JPS6262252A - Pin position detector - Google Patents

Abstract

PURPOSE:To enable highly accurate detection of a pin position with a relatively simple construction, by a method wherein a pin is irradiated with a slit laser light along the length thereof and at the right angle thereto and the reflected light and the scattered light are received to pick up an image of the pin along the length thereof to perform an arithmetic processing of the image. CONSTITUTION:The tip of a pin 2 arranged on an IC package 1 held with an IC adsorber 3 is irradiated with a slit light B3 which is formed through an expander comprising a convex lens 10 and a collimator 11 and a cylindrical lens 12 from a laser beam B1 from a He-Ne laser 9. The reflected light and the scattered light are taken with a camera 6 through a lens 4 and a close-up link 5. The image screen is displayed on a monitor 7, processed by an image processing section 8; thus, the pin position is detected at a high accuracy.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a pin position detection device, and particularly to a pin position detection device that can easily detect defects such as curved pin 9, which is effective when inserting a pin into another member. Regarding.

[Conventional technology]

Generally, when inserting pins from IC devices, cages, relays, etc. into pin holes in other parts, it is important to maintain the correct pin tip position with little difference in the pin tip position, especially when automating pin insertion. be.

Conventionally, in order to detect the bending of the pins of this kind of IC packages, relays, etc., as shown in FIG. Images are taken from the sides with cameras 6X and 6Y arranged orthogonal to each other, and the images are observed on monitors 7X and 7Y, respectively, or judgment 1 position is detected by image processing by the image processing device 8. In other words, if the pin arrangement and pin tip position are all normal, monitors 7X and 7
On the Y screen, it is recognized as a single row bin image. For example, on the monitor 7X, the bin images 75 arranged in the X direction are completely overlapped in the Y direction, so that only one bin image 75 is visible. On the other hand, on the monitor 7Y, if at least one of the pins has a bent tip 74, it can be distinguished from other pins 73 as shown in the figure.

On the other hand, as shown in Figure 4, the pin arrangement surface (IC
A device has also been proposed which solves the drawbacks of the device shown in FIG. 3 by arranging the camera 6 to face the package surface.

[Problem that the invention seeks to solve]

However, with the former device, although it is possible to identify curves at the tips of pins arranged in the imaging direction, it is difficult to identify which pin has a curve. In addition, since two cameras are required as imaging means, the configuration becomes complicated and it is disadvantageous in terms of cost.

Also, in the latter device, a pin image and a background image (I
C package surface image) was difficult to distinguish because the contrast ratio was generally not very good.

[Failure to solve the problem]

The present invention includes a holding part that holds a pin, a laser light source part that irradiates the pin with a slit laser beam from a direction perpendicular to the length direction of the pin, and a laser light source that irradiates the pin with reflected light and scattered light from the pin. This is a bin position detection device characterized by comprising: an imaging unit that receives light and captures a pin image viewed from the length direction of the pin; and an image processing unit that determines and calculates a bin position from the pin image.

〔Example〕

Embodiments of the present invention will be described below with reference to the drawings.

FIG. 1 is a diagram showing a basic example of a pin position detection device according to the present invention. The tip of the pin 2 placed on the IC package 9 held by the IC suction device 3 is irradiated with slit beam light. That is, the laser beam B from the He-Ne laser 9 is transmitted through the convex lens 10 and the collimator 11, for example.
After the beam diameter is expanded by an expander consisting of (beam light B2), a slit light (
A fan-shaped light) B3 is generated, and this slit light B3
The tip of the beam is irradiated. The reflected light and scattered light from the tip of the pin irradiated in this way is transmitted to the lens 4. The image signal is inputted to the camera 6 via the close-up link 5, and the captured screen is displayed on the monitor 3, and the image signal is subjected to image processing for detecting the bin position in the image processing section 8. Slit light B
The thickness of the pin 3 is determined by the expander and is set to a thickness including the tip of the pin. In the present invention, the laser slit light B3 is efficiently reflected and scattered at the tip of the pin 2, and this reflected and scattered light is placed directly below the pin 2, and the depth of focus is narrowed around the tip of the pin 2. The image is captured by the camera 6 which is adjusted so that Therefore, the reflected light from the surface of the IC package can be ignored as an image signal, and only the pin image can be obtained with extremely high contrast, so image processing for pin position determination and pin position detection on the monitor 7 can be done visually. It can also be done easily. Here, in order to calculate the pin position, it is effective to use the center of gravity position as the bibin position reference point based on the pin image signal in order to improve accuracy. In addition, by covering the portion other than the irradiation area of the slit laser beam B3 with an external light shielding plate 13 as shown in FIG. 1, highly accurate bin position detection with a high contrast ratio becomes possible.

