JPS63103064A - Film forming device - Google Patents
Film forming deviceInfo
- Publication number
- JPS63103064A JPS63103064A JP24784786A JP24784786A JPS63103064A JP S63103064 A JPS63103064 A JP S63103064A JP 24784786 A JP24784786 A JP 24784786A JP 24784786 A JP24784786 A JP 24784786A JP S63103064 A JPS63103064 A JP S63103064A
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- sample
- evaporation source
- evaporation
- evaporated
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、少なくとも真空蒸着によって、あるいは真
空蒸着とイオンビーム照射を併用することによって、試
料の表面に膜を形成する膜形成装置に関する。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a film forming apparatus for forming a film on the surface of a sample at least by vacuum evaporation or by using vacuum evaporation and ion beam irradiation in combination.
第2図および第3図は、それぞれ、従来の膜形成装置の
例を示す概略図であり、いずれも真空蒸着とイオンビー
ム照射を併用可能なものである。FIGS. 2 and 3 are schematic diagrams showing examples of conventional film forming apparatuses, each of which is capable of using vacuum evaporation and ion beam irradiation in combination.
即ち、図示しない真空ポンプによって真空引きされる真
空容器2内に、回転式のホルダ4に装着されて試料6が
収納されており、当該試料6に対して、真空容器2内に
収納された蒸発源8からの蒸発物質10の蒸着と、真空
容器2に取り付けられたイオン源12からのイオンビー
ム14の照射を併用することによって、試料6の表面に
膜を形成するようにしている。That is, a sample 6 is housed in a rotary holder 4 in a vacuum container 2 that is evacuated by a vacuum pump (not shown). A film is formed on the surface of the sample 6 by using both the vapor deposition of the evaporated substance 10 from the source 8 and the irradiation of the ion beam 14 from the ion source 12 attached to the vacuum container 2.
(発明が解決しようとする問題点〕
ところが上記のような従来の膜形成装置においては、次
のような問題点がある。(Problems to be Solved by the Invention) However, the conventional film forming apparatus as described above has the following problems.
■ 蒸発源8からの蒸発物質10の付着によって、真空
容器2内の殆ど全体が汚れてしまう。ちなみにこれを放
置しておくと、付着物質からのアウトガスにより真空度
が悪化したり、付着物質の剥離混入によってイオン源1
2や蒸発源8において放電等のトラブルが発生したりす
る。(2) Almost the entire inside of the vacuum container 2 becomes dirty due to the adhesion of the evaporation substance 10 from the evaporation source 8. By the way, if this is left untreated, the degree of vacuum may deteriorate due to outgas from the adhered substances, or the ion source 1 may be damaged due to the detachment of the adhered substances.
2 or the evaporation source 8, problems such as discharge may occur.
■ 真空容器2が分割できない等のために、真空容器2
内部の清掃等の保守作業が困難である。■ Because vacuum container 2 cannot be divided,
Maintenance work such as internal cleaning is difficult.
またその作業の際に真空容器2内の付着物質が塵埃とな
って外部に拡散する恐れがあるため、当該膜形成装置が
通常設置されるクリーンルーム内では清掃作業ができず
、これが保守作業を一層困難にしている。In addition, during this work, there is a risk that the adhered substances inside the vacuum container 2 will become dust and spread outside, so cleaning work cannot be done in the clean room where the film forming apparatus is normally installed, which makes maintenance work even more difficult. making it difficult.
そこでこの発明は、真空容器内の汚れを最小限に抑える
と共に、その内部の清掃等の保守作業が容易に行えるよ
うにした膜形成装置を提供することを目的とする。SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a film forming apparatus that minimizes contamination within a vacuum container and allows maintenance work such as cleaning the inside of the vacuum container to be easily performed.
この発明の膜形成装置は、真空容器を試料を収納する試
料室側と蒸発源を収納した蒸発源室側とに分割して蒸発
源室側を取り外し可能にし、かつ両室間に蒸発源からの
蒸発物質を試料に輸送するための開口部を有する仕切板
であって蒸発源室と共に取り外し可能なものを設け、更
に少なくとも仕切仮にそれの冷却手段を設けていること
を特徴とする。The film forming apparatus of the present invention divides a vacuum container into a sample chamber side that stores a sample and an evaporation source chamber side that stores an evaporation source, and makes the evaporation source chamber side removable. The present invention is characterized in that it includes a partition plate having an opening for transporting the evaporated substance to the sample and is removable together with the evaporation source chamber, and further includes at least a means for cooling the partition.
