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JPS62216250A - Manufacture of printed substrate type pga package - Google Patents

Manufacture of printed substrate type pga package

Info

Publication number
JPS62216250A
JPS62216250A JP24865685A JP24865685A JPS62216250A JP S62216250 A JPS62216250 A JP S62216250A JP 24865685 A JP24865685 A JP 24865685A JP 24865685 A JP24865685 A JP 24865685A JP S62216250 A JPS62216250 A JP S62216250A
Authority
JP
Japan
Prior art keywords
plating
holes
opening
plate
hole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP24865685A
Other languages
Japanese (ja)
Other versions
JPH025014B2 (en
Inventor
Yukiharu Takeuchi
之治 竹内
Kuniyuki Hori
堀 邦行
Shinobu Sasaki
忍 佐々木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shinko Electric Industries Co Ltd
Shindo Denshi Kogyo KK
Original Assignee
Shinko Electric Industries Co Ltd
Shindo Denshi Kogyo KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinko Electric Industries Co Ltd, Shindo Denshi Kogyo KK filed Critical Shinko Electric Industries Co Ltd
Priority to JP24865685A priority Critical patent/JPS62216250A/en
Publication of JPS62216250A publication Critical patent/JPS62216250A/en
Publication of JPH025014B2 publication Critical patent/JPH025014B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/498Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
    • H01L23/49822Multilayer substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Production Of Multi-Layered Print Wiring Board (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)

Abstract

PURPOSE:To prevent the adhesion of plating to wiring patterns in a semiconductor element housing hole completely by forming through-holes and the wiring patterns to a plurality of laminated board bodies through a specific process and plating the through-holes. CONSTITUTION:With a plurality of laminated board bodies 2, 5, 8, 10A, openings for shaping a semiconductor-element housing hole 16 are not formed to the board bodies 2, 10A on both outsides, wiring patterns except the outer surfaces of the board bodies 2, 10A on both outsides are laminated so as to be hermetically sealed by the board bodies 2, 10A on both outsides, through-holes 17 are shaped to a plurality of the board bodies 2, 5, 8, 10A while the through-holes 17 are plated, and an opening for forming the semiconductor-element housing hole 16 is shaped so at least one 10A of the board bodies on both outsides. Accordingly, the opening 11A for the board body 10 A positioned at the end of the semiconductor-element housing hole 16 is shaped lastly, thus positively preventing the state of on adhesion on the wiring patterns for copper foils 3, 7 for the board bodies 2, 5 of plating when the through-holes 17 are plated.

Description

【発明の詳細な説明】 (発明の技術分野) 本発明はPGAパッケージの製造方法に係り、特にプリ
ント基板型PGAパッケージの製造方法の改良に関する
DETAILED DESCRIPTION OF THE INVENTION (Technical Field of the Invention) The present invention relates to a method for manufacturing a PGA package, and more particularly to an improvement in a method for manufacturing a printed circuit board type PGA package.

(技術の背景) 従来からのPG^パッケージ(ピングリットアレイパッ
ケージ)はセラミックを使用していたため、高価であり
、低価格化が課題となっていた。そこで、近年、ガラス
繊維入り合成樹脂等の板体を積層してなるプリント基板
型PG^パッケージが開発され、多ピン化への対応と低
価格化を同時に実現し得るようになってきた。
(Technical background) Conventional PG^ packages (pin grid array packages) use ceramics and are therefore expensive, making cost reduction an issue. Therefore, in recent years, a printed circuit board type PG^ package, which is made by laminating plates made of glass fiber-containing synthetic resin, etc., has been developed, and it has become possible to simultaneously accommodate a large number of pins and reduce costs.

まず、このようなプリント基板型PGAパッケージの従
来の製造方法を第2図(A)、  (B)により説明す
る。
First, a conventional manufacturing method of such a printed circuit board type PGA package will be explained with reference to FIGS. 2(A) and 2(B).

