 onto the etalon 31. The etalon 31 transmits only laser light of a specific wavelength. The line detector 33 generates interference fringes of the laser beam and detects the line width and wavelength of the laser beam.
第1図においてエキシマレーザ1によって死生されたレ
ーザ光3は集光部15.光ファイバ17を介してモニタ
エタロン19に送られ、このモニタエタロン19におい
てレーザ光の線巾及び波長が検出される。In FIG. 1, the laser beam 3 that has been deactivated by the excimer laser 1 is collected at a condensing section 15. The laser beam is sent through an optical fiber 17 to a monitor etalon 19, where the line width and wavelength of the laser beam are detected.
このように本実施例ではレーザ光の光路中に直接光ファ
イバ17の一端を挿入しこの光ファイバ17を介して送
られてくるレーザ光を検出するようにしたので従来のよ
うにビームスプリッタ5゜レンズ7等が不要となる。こ
の為アライメントが不要となり、又、装置自体を小型化
することができる。さらにパワーモニタディテクタ35
によりレーザ光のパワーを知ることができる。In this way, in this embodiment, one end of the optical fiber 17 is inserted directly into the optical path of the laser beam, and the laser beam sent through this optical fiber 17 is detected. Lens 7 etc. are not required. This eliminates the need for alignment and allows the device itself to be downsized. Furthermore, power monitor detector 35
The power of the laser beam can be determined by
第4図はエキシマレーザステッパの構成図である。同図
に示されるようにこのエキシマレーザステッパはりアミ
シー3フ、エタロン39.レーザヘツド41.フロント
ミラー432反射鏡45゜インケグレータ4フ2反1)
18fl 49 、コンデンサレンズ51.レチクル5
3.投射レンズ55.ウエフ?57からなる。FIG. 4 is a block diagram of the excimer laser stepper. As shown in the same figure, this excimer laser stepper beam has 3 amices and an etalon 39. Laser head 41. Front mirror 432 reflector 45° ink grater 4 f2 anti 1)
18fl 49, condenser lens 51. Reticle 5
3. Projection lens 55. Uef? Consists of 57.
エタロン39は特定の波長のレーザ光のみを透過させる
。レーザヘッド41はレーザ光の死生を行う。インテグ
レータ47はレーザ光を多光源の光にする。レチクル5
3はウェファ57に形成すべきバタンを有し、レチクル
53を透過した光が投射レンズ55を介してウェファ5
7に照射されこのウェファ57上に所定のバタンか形成
される。The etalon 39 transmits only laser light of a specific wavelength. The laser head 41 performs life and death of laser light. The integrator 47 converts the laser light into multi-source light. Reticle 5
3 has a button to be formed on the wafer 57, and the light transmitted through the reticle 53 is directed to the wafer 5 through the projection lens 55.
7 and a predetermined pattern is formed on the wafer 57.
このようなエキシマレーザステッパにおいて本発明によ
る波長検出装置を用いる場合フロントミラー43と反射
ff145との間、反射v145とインテグレータ47
との間、インテグレータ47と反射鏡49との間、反射
鏡49とコンデンサレンズ51との間、コンデンサレン
ズ51とレチクル53との間、レチクル53上等の場所
に集光部15を配置することができる。When using the wavelength detection device according to the present invention in such an excimer laser stepper, there are
, between the integrator 47 and the reflecting mirror 49, between the reflecting mirror 49 and the condenser lens 51, between the condensing lens 51 and the reticle 53, above the reticle 53, etc. Can be done.
第5図はレチクル53近傍に集光部15を配置した場合
を説明するものでレチクルホルダ59に集光部15をネ
ジ(図示せず)によって螺合したものである。コンデン
サレンズ51から照射されるレーザ光61はレチクル5
3の全面よりも一般には広がるので集光部15をこのよ
うな位置に配置してもレーザ光をモニタエタロン19に
導くことができる。FIG. 5 illustrates a case where the light condensing section 15 is arranged near the reticle 53, and the light condensing section 15 is screwed into the reticle holder 59 with a screw (not shown). The laser beam 61 irradiated from the condenser lens 51 is directed toward the reticle 5.
3, the laser beam can be guided to the monitor etalon 19 even if the condenser 15 is placed in such a position.
第6図はレチクル53とコンデンサレンズ51との間に
ビームスプリッタ63を位置しレーザ光の一部をこのビ
ームスプリッタ65で反射さゼこの反射させたレーザ光
の波長検出を行うものである。即ちレチクルホルダ59
にロッド67を介して集光部15を固定させこの集光部
15にビームスプリッタ63で反射されたレーザ光65
を導き、このレーザ光65を光ファイバ17を介してモ
ニタエタロン19に送りこんでレーザ光の波長検出を行
う。In FIG. 6, a beam splitter 63 is positioned between a reticle 53 and a condenser lens 51, a portion of the laser beam is reflected by the beam splitter 65, and the wavelength of the reflected laser beam is detected. That is, the reticle holder 59
The condensing section 15 is fixed via a rod 67 to the condensing section 15, and the laser beam 65 reflected by the beam splitter 63 is transmitted to the condensing section 15.
This laser light 65 is sent to the monitor etalon 19 via the optical fiber 17 to detect the wavelength of the laser light.