蒸発源室内の蒸発源による試料室内の試料に対する真空
蒸着は、両室間に設けられた仕切板の開口部を通して行
われる。従って、試料室内の蒸発物質による汚れを最小
限に抑えることができる。Vacuum deposition of the sample in the sample chamber by the evaporation source in the evaporation source chamber is performed through an opening in a partition plate provided between both chambers. Therefore, contamination caused by evaporated substances in the sample chamber can be minimized.
また、蒸発源室を取り外し可能にしているため、真空容
器内部の清掃等の保守作業を容易に行うことができる。Furthermore, since the evaporation source chamber is made removable, maintenance work such as cleaning the inside of the vacuum container can be easily performed.
第1図は、この発明の一実施例に係る膜形成装置を示す
概略図である。第2図あるいは第3図と同等部分には同
一符号を付し、以下においては従来例との相違点を主に
説明する。FIG. 1 is a schematic diagram showing a film forming apparatus according to an embodiment of the present invention. Components equivalent to those in FIG. 2 or 3 are given the same reference numerals, and the differences from the conventional example will be mainly explained below.
この実施例においては、真空容器2を、試料6をホルダ
4に装着して収納する試料室16側と、この例では2台
の蒸発源8a、8bを収納した蒸発源室18側とに分割
して蒸発源室工8側を取り外し可能にしており、かつ両
室16.18間にそこを仕切るための仕切板20を設け
ている。17.19は分割構造のためのフランジであり
、その部分は図示しないOリング等によって真空シール
されている。また仕切板20は、フランジ19あるいは
蒸発源室18に固定されていて蒸発源室18と共に取り
外しできるようにされている。In this embodiment, the vacuum container 2 is divided into a sample chamber 16 side in which the sample 6 is mounted and stored in the holder 4, and an evaporation source chamber 18 side in which two evaporation sources 8a and 8b are housed in this example. The evaporation source chamber 8 side is made removable, and a partition plate 20 is provided between the two chambers 16 and 18 to partition the two chambers. Reference numerals 17 and 19 are flanges for the split structure, and these parts are vacuum-sealed with an O-ring or the like (not shown). Further, the partition plate 20 is fixed to the flange 19 or the evaporation source chamber 18, and can be removed together with the evaporation source chamber 18.
ところでこの例では、試料室16の左右に高エネルギー
(例えばLKeV〜5QKeV程度の範囲)のイオンビ
ーム14aを発生し得る高エネルギーイオン源12aと
、低エネルギー(例えば50eV〜IKeV程度の範囲
)のイオンビームI4bを発生し得る低エネルギーイオ
ン源12bを配置して、ホルダ駆動装置26によってホ
ルダ4を矢印Aのように回転させて両イオン源12a、
12bおよび両蒸発源8a、8bの使い分けを可能にし
ており、そのために仕切仮20には、高エネルギーイオ
ン源12a側に向けられた試料6に蒸発源8aからの蒸
発物質10aを輸送して蒸着させるための開口部22a
と、低エネルギーイオンm1Zb側に向けられた試料6
に蒸発rAabからの蒸発物質10bを輸送して蒸着さ
せるための開口部22bを設けている。In this example, a high-energy ion source 12a that can generate an ion beam 14a with high energy (for example, in the range of about LKeV to 5QKeV) and ions with low energy (for example, in the range of about 50eV to IKeV) are placed on the left and right sides of the sample chamber 16. A low-energy ion source 12b that can generate a beam I4b is arranged, and the holder 4 is rotated in the direction of arrow A by the holder driving device 26 to remove both ion sources 12a,
12b and both evaporation sources 8a, 8b, and for this purpose, the temporary partition 20 is provided with a partition 20 that transports the evaporated substance 10a from the evaporation source 8a to the sample 6 facing the high-energy ion source 12a for evaporation. opening 22a for
and sample 6 directed toward the low energy ion m1Zb side.
An opening 22b is provided for transporting and depositing the evaporated substance 10b from the evaporated rAab.
この場合、両開口部22a、22bは、必要最小限の大
きさ、例えば、少なくとも蒸発物質10a、10bを試
料6およびその近傍に設けられた膜厚モニタ(図示省略
)に輸送するのに必要最小限の大きさ、あるいはそれに
加えて試料室16の外側から蒸着中の蒸発源8a、8b
の観察をも行うのに必要最小限の大きさにするのが好ま
しい。In this case, both openings 22a and 22b have the minimum necessary size, for example, the minimum size necessary to transport at least the evaporated substances 10a and 10b to the sample 6 and a film thickness monitor (not shown) provided in the vicinity thereof. evaporation sources 8a, 8b during evaporation from outside the sample chamber 16.