第2図(A)は、プリント基板型PG^パッケージの基
板1の構成を示す説明図であり、この基板1の最下部に
は、上面に配線パターンが形成され所要のめっきが施さ
れる半導体素子搭載用の銅WM3が貼着され、下面には
配線パターンが形成され所要のめっきが施されるw4箔
4が貼着された絶縁材料製の板体2が配設されている。
FIG. 2(A) is an explanatory diagram showing the structure of a substrate 1 of a printed circuit board type PG^ package. At the bottom of this substrate 1, a wiring pattern is formed on the upper surface and a semiconductor is coated with the required plating. A plate body 2 made of an insulating material is provided, on which a copper WM3 for mounting elements is adhered, and a W4 foil 4 on which a wiring pattern is formed and required plating is adhered on the lower surface.

この板体2上には、開口6が形成された絶縁材料製の板
体5が積層して貼着されるようになっており、この板体
5の上面には半導体素子実装用端子パターンが形成され
所要のめっきが施される銅箔7が貼着されている。この
板体5上には、板体5の開口6に合致し、かつこの間口
6より大きな開口9が形成された絶縁材料製の板体8が
積層して貼着されるようになっている。さらに、この板
体8上には、板体8の開口9に合致し、かつこの間口9
より大きな開口11が形成された絶縁材料製の板体10
が積層して貼着されるようになっている。この板体10
の上面には、配線パターンが形成され所要のめっきが施
される銅箔12が貼着されている。
A plate 5 made of an insulating material and having an opening 6 formed therein is laminated and pasted on the plate 2, and a terminal pattern for mounting a semiconductor element is formed on the upper surface of the plate 5. A copper foil 7 that is formed and subjected to required plating is attached. A plate 8 made of an insulating material and having an opening 9 that matches the opening 6 of the plate 5 and is larger than the width 6 is laminated and pasted on the plate 5. . Furthermore, on this plate body 8, there is a space that matches the opening 9 of the plate body 8, and which
Plate body 10 made of insulating material with larger opening 11 formed therein
are layered and pasted together. This plate 10
A copper foil 12 on which a wiring pattern is formed and a required plating is applied is adhered to the upper surface of the .

このような第2図(A)の各板体2,5,8゜10によ
り第2図(B)に示す基板1を形成するには、まず板体
2,5間、板体5.8間ならびに板体8,10間にそれ
ぞれ接着剤シー)13,14゜15を介して、銅箔3.
7に所要の配線パターンが形成され所要のめっき(図示
しないが、一般にはニッケルめっき下地の金めつき)が
施された板体2.5.板体8.10を積層して貼着する
。すると、各開口6,9.11により半導体素子収納穴
16が形成される。ついで、第2図(B)に示すように
、基板1に貫通孔17.  1?、・・・を形成し、各
貫通孔17内に無電解銅めっき等のめっきを施し、板体
2の銅箔4および板体10の銅箔12に所要の配線パタ
ーンを形成し、所要のめっきを施す。さらにリードピン
(図示せず)をこの貫通孔17に挿通してはんだ付は等
により固定することによりプリンI−基板型PG^パッ
ケージとなる。
In order to form the substrate 1 shown in FIG. 2(B) using the plates 2, 5, and 8° 10 of FIG. 2(A), first, between the plates 2 and 5, Copper foil 3.
7, a required wiring pattern is formed and required plating (not shown, but generally gold plating on a nickel plating base) is applied to the plate body 2.5. The plates 8 and 10 are laminated and pasted. Then, a semiconductor element housing hole 16 is formed by each opening 6, 9, 11. Next, as shown in FIG. 2(B), a through hole 17. is formed in the substrate 1. 1? . Apply plating. Further, lead pins (not shown) are inserted into the through holes 17 and fixed by soldering or the like, thereby forming a printed circuit board type PG^ package.