このように本実施例に係る波長検出装置を用いればエキ
シマレーザステップの色々な位置で波長検出を行うこと
ができる。As described above, by using the wavelength detection device according to this embodiment, wavelength detection can be performed at various positions of the excimer laser step.
〔発明の効果]
以上詳細に説明したように本発明によればアライメント
を行う必要がなくまた装置の小型化をはかることができ
る。[Effects of the Invention] As described in detail above, according to the present invention, there is no need to perform alignment, and the device can be downsized.
第1図は本発明の一実施例に係わるレーザ光の波長検出
装置の概略構成図、第2図は集光部のA−A方向矢視図
、第3図はモニタエタロンの内部構成図、第4図はエキ
シマレーザステッパの構成図、第5図はレチクルに集光
部をとりつけた場合の説明図、第6図はビームスプリッ
タを用いて波長検出を行う場合の説明図、第7図は従来
の波長検出装置の概略構成図である。
15・・・集光部、17・・・光ファイバ、19・・・
モニタエタロン。
第3図
第4図
第5図FIG. 1 is a schematic configuration diagram of a laser beam wavelength detection device according to an embodiment of the present invention, FIG. 2 is a view taken along arrow A-A of a condensing section, and FIG. 3 is an internal configuration diagram of a monitor etalon. Figure 4 is a configuration diagram of the excimer laser stepper, Figure 5 is an explanatory diagram when the condenser is attached to the reticle, Figure 6 is an explanatory diagram when wavelength detection is performed using a beam splitter, and Figure 7 is an explanatory diagram when wavelength detection is performed using a beam splitter. FIG. 1 is a schematic configuration diagram of a conventional wavelength detection device. 15... Concentrating section, 17... Optical fiber, 19...
monitor etalon. Figure 3 Figure 4 Figure 5
Claims (1)
を取り出す光ファイバと、 前記光ファイバによって導かれるレーザ光の干渉縞を形
成し、この干渉縞からレーザ光の波長を検出するモニタ
手段と を具備することを特徴とするレーザ光の波長検出装置。[Claims] An optical fiber whose end is inserted into the optical path of a laser beam and takes out a part of the laser beam, and an interference fringe of the laser beam guided by the optical fiber, and from this interference fringe, the laser beam is extracted. What is claimed is: 1. A wavelength detection device for laser light, comprising: monitoring means for detecting the wavelength of a laser beam.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25349286A JPS63107177A (en) | 1986-10-24 | 1986-10-24 | Device for detecting wavelength of laser beam |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP25349286A JPS63107177A (en) | 1986-10-24 | 1986-10-24 | Device for detecting wavelength of laser beam |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS63107177A true JPS63107177A (en) | 1988-05-12 |
Family
ID=17252129
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP25349286A Pending JPS63107177A (en) | 1986-10-24 | 1986-10-24 | Device for detecting wavelength of laser beam |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS63107177A (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989000779A1 (en) * | 1987-07-17 | 1989-01-26 | Kabushiki Kaisha Komatsu Seisakusho | Apparatus for controlling laser wavelength |
WO1989002175A1 (en) * | 1987-08-25 | 1989-03-09 | Kabushiki Kaisha Komatsu Seisakusho | Device for controlling the output of excimer laser |
WO1990014582A1 (en) * | 1989-05-23 | 1990-11-29 | Kabushiki Kaisha Komatsu Seisakusho | Wavelength detector |
JPH02306679A (en) * | 1989-05-22 | 1990-12-20 | Komatsu Ltd | Wavelength controller for laser |
WO1991001579A1 (en) * | 1989-07-14 | 1991-02-07 | Kabushiki Kaisha Komatsu Seisakusho | Narrow-band oscillation excimer laser and wavelength detector |
USRE38372E1 (en) | 1989-07-14 | 2003-12-30 | Kabushiki Kaisha Komatsu Shisakusho | Narrow band excimer laser and wavelength detecting apparatus |
-
1986
- 1986-10-24 JP JP25349286A patent/JPS63107177A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1989000779A1 (en) * | 1987-07-17 | 1989-01-26 | Kabushiki Kaisha Komatsu Seisakusho | Apparatus for controlling laser wavelength |
WO1989002175A1 (en) * | 1987-08-25 | 1989-03-09 | Kabushiki Kaisha Komatsu Seisakusho | Device for controlling the output of excimer laser |
JPH02306679A (en) * | 1989-05-22 | 1990-12-20 | Komatsu Ltd | Wavelength controller for laser |
WO1990014582A1 (en) * | 1989-05-23 | 1990-11-29 | Kabushiki Kaisha Komatsu Seisakusho | Wavelength detector |
US5198872A (en) * | 1989-05-23 | 1993-03-30 | Kabushiki Kaisha Komatsu Seisakusho | Apparatus for detecting the wavelength of laser light |
WO1991001579A1 (en) * | 1989-07-14 | 1991-02-07 | Kabushiki Kaisha Komatsu Seisakusho | Narrow-band oscillation excimer laser and wavelength detector |
USRE38372E1 (en) | 1989-07-14 | 2003-12-30 | Kabushiki Kaisha Komatsu Shisakusho | Narrow band excimer laser and wavelength detecting apparatus |
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