It is preferable to make the size the minimum necessary to perform the observation.
もっとも必要があれば、開口部22a、22bを上記の
ような目的に応じてそれぞれ複数の開口部に分けても良
い。However, if necessary, the openings 22a and 22b may be divided into a plurality of openings depending on the purpose described above.
また仕切板20には、蒸発源3a、8bからの輻射熱に
よる温度上昇を抑えるために、それの冷却手段として冷
却水配管24を設けている。更に、蒸発源8a、8bが
蒸発源室18の側壁の近くに設けられている場合は、こ
の例のように蒸発源室18の側壁にも冷却水配管24を
設けるのが好ましい。Further, the partition plate 20 is provided with a cooling water pipe 24 as a cooling means in order to suppress a temperature rise due to radiant heat from the evaporation sources 3a and 8b. Further, when the evaporation sources 8a and 8b are provided near the side wall of the evaporation source chamber 18, it is preferable to provide the cooling water pipe 24 also on the side wall of the evaporation source chamber 18 as in this example.
尚、この例では、試料室16側を図示しない架台に固定
し、蒸発源室18側は試料室16側にぷら下がるような
構造としている。In this example, the structure is such that the sample chamber 16 side is fixed to a stand (not shown), and the evaporation source chamber 18 side is lowered toward the sample chamber 16 side.
上記装置においては、真空容器2を試料室6と蒸発源室
18とに分けて両室間を必要最小限の開口部22a、2
2bを有する仕切板20で仕切っているため、蒸発物質
tOa、10bによる試料室16内の汚れを最小限に抑
えることができる。In the above device, the vacuum container 2 is divided into the sample chamber 6 and the evaporation source chamber 18, and the necessary minimum openings 22a, 2 are provided between the two chambers.
Since the sample chamber 16 is partitioned by the partition plate 20 having 2b, contamination in the sample chamber 16 due to evaporated substances tOa and 10b can be minimized.
また、蒸発源室18側を取り外し可能にしているため、
真空容器2の内部、即ち試料室16および蒸発源室18
の内部の清掃等の保守作業を容易に行うことができる。In addition, since the evaporation source chamber 18 side is made removable,
Inside the vacuum container 2, that is, the sample chamber 16 and the evaporation source chamber 18
Maintenance work such as cleaning the inside of the machine can be easily performed.
しかも、従来の装置ではクリーンルーム外でしか内部の
保守作業ができなかったけれども、この装置では試料室
16内は殆ど汚れないため、汚れ易い蒸発源室18側の
みを仕切板20で蓋をした状態でクリーンルーム以外の
場所へ移動させてそこで保守作業をすれば良く、この点
からも保守作業が一層容易となる。In addition, in conventional devices, internal maintenance work could only be done outside the clean room, but in this device, the inside of the sample chamber 16 hardly gets dirty, so only the easily dirty side of the evaporation source chamber 18 is covered with the partition plate 20. All you have to do is move it to a location other than the clean room and perform maintenance work there, which further simplifies maintenance work.
更に、仕切板20や更には蒸発源室1日の側壁をも冷却
できるようにしているため、それらからのアウトガスが
抑えられて良好な膜形成が可能であると共に、それらに
対する付着物質の密着性が阻害されるため付着物質の除
去も容易となる。Furthermore, since the partition plate 20 and even the side walls of the evaporation source chamber can be cooled, outgassing from them is suppressed and good film formation is possible, and the adhesion of adhering substances to them is improved. Since the adhering substances are inhibited, it becomes easy to remove the adhering substances.
また、この実施例のように高エネルギーイオン源12a
と低エネルギーイオン源12bを設けて、同一の試料6
に対する膜形成の初期においては前者を、それ以降にお
いては後者を用いれば、単一のイオン源では困難であっ
た密着力が良好でしかも照射損傷の少ない膜を試料6の
表面に形成することができる。In addition, as in this embodiment, the high energy ion source 12a
and a low-energy ion source 12b, the same sample 6
By using the former in the initial stage of film formation and the latter later, it is possible to form a film on the surface of the sample 6 with good adhesion and less radiation damage, which was difficult to do with a single ion source. can.