(従来技術の問題点) しかしながら、このような従来の方法では貫i1孔17
へ無電解銅めっき等を施すと、めっきが金めっきされた
銅箔3や半導体素子実装用の金めっきされた端子パター
ンが形成された銅箔7はもとより基板1の全体に析出し
、端子パターンが全て短絡してしまう等の問題点があっ
た。
(Problems with the prior art) However, in such a conventional method, the through hole 17
When electroless copper plating or the like is applied to the substrate, the plating is deposited not only on the gold-plated copper foil 3 and the copper foil 7 on which the gold-plated terminal pattern for mounting semiconductor elements is formed, but also on the entire substrate 1, and the terminal pattern is formed. There were problems such as all of them being short-circuited.

このため無電解銅めっきを基板1に施した後貫通孔17
や貫通孔周囲の銅めっき必要部のみをエツチングレジス
トで被覆し、不要部分の銅めっきを選択的に剥離除去し
て金めつきが施された端子パターンを露出させて独立の
パターンにするか、または貫通孔等の銅めっき必要線以
外を予めマスキング状態で被覆しておき、必要部のみに
選択的に無電解銅めっきを施す必要があった。
For this reason, after electroless copper plating is applied to the substrate 1, the through holes 17
Either cover only the parts that require copper plating around the through-holes with etching resist, selectively peel off the copper plating on unnecessary parts, and expose the gold-plated terminal pattern to create an independent pattern. Alternatively, it was necessary to cover lines other than lines requiring copper plating, such as through holes, in advance in a masked state, and selectively apply electroless copper plating only to the necessary areas.

従ってこのような方法では、エツチングレジストやマス
キング材の塗布や剥離除去という工程が必要で作業性が
悪く、また端子パターンの金めつき面がエツチングレジ
ストおよび銅めっきの剥離液、またはマスキング材の剥
離液に接触するため表面状態が悪化し、ワイヤボンディ
ング特性が低下する等の問題点があった。また、マスキ
ング材を使用した場合は、マスキング材上に析出した銅
めっき皮膜が箔状となってめっき液中に剥落して浮遊す
るため、めっき液の寿命を著しく損なうという問題点が
あった。
Therefore, with this method, the process of applying and peeling off the etching resist or masking material is required, resulting in poor workability.In addition, the gold-plated surface of the terminal pattern may be exposed to the etching resist or copper plating stripping solution, or the stripping of the masking material. There were problems such as deterioration of the surface condition due to contact with liquid and deterioration of wire bonding characteristics. Further, when a masking material is used, there is a problem in that the copper plating film deposited on the masking material becomes a foil and peels off and floats in the plating solution, significantly shortening the life of the plating solution.

(発明の目的) 本発明は、前述した従来の製造方法における問題点を克
服し、銅箔3や銅箔7に11通孔をめっきする際のめっ
きが被着しないようにしたプリント基板型PGAパッケ
ージの製造方法を提供することを目的としている。
(Object of the Invention) The present invention overcomes the problems in the conventional manufacturing method described above, and provides a printed circuit board type PGA that prevents the plating from adhering when plating 11 through holes on the copper foil 3 and the copper foil 7. The purpose is to provide a method for manufacturing packages.

(発明の構成) 本発明は、積層された複数枚の板体に半導体素子収納穴
、貫通孔ならびに配線パターンが形成され、貫通孔には
メッキが施されているプリント基盤型PGAパッケージ
の製造方法において、前記積層された複数枚の板体は、
両外側の板体には半導体素子収納穴を形成するための開
口が形成されておらず、両外側の板体の外面を除く配線
パターンは、両外側の板体によって密閉されるように積
層されており、該積層された複数枚の板体に貫通孔を形
成するとともに貫通孔にめっきを施し、その後両外側の
板体の少なくとも一方に半導体素子収納穴を形成するた
めの開口を形成するようにしたことを特徴としている。
(Structure of the Invention) The present invention provides a method for manufacturing a printed circuit board type PGA package in which a semiconductor element housing hole, a through hole, and a wiring pattern are formed in a plurality of laminated plates, and the through hole is plated. In the above, the plurality of laminated plates are:
No opening for forming a semiconductor element storage hole is formed in the outer plates, and the wiring pattern except for the outer surface of the outer plates is stacked so as to be sealed by the outer plates. A through-hole is formed in the plurality of laminated plates, and the through-hole is plated, and then an opening for forming a semiconductor element storage hole is formed in at least one of both outer plates. It is characterized by the fact that

(発明の実施例) 以下、本発明を第1図(A)〜(H)に示す実施例によ
り説明する。なお、前述した従来のものと同一の構成に
ついては、図面中に同一の符号を付し、その説明は省略
する。
(Embodiments of the Invention) The present invention will be described below with reference to embodiments shown in FIGS. 1(A) to 1(H). Note that the same components as those of the conventional device described above are denoted by the same reference numerals in the drawings, and the explanation thereof will be omitted.

第1図(F)に示すプリント基板型PGAパッケージの
基板1を形成するためには、第1図(A)に示すように
、従来の方法において用いた3枚の板体2,5.8のほ
か開口の形成されていない板体10Aを用いる。そして
、板体2の銅tf33ならびに板体5の銅箔7をそれぞ
れエツチングして配線パターンを形成する。その後、第
1図(B)に示すように、これらの配線パターン上に下
地にニッケルめっきを施した金の皮膜18.19をメッ
キにより被着する。ついで、第1図(C)に示すように
、接着剤シート13.14.15により各板体2,5,
8.板体10Aを積層して接着する。
In order to form the substrate 1 of the printed circuit board type PGA package shown in FIG. 1(F), as shown in FIG. 1(A), three plates 2, 5. In addition to the above, a plate body 10A having no openings is used. Then, the copper tf 33 of the plate 2 and the copper foil 7 of the plate 5 are etched to form a wiring pattern. Thereafter, as shown in FIG. 1(B), gold films 18 and 19 with a nickel-plated base are deposited on these wiring patterns by plating. Then, as shown in FIG. 1(C), each plate body 2, 5,
8. The plates 10A are stacked and bonded.

なお、板体8.板体10Aを接着するための接着剤シー
ト15は、板体10Aに後で形成される開口11A(第
1図(F))の部位を接着しないよている。
In addition, plate body 8. The adhesive sheet 15 for bonding the plate body 10A does not adhere to the opening 11A (FIG. 1(F)) that will be formed later in the plate body 10A.

つぎに、第1図(D)に示すように、板体2゜5.8.
板体10Aにかけて貫通孔17.17、・・・を形成し
、各貫通孔17に無電解銅めっき20を施し、各銅箔3
,4,7、+2Aに必要な電気的導通を与える。さらに
、第1図(E)に示すように、板体2の下面の銅箔4な
らびに、板体10Aの上面の銅Ffi l 2 Aをエ
ツチングして配線パターン21.22を形成し、これら
の配線パターン21゜22および貫通孔に下地にニッケ
ルめっきを施した金の皮膜23をめっきにより施してリ
ードピンを固定するための配線パターンを形成する。そ
して、最後に、第1図(F)に示すように、板体]OA
に開口11Aを穿設して、板体5.8の開口6゜9とと
もに半導体素子収納穴16を形成する。
Next, as shown in FIG. 1(D), the plate body 2°5.8.
Through holes 17, 17, .
, 4, 7, +2A. Furthermore, as shown in FIG. 1(E), the copper foil 4 on the lower surface of the plate 2 and the copper Ffil 2 A on the upper surface of the plate 10A are etched to form wiring patterns 21 and 22. A gold film 23 with a nickel-plated base is applied to the wiring patterns 21 and 22 and the through holes by plating to form a wiring pattern for fixing the lead pins. Finally, as shown in FIG. 1 (F), the plate] OA
An opening 11A is bored in the plate 5.8 to form a semiconductor element storage hole 16 together with the opening 6.9 of the plate 5.8.

この際板体10Aの開口11Aと接する部分の板体8の
上面には開口11Aを形成する際の力・ツタ−等により
若干の凹部が形成されるためこの面に配線パターンを設
けることは極めて困難である。
At this time, it is extremely difficult to provide a wiring pattern on this surface because a slight recess is formed on the upper surface of the plate 8 in the part that contacts the opening 11A of the plate 10A due to the force, tumble, etc. when forming the opening 11A. Have difficulty.

この凹部は半導体素子搭載後に蓋体で気密封止する際の
接着剤流入凹部となり、不具合が生じる個所への接着剤
の流出を防止して、蓋体の接着強度を高めることができ
る。
This recess serves as an adhesive inflow recess when airtightly sealing with the lid after mounting the semiconductor element, and prevents the adhesive from flowing out to areas where problems occur, thereby increasing the adhesive strength of the lid.

なお、第1図(G)に示すように板体10Aの開口11
Aの形成部全周に積層前に予め凹溝24を形成しておく
ことにより、板体8に何ら影響を与えることなく開口1
1Aを形成できるため、板体8にも配線パターンを形成
することができ、一層の多ピン化、高密度化が可能とな
る。この凹溝24は開口形成部へ接着剤が流出し、板体
10Aの開口形成部が板体8と接着することを防止でき
る。また、板体8に配線パターンを形成する必要がない
場合は、板体8を取り去って板体5と板体10Aを直接
積層しても配線パターンを損なうことなく開口を形成す
ることもできるのでより小型化が可能となる。
In addition, as shown in FIG. 1(G), the opening 11 of the plate body 10A
By forming the concave groove 24 in advance around the entire circumference of the forming part A before lamination, the opening 1 can be formed without affecting the plate body 8 in any way.
Since 1A can be formed, a wiring pattern can also be formed on the plate 8, making it possible to further increase the number of pins and increase the density. This groove 24 can prevent the adhesive from flowing out to the opening forming portion and preventing the opening forming portion of the plate body 10A from adhering to the plate body 8. Further, if it is not necessary to form a wiring pattern on the plate 8, the opening can be formed without damaging the wiring pattern even if the plate 8 is removed and the plate 5 and the plate 10A are directly laminated. Further downsizing is possible.

また第1図(H)に示すようにパッケージの熱放散性を
一層高めるために半導体素子を銅板等の放熱板2A上に
搭載する場合には、板体5Aの開口6Aの形成は、貫通
孔17にめっきを施し、板体10Aに開口11Aを形成
した後に行い、最後に放熱板2Aを板体5Aに貼着して
半導体素子収納穴を形成することにより、貫通孔17に
無電解めっきを施す際に配線パターン7Aにこのめっき
が被着することを阻止することができる。
Further, as shown in FIG. 1(H), when a semiconductor element is mounted on a heat dissipating plate 2A such as a copper plate in order to further improve the heat dissipation performance of the package, the opening 6A of the plate 5A is formed as a through hole. Electroless plating is applied to the through hole 17 by plating the through hole 17 and forming the opening 11A in the plate 10A, and finally attaching the heat sink 2A to the plate 5A to form the semiconductor element storage hole. This plating can be prevented from adhering to the wiring pattern 7A during plating.

さらにこの場合には板体10Aに第1図(G)に示す凹
溝24を形成することにより板体8を取り去ることが可
能となり、板体10A、5Aの半導体素子収納穴を形成
するための開口は、貫通孔17にめっきを施して後に形
成し、その後放熱板2人を貼着することもできる。
Furthermore, in this case, by forming the groove 24 shown in FIG. 1(G) in the plate body 10A, the plate body 8 can be removed, and the groove 24 shown in FIG. 1(G) can be removed. The opening can also be formed after plating the through hole 17 and then attaching the two heat sinks.

以上述べたように本実施例によれば、半導体素子収納穴
16の端に位置する板体10Aの開口11Aを最後に形
成するので、貫通孔17にめっきを施す際にめっきが板
体2,5の銅箔3.7の配線パターンに被着するという
事態を確実に阻止することができる。
As described above, according to this embodiment, the opening 11A of the plate body 10A located at the end of the semiconductor element storage hole 16 is formed last, so that when plating the through hole 17, the plating is applied to the plate body 2, It is possible to reliably prevent the copper foil 3.5 from adhering to the wiring pattern 7.

なお、銅箔3,7には、配線パターン形成後に所要のめ
っきを施さずに積層し、貫通孔17に無電解銅めっき等
を施した後に開口11Aを形成し、金等のめっき皮膜2
3を施す際に同時に銅箔3゜7にも金等のめっき皮膜1
8.19を形成することによっても、銅箔3,7には不
要な無電解銅めっき等が被着することを阻止することが
できる。
Note that the copper foils 3 and 7 are laminated without any required plating after the wiring pattern is formed, and the opening 11A is formed after electroless copper plating or the like is applied to the through hole 17, and the plating film 2 of gold or the like is formed.
When applying step 3, a plating film 1 of gold etc. is also applied to the copper foil 3°7 at the same time.
8.19 also prevents unnecessary electroless copper plating from being deposited on the copper foils 3 and 7.

(発明の効果) 以上説明したように、本発明によれば、基板の貫通孔に
無電解めっき等を施す際に半導体素子収納穴内の配線パ
ターンにこのめっきが被着することを完全に阻止できる
ため、量産性に優れる等の効果を奏する。
(Effects of the Invention) As explained above, according to the present invention, when electroless plating or the like is applied to the through-hole of a substrate, it is possible to completely prevent the plating from adhering to the wiring pattern in the semiconductor element housing hole. Therefore, it has advantages such as excellent mass productivity.

【図面の簡単な説明】[Brief explanation of drawings]

第1図(A)、  (B)、  (C)、  (D)、
  (E)。 (F)、  (G)、  H()は本発明に係るプリン
ト基板型PGAパッケージの製造方法の実施例をしめず
説明図、第1図(A>、  (B)は従来の方法を示す
説明図である。 1・・・基板、 2.5,8,10.IOA・・・板体、6.9,11.
IIA・・・開口、 16・・・半導体阻止収納穴、 17・・・貫通孔、  24・・・凹溝。
Figure 1 (A), (B), (C), (D),
(E). (F), (G), and H() are explanatory diagrams showing an embodiment of the method for manufacturing a printed circuit board type PGA package according to the present invention, and Figures 1 (A> and (B) are explanatory diagrams showing a conventional method. 1... Substrate, 2.5, 8, 10. IOA... Plate body, 6.9, 11.
IIA...Opening, 16...Semiconductor blocking storage hole, 17...Through hole, 24...Concave groove.

Claims (1)

【特許請求の範囲】[Claims] 1、積層された複数枚の板体に半導体素子収納穴、貫通
孔ならびに配線パターンが形成され、貫通孔にはメッキ
が施されているプリント基盤型PGAパッケージの製造
方法において、前記積層された複数枚の板体は、両外側
の板体には半導体素子収納穴を形成するための開口が形
成されておらず、両外側の板体の外面を除く配線パター
ンは、両外側の板体によって密閉されるように積層され
ており、該積層された複数枚の板体に貫通孔を形成する
とともに貫通孔にめっきを施し、その後両外側の板体の
少なくとも一方に半導体素子収納穴を形成するための開
口を形成するようにしたことを特徴とするプリント基板
型PGAパッケージの製造方法。
1. A method for manufacturing a printed circuit board type PGA package in which semiconductor element storage holes, through holes, and wiring patterns are formed in a plurality of laminated plates, and the through holes are plated. The two outer plates do not have openings for forming semiconductor element storage holes, and the wiring pattern except for the outer surface of the two outer plates is sealed by the outer plates. In order to form a through hole in the plurality of laminated plates and apply plating to the through hole, and then to form a semiconductor element storage hole in at least one of both outer plates. 1. A method for manufacturing a printed circuit board type PGA package, characterized in that an opening is formed.
JP24865685A 1985-11-06 1985-11-06 Manufacture of printed substrate type pga package Granted JPS62216250A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24865685A JPS62216250A (en) 1985-11-06 1985-11-06 Manufacture of printed substrate type pga package

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24865685A JPS62216250A (en) 1985-11-06 1985-11-06 Manufacture of printed substrate type pga package

Publications (2)

Publication Number Publication Date
JPS62216250A true JPS62216250A (en) 1987-09-22
JPH025014B2 JPH025014B2 (en) 1990-01-31

Family

ID=17181373

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24865685A Granted JPS62216250A (en) 1985-11-06 1985-11-06 Manufacture of printed substrate type pga package

Country Status (1)

Country Link
JP (1) JPS62216250A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63255996A (en) * 1987-04-14 1988-10-24 シチズン時計株式会社 Multilayer board for semiconductor chip mounting
JPH01112739A (en) * 1987-10-27 1989-05-01 Matsushita Electric Works Ltd Printed circuit board for mounting electronic component
US5804422A (en) * 1995-09-20 1998-09-08 Shinko Electric Industries Co., Ltd. Process for producing a semiconductor package
US6011694A (en) * 1996-08-01 2000-01-04 Fuji Machinery Mfg. & Electronics Co., Ltd. Ball grid array semiconductor package with solder ball openings in an insulative base
US6040984A (en) * 1996-02-27 2000-03-21 Fuji Machinery Mfg. & Electronics Co., Ltd. Printed circuit board with opposed bonding shelves for semiconductor chip wire bonding at different levels
KR100285116B1 (en) * 1997-02-12 2001-06-01 모기 쥰이찌 Manufacturing method of semiconductor package
CN103227164A (en) * 2013-03-21 2013-07-31 日月光半导体制造股份有限公司 Semiconductor package structure and manufacturing method thereof

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568855A (en) * 1979-07-04 1981-01-29 Mitsubishi Electric Corp Container for semiconductor
JPS5892248A (en) * 1981-11-28 1983-06-01 Mitsubishi Electric Corp Large scale mounted semiconductor device
JPS59201449A (en) * 1983-03-09 1984-11-15 プリンテツド・サ−キツツ・インタ−ナシヨナル・インコ−ポレイテツド Semiconductor chip carrier pacakge having heat sink and its producing method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568855A (en) * 1979-07-04 1981-01-29 Mitsubishi Electric Corp Container for semiconductor
JPS5892248A (en) * 1981-11-28 1983-06-01 Mitsubishi Electric Corp Large scale mounted semiconductor device
JPS59201449A (en) * 1983-03-09 1984-11-15 プリンテツド・サ−キツツ・インタ−ナシヨナル・インコ−ポレイテツド Semiconductor chip carrier pacakge having heat sink and its producing method

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63255996A (en) * 1987-04-14 1988-10-24 シチズン時計株式会社 Multilayer board for semiconductor chip mounting
JPH01112739A (en) * 1987-10-27 1989-05-01 Matsushita Electric Works Ltd Printed circuit board for mounting electronic component
US5804422A (en) * 1995-09-20 1998-09-08 Shinko Electric Industries Co., Ltd. Process for producing a semiconductor package
US6040984A (en) * 1996-02-27 2000-03-21 Fuji Machinery Mfg. & Electronics Co., Ltd. Printed circuit board with opposed bonding shelves for semiconductor chip wire bonding at different levels
US6011694A (en) * 1996-08-01 2000-01-04 Fuji Machinery Mfg. & Electronics Co., Ltd. Ball grid array semiconductor package with solder ball openings in an insulative base
KR100285116B1 (en) * 1997-02-12 2001-06-01 모기 쥰이찌 Manufacturing method of semiconductor package
CN103227164A (en) * 2013-03-21 2013-07-31 日月光半导体制造股份有限公司 Semiconductor package structure and manufacturing method thereof

Also Published As

Publication number Publication date
JPH025014B2 (en) 1990-01-31

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