Figures 2 (5) and (B) show other embodiments of the present invention, in which deterioration in position detection accuracy due to pin curvature is prevented, and the position of pin curvature can also be detected. shows.

6- In this embodiment, the laser beams from the two He-Ne lasers 9a and 9b are slitted by polygon mirrors 12m and 12b, and the slit beams Baa and Bsb are applied to pin/2 pins on the IC package 1 from opposite sides. The reflected light and scattered light from the pin 2 are irradiated onto the tip of the lens 4. A photograph is taken with the camera 26 via the close-up link 5. When irradiating slit light from one direction, if the pin is bent in the irradiation direction, the slit light will not be irradiated on the camera side part (back part) of the bent part of the pin, and the slit light will not be irradiated from that part. Since the intensity of the reflected light is small, it becomes difficult to detect songs with low contrast. In this embodiment, since the pin tips are irradiated from opposite directions, the reflected light from the pin tips is always received by the camera no matter which direction the pin is bent, and this problem does not occur.

Furthermore, as shown in FIG. 2(B), since the vertical position of the pin 2 can be adjusted using the two-axis table 14, the irradiation area of the slit beam light can be gradually adjusted from the vicinity of the base of the pin to the tip. If you move it to the position, you can easily obtain the bending situation corresponding to each height position of the pin.

Incidentally, it is of course possible to use a galvanometer mirror to obtain the slit beam light. Furthermore, by attaching a color filter or an interference filter to the camera that allows only light having the wavelength of the slit laser beam to pass through, shadows caused by extraneous light can be removed, making it possible to detect pin positions with high precision. You can also do it.

〔Effect of the invention〕

As described above, the present invention enables highly accurate detection of pin positions with a relatively simple configuration, and is extremely effective when used in automatic pin insertion devices and the like.

[Brief explanation of drawings]

FIG. 1 is a basic configuration diagram of a pin position detection device according to the present invention;
FIGS. 2(5) and 2(B) are main part configuration diagrams showing an embodiment of the present invention, and FIGS. 3 and 4 are configuration diagrams of a conventional pin position detection device. 1...IC package, 2...pin,
3...IC adsorption device, 4...lens, 5
・・・・・・Close-up link, 6,6X. 6Y... Camera, 7, 7X, 7Y...
Monitor, 8... Image processing section, 9...
He-Ne laser, 10...Convex lens, 11.
...Collimator, 12...Cylindrical lens,
12M, 12b...Borigonmi 9-113...
...External light shielding plate, 14...2-axis table. ,゛・・−

Claims (6)

[Claims] (1) a holding part that holds the pin; a laser light source part that irradiates the pin with a slit laser beam from a direction perpendicular to the length direction of the pin; and reflected light of the laser beam from the pin;
A pin position detection device comprising: an imaging unit that receives scattered light and captures a pin image viewed from the length direction of the pin; and an image processing unit that determines and calculates a pin position from the pin image. . (2) The pin position detection device according to claim (1), wherein the laser light source section includes a cylindrical lens, a galvano mirror, or a polygon mirror, and generates the slit laser beam. (3) In claim 1, the laser light source section is characterized by comprising means for generating two slit laser beams and irradiating the pin with the laser beams from directions perpendicular to each other. Pin position detection device. (4) The pin position detection device according to claim 1, wherein at least one of the holding section and the laser light source section is movable in the length direction of the pin. (5) The pin position detection device according to claim 1, wherein the laser light source section includes an expander that expands the diameter of the laser beam to a predetermined value. (6) The pin position detection device according to claim 1, wherein a light shielding plate is provided in a portion of the holding portion and the pin other than the laser beam irradiation portion.