尚、上記実施例はイオン源および蒸発源がそれぞれ2台
ずつの場合を例示したが、それらの台数はそれに限られ
るものではなく任意である。Incidentally, although the above-mentioned embodiment illustrates a case in which there are two ion sources and two evaporation sources, the number thereof is not limited to this and is arbitrary.
また、単に真空蒸着によって試料6に膜形成するのであ
れば、膜形成手段としては少なくとも蒸発源を備えてお
れば良く、イオン源は必ずしも設けなくても良い。Furthermore, if a film is to be formed on the sample 6 simply by vacuum evaporation, at least an evaporation source may be provided as the film forming means, and an ion source may not necessarily be provided.
以゛上のようにこの発明によれば、真空容器内の蒸発物
質による汚れを最小限に抑えることができると共に、真
空容器内部の清掃等の保守作業が容易に行えるようにな
る。As described above, according to the present invention, contamination caused by evaporated substances inside the vacuum container can be minimized, and maintenance work such as cleaning inside the vacuum container can be easily performed.
第1図は、この発明の一実施例に係る膜形成装置を示す
概略図である。第2図および第3図は、それぞれ、従来
の膜形成装置の例を示す概略図である。
2・・・真空容器、6・・・試料、3a、3b・・・蒸
発源、10a、10b・−・蒸発物質、12a。
12b・・・イオン源、16・・・試料室、18・・・
蒸発源室、20・・・仕切板、22a、22b・・・開
口部、24・・・冷却水配管。FIG. 1 is a schematic diagram showing a film forming apparatus according to an embodiment of the present invention. FIGS. 2 and 3 are schematic diagrams showing examples of conventional film forming apparatuses, respectively. 2... Vacuum container, 6... Sample, 3a, 3b... Evaporation source, 10a, 10b... Evaporation substance, 12a. 12b...Ion source, 16...Sample chamber, 18...
Evaporation source chamber, 20... Partition plate, 22a, 22b... Opening, 24... Cooling water piping.
Claims (1)
膜形成手段として少なくとも蒸発源を備える膜形成装置
において、真空容器を試料を収納する試料室側と蒸発源
を収納した蒸発源室側とに分割して蒸発源室側を取り外
し可能にし、かつ両室間に蒸発源からの蒸発物質を試料
に輸送するための開口部を有する仕切板であって蒸発源
室と共に取り外し可能なものを設け、更に少なくとも仕
切板にそれの冷却手段を設けていることを特徴とする膜
形成装置。(1) In a film forming apparatus that includes a vacuum container and at least an evaporation source as a film forming means for a sample stored therein, the vacuum container is separated into a sample chamber side that stores the sample and an evaporation source chamber side that stores the evaporation source. The partition plate is divided so that the evaporation source chamber side is removable, and a partition plate having an opening for transporting the evaporation material from the evaporation source to the sample is provided between the two chambers, which is removable together with the evaporation source chamber. A film forming apparatus further comprising a cooling means provided on at least the partition plate.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24784786A JPH0742577B2 (en) | 1986-10-18 | 1986-10-18 | Film forming equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP24784786A JPH0742577B2 (en) | 1986-10-18 | 1986-10-18 | Film forming equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS63103064A true JPS63103064A (en) | 1988-05-07 |
JPH0742577B2 JPH0742577B2 (en) | 1995-05-10 |
Family
ID=17169546
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP24784786A Expired - Fee Related JPH0742577B2 (en) | 1986-10-18 | 1986-10-18 | Film forming equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0742577B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6892041B1 (en) * | 2003-08-06 | 2005-05-10 | Xerox Corporation | Passive dirt shield for image reproduction devices |
JP2006176867A (en) * | 2004-12-24 | 2006-07-06 | Utec:Kk | Film-forming apparatus and vapor deposition apparatus |
-
1986
- 1986-10-18 JP JP24784786A patent/JPH0742577B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6892041B1 (en) * | 2003-08-06 | 2005-05-10 | Xerox Corporation | Passive dirt shield for image reproduction devices |
JP2006176867A (en) * | 2004-12-24 | 2006-07-06 | Utec:Kk | Film-forming apparatus and vapor deposition apparatus |
JP4557710B2 (en) * | 2004-12-24 | 2010-10-06 | 株式会社ユーテック | Film forming apparatus and vapor deposition apparatus |
Also Published As
Publication number | Publication date |
---|---|
JPH0742577B2 (en) | 1995-05-10 |
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Legal Events
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---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |